{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T23:24:31Z","timestamp":1762298671889,"version":"3.41.0"},"reference-count":57,"publisher":"Springer Science and Business Media LLC","issue":"8","license":[{"start":{"date-parts":[[2017,8,16]],"date-time":"2017-08-16T00:00:00Z","timestamp":1502841600000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"funder":[{"name":"Research paid by the Treasury Board of Government of Canada"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Machine Vision and Applications"],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1007\/s00138-017-0866-y","type":"journal-article","created":{"date-parts":[[2017,8,16]],"date-time":"2017-08-16T10:14:42Z","timestamp":1502878482000},"page":"903-915","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":7,"title":["Characterizing the impact of optically induced blurring of a high-resolution phase-shift 3D scanner"],"prefix":"10.1007","volume":"28","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8344-0842","authenticated-orcid":false,"given":"Marc-Antoine","family":"Drouin","sequence":"first","affiliation":[]},{"given":"Fran\u00e7ois","family":"Blais","sequence":"additional","affiliation":[]},{"given":"Michel","family":"Picard","sequence":"additional","affiliation":[]},{"given":"Jonathan","family":"Boisvert","sequence":"additional","affiliation":[]},{"given":"Jean-Angelo","family":"Beraldin","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2017,8,16]]},"reference":[{"key":"866_CR1","unstructured":"Inspect, Optional 3d digitizer, system and method for digitizing an object. U.S. patent office 6493095, (2002)"},{"key":"866_CR2","unstructured":"Breuckmann, Projector for an arrangement for three-dimensional optical measurement of object. U.S. patent office 7532332, (2009)"},{"key":"866_CR3","unstructured":"Numetrix, Device and method for obtaining three-dimensional object surface data ca 2771727, (2013)"},{"key":"866_CR4","unstructured":"Steinbichler, Apparatus and method for determining the 3d coordinates of an object and for calibrating an industrial robot app. 13\/397,056, (2013)"},{"key":"866_CR5","doi-asserted-by":"crossref","unstructured":"Sansoni, G., Patrioli, A.: Noncontact 3D sensing of free-form complex surfaces. In: Proc. SPIE, Videometrics and Optical Methods for 3D Shape Measurement, vol. 4309 (2001)","DOI":"10.1117\/12.410878"},{"issue":"6","key":"866_CR6","doi-asserted-by":"crossref","first-page":"669","DOI":"10.1109\/PROC.1972.8726","volume":"60","author":"PM Will","year":"1972","unstructured":"Will, P.M., Pennington, K.S.: Grid coding: A novel technique for image processing. IEEE. Proc. 60(6), 669\u2013680 (1972)","journal-title":"IEEE. Proc."},{"issue":"2","key":"866_CR7","doi-asserted-by":"crossref","first-page":"67","DOI":"10.1088\/0335-7368\/6\/2\/301","volume":"6","author":"P Benoit","year":"1975","unstructured":"Benoit, P., Mathieu, E., Hormire, J., Thomas, A.: Characterization and control of three-dimensional objects using fringe projection techniques. Nouvelle Revue d\u2019Optique 6(2), 67\u201386 (1975)","journal-title":"Nouvelle Revue d\u2019Optique"},{"key":"866_CR8","doi-asserted-by":"crossref","first-page":"827","DOI":"10.1016\/j.patcog.2003.10.002","volume":"37","author":"J Salvi","year":"2004","unstructured":"Salvi, J., Pages, J., Batlle, J.: Pattern codification strategies in structured light systems. Pattern Recognit. 37, 827\u2013849 (2004)","journal-title":"Pattern Recognit."},{"issue":"17","key":"866_CR9","doi-asserted-by":"crossref","first-page":"2886","DOI":"10.1364\/AO.40.002886","volume":"40","author":"KA Goldberg","year":"2001","unstructured":"Goldberg, K.A., Bokor, J.: Fourier-transform method of phase-shift determination. Appl. Opt. 40(17), 2886\u20132894 (2001)","journal-title":"Appl. Opt."