{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:59:22Z","timestamp":1759147162951,"version":"3.32.0"},"reference-count":5,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[1993,11,1]],"date-time":"1993-11-01T00:00:00Z","timestamp":752112000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1993,11]]},"DOI":"10.1007\/bf00972161","type":"journal-article","created":{"date-parts":[[2005,1,14]],"date-time":"2005-01-14T07:55:28Z","timestamp":1105689328000},"page":"369-374","source":"Crossref","is-referenced-by-count":5,"title":["A structure for interconnect testing on mixed-signal boards"],"prefix":"10.1007","volume":"4","author":[{"given":"B. R.","family":"Wilkins","sequence":"first","affiliation":[]},{"given":"B. S.","family":"Suparjo","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","unstructured":"IEEE Standard 1149.1: Standard Test Access Port and Boundary-Scan Architecture, IEEE Computer Society, 1990."},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"B.R. Wilkins, ?A structure for board-level mixed-signal testability,?Proc. ITC, 556?557, 1992.","DOI":"10.1109\/TEST.1992.527875"},{"key":"CR3","unstructured":"P.T. Wagner, ?Interconnect testing with boundary scan,?Proc. ITC, 52?57, 1987."},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"P.J. Dickinson, and B.R. Wilkins, ?Interconnect testing for busstructured systems,?Proc. ETC, 476?483, 1993.","DOI":"10.1109\/ETC.1993.246595"},{"key":"CR5","doi-asserted-by":"crossref","unstructured":"B.R. Wilkins, S. Oresjo, and B.S. Suparjo, ?Towards a mixed-signal testability bus standard: P1149.4,?Proc. ETC, 58?65, 1993.","DOI":"10.1109\/ETC.1993.246533"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972161.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00972161\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00972161","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T15:42:47Z","timestamp":1734882167000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00972161"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,11]]},"references-count":5,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1993,11]]}},"alternative-id":["BF00972161"],"URL":"https:\/\/doi.org\/10.1007\/bf00972161","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1993,11]]}}}