{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,19]],"date-time":"2026-02-19T08:04:21Z","timestamp":1771488261655,"version":"3.50.1"},"reference-count":36,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2012,9,19]],"date-time":"2012-09-19T00:00:00Z","timestamp":1348012800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Circuits Syst Signal Process"],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1007\/s00034-012-9487-x","type":"journal-article","created":{"date-parts":[[2012,9,18]],"date-time":"2012-09-18T15:49:51Z","timestamp":1347983391000},"page":"525-539","source":"Crossref","is-referenced-by-count":14,"title":["Fault Diagnosis of Analog Circuits Using Systematic Tests Based on Data Fusion"],"prefix":"10.1007","volume":"32","author":[{"given":"Minfang","family":"Peng","sequence":"first","affiliation":[]},{"given":"Chi K.","family":"Tse","sequence":"additional","affiliation":[]},{"given":"Meie","family":"Shen","sequence":"additional","affiliation":[]},{"given":"Kai","family":"Xie","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2012,9,19]]},"reference":[{"issue":"5","key":"9487_CR1","doi-asserted-by":"crossref","first-page":"1116","DOI":"10.1109\/TIM.2002.806004","volume":"51","author":"C. Alippi","year":"2002","unstructured":"C. Alippi, M. Catelani, A. Fort, M. Mugnaini, SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms. IEEE Trans. Instrum. Meas. 51(5), 1116\u20131125 (2002)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"9487_CR2","doi-asserted-by":"crossref","first-page":"1033","DOI":"10.1109\/TIM.2005.847115","volume":"54","author":"C. Alippi","year":"2005","unstructured":"C. Alippi, M. Catelani, A. Fort, M. Mugnaini, Automated selection of test frequencies for fault diagnosis in analog electronic circuits. IEEE Trans. Instrum. Meas. 54(3), 1033\u20131044 (2005)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"9487_CR3","doi-asserted-by":"crossref","first-page":"544","DOI":"10.1109\/TIM.2002.1017726","volume":"51","author":"F. Aminian","year":"2002","unstructured":"F. Aminian, M. Aminian, H.W. Collins Jr., Analog fault diagnosis of actual circuits using neural networks. IEEE Trans. Instrum. Meas. 51(3), 544\u2013550 (2002)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"5","key":"9487_CR4","doi-asserted-by":"crossref","first-page":"1546","DOI":"10.1109\/TIM.2007.904549","volume":"56","author":"M. Aminian","year":"2007","unstructured":"M. Aminian, F. Aminian, A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans. Instrum. Meas. 56(5), 1546\u20131554 (2007)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"8","key":"9487_CR5","doi-asserted-by":"crossref","first-page":"1279","DOI":"10.1109\/PROC.1985.13281","volume":"73","author":"J.W. Bandler","year":"1985","unstructured":"J.W. Bandler, A.E. Salama, Fault diagnosis of analog circuits. Proc. IEEE 73(8), 1279\u20131327 (1985)","journal-title":"Proc. IEEE"},{"issue":"6","key":"9487_CR6","doi-asserted-by":"crossref","first-page":"1513","DOI":"10.1109\/TNN.2005.853337","volume":"16","author":"O. Basir","year":"2005","unstructured":"O. Basir, F. Karray, H. Zhu, Connectionist-based Dempster\u2013Shafer evidential reasoning for data fusion. IEEE Trans. Neural Netw. 16(6), 1513\u20131530 (2005)","journal-title":"IEEE Trans. Neural Netw."