{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T16:29:16Z","timestamp":1742401756058},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1995,4,1]],"date-time":"1995-04-01T00:00:00Z","timestamp":796694400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1995,4]]},"DOI":"10.1007\/bf00993089","type":"journal-article","created":{"date-parts":[[2005,1,9]],"date-time":"2005-01-09T11:51:24Z","timestamp":1105271484000},"page":"229-241","source":"Crossref","is-referenced-by-count":7,"title":["Avoiding linear dependencies in LFSR test pattern generators"],"prefix":"10.1007","volume":"6","author":[{"given":"Dimitrios","family":"Kagaris","sequence":"first","affiliation":[]},{"given":"Spyros","family":"Tragoudas","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"W.-B. Jone and C.A. Papachristou, ?A Coordinated Approach to Partitioning and Test Pattern Generation for Pseudo-exhaustive Testing,?Proc. 26th ACM\/IEEE Design Automation Conference, pp. 525?530, 1989.","DOI":"10.1145\/74382.74470"},{"key":"CR2","unstructured":"H.-J. Wunderlich and S. Hellebrand, ?Tools and Devices Supporting the Pseudo-Exhaustive Test,?Proc. European Conference on Design Automation, pp. 13?17, 1990."},{"issue":"no. 9","key":"CR3","doi-asserted-by":"crossref","first-page":"1170","DOI":"10.1109\/43.310906","volume":"13","author":"D. Kagaris","year":"1994","unstructured":"D. Kagaris, F. Makedon, and S. Tragoudas, ?A Method for Pseudo-Exhaustive Test Pattern Generation,?IEEE Transactions on Computer-Aided Design, Vol. 13, no. 9, pp. 1170?1178, 1994.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"CR4","volume-title":"Shift Register Sequences","author":"S.W. Golomb","year":"1982","unstructured":"S.W. Golomb,Shift Register Sequences, Aegean Park Press, Laguna Hills, CA, 1982."},{"key":"CR5","volume-title":"Algebaic Coding Theory","author":"E.R. Berlekamp","year":"1984","unstructured":"E.R. Berlekamp,Algebaic Coding Theory, Aegean Park Press, Laguna Hills, CA, 1984."},{"key":"CR6","doi-asserted-by":"crossref","first-page":"190","DOI":"10.1109\/TC.1983.1676202","volume":"32","author":"Z. Barzilai","year":"1983","unstructured":"Z. Barzilai, D. Coppersmith, and A.L. Rosenberg, ?Exhaustive Bit Generation with Application to VLSI Self-Testing,?IEEE Transactions on Computers, Vol. 32, pp. 190?194, 1983.","journal-title":"IEEE Transactions on Computers"},{"key":"CR7","doi-asserted-by":"crossref","first-page":"845","DOI":"10.1109\/TC.1984.1676501","volume":"33","author":"D.T. Tang","year":"1984","unstructured":"D.T. Tang and C.L. Chen, ?Logic Test Pattern Generation Using Linear Codes,?IEEE Trans. on Computers, Vol. 33, pp. 845?850, June 1984.","journal-title":"IEEE Trans. on Computers"},{"key":"CR8","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/TIT.1985.1057003","volume":"31","author":"A. Lempel","year":"1985","unstructured":"A. Lempel and M. Cohn, ?Design of Universal Test Sequences for VLSI,?IEEE Trans. on Information Theory, Vol. 31, pp. 10?15, Jan. 1985.","journal-title":"IEEE Trans. on Information Theory"},{"issue":"No. 4","key":"CR9","doi-asserted-by":"crossref","first-page":"526","DOI":"10.1109\/92.250200","volume":"1","author":"D. Kagaris","year":"1993","unstructured":"D. Kagaris and S. Tragoudas, ?Cost-Effective LFSR Synthesis for Optimal Pseudo-Exhaustive Test Sets,?IEEE Transactions on VLSI Systems, Vol. 1, No. 4, pp. 526?536, 1993.","journal-title":"IEEE Transactions on VLSI Systems"},{"key":"CR10","doi-asserted-by":"crossref","unstructured":"E.J. McCluskey, ?Built-in Self-Testing Techniques,?IEEE Design and Test of Computers, pp. 21?28, April 1985.","DOI":"10.1109\/MDT.1985.294856"},{"key":"CR11","doi-asserted-by":"crossref","first-page":"332","DOI":"10.1109\/TC.1987.1676905","volume":"36","author":"K.D. Wagner","year":"1987","unstructured":"K.D. Wagner, C.K. Chin, and E.J. McCluskey, ?Pseudorandom Testing,?IEEE Trans. on Computers, Vol. 36, pp. 332?343, Mar. 1987.","journal-title":"IEEE Trans. on Computers"},{"key":"CR12","doi-asserted-by":"crossref","unstructured":"A. Majumdar and S. Sastry, ?On the Distribution of Fault Coverage and Test Length in Random Testing of Combinational Circuits,?Proc. 29th ACM\/IEEE Design Automation Conf., pp. 341?345, 1992.","DOI":"10.1109\/DAC.1992.227781"},{"key":"CR13","unstructured":"S.C. Seth and V.D. Agrawal, ?Statistical Design Verification,?Proc. Int. Symposium on Fault-Tolerant Computing, pp. 393?399, 1982."