},{"issue":"1","key":"866_CR10","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1364\/AO.36.000271","volume":"36","author":"Y Surrel","year":"1994","unstructured":"Surrel, Y.: Additive noise effect in digital phase detection. Appl. Opt. 36(1), 271\u2013276 (1994)","journal-title":"Appl. Opt."},{"issue":"10","key":"866_CR11","doi-asserted-by":"crossref","first-page":"2084","DOI":"10.1364\/AO.36.002084","volume":"36","author":"K Hibino","year":"1997","unstructured":"Hibino, K.: Susceptibility of systematic error-compensating algorithms to random noise in phase-shifting interferometry. Appl. Opt. 36(10), 2084\u20132093 (1997)","journal-title":"Appl. Opt."},{"issue":"9","key":"866_CR12","doi-asserted-by":"crossref","first-page":"1997","DOI":"10.1364\/JOSAA.12.001997","volume":"12","author":"C Rathjen","year":"1995","unstructured":"Rathjen, C.: Statistical properties of phase-shift algorithms. J. Opt. Soc. Am. A 12(9), 1997\u20132008 (1995)","journal-title":"J. Opt. Soc. Am. A"},{"key":"866_CR13","doi-asserted-by":"crossref","unstructured":"Goesele, M., Fuchs, C., Seidel, H.-P.: Accuracy of 3d range scanners by measurement of the slanted edge modulation transfer function. In: International Conference on 3D Digital Imaging and Modeling, p. 37 (2003)","DOI":"10.1109\/IM.2003.1240230"},{"key":"866_CR14","unstructured":"Boehler, W., Marbs, A.: Investigating scanner accuracy, tech. rep., German University FH Mainz, (2003)"},{"key":"866_CR15","doi-asserted-by":"crossref","unstructured":"Brownhill, A., Brade, R., Robson, S.: Performance study of non-contact surface measurement technology for use in an experimental fusion device. In: 21st Annual IS&T\/SPIE Symposium on Electronic Imaging, (2009)","DOI":"10.1117\/12.825267"},{"key":"866_CR16","doi-asserted-by":"crossref","unstructured":"Robson, S., Beraldin, A., Brownhill, A., MacDonald, L.: Artefacts for optical surface measurement. In: Society of Photo-Optical Instrumentation & Electronics & Society for Imaging Science and Technology, in Videometrics, Range Imaging, and Applications XI, (2011)","DOI":"10.1117\/12.882702"},{"key":"866_CR17","unstructured":"Luhmann, T., Bethmann, F., Herd, B., Ohm, J.: Comparison and verification of optical 3-d surface measurement systems. In: The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences. 37. Part B5. Beijing, (2008)"},{"key":"866_CR18","unstructured":"Bridges, R.E.: Ways to verify performance of 3d imaging instruments. In: International Society for Optics and Photonics, IS&T\/SPIE Electronic Imaging, pp.\u00a072390R\u201372390R, (2009)"},{"issue":"10","key":"866_CR19","doi-asserted-by":"crossref","first-page":"473","DOI":"10.1016\/j.measurement.2009.07.013","volume":"42","author":"AB Forbes","year":"2009","unstructured":"Forbes, A.B., Hughes, B., Sun, W.: Comparison of measurements in co-ordinate metrology, IMEKO TC8-traceability to support CIPM MRA and other international arrangements. Measurement 42(10), 473\u20131477 (2009)","journal-title":"Measurement"},{"issue":"Part 5","key":"866_CR20","first-page":"696","volume":"34","author":"W Boehler","year":"2003","unstructured":"Boehler, W., Vicent, M.B., Marbs, A.: Investigating laser scanner accuracy. Int. Arch. Photogrammetry Remote Sens. Spat. Inf. Sci. 34(Part 5), 696\u2013701 (2003)","journal-title":"Int. Arch. Photogrammetry Remote Sens. Spat. Inf. Sci."},{"issue":"2","key":"866_CR21","doi-asserted-by":"crossref","first-page":"870","DOI":"10.1109\/JSEN.2012.2228638","volume":"13","author":"B M\u00f8ller","year":"2013","unstructured":"M\u00f8ller, B., Balslev, I., Kr\u00fcger, N.: An automatic evaluation procedure for 3d scanners in robotics applications. IEEE Sens. J. 13(2), 870\u2013878 (2013)","journal-title":"IEEE Sens. J."