},{"issue":"2","key":"9487_CR7","doi-asserted-by":"crossref","first-page":"196","DOI":"10.1109\/19.997811","volume":"51","author":"M. Catelani","year":"2002","unstructured":"M. Catelani, A. Fort, Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks. IEEE Trans. Instrum. Meas. 51(2), 196\u2013202 (2002)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"8","key":"9487_CR8","doi-asserted-by":"crossref","first-page":"921","DOI":"10.1109\/81.940182","volume":"48","author":"K.H. Chung","year":"2001","unstructured":"K.H. Chung, P.R. Shepherd, F. Eberhardt, W. Tenten, Hierarchical fault diagnosis of analog integrated circuits. IEEE Trans. Circuits Syst. I 48(8), 921\u2013929 (2001)","journal-title":"IEEE Trans. Circuits Syst. I"},{"issue":"2","key":"9487_CR9","doi-asserted-by":"crossref","first-page":"358","DOI":"10.1109\/TIM.2011.2161930","volume":"61","author":"Y. Deng","year":"2012","unstructured":"Y. Deng, Y. Shi, W. Zhang, An approach to locate parametric faults in nonlinear analog circuits. IEEE Trans. Instrum. Meas. 61(2), 358\u2013367 (2012)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"10","key":"9487_CR10","doi-asserted-by":"crossref","first-page":"2660","DOI":"10.1109\/TIM.2010.2045542","volume":"59","author":"M.G. Dimopoulos","year":"2010","unstructured":"M.G. Dimopoulos, A.D. Spyronasios, D.K. Papakostas, Circuit implementation of a supply current spectrum test method. IEEE Trans. Instrum. Meas. 59(10), 2660\u20132670 (2010)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"6","key":"9487_CR11","doi-asserted-by":"crossref","first-page":"2322","DOI":"10.1109\/TIM.2007.907947","volume":"56","author":"F. Grasso","year":"2007","unstructured":"F. Grasso, A. Luchetta, S. Manetti, M.C. Piccirilli, A method for the automatic selection of test frequencies in analog fault diagnosis. IEEE Trans. Instrum. Meas. 56(6), 2322\u20132329 (2007)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"1","key":"9487_CR12","doi-asserted-by":"crossref","first-page":"150","DOI":"10.1109\/TIM.2005.861490","volume":"55","author":"Z. Guo","year":"2006","unstructured":"Z. Guo, J. Savir, Coefficient-based test of parametric faults in analog circuits. IEEE Trans. Instrum. Meas. 55(1), 150\u2013157 (2006)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"4","key":"9487_CR13","doi-asserted-by":"crossref","first-page":"804","DOI":"10.1109\/TSMCA.2005.855778","volume":"36","author":"V.-N. Huynh","year":"2006","unstructured":"V.-N. Huynh, Y. Nakamori, T.-B. Ho, T. Murai, Multiple-attribute decision making under uncertainty: the evidential reasoning approach revisited systems. IEEE Trans. Syst. Man Cybern., Part A 36(4), 804\u2013822 (2006)","journal-title":"IEEE Trans. Syst. Man Cybern., Part A"},{"key":"9487_CR14","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1023\/A:1008351601024","volume":"16","author":"A. Khouas","year":"2000","unstructured":"A. Khouas, A. Derieux, Fault simulation of analog circuits under parameter variations. J. Electron. Test. 16, 269\u2013278 (2000)","journal-title":"J. Electron. Test."},{"issue":"1","key":"9487_CR15","doi-asserted-by":"crossref","first-page":"105","DOI":"10.1109\/81.974884","volume":"49","author":"F. Li","year":"2002","unstructured":"F. Li, P.-Y. Woo, Fault detection for linear analog IC\u2014the method of short-circuit admittance parameters. IEEE Trans. Circuits Syst. I 49(1), 105\u2013108 (2002)","journal-title":"IEEE Trans. Circuits Syst. I"},{"issue":"2","key":"9487_CR16","doi-asserted-by":"crossref","first-page":"1111","DOI":"10.1109\/TPWRD.2010.2096482","volume":"26","author":"R. Liao","year":"2011","unstructured":"R. Liao, H. Zheng, S. Grzybowski, An integrated decision-making model for condition assessment of power transformers using fuzzy approach and evidential reasoning. IEEE Trans. Power Deliv. 26(2), 1111\u20131118 (2011)","journal-title":"IEEE Trans. Power Deliv."},{"issue":"8","key":"9487_CR17","doi-asserted-by":"crossref","first-page":"1465","DOI":"10.1109\/TCAD.2007.891373","volume":"26","author":"F. Liu","year":"2007","unstructured":"F. Liu, S. Ozev, Statistical test development for analog circuits under high process variations. