{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:31Z","timestamp":1749205531794,"version":"3.32.0"},"reference-count":19,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1995,12,1]],"date-time":"1995-12-01T00:00:00Z","timestamp":817776000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1995,12]]},"DOI":"10.1007\/bf00995314","type":"journal-article","created":{"date-parts":[[2005,1,18]],"date-time":"2005-01-18T17:52:57Z","timestamp":1106070777000},"page":"209-221","source":"Crossref","is-referenced-by-count":13,"title":["Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults"],"prefix":"10.1007","volume":"7","author":[{"given":"Shujian","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Rod","family":"Byrne","sequence":"additional","affiliation":[]},{"given":"Jon C.","family":"Muzio","sequence":"additional","affiliation":[]},{"given":"D. Michael","family":"Miller","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","unstructured":"P.H. Bardell, W.H. McAnney, and J. Savir,Built-In Test for VLSI: Pseudorandom Techniques, John Wiley and Sons, 1987."},{"issue":"7","key":"CR2","doi-asserted-by":"crossref","first-page":"767","DOI":"10.1109\/43.55213","volume":"9","author":"M. Serra","year":"1990","unstructured":"M. Serra, T. Slater, J.C. Muzio, and D.M. Miller, ?The Analysis of One-Dimensional Linear Cellular Automata and Their Aliasing Properties,?IEEE Transactions on Computer-Aided Design, Vol. 9(7), pp. 767?778, July 1990.","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"CR3","doi-asserted-by":"crossref","unstructured":"S. Zhang, R. Byrne, and D.M. Miller, ?BIST Generators for Sequential Faults,?Proceedings of IEEE International Conference on Computer Design, October 1992, pp. 260?263.","DOI":"10.1109\/ICCD.1992.276264"},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"K. Furuya and E.J. McCluskey, ?Two-Pattern Test Capabilities of Autonomous TPG Circuits,?Proceedings of IEEE International Test Conference, 1991, pp. 704?711.","DOI":"10.1109\/TEST.1991.519735"},{"issue":"1","key":"CR5","first-page":"41","volume":"141","author":"S. Nandi","year":"1994","unstructured":"S. Nandi, B. Vamsi, S. Chakraborty, and P.P. Chaudhuri, ?Cellular Automata as a BIST Structure for Testing CMOS Circuits,?IEEE Proceedings of Part E: Computers and Digital Techniques, Vol. 141(1), pp. 41?47, January 1994.","journal-title":"IEEE Proceedings of Part E: Computers and Digital Techniques"},{"key":"CR6","unstructured":"H.S. Stone,Discrete Mathematics Structures and Their Applications, Science Research Associates Inc., 1973."},{"issue":"1","key":"CR7","doi-asserted-by":"crossref","first-page":"81","DOI":"10.1049\/ip-e.1990.0008","volume":"137","author":"A.K. Das","year":"1990","unstructured":"A.K. Das, A. Ganguly, A. Dasgupta, S. Bhawmik, and P.P. Chaudhuri, ?Efficient Characterisation of Cellular Automata,?IEE Proceedings of Part E: Computers and Digital Techniques, Vol. 137(1), pp. 81?87, January 1990.","journal-title":"IEE Proceedings of Part E: Computers and Digital Techniques"},{"key":"CR8","series-title":"Technical Report DCS-105-IR","volume-title":"Table of Linear Hybrid 90\/150 Cellular Automata","author":"T. Slater","year":"1990","unstructured":"T. Slater and M. Serra. ?Table of Linear Hybrid 90\/150 Cellular Automata,? Technical Report DCS-105-IR, Department of Computer Science, University of Victoria, Victoria, BC, Canada, 1990."},{"key":"CR9","unstructured":"K. Cattell and J. C. Muzio, ?A Linear Cellular Automata Algorithm: Algorithm Summary,?Proceedings of the 5th Technical Workshop on New Directions for 1C Testing, August 1991."