},{"key":"866_CR22","unstructured":"Cheok, G.S., Saidi, K.S., Franaszek, M., Filliben, J., Scott, N.A.: Characterization of the range performance of a 3d imaging system, Tech. Rep. NIST TN-1695 (2011)"},{"key":"866_CR23","doi-asserted-by":"crossref","unstructured":"Carrier, B., Mackinnon, D., Cournoyer, L., Beraldin, J.-A.: Proposed NRC portable target case for short-range triangulation-based 3-d imaging systems characterization. In: 23st Annual IS&T\/SPIE Symposium on Electronic Imaging, (2011)","DOI":"10.1117\/12.871942"},{"issue":"1\u20133","key":"866_CR24","doi-asserted-by":"crossref","first-page":"56","DOI":"10.1007\/s11263-012-0570-3","volume":"102","author":"D MacKinnon","year":"2013","unstructured":"MacKinnon, D., Carrier, B., Beraldin, J.-A., Cournoyer, L.: Gd&t-based characterization of short-range non-contact 3d imaging systems. Int. J. comput. Vis. 102(1\u20133), 56\u201372 (2013)","journal-title":"Int. J. comput. Vis."},{"key":"866_CR25","doi-asserted-by":"crossref","unstructured":"Hansen, K., Pedersen, J., Solund, T., Aanaes, H., Kraft, D.: A structured light scanner for hyper flexible industrial automation. In: 2nd International Conference on 3D Vision (3DV), vol. 1, pp. 401\u2013408. (2014)","DOI":"10.1109\/3DV.2014.53"},{"key":"866_CR26","doi-asserted-by":"crossref","unstructured":"MacKinnon, D., Beraldin, J.-A., Cournoyer, L., Blais, F.: Evaluation laser spot range scanner lateral resolution in 3d metrology. In: 21st Annual IS&T\/SPIE Symposium on Electronic Imaging, (2009)","DOI":"10.1117\/12.805868"},{"key":"866_CR27","doi-asserted-by":"crossref","unstructured":"MacKinnon, D., Beraldin, J.-A., Cournoyer, L., Carrier, B., Blais, F.: Proposed traceable structural resolution protocols for 3d imaging systems. In: Proceedings on SPIE, vol. 7447, (2009)","DOI":"10.1117\/12.824458"},{"issue":"2","key":"866_CR28","doi-asserted-by":"crossref","first-page":"021111","DOI":"10.1117\/1.OE.51.2.021111","volume":"51","author":"D MacKinnon","year":"2012","unstructured":"MacKinnon, D., Beraldin, J.-A., Cournoyer, L., Picard, M., Blais, F.: Lateral resolution challenges for triangulation-based three-dimensional imaging systems. Opt. Eng. 51(2), 021111 (2012)","journal-title":"Opt. Eng."},{"key":"866_CR29","unstructured":"Okouneva, G., McTavish, D., Okunev, O.G.: Selection of regions on a 3d surface for efficient lidar-based pose estimation.. In: VMV, pp. 387\u2013388, (2009)"},{"key":"866_CR30","doi-asserted-by":"crossref","unstructured":"McTavish, D., Okouneva, G.: A new approach to geometrical feature assessment for icp-based pose measurement: Continuum shape constraint analysis. In: IEEE International Conference on Machine Vision and Image Processing IMVIP 2007. pp. 23\u201332, (2007)","DOI":"10.1109\/IMVIP.2007.38"},{"key":"866_CR31","first-page":"19","volume":"3","author":"K Mechelke","year":"2007","unstructured":"Mechelke, K., Kersten, T.P., Lindstaedt, M.: Comparative investigations into the accuracy behaviour of the new generation of terrestrial laser scanning systems. Proc. Opt. 3, 19\u2013327 (2007)","journal-title":"Proc. Opt."},{"issue":"2","key":"866_CR32","doi-asserted-by":"crossref","first-page":"206","DOI":"10.1109\/PROC.1977.10458","volume":"65","author":"D Nitzan","year":"1977","unstructured":"Nitzan, D., Brain, A.E., Duda, R.O.: The measurement and use of registered reflectance and range data in scene analysis. Proc. IEEE. 65(2), 206\u2013220 (1977)","journal-title":"Proc. IEEE."},{"key":"866_CR33","first-page":"428","volume":"38","author":"N Mak","year":"2010","unstructured":"Mak, N., Beraldin, J., Cournoyer, L., Picard, M., et al.: A distance protocol for mid-range tls in support of astm-e57 standards activities. Proc. ISPRS Comm. V Mid-Term Symp. Close Range Image Meas. Tech. 38, 428\u2013433 (2010)","journal-title":"Proc. ISPRS Comm. V Mid-Term Symp. Close Range Image Meas. Tech."