{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,5]],"date-time":"2025-10-05T20:00:10Z","timestamp":1759694410298},"reference-count":28,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T00:00:00Z","timestamp":1674432000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T00:00:00Z","timestamp":1674432000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Circuits Syst Signal Process"],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1007\/s00034-022-02276-0","type":"journal-article","created":{"date-parts":[[2023,1,23]],"date-time":"2023-01-23T04:16:44Z","timestamp":1674447404000},"page":"3229-3254","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["Test Node Selection for Fault Diagnosis in Analog Circuits using Faster RCNN Model"],"prefix":"10.1007","volume":"42","author":[{"given":"G.","family":"Puvaneswari","sequence":"first","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,1,23]]},"reference":[{"issue":"3","key":"2276_CR1","doi-asserted-by":"publisher","first-page":"655","DOI":"10.1515\/amcs-2016-0045","volume":"26","author":"A Bilski","year":"2016","unstructured":"A. Bilski, J. Wojciechowski, Automatic parametric fault detection in complex analog systems based on a method of minimum node selection. Int. J. Appl. Math. Comput. Sci. 26(3), 655\u2013668 (2016). https:\/\/doi.org\/10.1515\/amcs-2016-0045","journal-title":"Int. J. Appl. Math. Comput. Sci."},{"key":"2276_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/s12652-022-04412-9","author":"S Chauhan","year":"2022","unstructured":"S. Chauhan, G. Vashishtha, A. Kumar, Approximating parameters of photovoltaic models using an amended reptile search algorithm. J Ambient Intell Human Comput (2022). https:\/\/doi.org\/10.1007\/s12652-022-04412-9","journal-title":"J Ambient Intell Human Comput"},{"key":"2276_CR3","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/259430","author":"Y Gao","year":"2014","unstructured":"Y. Gao, C. Yang, S. Tian, F. Chen, Entropy-based test point evaluation and selection method for analog circuit fault diagnosis. Math. Probl. Eng. (2014). https:\/\/doi.org\/10.1155\/2014\/259430","journal-title":"Math. Probl. Eng."},{"issue":"2","key":"2276_CR4","doi-asserted-by":"publisher","first-page":"117","DOI":"10.1109\/TCSII.2006.884112","volume":"54","author":"T Golonek","year":"2007","unstructured":"T. Golonek, J. Rutkowski, Genetic-algorithm-based method for optimal analog test points selection. IEEE Trans. Circuits Syst. II Express Briefs 54(2), 117\u2013121 (2007). https:\/\/doi.org\/10.1109\/TCSII.2006.884112","journal-title":"IEEE Trans. Circuits Syst. II Express Briefs"},{"key":"2276_CR5","doi-asserted-by":"publisher","unstructured":"O. Karaca, K. Kirscher, A. Laroche, A. Tributsch, L. Maurer, G. Pelz, Fault grouping for fault injection based simulation of AMS circuits in the context of functional safety. in 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD), 2016, Lisbon, 1\u20134. https:\/\/doi.org\/10.1109\/SMACD.2016.7520721","DOI":"10.1109\/SMACD.2016.7520721"},{"key":"2276_CR6","doi-asserted-by":"publisher","first-page":"225","DOI":"10.1007\/s10470-019-01550-7","volume":"102","author":"M Khanlari","year":"2020","unstructured":"M. Khanlari, M. Ehsanian, A test point selection approach for DC analog circuits with a large number of predefined faults. Analog IntegrCirc Sig Process 102, 225\u2013235 (2020). https:\/\/doi.org\/10.1007\/s10470-019-01550-7","journal-title":"Analog IntegrCirc Sig Process"},{"key":"2276_CR7","doi-asserted-by":"publisher","first-page":"371","DOI":"10.1007\/s10470-014-0273-5","volume":"79","author":"H Lei","year":"2014","unstructured":"H. Lei, K. Qin, Greedy randomized adaptive search procedure for analog test point selection. Analog IntegrCirc Sig Process 79, 371\u2013383 (2014). https:\/\/doi.org\/10.1007\/s10470-014-0273-5","journal-title":"Analog IntegrCirc Sig Process"},{"key":"2276_CR8","doi-asserted-by":"publisher","first-page":"107449","DOI":"10.1016\/j.epsr.2021.107449","volume":"199","author":"X Liu","year":"2021","unstructured":"X. Liu, Y. Lin, H. Jiang, X. Miao, J. Chen, Slippage fault diagnosis of dampers for transmission lines based on faster R-CNN and distance constraint. Electr. Power Syst. Res. 199, 107449 (2021)","journal-title":"Electr. Power Syst. Res."},{"key":"2276_CR9","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/9714206","author":"Q Ma","year":"2018","unstructured":"Q. Ma, Y. He, F. Zhou, P. Song, Test point selection method for analog circuit fault diagnosis based on similarity coefficient. Math. Probl. Eng. (2018). https:\/\/doi.org\/10.1155\/2018\/9714206","journal-title":"Math. Probl. Eng."