{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T17:51:24Z","timestamp":1777571484946,"version":"3.51.4"},"reference-count":32,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2013,4,13]],"date-time":"2013-04-13T00:00:00Z","timestamp":1365811200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Circuits Syst Signal Process"],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1007\/s00034-013-9589-0","type":"journal-article","created":{"date-parts":[[2013,4,12]],"date-time":"2013-04-12T09:19:14Z","timestamp":1365758354000},"page":"2151-2170","source":"Crossref","is-referenced-by-count":16,"title":["Diagnosis of Incipient Faults in Weak Nonlinear Analog Circuits"],"prefix":"10.1007","volume":"32","author":[{"given":"Yibing","family":"Shi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2013,4,13]]},"reference":[{"issue":"5","key":"9589_CR1","doi-asserted-by":"crossref","first-page":"979","DOI":"10.1109\/78.917802","volume":"49","author":"O. Akay","year":"2001","unstructured":"O. Akay, G.F. Boudreaux-Bartels, Fractional convolution and correlation via operator methods and an application to detection of linear FM signals. IEEE Trans. Signal Process. 49(5), 979\u2013993 (2001)","journal-title":"IEEE Trans. Signal Process."},{"issue":"3","key":"9589_CR2","doi-asserted-by":"crossref","first-page":"544","DOI":"10.1109\/TIM.2002.1017726","volume":"51","author":"F. Aminian","year":"2002","unstructured":"F. Aminian, M. Aminian, H.W. Collins, Analog fault diagnosis of actual circuits using neural networks. IEEE Trans. Instrum. Meas. 51(3), 544\u2013550 (2002)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"9589_CR3","doi-asserted-by":"crossref","first-page":"151","DOI":"10.1109\/82.823545","volume":"47","author":"M. Aminian","year":"2000","unstructured":"M. Aminian, F. Aminian, Neural-network based analog circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans. Circuits Syst. II 47(2), 151\u2013156 (2000)","journal-title":"IEEE Trans. Circuits Syst. II"},{"issue":"8","key":"9589_CR4","doi-asserted-by":"crossref","first-page":"1279","DOI":"10.1109\/PROC.1985.13281","volume":"73","author":"J.W. Bandler","year":"1985","unstructured":"J.W. Bandler, A.E. Salama, Fault diagnosis of analog circuits. Proc. IEEE 73(8), 1279\u20131325 (1985)","journal-title":"Proc. IEEE"},{"issue":"2","key":"9589_CR5","doi-asserted-by":"crossref","first-page":"196","DOI":"10.1109\/19.997811","volume":"51","author":"M. Catelani","year":"2002","unstructured":"M. Catelani, A. Fort, Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy method and radial basis function networks. IEEE Trans. Instrum. Meas. 51(2), 196\u2013202 (2002)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"9589_CR6","doi-asserted-by":"crossref","first-page":"358","DOI":"10.1109\/TIM.2011.2161930","volume":"61","author":"Y. Deng","year":"2012","unstructured":"Y. Deng, Y. Shi, W. Zhang, An approach to locate parametric faults in nonlinear analog circuits. IEEE Trans. Instrum. Meas. 61(2), 358\u2013367 (2012)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"2","key":"9589_CR7","doi-asserted-by":"crossref","first-page":"362","DOI":"10.1109\/19.492749","volume":"45","author":"C. Evans","year":"1996","unstructured":"C. Evans, D. Rees, L. Jones et al., Periodic signals for measuring nonlinear Volterra kernels. IEEE Trans. Instrum. Meas. 45(2), 362\u2013371 (1996)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9589_CR8","first-page":"762","volume-title":"ICMA","author":"X. Fan","year":"2010","unstructured":"X. Fan, Y. Zhu, Study on fault phase selection based on FFT and phase-separation current phase difference of high-voltage transmission lines, in ICMA (2010), pp. 762\u2013767"},{"issue":"11","key":"9589_CR9","doi-asserted-by":"crossref","first-page":"3042","DOI":"10.1109\/78.796438","volume":"47","author":"G.O. Glentis","year":"1999","unstructured":"G.O. Glentis, P. Koukoulas, N. Kalouptsidis, Efficient algorithms for Volterra system identification. IEEE Trans. Signal Process. 47(11), 3042\u20133057 (1999)","journal-title":"IEEE Trans. Signal Process."},{"key":"9589_CR10","volume-title":"Matrix Computations","author":"G.H. Golub","year":"1996","unstructured":"G.H. Golub, C.F.V. Loan, Matrix Computations, 3rd edn. (Johns Hopkins University Press, Baltimore, 1996)","edition":"3"},{"issue":"5","key":"9589_CR11","doi-asserted-by":"crossref","first-page":"257","DOI":"10.1109\/TCS.1983.1085359","volume":"30","author":"Z. Huang","year":"1983","unstructured":"Z. Huang, C. Liu, R. Liu, Node fault diagnosis and a design of testability. IEEE Trans. Circuits Syst. 30(5), 257\u2013265 (1983)","journal-title":"IEEE Trans. Circuits Syst."