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 26(8), 1465\u20131477 (2007)","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"issue":"5","key":"9487_CR18","doi-asserted-by":"crossref","first-page":"503","DOI":"10.1002\/cta.586","volume":"38","author":"D.K. Papakostas","year":"2010","unstructured":"D.K. Papakostas, A.A. Hatzopoulos, Improved analogue fault coverage estimation using probabilistic analysis. Int. J. Circuit Theory Appl. 38(5), 503\u2013514 (2010)","journal-title":"Int. J. Circuit Theory Appl."},{"issue":"5","key":"9487_CR19","doi-asserted-by":"crossref","first-page":"434","DOI":"10.1049\/ip-cds:20030579","volume":"150","author":"D.K. Papakostas","year":"2003","unstructured":"D.K. Papakostas, A.A. Hatzopoulos, Impact of parameter covariance on fault detectability estimation of analogue and mixed-mode circuits. IEE Proc., Circuits Devices Syst. 150(5), 434\u2013438 (2003)","journal-title":"IEE Proc., Circuits Devices Syst."},{"issue":"6","key":"9487_CR20","doi-asserted-by":"crossref","first-page":"350","DOI":"10.1049\/ip-cds:19990581","volume":"146","author":"D.K. Papakostas","year":"1999","unstructured":"D.K. Papakostas, A.A. Hatzopoulos, Estimation of statistical variables for analogue fault detectability evaluation. IEE Proc., Circuits Devices Syst. 146(6), 350\u2013354 (1999)","journal-title":"IEE Proc., Circuits Devices Syst."},{"issue":"11","key":"9487_CR21","doi-asserted-by":"crossref","first-page":"2589","DOI":"10.1109\/TIM.2008.924932","volume":"57","author":"D.K. Papakostas","year":"2008","unstructured":"D.K. Papakostas, A.A. Hatzopoulos, A unified procedure for fault detection of analogue and mixed-mode circuits using magnitude and phase components of the power supply current spectrum. IEEE Trans. Instrum. Meas. 57(11), 2589\u20132595 (2008)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9487_CR22","first-page":"161","volume-title":"Proc. WCECS","author":"M. Peng","year":"2008","unstructured":"M. Peng, M. Shen, J. He, Data fusion based fault diagnosis of analog circuits, in Proc. WCECS, San Francisco, USA (2008), pp. 161\u2013165"},{"key":"9487_CR23","first-page":"378","volume-title":"Proc. Int Conf. CCCT","author":"M. Peng","year":"2004","unstructured":"M. Peng, Y. He, A new fault dictionary method for diagnosis of tolerance circuit, in Proc. Int Conf. CCCT, vol.\u00a0I, Austin, USA (2004), pp. 378\u2013382"},{"issue":"5","key":"9487_CR24","doi-asserted-by":"crossref","first-page":"1323","DOI":"10.1142\/S0218127411029185","volume":"21","author":"M. Peng","year":"2011","unstructured":"M. Peng, J. Wang, C.K. Tse, M. Shen, Complex network application in fault diagnosis of analog circuit. Int. J. Bifurc. Chaos 21(5), 1323\u20131330 (2011)","journal-title":"Int. J. Bifurc. Chaos"},{"issue":"1","key":"9487_CR25","doi-asserted-by":"crossref","first-page":"58","DOI":"10.1109\/MDT.2006.11","volume":"23","author":"A. Petraglia","year":"2006","unstructured":"A. Petraglia, J.M. Canive, M.R. Petraglia, Efficient parametric fault detection in switched-capacitor filters. IEEE Des. Test Comput. 23(1), 58\u201366 (2006)","journal-title":"IEEE Des. Test Comput."},{"issue":"3","key":"9487_CR26","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1109\/TCAD.2002.807896","volume":"22","author":"J. Plusquellic","year":"2003","unstructured":"J. Plusquellic, A. Singh, C. Patel, A. Gattiker, Power supply transient signal analysis for defect-oriented test. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 22(3), 370\u2013374 (2003)","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"issue":"6","key":"9487_CR27","doi-asserted-by":"crossref","first-page":"2025","DOI":"10.1109\/TIM.2011.2115550","volume":"60","author":"A.D. Spyronasios","year":"2011","unstructured":"A.D. Spyronasios, M.G. Dimopoulos, A.A. Hatzopoulos, Wavelet analysis for the detection of parametric and catastrophic faults in mixed-signal circuits. IEEE Trans. Instrum. Meas. 60(6), 2025\u20132038 (2011)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"11","key":"9487_CR28","doi-asserted-by":"crossref","first-page":"1648","DOI":"10.1109\/TCSI.2002.804596","volume":"49","author":"M. Tadeusiewicz","year":"2002","unstructured":"M. Tadeusiewicz, S. Halgas, M. Korzybski, An algorithm for soft-fault diagnosis of linear and nonlinear circuits. IEEE Trans. Circuits Syst. I 49(11), 1648\u20131653 (2002)","journal-title":"IEEE Trans. Circuits Syst. I"},{"key":"9487_CR29","doi-asserted-by":"crossref","first-page":"408","DOI":"10.1016\/j.amc.2012.06.033","volume":"219","author":"H. Tan","year":"2012","unstructured":"H. Tan, M. Peng, Minimization of ambiguity in parametric fault diagnosis of analog circuits: a complex network approach. Appl. Math. Comput. 219, 408\u2013415 (2012)","journal-title":"Appl. Math. Comput."},{"issue":"10","key":"9487_CR30","doi-asserted-by":"crossref","first-page":"2118","DOI":"10.1109\/TCSI.2005.853266","volume":"52","author":"P. Wang","year":"2005","unstructured":"P. Wang, S. Yang, A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans. Circuits Syst. I 52(10), 2118\u20132127 (2005)","journal-title":"IEEE Trans. Circuits Syst. I"},{"issue":"3","key":"9487_CR31","doi-asserted-by":"crossref","first-page":"281","DOI":"10.1002\/(SICI)1097-007X(200005\/06)28:3<281::AID-CTA109>3.0.CO;2-N","volume":"28","author":"M. Worsman","year":"2000","unstructured":"M. Worsman, M.W.T. Wong, Non-linear analog circuit fault diagnosis with large change sensitivity. Int. J. Circuit Theory Appl. 28(3), 281\u2013303 (2000)","journal-title":"Int. J. Circuit Theory Appl."},{"issue":"1","key":"9487_CR32","doi-asserted-by":"crossref","first-page":"176","DOI":"10.1109\/TIM.2010.2050356","volume":"60","author":"C. Yang","year":"2011","unstructured":"C. Yang, S. Tian, B. Long, F. Chen, Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans. Instrum. Meas. 60(1), 176\u2013185 (2011)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"3","key":"9487_CR33","doi-asserted-by":"crossref","first-page":"586","DOI":"10.1109\/TIM.2009.2025068","volume":"59","author":"L. Yuan","year":"2010","unstructured":"L. Yuan, Y. He, J. Huang, A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans. Instrum. Meas. 59(3), 586\u2013595 (2010)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9487_CR34","first-page":"51","volume":"3174","author":"D. Zhu","year":"2004","unstructured":"D. Zhu, Y. Yang, W. Li, Blind fault diagnosis algorithm for integrated circuit based on the CPN neural networks. Lect. Notes Comput. Sci. 3174, 51\u201363 (2004)","journal-title":"Lect. Notes Comput. Sci."},{"key":"9487_CR35","volume-title":"The principle and method for analog circuit diagnosis","author":"R. Zou","year":"1989","unstructured":"R. Zou, The principle and method for analog circuit diagnosis (Middle-China, Univ., Wuhan, 1989)"},{"key":"9487_CR36","first-page":"1163","volume-title":"Proc. IEEE ISCAS","author":"R. Zou","year":"1988","unstructured":"R. Zou, J.M. Huang, Fault location of linear nonreciprocal circuit with tolerance, in Proc. IEEE ISCAS, (1988), pp. 1163\u20131166"}],"container-title":["Circuits, Systems, and Signal Processing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-012-9487-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00034-012-9487-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-012-9487-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,29]],"date-time":"2024-04-29T14:30:54Z","timestamp":1714401054000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00034-012-9487-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9,19]]},"references-count":36,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2013,4]]}},"alternative-id":["9487"],"URL":"https:\/\/doi.org\/10.1007\/s00034-012-9487-x","relation":{},"ISSN":["0278-081X","1531-5878"],"issn-type":[{"value":"0278-081X","type":"print"},{"value":"1531-5878","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,9,19]]}}}