{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T17:44:13Z","timestamp":1773942253105,"version":"3.50.1"},"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[1997,2,1]],"date-time":"1997-02-01T00:00:00Z","timestamp":854755200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Machine Vision and Applications"],"published-print":{"date-parts":[[1997,2,1]]},"DOI":"10.1007\/s001380050041","type":"journal-article","created":{"date-parts":[[2002,8,25]],"date-time":"2002-08-25T07:30:30Z","timestamp":1030260630000},"page":"201-214","source":"Crossref","is-referenced-by-count":91,"title":["Automatic defect classification for semiconductor manufacturing"],"prefix":"10.1007","volume":"9","author":[{"given":"Paul B.","family":"Chou","sequence":"first","affiliation":[]},{"given":"A. Ravishankar","family":"Rao","sequence":"additional","affiliation":[]},{"given":"Martin C.","family":"Sturzenbecker","sequence":"additional","affiliation":[]},{"given":"Frederick Y.","family":"Wu","sequence":"additional","affiliation":[]},{"given":"Virginia H.","family":"Brecher","sequence":"additional","affiliation":[]}],"member":"297","container-title":["Machine Vision and Applications"],"original-title":[],"link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s001380050041.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s001380050041\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s001380050041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,23]],"date-time":"2019-05-23T13:09:39Z","timestamp":1558616979000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s001380050041"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,2,1]]},"references-count":0,"journal-issue":{"issue":"4","published-print":{"date-parts":[[1997,2,1]]}},"alternative-id":["BM2BANJKNXK6T7QK"],"URL":"https:\/\/doi.org\/10.1007\/s001380050041","relation":{},"ISSN":["0932-8092","1432-1769"],"issn-type":[{"value":"0932-8092","type":"print"},{"value":"1432-1769","type":"electronic"}],"subject":[],"published":{"date-parts":[[1997,2,1]]}}}