{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T00:23:44Z","timestamp":1725495824173},"publisher-location":"Berlin, Heidelberg","reference-count":11,"publisher":"Springer Berlin Heidelberg","isbn-type":[{"type":"print","value":"9783540633464"},{"type":"electronic","value":"9783540695202"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1997]]},"DOI":"10.1007\/bfb0052843","type":"book-chapter","created":{"date-parts":[[2006,6,7]],"date-time":"2006-06-07T00:31:57Z","timestamp":1149640317000},"page":"223-234","source":"Crossref","is-referenced-by-count":2,"title":["Exploiting symbolic learning in visual inspection"],"prefix":"10.1007","author":[{"given":"M.","family":"Piccardi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Cucchiara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Bariani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Mello","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2006,5,19]]},"reference":[{"key":"19_CR1","doi-asserted-by":"crossref","unstructured":"T.S. Newman, A.K. Jain: A survey of automated visual inspection, Comp. Vision and Image Understanding, 6, n. 2, pp. 231\u2013262.","DOI":"10.1006\/cviu.1995.1017"},{"volume-title":"Machine Learning \u2014 An Artificial Intelligence Approach","year":"1984","key":"19_CR2","unstructured":"R.S. Michalski, J.G. Carbonell, T.M. Mitchell, editors: Machine Learning \u2014 An Artificial Intelligence Approach. Springer-Verlag, Berlin, 1984."},{"issue":"n.9","key":"19_CR3","doi-asserted-by":"publisher","first-page":"882","DOI":"10.1109\/34.310683","volume":"16","author":"K. Cho","year":"1994","unstructured":"K. Cho, S.M. Dunn: Learning shape classes, IEEE Trans on PAMI, 16, n. 9, pp. 882\u2013893, 1994.","journal-title":"IEEE Trans on PAMI"},{"key":"19_CR4","unstructured":"R.M. Haralick, L.G. Shapiro: Computer and Robot Vision. Addison-Wesley, 1992."},{"key":"19_CR5","volume-title":"C4.5: Programs for Machine Learning","author":"J.R. Quinlan","year":"1993","unstructured":"J.R. Quinlan: C4.5: Programs for Machine Learning. Morgan Kaufmann Publishers, San Mateo, California, 1993."},{"key":"19_CR6","doi-asserted-by":"publisher","first-page":"287","DOI":"10.1007\/BF03037228","volume":"13","author":"J.R. Quinlan","year":"1995","unstructured":"J.R. Quinlan, R.M. Cameron-Jones: Induction of Logic Programs: FOIL and related systems, New Generation Computing, 13, pp. 287\u2013312, 1995.","journal-title":"New Generation Computing"},{"key":"19_CR7","unstructured":"M. Bariani, R. Cucchiara, P. Mello, M. Piccardi: Data mining for automated visual inspection, Proc. of PADD97, London, UK, 1997, pp. 51\u201364."},{"key":"19_CR8","volume-title":"Statistical tests for comparing supervised classification learning algorithms","author":"T. G. Dietterich","year":"1996","unstructured":"T. G. Dietterich: Statistical tests for comparing supervised classification learning algorithms, Pre-print, submitted, Dept. of CS, Oregon State University, OR, 1996."},{"key":"19_CR9","unstructured":"R. Mason (ed.): Magnetic Particle Inspection, Nondestructive Testing, 33, pp. 6\u201312."},{"key":"19_CR10","doi-asserted-by":"crossref","unstructured":"J. Illingworth, J. Kittler: A survey of the Hough transform, Comp. Vision Graphics, Image Process, 43, 221\u2013238.","DOI":"10.1016\/0734-189X(88)90071-0"},{"key":"19_CR11","doi-asserted-by":"crossref","unstructured":"R. Cucchiara, F. Filicori: A highly selective HT based algorithm for detecting extended, almost rectilinear shapes, Computer Analysis of Images and Patterns: LNCS n. 970 Springer Verlag, pp. 692\u2013698, 1995.","DOI":"10.1007\/3-540-60268-2_366"}],"container-title":["Lecture Notes in Computer Science","Advances in Intelligent Data Analysis Reasoning about Data"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/BFb0052843","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,19]],"date-time":"2019-04-19T02:24:30Z","timestamp":1555640670000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/BFb0052843"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997]]},"ISBN":["9783540633464","9783540695202"],"references-count":11,"URL":"https:\/\/doi.org\/10.1007\/bfb0052843","relation":{},"ISSN":["0302-9743","1611-3349"],"issn-type":[{"type":"print","value":"0302-9743"},{"type":"electronic","value":"1611-3349"}],"subject":[],"published":{"date-parts":[[1997]]}}}