{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T13:10:22Z","timestamp":1725455422010},"publisher-location":"Berlin\/Heidelberg","reference-count":16,"publisher":"Springer-Verlag","isbn-type":[{"type":"print","value":"3540167838"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1007\/bfb0016245","type":"book-chapter","created":{"date-parts":[[2005,11,13]],"date-time":"2005-11-13T05:39:17Z","timestamp":1131860357000},"page":"218-229","source":"Crossref","is-referenced-by-count":3,"title":["Efficient testing of optimal time adders"],"prefix":"10.1007","author":[{"given":"Bernd","family":"Becker","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"16_CR1","doi-asserted-by":"crossref","first-page":"175","DOI":"10.1145\/356914.356916","volume":"15","author":"M.S. Abadir","year":"1983","unstructured":"M.S. Abadir, H.K. Reghbati: \u2018Functional Testing of Semiconductor Random Access Memories', Computing Surveys, Vol.15, 1983, pp175\u2013198","journal-title":"Computing Surveys"},{"key":"16_CR2","first-page":"875","volume":"C-30","author":"J.A. Abraham","year":"1981","unstructured":"J.A. Abraham, D.D. Gajski: \u2018Design of Testable Structures Defined by Simple Loops', IEEE Trans., C-30, 1981, pp875\u2013883","journal-title":"IEEE Trans."},{"key":"16_CR3","unstructured":"B.Becker: \u2018An Easily Testable Optimal-Time VLSI Multiplier', T.R., 3\/1985, SFB 124, Saarbr\u00fccken 1985"},{"key":"16_CR4","unstructured":"B.Becker: \u2018Efficient Testing of Optimal Time Adders', T.R., 4\/1985, SFB 124, Saarbr\u00fccken 1985"},{"key":"16_CR5","doi-asserted-by":"crossref","first-page":"260","DOI":"10.1109\/TC.1982.1675982","volume":"C-31","author":"R.P. Brent","year":"1982","unstructured":"R.P. Brent, H.T. Kung: \u2018A Regular Layout for Parallel Adders', IEEE Trans. on Comp., C-31, 1982, pp260\u2013264","journal-title":"IEEE Trans. on Comp."},{"volume-title":"Diagnosis and Reliable Design of Digital Systems","year":"1976","key":"16_CR6","unstructured":"M.A. Breuer, Ed.: \u2018Diagnosis and Reliable Design of Digital Systems', Woodland Hills, CA: Computer Science Press, 1976"},{"key":"16_CR7","first-page":"1033","volume":"CAS-28","author":"W. Daehn","year":"1981","unstructured":"W. Daehn, J. Mucha: \u2018A Hardware Approach to Self-Testing of large PLA's', IEEE Trans. CAS-28, p1033, 1981","journal-title":"IEEE Trans."},{"key":"16_CR8","doi-asserted-by":"crossref","unstructured":"J.Ferguson, J.P.Shen: \u2018The Design of Two Easily-Testable VLSI Array Multipliers', Proc. 6th Symp. on Comp. Arithmetic, June 20\u201322, 1983, Aarhus, Denmark, IEEE Catalog No. 83CH1892-9","DOI":"10.1109\/ARITH.1983.6158077"},{"key":"16_CR9","doi-asserted-by":"crossref","first-page":"1061","DOI":"10.1109\/T-C.1973.223651","volume":"C-22","author":"A.D. Friedman","year":"1973","unstructured":"A.D. Friedman: \u2018Easily Testable Iterative Systems', IEEE Trans. on Comp., C-22, 1973, pp1061\u20131064","journal-title":"IEEE Trans. on Comp."},{"key":"16_CR10","unstructured":"G.Hotz, B.Becker, R.Kolla, P.Molitor: \u2018Ein logisch-topologischer Kalk\u00fcl zur Konstruktion integrierter Schaltkreise', Informatik Forschung und Entwicklung, 1, 1986, pp38\u201347, Springer Verlag"},{"key":"16_CR11","doi-asserted-by":"crossref","unstructured":"W.H.Kautz: \u2018Testing for Faults in Cellular Logic Arrays', Proc. of 8th Symp. on Switch. Autom. Th., 1967, pp161\u2013174","DOI":"10.1109\/FOCS.1967.33"},{"key":"16_CR12","unstructured":"R.K.Montoye, J.A.Abraham: \u2018Built-in Tests for Abitrarily Structured VLSI Carry Look-Ahead Adders', IFIP 1983, pp361\u2013371"},{"key":"16_CR13","first-page":"226","volume":"9","author":"J. Sklansky","year":"1960","unstructured":"J. Sklansky: \u2018Conditional-sum Addition Logic', IRE-EC 9, 1960, pp226\u2013231","journal-title":"IRE-EC"},{"key":"16_CR14","doi-asserted-by":"crossref","first-page":"845","DOI":"10.1109\/TC.1979.1675264","volume":"C-28","author":"J.E. Smith","year":"1979","unstructured":"J.E. Smith: \u2018Detection of Faults in PLA's', IEEE Trans. on Comp., C-28, p845, 1979","journal-title":"IEEE Trans. on Comp."},{"key":"16_CR15","unstructured":"J.Vuillemin, L.Guibas: \u2018On Fast Binary Addition in MOS Technologies', ICCC 82, pp147\u2013150"},{"key":"16_CR16","unstructured":"W.K.Luk, J.Vuillemin: \u2018Recursive Implementation of Optimal Time VLSI Integer Multipliers, IFIP 1983, pp155\u2013168"}],"container-title":["Lecture Notes in Computer Science","Mathematical Foundations of Computer Science 1986"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BFb0016245.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,9]],"date-time":"2020-12-09T21:35:36Z","timestamp":1607549736000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BFb0016245"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"ISBN":["3540167838"],"references-count":16,"URL":"https:\/\/doi.org\/10.1007\/bfb0016245","relation":{},"subject":[]}}