{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T21:36:26Z","timestamp":1649108186791},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[1995,4,1]],"date-time":"1995-04-01T00:00:00Z","timestamp":796694400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1995,4]]},"DOI":"10.1007\/bf00993090","type":"journal-article","created":{"date-parts":[[2005,1,9]],"date-time":"2005-01-09T16:51:24Z","timestamp":1105289484000},"page":"243-253","source":"Crossref","is-referenced-by-count":3,"title":["Evaluating the safety of self-checking circuits"],"prefix":"10.1007","volume":"6","author":[{"given":"Shujian","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Jon C.","family":"Muzio","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","first-page":"150","DOI":"10.1109\/TCAD.1984.1270069","volume":"3","author":"D.J. Lu","year":"1984","unstructured":"D.J. Lu and E.J. McCluskey, ?Quantitative evaluation of self-checking circuits,?IEEE Transactions on Computer-Aided Design, vol. 3, pp. 150?155, April 1984.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"CR2","first-page":"146","volume":"33","author":"E. Fujiwara","year":"1984","unstructured":"E. Fujiwara, N. Mutoh, and K. Matsuoka, ?A self-testing groupparity prediction checker and its use for built-in testing,?IEEE Transactions on Computers, vol. 33, pp. 146?153, June 1984.","journal-title":"IEEE Transactions on Computers"},{"key":"CR3","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1109\/TC.1987.5009451","volume":"36","author":"E. Fujiwara","year":"1987","unstructured":"E. Fujiwara and K. Matsuoka, ?A self-checking generalized prediction checker and its use for built-in testing,?IEEE Transactions on Computers, vol. 36, pp. 86?93, January 1987.","journal-title":"IEEE Transactions on Computers"},{"key":"CR4","unstructured":"J.C. Lo and E. Fujiwara, ?A probabilistic measurement for totally self-checking circuits,?Proceedings of International Workshop on Defect and Fault Tolerance in VLSI Systems, pp. 262?270, October 1993."},{"key":"CR5","doi-asserted-by":"crossref","first-page":"263","DOI":"10.1109\/T-C.1973.223705","volume":"22","author":"D.A. Anderson","year":"1973","unstructured":"D.A. Anderson and G. Metze, ?Design of totally self-checking circuits for m-out-of-n codes,?IEEE Transactions on Computers, vol. 22, pp. 263?269, March 1973.","journal-title":"IEEE Transactions on Computers"},{"key":"CR6","doi-asserted-by":"crossref","first-page":"491","DOI":"10.1109\/TC.1978.1675139","volume":"27","author":"J.E. Smith","year":"1978","unstructured":"J.E. Smith and G. Metze, ?Strongly fault secure logic networks,?IEEE Transactions on Computers, vol. 27, pp. 491?499, June 1978.","journal-title":"IEEE Transactions on Computers"},{"key":"CR7","unstructured":"D.A. Anderson, ?Design of self-checking digital networks using coding techniques,?Coordinated Sci. Lab., Univ. Illinois, Urbana, Report R-527, September 1971."},{"key":"CR8","doi-asserted-by":"crossref","first-page":"878","DOI":"10.1109\/43.229762","volume":"12","author":"N.K. Jha","year":"1993","unstructured":"N.K. Jha and S.J. Wang, ?Design and synthesis of self-checking VLSI circuits,?IEEE Transactions on Computer-Aided Design, vol. 12, pp. 878?887, June 1993.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"CR9","unstructured":"M.M. Mano,Digital Logic, Second Edition. Prentice-Hall, Inc., 1991."},{"key":"CR10","unstructured":"M. Abramovici, M.A. Breuer, and A.D. Friedman,Digital System Testing and Testable Design, Computer Science Press, 1990."},{"key":"CR11","unstructured":"B.W. Johnson,Design and Analysis of Fault Tolerant Digital Systems, Addison-Wesley, 1989."},{"key":"CR12","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1007\/BF02187098","volume":"8","author":"A. Goyal","year":"1987","unstructured":"A. Goyal, S.S. Lanvenberg, and K.S. Trivedi, ?Probabilistic modeling of computer system availability,?Annals of Operations Research, vol 8, pp. 285?306, March 1987.","journal-title":"Annals of Operations Research"},{"key":"CR13","doi-asserted-by":"crossref","first-page":"197","DOI":"10.1016\/0166-5316(92)90004-Z","volume":"14","author":"K.S. Trivedi","year":"1992","unstructured":"K.S. Trivedi, J.K. Muppala, S.P. Woolet, and B.R. Haverkort, ?Composite performance and dependability analysis,?Performance Evaluation, vol. 14, pp. 197?212, February 1992.","journal-title":"Performance Evaluation"},{"key":"CR14","doi-asserted-by":"crossref","first-page":"1178","DOI":"10.1109\/PROC.1978.11111","volume":"66","author":"D.P. Siewiorek","year":"1978","unstructured":"D.P. Siewiorek, V. Kini, H. Mashburn, S.R. McConnel, and M. Tsao, ?A case study of C.mmp, Cm*, and C.vmp: Part I?experiences with fault tolerance in multiprocessor systems,?Proceedings of the IEEE, vol. 66, pp. 1178?1199, October 1978.","journal-title":"Proceedings of the IEEE"},{"key":"CR15","unstructured":"S.R. McConnel, D.P. Siewiorek, and M.M. Tsao, ?The measurement and analysis of transient errors in digital computer systems,?Proceedings of IEEE International Symposium on Fault Tolerant Computing, pp. 67?70, 1979."},{"key":"CR16","doi-asserted-by":"crossref","first-page":"697","DOI":"10.1109\/TC.1982.1676070","volume":"31","author":"R.K. Iyer","year":"1982","unstructured":"R.K. Iyer, S.E. Butner, and E.J. McCluskey, ?A statistical failure\/load relationship: results of a multicomputer study,?IEEE Transactions on Computers, vol 31, pp. 697?705, July 1982.","journal-title":"IEEE Transactions on Computers"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00993090.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00993090\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00993090","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,29]],"date-time":"2019-04-29T22:58:40Z","timestamp":1556578720000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00993090"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,4]]},"references-count":16,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1995,4]]}},"alternative-id":["BF00993090"],"URL":"https:\/\/doi.org\/10.1007\/bf00993090","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1995,4]]}}}