},{"key":"866_CR34","doi-asserted-by":"crossref","unstructured":"Hebert, M., Krotkov, E.: 3-d measurements from imaging laser radars: How good are they?. In: IEEE\/RSJ International Workshop on Intelligent Robots and Systems\u2019 Proceedings IROS\u201991 Intelligence for Mechanical Systems, pp. 359\u2013364, (1991)","DOI":"10.1109\/IROS.1991.174476"},{"issue":"2","key":"866_CR35","doi-asserted-by":"crossref","first-page":"587","DOI":"10.1016\/S0007-8506(07)61702-8","volume":"51","author":"W Estler","year":"2002","unstructured":"Estler, W., Edmundson, K., Peggs, G., Parker, D.: Large-scale metrology-an update. CIRP Ann. Manuf. Tech. 51(2), 587\u2013609 (2002)","journal-title":"CIRP Ann. Manuf. Tech."},{"key":"866_CR36","unstructured":"ASTM E2544 10, Standard Terminology for Three-Dimensional (3d) Imaging Systems, (2010)"},{"key":"866_CR37","unstructured":"VDI 2634 Part 2, Optical 3-d Measuring Systems Optical System Based on Area Scanning, (2002)"},{"key":"866_CR38","unstructured":"International Standards Organization (ISO), ISO Guide 98-3, Uncertainty of Measurement Part 3: Guide to the Expression of Uncertainty in Measurement (GUM: 1995). (1995)"},{"key":"866_CR39","unstructured":"JCGM\/WG-2, CGM 200:2008, International Vocabulary of metrology Basic and general concepts and associated terms (VIM). (2008)"},{"key":"866_CR40","unstructured":"Beraldin, J.-Angelo., Mackinnon, David., Cournoyer, Luc.: Metrological characterization of 3d imaging systems: progress report on standards developments. In: International Congress of Metrology (Array, ed.), p. 13003, (2015)"},{"key":"866_CR41","series-title":"Advances in Image Processing, Multimedia and Machine Vision","doi-asserted-by":"crossref","first-page":"385","DOI":"10.1007\/978-3-642-58288-2_15","volume-title":"Image Technology","author":"RB Fisher","year":"1996","unstructured":"Fisher, R.B., Naidu, D.K.: A comparison of algorithms for subpixel peak detection. Image Technology. Advances in Image Processing, Multimedia and Machine Vision, pp. 385\u2013404. Springer, Berlin (1996)"},{"key":"866_CR42","doi-asserted-by":"crossref","unstructured":"Naidu, K., Fisher, R.B.: A comparative analysis of algorithms for determining the peak position of a stripe to sub-pixel accuracy. In: Proceedings of British Machine Vision Conference, (1991)","DOI":"10.5244\/C.5.28"},{"key":"866_CR43","unstructured":"Trobina, M.: Error model of a coded-light range sensor, Tech. Rep. BIWI-TR-164, ETH-Zentrum, (1995)"},{"key":"866_CR44","doi-asserted-by":"crossref","unstructured":"Rashidizad, H., Rahimi, A.: Effect of scanning depth of field on the measurement noises of developed fringe projection 3d scanning system. Appl. Mech. Mater. 624, 322\u2013326 (2014)","DOI":"10.4028\/www.scientific.net\/AMM.624.322"},{"issue":"20","key":"866_CR45","doi-asserted-by":"crossref","first-page":"2873","DOI":"10.1364\/AO.30.002873","volume":"30","author":"R Baribeau","year":"1991","unstructured":"Baribeau, R., Rioux, M.: Influence of speckle on laser range finders. Appl. Opt. 30(20), 2873\u20132878 (1991)","journal-title":"Appl. Opt."},{"issue":"7","key":"866_CR46","doi-asserted-by":"crossref","first-page":"1306","DOI":"10.1364\/AO.33.001306","volume":"33","author":"RG Dorsch","year":"1994","unstructured":"Dorsch, R.G., H\u00e4usler, G., Herrmann, J.M.: Laser triangulation: fundamental uncertainty in distance measurement. Appl. Opt. 33(7), 1306\u20131314 (1994)","journal-title":"Appl. Opt."