},{"issue":"1","key":"CR10","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1007\/BF00159828","volume":"3","author":"P.H. Bardell","year":"1992","unstructured":"P.H. Bardell, ?Discrete Logarithms: A Parallel Pseudorandom Pattern Generator Analysis Method,?Journal of Electronic Testing: Theory and Applications, Vol. 3(1), pp. 17?31, 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"CR11","doi-asserted-by":"crossref","first-page":"175","DOI":"10.1007\/BF00137255","volume":"3","author":"P.H. Bardell","year":"1992","unstructured":"P.H. Bardell, ?Primitive Polynomials of Degree 301 Through 500,Journal of Electronic Testing: Theory and Applications, Vol. 3, pp. 175?176, 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"issue":"18","key":"CR12","doi-asserted-by":"crossref","first-page":"1625","DOI":"10.1049\/el:19911016","volume":"27","author":"S. Zhang","year":"1991","unstructured":"S. Zhang, D.M. Miller, and J.C. Muzio, ?Determination of Minimal Cost One-Dimensional Linear Hybrid Cellular Automata,?IEE Electronics Letters, Vol 27(18), pp. 1625?1627, August 1991.","journal-title":"IEE Electronics Letters"},{"issue":"2","key":"CR13","doi-asserted-by":"crossref","first-page":"255","DOI":"10.1007\/BF00993091","volume":"6","author":"K. Cattell","year":"1995","unstructured":"K. Cattell and S. Zhang, ?Minimal Cost One-Dimensional Linear Hybrid Cellular Automata of Degree Through 500,?Journal of Electronic Testing: Theory and Applications, Vol. 6(2), pp. 255?258, April 1995.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"CR14","unstructured":"T.H. Cormen, C.E. Leiserson, and R.L. Rivest,Introduction to Algorithms, The MIT Press, 1990."},{"key":"CR15","unstructured":"F. Brglez and H. Fujiwara, ?A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in FORTRAN.?Proceedings of IEEE Interantional Symposium on Circuits and Systems, 1985, pp. 663?698."},{"key":"CR16","doi-asserted-by":"crossref","unstructured":"J.A. Waicukauski, E. Lindbloom, B.K. Rosen, and V.S. Iyengar, ?Transition Fault Simulation,?IEEE Design and Test of Computers, April 1987, pp. 32?38.","DOI":"10.1109\/MDT.1987.295104"},{"key":"CR17","doi-asserted-by":"crossref","unstructured":"G. Tromp and A.J. van de Goor, ?Logic Synthesis of 100-Percent Testable Logic Networks,?Proceedings of IEEE International Conference on Computer Design, 1991, pp. 428?431.","DOI":"10.1109\/ICCD.1991.139937"},{"key":"CR18","volume-title":"Enhancing Transition Fault Coverage in Built-in Self-Test","author":"F. Kadri","year":"1993","unstructured":"F. Kadri, ?Enhancing Transition Fault Coverage in Built-in Self-Test,? M. Sc. Thesis, Department of Computer Science, University of Victoria, Victoria, BC, Canada, May 1993."},{"issue":"2","key":"CR19","doi-asserted-by":"crossref","first-page":"119","DOI":"10.1007\/BF00137249","volume":"3","author":"J. Savir","year":"1992","unstructured":"J. Savir and R. Berry, ?AC Strength of a Pattern Generator,?Journal of Electronic Testing: Theory and Applications, Vol. 3(2), pp. 119?125, May 1992.","journal-title":"Journal of Electronic Testing: Theory and Applications"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00995314.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00995314\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00995314","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,22]],"date-time":"2024-12-22T17:08:43Z","timestamp":1734887323000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00995314"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,12]]},"references-count":19,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1995,12]]}},"alternative-id":["BF00995314"],"URL":"https:\/\/doi.org\/10.1007\/bf00995314","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[1995,12]]}}}