{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T17:40:02Z","timestamp":1734889202249,"version":"3.32.0"},"reference-count":6,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1995,12,1]],"date-time":"1995-12-01T00:00:00Z","timestamp":817776000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1995,12]]},"DOI":"10.1007\/bf00995310","type":"journal-article","created":{"date-parts":[[2005,1,18]],"date-time":"2005-01-18T17:52:57Z","timestamp":1106070777000},"page":"145-155","source":"Crossref","is-referenced-by-count":4,"title":["Short test procedures for R-2R D\/A converters by electrical modeling and application of the ambiguity algorithm"],"prefix":"10.1007","volume":"7","author":[{"given":"A.","family":"Boni","sequence":"first","affiliation":[]},{"given":"G.","family":"Chiorboli","sequence":"additional","affiliation":[]},{"given":"G.","family":"Franco","sequence":"additional","affiliation":[]},{"given":"M.","family":"Ostacoli","sequence":"additional","affiliation":[]},{"given":"S.","family":"Mazzoleni","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"T.M. Souders and G.N. Stenbakken, ?A comprehensive approach for modeling and testing analog and mixed-signal devices,?Proc. of International Test Conference, 1990, pp. 169?176.","DOI":"10.1109\/TEST.1990.114015"},{"key":"CR2","doi-asserted-by":"crossref","unstructured":"T.M. Souders and G.N. Stenbakken, ?Linear error modeling of analog and mixed-signal devices,?Proc. of International Test Conference, 1991, pp. 573?581.","DOI":"10.1109\/TEST.1991.519720"},{"issue":"2","key":"CR3","doi-asserted-by":"crossref","first-page":"406","DOI":"10.1109\/TIM.1987.6312710","volume":"36","author":"G.N. Stenbakken","year":"1987","unstructured":"G.N. Stenbakken and T.M. Souders, ?Test-Point selection and testability measures via QR factorization of linear models,?IEEE Trans. on Instrumentation and Measurement, Vol. IM-36(2), pp. 406?410, June 1987.","journal-title":"IEEE Trans. on Instrumentation and Measurement"},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"G.N. Stenbakken, T.M. Souders, and G.W. Stewart, ?Ambiguity groups and testability,?IEEE Trans. on Instrumentation and Measurement, Vol. IM-38(5), October 1989.","DOI":"10.1109\/19.39034"},{"key":"CR5","unstructured":"K.G. Beauchamp, ?Applications of Walsh and related functions,? Academic Press, 1984."},{"key":"CR6","unstructured":"Analog Devices, ?Data coverter reference manual,? Vol. 1, October 1991."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00995310.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00995310\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00995310","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T17:08:35Z","timestamp":1734887315000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00995310"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,12]]},"references-count":6,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1995,12]]}},"alternative-id":["BF00995310"],"URL":"https:\/\/doi.org\/10.1007\/bf00995310","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1995,12]]}}}