},{"volume-title":"Optical Measurement of Surface Topography","year":"2011","key":"866_CR47","unstructured":"Leach, R. (ed.): Optical Measurement of Surface Topography. Springer, Berlin (2011)"},{"issue":"12","key":"866_CR48","doi-asserted-by":"crossref","first-page":"1245","DOI":"10.1117\/12.7977163","volume":"26","author":"M Rioux","year":"1987","unstructured":"Rioux, M., Taylor, D., Duggan, M.: Design of a large depth of view three-dimensional camera for robot vision. Opt. Eng. 26(12), 1245\u20131250 (1987)","journal-title":"Opt. Eng."},{"issue":"1","key":"866_CR49","doi-asserted-by":"crossref","first-page":"231","DOI":"10.1117\/1.1631921","volume":"13","author":"F Blais","year":"2004","unstructured":"Blais, F.: Review of 20 years of range sensor development. J. Electron. Imaging 13(1), 231\u2013243 (2004)","journal-title":"J. Electron. Imaging"},{"issue":"9","key":"866_CR50","doi-asserted-by":"crossref","first-page":"1997","DOI":"10.1364\/JOSAA.12.001997","volume":"12","author":"N Ohyama","year":"1995","unstructured":"Ohyama, N., Kinoshita, S., Cornejo-Rodriguez, A., Tsujiuchi, J.: Accuracy of phase determination with unequal reference phase shift. J. Opt. Soc. Am. A 12(9), 1997\u20132008 (1995)","journal-title":"J. Opt. Soc. Am. A"},{"key":"866_CR51","unstructured":"Guidi, G., Cioci, A., Atzeni, C., Beraldin, J.-A.: Accuracy verification and enhancement in 3d modeling: application to donatello\u2019s maddalena. In: Fourth International Conference on Proceedings of 3-D Digital Imaging and Modeling, 3DIM 2003, pp. 334\u2013341, (2003)"},{"key":"866_CR52","volume-title":"Modern Optical Engineering","author":"WJ Smith","year":"2000","unstructured":"Smith, W.J.: Modern Optical Engineering, 3rd edn. McGraw-Hill, New York (2000)","edition":"3"},{"issue":"5","key":"866_CR53","doi-asserted-by":"crossref","first-page":"887","DOI":"10.1007\/s00138-011-0358-4","volume":"23","author":"M-A Drouin","year":"2012","unstructured":"Drouin, M.-A., Jodoin, P.-M., Premont, J.: Camera-projector matching using unstructured video. Mach. Vis. Appl. 23(5), 887\u2013902 (2012)","journal-title":"Mach. Vis. Appl."},{"key":"866_CR54","unstructured":"Drouin, M., Blais, F., Godin, G.: High resolution projector for 3d imaging. In: 2nd International Conference on 3D Vision, 3DV 2014, Tokyo, Japan, December 8\u201311, pp. 337\u2013344, (2014)"},{"key":"866_CR55","doi-asserted-by":"crossref","unstructured":"Pears, N., Liu, Y., Bunting, P.: 3D Imaging, Analysis and Applications. Springer, London (2012)","DOI":"10.1007\/978-1-4471-4063-4"},{"key":"866_CR56","doi-asserted-by":"crossref","unstructured":"Hartley, R.I., Zisserman, A.: Multiple View Geometry in Computer Vision, 2nd edn., Cambridge, Cambridge University Press, ISBN: 0521540518, (2004)","DOI":"10.1017\/CBO9780511811685"},{"key":"866_CR57","doi-asserted-by":"crossref","unstructured":"Bumbaca, F., Blais, F.: Real-time correction of three-dimensional non-linearities for a laser range finder. Opt. Eng. 25(4), 254561 (1986)","DOI":"10.1117\/12.7973860"}],"container-title":["Machine Vision and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00138-017-0866-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00138-017-0866-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00138-017-0866-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T23:01:01Z","timestamp":1750806061000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00138-017-0866-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8,16]]},"references-count":57,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2017,11]]}},"alternative-id":["866"],"URL":"https:\/\/doi.org\/10.1007\/s00138-017-0866-y","relation":{},"ISSN":["0932-8092","1432-1769"],"issn-type":[{"type":"print","value":"0932-8092"},{"type":"electronic","value":"1432-1769"}],"subject":[],"published":{"date-parts":[[2017,8,16]]}}}