},{"key":"CR14","doi-asserted-by":"crossref","first-page":"79","DOI":"10.1109\/TC.1984.5009315","volume":"33","author":"J. Savir","year":"1984","unstructured":"J. Savir, G.S. Ditlow, and P.H. Bardell, ?Random Pattern Testability,?IEEE Trans. on Computers, Vol. 33, pp. 79?90, Jan. 1984.","journal-title":"IEEE Trans. on Computers"},{"key":"CR15","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1147\/rd.273.0265","volume":"27","author":"E.B. Eichelberger","year":"1983","unstructured":"E.B. Eichelberger and E. Lindbloom, ?Random Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self Test,?IBM Journal of Research and Development, Vol. 27 pp. 265?272, May 1983.","journal-title":"IBM Journal of Research and Development"},{"key":"CR16","unstructured":"S.B. Akers, ?On Use of Linear Sums in Exhaustive Testing,?Proc. Int. Symposium on Fault-Tolerant Computing, pp. 148?158, 1985."},{"key":"CR17","doi-asserted-by":"crossref","first-page":"1086","DOI":"10.1109\/TC.1986.1676718","volume":"35","author":"C.L. Chen","year":"1986","unstructured":"C.L. Chen, ?Linear Dependencies in Linear Feedback Shift Registers,?IEEE Transactions on Computers, Vol. 35, pp. 1086?1088, Dec. 1986.","journal-title":"IEEE Transactions on Computers"},{"key":"CR18","doi-asserted-by":"crossref","first-page":"496","DOI":"10.1109\/12.2198","volume":"37","author":"P. Golan","year":"1988","unstructured":"P. Golan, O. Novak, and J. Hlavicka, ?Pseudo-Exhaustive Test Pattern Generator with Enhanced Fault Coverage,?IEEE Trans. on Computers, Vol. 37, pp. 496?500, Jan. 1988.","journal-title":"IEEE Trans. on Computers"},{"key":"CR19","volume-title":"Built-in Test for VLSI","author":"P.H. Bardell","year":"1987","unstructured":"P.H. Bardell, W.H. McAnney, and J. Savir,Built-in Test for VLSI, Wiley, New York, 1987."},{"key":"CR20","volume-title":"Computers and Intractability ? A Guide to The Theory of NP-Completeness","author":"M.R. Garey","year":"1979","unstructured":"M.R. Garey and D.S. Johnson,Computers and Intractability ? A Guide to The Theory of NP-Completeness, W.H. Freeman and Co., New York, 1979."},{"key":"CR21","unstructured":"F. Brglez, P. Pownall, and R. Hum, ?Accelerated ATPG and Fault Grading via Testability Analysis,?Proc. IEEE Int. Symp. on Circuits and Systems, pp. 695?698, 1985."},{"key":"CR22","unstructured":"P.H. Bardell, ?Primitive Polynomials: A Collection from Various Sources,?IBM Technical Report, TR 00.3703, Nov. 1992."},{"key":"CR23","unstructured":"W.-T. Cheng and J.H. Patel, ?PROOFS: A Super Fast Simulator for Sequential Circuits,?Proc. IEEE Int. Conf. on Computer-Aided Design, pp. 475?479, 1990."},{"key":"CR24","volume-title":"Digital Systems Testing and Testable Design","author":"M. Abramovici","year":"1990","unstructured":"M. Abramovici, M.A. Breuer, and A.D. Friedman,Digital Systems Testing and Testable Design, Computer Science Press, New York, 1990."},{"key":"CR25","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1109\/43.108621","volume":"11","author":"P.H. Bardell","year":"1992","unstructured":"P.H. Bardell, ?Calculating the Effects of Linear Dependencies inm-Sequences Used as Test Stimuli,?IEEE Transactions on Computer-Aided Design, Vol. 11, pp. 83?86, Jan. 1992.","journal-title":"IEEE Transactions on Computer-Aided Design"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00993089.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00993089\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00993089","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,29]],"date-time":"2019-04-29T18:58:40Z","timestamp":1556564320000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00993089"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,4]]},"references-count":25,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1995,4]]}},"alternative-id":["BF00993089"],"URL":"https:\/\/doi.org\/10.1007\/bf00993089","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1995,4]]}}}