},{"key":"2276_CR10","doi-asserted-by":"publisher","unstructured":"S. Mosin, An approach to reducing the complexity of neuromorphic fault dictionary construction for analog integrated circuits. in 28th International Conference Radioelektronika (RADIOELEKTRONIKA), Prague, 2018, pp. 1\u20136. https:\/\/doi.org\/10.1109\/RADIOELEK.2018.8376404","DOI":"10.1109\/RADIOELEK.2018.8376404"},{"issue":"6","key":"2276_CR11","doi-asserted-by":"publisher","first-page":"1289","DOI":"10.1109\/19.893273","volume":"49","author":"VC Prasad","year":"2000","unstructured":"V.C. Prasad, N.S.C. Babu, Selection of test nodes for analog fault diagnosis in dictionary approach. IEEE Trans. Instrum. Meas. 49(6), 1289\u20131297 (2000). https:\/\/doi.org\/10.1109\/19.893273","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"2276_CR12","doi-asserted-by":"publisher","unstructured":"J. Rutkowski, J. Machniewski, Integer-code DC fault dictionary. in 2000 IEEE International Symposium on Circuits and Systems (ISCAS), Geneva, Switzerland, 5, 713\u2013716. https:\/\/doi.org\/10.1109\/ISCAS.2000.857594","DOI":"10.1109\/ISCAS.2000.857594"},{"key":"2276_CR13","doi-asserted-by":"publisher","first-page":"167","DOI":"10.1007\/s10470-019-01453-7","volume":"100","author":"S Saeedi","year":"2019","unstructured":"S. Saeedi, S.H. Pishgar, M. Eslami, Optimum test point selection method for analog fault dictionary techniques. Analog IntegrCirc. Signal Process. 100, 167\u2013179 (2019). https:\/\/doi.org\/10.1007\/s10470-019-01453-7","journal-title":"Analog IntegrCirc. Signal Process."},{"issue":"3","key":"2276_CR14","doi-asserted-by":"publisher","first-page":"782","DOI":"10.1109\/TIM.2019.2905307","volume":"69","author":"J Shi","year":"2019","unstructured":"J. Shi, Y. Deng, Z. Wang, Q. He, A combined method for analog circuit fault diagnosis based on dependence matrices and intelligent classifiers. IEEE Trans. Instrum. Meas. 69(3), 782\u2013793 (2019)","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"7","key":"2276_CR15","doi-asserted-by":"publisher","first-page":"075013","DOI":"10.1088\/1361-6501\/ac656a","volume":"33","author":"G Vashishtha","year":"2022","unstructured":"G. Vashishtha, S. Chauhan, A. Kumar, R. Kumar, An ameliorated African vulture optimization algorithm to diagnose the rolling bearing defects. Meas. Sci. Technol. 33(7), 075013 (2022)","journal-title":"Meas. Sci. Technol."},{"key":"2276_CR16","doi-asserted-by":"publisher","first-page":"108905","DOI":"10.1016\/j.apacoust.2022.108905","volume":"197","author":"G Vashishtha","year":"2022","unstructured":"G. Vashishtha, S. Chauhan, N. Yadav, A. Kumar, R. Kumar, A two-level adaptive chirp mode decomposition and tangent entropy in estimation of single-valued neutrosophic cross-entropy for detecting impeller defects in centrifugal pump. Appl. Acoust. 197, 108905 (2022)","journal-title":"Appl. Acoust."},{"issue":"9","key":"2276_CR17","doi-asserted-by":"publisher","first-page":"094003","DOI":"10.1088\/1361-6501\/abeea7","volume":"32","author":"G Vashishtha","year":"2021","unstructured":"G. Vashishtha, R. Kumar, An effective health indicator for the Pelton wheel using a Levy flight mutated genetic algorithm. Meas. Sci. Technol. 32(9), 094003 (2021)","journal-title":"Meas. Sci. Technol."},{"issue":"1","key":"2276_CR18","doi-asserted-by":"publisher","first-page":"015006","DOI":"10.1088\/1361-6501\/ac2cf2","volume":"33","author":"G Vashishtha","year":"2021","unstructured":"G. Vashishtha, R. Kumar, Autocorrelation energy and aquila optimizer for MED filtering of sound signal to detect bearing defect in Francis turbine. Meas. Sci. Technol. 33(1), 015006 (2021)","journal-title":"Meas. Sci. Technol."