},{"key":"9589_CR12","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1007\/s00034-010-9203-7","volume":"30","author":"B. Jiang","year":"2011","unstructured":"B. Jiang, P. Shi, Z.H. Mao, Sliding mode observer-based fault estimation for nonlinear networked control systems. Circuits Syst. Signal Process. 30, 1\u201316 (2011)","journal-title":"Circuits Syst. Signal Process."},{"issue":"3","key":"9589_CR13","doi-asserted-by":"crossref","first-page":"251","DOI":"10.1080\/00401706.1991.10484833","volume":"33","author":"B.H. Juang","year":"1991","unstructured":"B.H. Juang, L.R. Rabiner, Hidden Markov models for speech recognition. Technometrics 33(3), 251\u2013272 (1991)","journal-title":"Technometrics"},{"issue":"2","key":"9589_CR14","doi-asserted-by":"crossref","first-page":"126","DOI":"10.1109\/24.722274","volume":"47","author":"S.N. Kher","year":"1998","unstructured":"S.N. Kher, G.M. Bubel, Predicting system-failure risk from unanticipated fiber-breaks in manufacturing. IEEE Trans. Reliab. 47(2), 126\u2013130 (1998)","journal-title":"IEEE Trans. Reliab."},{"key":"9589_CR15","first-page":"217","volume-title":"Southeastcon\u201999, Proc. IEEE","author":"R. Kondagunturi","year":"1999","unstructured":"R. Kondagunturi, E. Bradley, K. Maggard, C. Stroud, Benchmark circuits for analog and mixed-signal testing, in Southeastcon\u201999, Proc. IEEE (1999), pp. 217\u2013220"},{"issue":"1","key":"9589_CR16","doi-asserted-by":"crossref","first-page":"105","DOI":"10.1109\/81.974884","volume":"49","author":"F. Li","year":"2002","unstructured":"F. Li, P.Y. Woo, Fault detection for linear analog IC\u2014the method of short-circuits admittance parameters. IEEE Trans. Circuits Syst. I 49(1), 105\u2013108 (2002)","journal-title":"IEEE Trans. Circuits Syst. I"},{"issue":"2","key":"9589_CR17","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1109\/43.21830","volume":"8","author":"L. Milor","year":"1989","unstructured":"L. Milor, V. Visvanathan, Detection of catastrophic faults in analog integrated circuits. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 8(2), 114\u2013130 (1989)","journal-title":"IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."},{"issue":"3","key":"9589_CR18","doi-asserted-by":"crossref","first-page":"212","DOI":"10.1078\/1434-8411-54100231","volume":"58","author":"A.A.K. Mohsen","year":"2004","unstructured":"A.A.K. Mohsen, M.F.A. El-Yazeed, Selection of input stimulus for fault diagnosis of analog circuits using ARMA model. AE\u00dc, Int. J. Electron. Commun. 58(3), 212\u2013217 (2004)","journal-title":"AE\u00dc, Int. J. Electron. Commun."},{"key":"9589_CR19","doi-asserted-by":"crossref","first-page":"23","DOI":"10.1002\/(SICI)1099-1638(200001\/02)16:1<23::AID-QRE283>3.0.CO;2-Q","volume":"16","author":"W. Nelson","year":"2000","unstructured":"W. Nelson, Weibull prediction of a future number of failures. Qual. Reliab. Eng. Int. 16, 23\u201326 (2000)","journal-title":"Qual. Reliab. Eng. Int."},{"issue":"3","key":"9589_CR20","doi-asserted-by":"crossref","first-page":"400","DOI":"10.1109\/24.664013","volume":"46","author":"O.T. Ogunyemi","year":"1997","unstructured":"O.T. Ogunyemi, P.I. Nelson, Prediction of gamma failure times. IEEE Trans. Reliab. 46(3), 400\u2013405 (1997)","journal-title":"IEEE Trans. Reliab."},{"issue":"1","key":"9589_CR21","doi-asserted-by":"crossref","first-page":"4","DOI":"10.1109\/MASSP.1986.1165342","volume":"3","author":"L.R. Rabiner","year":"1986","unstructured":"L.R. Rabiner, B.H. Juang, An introduction to hidden Markov models. IEEE ASSP Mag. 3(1), 4\u201315 (1986)","journal-title":"IEEE ASSP Mag."},{"issue":"2","key":"9589_CR22","doi-asserted-by":"crossref","first-page":"602","DOI":"10.1109\/TIM.2003.820494","volume":"53","author":"J. Roh","year":"2004","unstructured":"J. Roh, J.A. Abraham, Subband filtering for time and frequency analysis of mixed-signal circuit testing. IEEE Trans. Instrum. Meas. 53(2), 602\u2013611 (2004)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9589_CR23","volume-title":"Nonlinear System Theory\u2014The Volterra\/Wiener Approach","author":"W.J. Rugh","year":"1981","unstructured":"W.J. Rugh, Nonlinear System Theory\u2014The Volterra\/Wiener Approach (Johns Hopkins University Press, Baltimore, 1981)"},{"key":"9589_CR24","doi-asserted-by":"crossref","first-page":"30","DOI":"10.1109\/54.124515","volume":"5","author":"M. Slamani","year":"1992","unstructured":"M. Slamani, B. Kaminska, Analog circuit fault diagnosis based on sensitivity computation and functional testing. IEEE Des. Test Comput. 