{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T01:24:27Z","timestamp":1648517067875},"reference-count":12,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[1995,6,1]],"date-time":"1995-06-01T00:00:00Z","timestamp":801964800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[1995,6]]},"DOI":"10.1007\/bf00996442","type":"journal-article","created":{"date-parts":[[2005,1,18]],"date-time":"2005-01-18T18:37:56Z","timestamp":1106073476000},"page":"333-336","source":"Crossref","is-referenced-by-count":1,"title":["Multifault and delay-fault testability of multilevel circuits"],"prefix":"10.1007","volume":"6","author":[{"given":"Wuudiann","family":"Ke","sequence":"first","affiliation":[]},{"given":"P. R.","family":"Menon","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"A. Saldanha, R.K. Brayton, and A.L. Sangiovanni-Vincentelli, ?Equivalence of robust delay-fault and single stuck-fault test generation,?Proc. ACM\/IEEE Design Autom. Conf., pp. 173?176, June 1992.","DOI":"10.1109\/DAC.1992.227841"},{"key":"CR2","doi-asserted-by":"crossref","first-page":"91","DOI":"10.1007\/BF00971942","volume":"4","author":"S. Devadas","year":"1993","unstructured":"S. Devadas, K. Keutzer, and S. Malik, ?A synthesis-based test generation and compaction algorithm for multifaults,?Journal of Electronic Testing: Theory and Applications, Vol. 4, pp. 91?104, 1993.","journal-title":"Journal of Electronic Testing: Theory and Applications"},{"key":"CR3","unstructured":"G.L. Smith, ?Models for delay faults based on paths,?Proc. Intl. Test Conf., pp. 342?349, November 1985."},{"issue":"No. 5","key":"CR4","doi-asserted-by":"crossref","first-page":"694","DOI":"10.1109\/TCAD.1987.1270315","volume":"6","author":"C.J. Lin","year":"1987","unstructured":"C.J. Lin and S.M. Reddy, ?On delay fault testing in logic circuits,?IEEE Trans. on CAD, Vol. CAD-6, No. 5, pp. 694?703, 1987.","journal-title":"IEEE Trans. on CAD"},{"key":"CR5","doi-asserted-by":"crossref","unstructured":"A.K. Pramanick and S.M. Reddy, ?On the design of path delay testable combinational circuits,?Proc. 20th Fault Tolerant Computing Symp., pp. 374?381, June 1990.","DOI":"10.1109\/FTCS.1990.89391"},{"key":"CR6","doi-asserted-by":"crossref","first-page":"556","DOI":"10.1109\/TC.1972.5009008","volume":"21","author":"I. Kohavi","year":"1972","unstructured":"I. Kohavi and Z. Kohavi, ?Detection of multiple faults in combinational logic circuit,?IEEE Trans. Comp., Vol. C-21, pp. 556?568, 1972.","journal-title":"IEEE Trans. Comp."},{"key":"CR7","doi-asserted-by":"crossref","first-page":"858","DOI":"10.1109\/TC.1972.5009041","volume":"21","author":"D.R. Schertz","year":"1972","unstructured":"D.R. Schertz and G. Metze, ?A new representation for faults in combinational digital circuits,?IEEE Trans. Comp., Vol. C-21, pp. 858?866, 1972.","journal-title":"IEEE Trans. Comp."},{"key":"CR8","doi-asserted-by":"crossref","first-page":"171","DOI":"10.1007\/BF00137254","volume":"3","author":"J. Jacob","year":"1992","unstructured":"J. Jacob and V.D. Agrawal, ?Multiple-fault detection in twolevel multi-output circuits,?Journal of Electronic Testing, Vol. 3, pp. 171?173, 1992.","journal-title":"Journal of Electronic Testing"},{"key":"CR9","doi-asserted-by":"crossref","first-page":"1062","DOI":"10.1109\/TCAD.1987.1270347","volume":"6","author":"R. Brayton","year":"1987","unstructured":"R. Brayton, R. Rudell, A Sangiovanni-vincentelli, and A. Wang, ?MIS: A multilevel logic optimization system,?IEEE Trans. CAD, Vol. CAD-6, pp. 1062?1081, 1987.","journal-title":"IEEE Trans. CAD"},{"issue":"No. 3","key":"CR10","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1109\/43.124418","volume":"11","author":"G. Hachtel","year":"1992","unstructured":"G. Hachtel, R.M. Jacoby, K. Keutzer, and C.R. Morrison, ?On properties of algebraic transformations and the synthesis of multifault-irredundant circuits,?IEEE Trans. CAD, Vol. 11, No. 3, pp. 313?321, 1992.","journal-title":"IEEE Trans. CAD"},{"key":"CR11","doi-asserted-by":"crossref","unstructured":"M.J. Bryan, S. Devadas, and K. Keutzer, ?Testability-preserving circuit transformations,?Proc. Int. Conf. CAD, pp. 456?459, November 1990.","DOI":"10.1109\/ICCAD.1990.129952"},{"issue":"No. 1","key":"CR12","doi-asserted-by":"crossref","first-page":"87","DOI":"10.1109\/43.108622","volume":"11","author":"S. Devadas","year":"1992","unstructured":"S. Devadas and K. Keutzer, ?Synthesis of robust delay-fault-testable circuits: theory,?IEEE Trans. CAD, Vol. 11, No. 1, pp. 87?101, 1992.","journal-title":"IEEE Trans. CAD"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00996442.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/BF00996442\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BF00996442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,29]],"date-time":"2019-04-29T22:59:26Z","timestamp":1556578766000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BF00996442"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,6]]},"references-count":12,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1995,6]]}},"alternative-id":["BF00996442"],"URL":"https:\/\/doi.org\/10.1007\/bf00996442","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[1995,6]]}}}