},{"key":"2276_CR19","doi-asserted-by":"publisher","first-page":"110272","DOI":"10.1016\/j.measurement.2021.110272","volume":"187","author":"G Vashishtha","year":"2022","unstructured":"G. Vashishtha, R. Kumar, An amended grey wolf optimization with mutation strategy to diagnose bucket defects in Pelton wheel. Measurement 187, 110272 (2022)","journal-title":"Measurement"},{"key":"2276_CR20","doi-asserted-by":"publisher","first-page":"8193","DOI":"10.1109\/ACCESS.2020.2964054","volume":"8","author":"C Yang","year":"2020","unstructured":"C. Yang, Multiple soft fault diagnosis of analog filter circuit based on genetic algorithm. IEEE Access 8, 8193\u20138201 (2020)","journal-title":"IEEE Access"},{"key":"2276_CR21","doi-asserted-by":"publisher","first-page":"18305","DOI":"10.1109\/ACCESS.2020.2968744","volume":"8","author":"H Yang","year":"2020","unstructured":"H. Yang, C. Meng, C. Wang, Data-driven feature extraction for analog circuit fault diagnosis using 1-D convolutional neural network. IEEE Access 8, 18305\u201318315 (2020)","journal-title":"IEEE Access"},{"key":"2276_CR22","doi-asserted-by":"publisher","first-page":"523","DOI":"10.1007\/s10836-010-5169-4","volume":"26","author":"C Yang","year":"2010","unstructured":"C. Yang, S. Tian, B. Long et al., A Novel test point selection method for analog fault dictionary techniques. J Electron Test 26, 523\u2013534 (2010). https:\/\/doi.org\/10.1007\/s10836-010-5169-4","journal-title":"J Electron Test"},{"key":"2276_CR23","doi-asserted-by":"publisher","first-page":"349","DOI":"10.1007\/s10470-009-9369-8","volume":"63","author":"C Yang","year":"2010","unstructured":"C. Yang, S. Tian, B. Long et al., A test points selection method for analog fault dictionary techniques. Analog IntegrCirc. Signal Process. 63, 349\u2013357 (2010). https:\/\/doi.org\/10.1007\/s10470-009-9369-8","journal-title":"Analog IntegrCirc. Signal Process."},{"issue":"1","key":"2276_CR24","doi-asserted-by":"publisher","first-page":"176","DOI":"10.1109\/TIM.2010.2050356","volume":"60","author":"C Yang","year":"2011","unstructured":"C. Yang, S. Tian, B. Long, F. Chen, Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis. IEEE Trans. Instrum. Meas. 60(1), 176\u2013185 (2011). https:\/\/doi.org\/10.1109\/TIM.2010.2050356","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"2276_CR25","doi-asserted-by":"publisher","first-page":"137945","DOI":"10.1109\/ACCESS.2019.2943071","volume":"7","author":"X Yuan","year":"2019","unstructured":"X. Yuan, Z. Liu, Z. Miao, Z. Zhao, F. Zhou, Y. Song, Fault diagnosis of analog circuits based on IH-PSO optimized support vector machine. IEEE Access 7, 137945\u2013137958 (2019)","journal-title":"IEEE Access"},{"key":"2276_CR26","doi-asserted-by":"publisher","first-page":"53","DOI":"10.1007\/s10836-015-5506-8","volume":"31","author":"D Zhao","year":"2015","unstructured":"D. Zhao, Y.A. He, New test point selection method for analog circuit. J. Electron. Test 31, 53\u201366 (2015). https:\/\/doi.org\/10.1007\/s10836-015-5506-8","journal-title":"J. Electron. Test"},{"key":"2276_CR27","doi-asserted-by":"crossref","unstructured":"G. Zhao, Y. Liu, Y. Gao, Z. Jiang, C. Hu, A new approach for analog circuit fault diagnosis based on extreme learning machine. in\u00a02018 Prognostics and System Health Management Conference (PHM-Chongqing)\u00a0(pp. 196\u2013200). IEEE. (2018)","DOI":"10.1109\/PHM-Chongqing.2018.00040"},{"key":"2276_CR28","doi-asserted-by":"publisher","first-page":"74","DOI":"10.1016\/j.neucom.2021.01.001","volume":"436","author":"T Zhong","year":"2021","unstructured":"T. Zhong, J. Qu, X. Fang, H. Li, Z. Wang, The intermittent fault diagnosis of analog circuits based on EEMD-DBN. Neurocomputing 436, 74\u201391 (2021)","journal-title":"Neurocomputing"}],"container-title":["Circuits, Systems, and Signal Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-022-02276-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00034-022-02276-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00034-022-02276-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,5,15]],"date-time":"2023-05-15T12:41:30Z","timestamp":1684154490000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00034-022-02276-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1,23]]},"references-count":28,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2023,6]]}},"alternative-id":["2276"],"URL":"https:\/\/doi.org\/10.1007\/s00034-022-02276-0","relation":{},"ISSN":["0278-081X","1531-5878"],"issn-type":[{"value":"0278-081X","type":"print"},{"value":"1531-5878","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1,23]]},"assertion":[{"value":"9 September 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"14 December 2022","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"15 December 2022","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"23 January 2023","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}},{"value":"This article does not contain any studies with human or animal subjects performed by any of the authors.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Human and Animal Rights"}}]}}