5, 30\u201339 (1992)","journal-title":"IEEE Des. Test Comput."},{"issue":"3","key":"9589_CR25","doi-asserted-by":"crossref","first-page":"754","DOI":"10.1109\/TIM.2004.827085","volume":"53","author":"J.A. Starzyk","year":"2004","unstructured":"J.A. Starzyk, D. Liu, Z.H. Liu, D.E. Nelson, J.O. Rutkowski, Entropy-based optimum test nodes selection for the analog fault dictionary techniques. IEEE Trans. Instrum. Meas. 53(3), 754\u2013761 (2004)","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"9589_CR26","first-page":"149","volume-title":"The 7th Mexican International Conference on Artificial Intelligence","author":"S.M. Virk","year":"2008","unstructured":"S.M. Virk, A. Muhammad, A.M. Martinez-Enriquez, Fault prediction using artificial neural network and fuzzy logic, in The 7th Mexican International Conference on Artificial Intelligence (2008), pp.\u00a0149\u2013154"},{"issue":"10","key":"9589_CR27","doi-asserted-by":"crossref","first-page":"2118","DOI":"10.1109\/TCSI.2005.853266","volume":"52","author":"P. Wang","year":"2005","unstructured":"P. Wang, S.Y. Yang, A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math. IEEE Trans. Circuits Syst. I 52(10), 2118\u20132127 (2005)","journal-title":"IEEE Trans. Circuits Syst. I"},{"key":"9589_CR28","doi-asserted-by":"crossref","first-page":"577","DOI":"10.1007\/s00034-010-9160-1","volume":"29","author":"L.J. Xu","year":"2010","unstructured":"L.J. Xu, J.G. Huang, H.J. Wang, B. Long, A novel method for the diagnosis of the incipient faults in analog circuits based on LDA and HMM. Circuits Syst. Signal Process. 29, 577\u2013600 (2010)","journal-title":"Circuits Syst. Signal Process."},{"issue":"1","key":"9589_CR29","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/3468.553220","volume":"27","author":"J. Yang","year":"1997","unstructured":"J. Yang, Y.S. Xu, C.S. Chen, Human action learning via hidden Markov model. IEEE Trans. Syst. Man Cybern., Part A, Syst. Hum. 27(1), 34\u201344 (1997)","journal-title":"IEEE Trans. Syst. Man Cybern., Part A, Syst. Hum."},{"issue":"3","key":"9589_CR30","doi-asserted-by":"crossref","first-page":"373","DOI":"10.1109\/TR.2003.816402","volume":"52","author":"S.K. Yang","year":"2003","unstructured":"S.K. Yang, A condition-based failure-prediction and processing-scheme for preventive maintenance. IEEE Trans. Reliab. 52(3), 373\u2013383 (2003)","journal-title":"IEEE Trans. Reliab."},{"key":"9589_CR31","doi-asserted-by":"crossref","first-page":"319","DOI":"10.1002\/(SICI)1099-1638(199809\/10)14:5<319::AID-QRE171>3.0.CO;2-6","volume":"14","author":"S.K. Yang","year":"1998","unstructured":"S.K. Yang, T.S. Liu, A Petri net approach to early failure detection and isolation for preventive maintenance. Qual. Reliab. Eng. Int. 14, 319\u2013330 (1998)","journal-title":"Qual. Reliab. Eng. Int."},{"key":"9589_CR32","first-page":"61","volume-title":"Metrol. Meas. Syst.","author":"L.F. Zhou","year":"2009","unstructured":"L.F. Zhou, Y.B. Shi, J.Y. Tang, Y.J. Li, Soft fault diagnosis in analog circuit based on fuzzy and direction vector, in Metrol. Meas. Syst., vol.\u00a0XVI(1) (2009), pp.\u00a061\u201375"}],"container-title":["Circuits, Systems, and Signal Processing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-013-9589-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00034-013-9589-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-013-9589-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,22]],"date-time":"2019-05-22T11:01:40Z","timestamp":1558522900000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00034-013-9589-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4,13]]},"references-count":32,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2013,10]]}},"alternative-id":["9589"],"URL":"https:\/\/doi.org\/10.1007\/s00034-013-9589-0","relation":{},"ISSN":["0278-081X","1531-5878"],"issn-type":[{"value":"0278-081X","type":"print"},{"value":"1531-5878","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4,13]]}}}