{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T23:40:25Z","timestamp":1738107625494,"version":"3.33.0"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2007,2,1]],"date-time":"2007-02-01T00:00:00Z","timestamp":1170288000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["New Gener. Comput."],"published-print":{"date-parts":[[2007,2]]},"DOI":"10.1007\/s00354-007-0010-z","type":"journal-article","created":{"date-parts":[[2008,3,6]],"date-time":"2008-03-06T05:44:54Z","timestamp":1204782294000},"page":"171-199","source":"Crossref","is-referenced-by-count":15,"title":["Defect-Tolerance in Cellular Nanocomputers"],"prefix":"10.1007","volume":"25","author":[{"given":"Teijiro","family":"Isokawa","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shin\u2019ya","family":"Kowada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yousuke","family":"Takada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ferdinand","family":"Peper","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Naotake","family":"Kamiura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nobuyuki","family":"Matsui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,3,7]]},"reference":[{"key":"10_CR1","doi-asserted-by":"crossref","unstructured":"Biafore, M., \u201cCellular Automata for Nanometer-scale Computation,\u201d Physica D, 70, pp. 415-433, 1994.","DOI":"10.1016\/0167-2789(94)90075-2"},{"key":"10_CR2","doi-asserted-by":"crossref","unstructured":"Cunningham, J. A., \u201cThe Use and Evaluation of Yield Models in Integrated Circuit Manufacturing,\u201d IEEE Transaction on Semiconductor Manufacturing, 3, 2, pp. 60-71, 1990.","DOI":"10.1109\/66.53188"},{"key":"10_CR3","unstructured":"Dalal, Y. K. and Metcalfe, R. M., \u201cReverse Path Forwarding of Broadcast Packets,\u201d Communications of the ACM, 21, 12, pp. 1040-1048, 1978."},{"key":"10_CR4","doi-asserted-by":"crossref","unstructured":"Durbeck, L. J. K. and Macias, N. J., \u201cThe Cell Matrix: An Architecture for Nanocomputing,\u201d Nanotechnology, 12, pp. 217-230, 2001.","DOI":"10.1088\/0957-4484\/12\/3\/305"},{"key":"10_CR5","doi-asserted-by":"crossref","unstructured":"Goldstein, S. C. and Budiu, M., \u201cNanoFabrics: Spatial Computing Using Molecular Electronics,\u201d in Proc. of the 28th Annual International Symposium on Computer Architecture, pp. 178-191, 2001.","DOI":"10.1145\/384285.379262"},{"key":"10_CR6","doi-asserted-by":"crossref","unstructured":"Han, J. and Jonker, P., \u201cA ddefect- and fault-tolerant Architecture for Nanocomputers,\u201d Nanotechnology, 14, pp. 224-230, 2003.","DOI":"10.1088\/0957-4484\/14\/2\/324"},{"key":"10_CR7","unstructured":"Heath, J. R., Kuekes, P. J., Snider, G. S., and Williams, R. S., \u201cA Defect-Tolerant Computer Architecture: Opportunities for Nanotechnology,\u201d Science, 280, pp. 1716-1721, 1998."},{"key":"10_CR8","doi-asserted-by":"crossref","unstructured":"Isokawa, T., Abo, F., Peper, F., Adachi, S., Lee, J., Matsui, N., and Mashiko, S., \u201cFault-tolerant Nanocomputers based on Asynchronous Cellular Automata,\u201d International Journal of Modern Physics D, 15, 6, pp. 893-915, 2004.","DOI":"10.1142\/S0129183104006327"},{"key":"10_CR9","unstructured":"Isokawa, T., Abo, F., Peper, F., Kamiura, N., and Matsui, N., \u201cDefect-tolerant Computing based on an Asynchronous Cellular Automaton,\u201d in Proc. of SICE Annual Conference, pp. 1746-1749, 2003."},{"key":"10_CR10","doi-asserted-by":"crossref","unstructured":"Kuekes, P. J., Robinett, W., Seroussi, G., and Williams, R. S., \u201cDefect-tolerant Interconnect to Nanoelecronic Circuits: Internally Redundant Demultiplexers based on Error-correcting Codes,\u201d Nanotechnology, 16, pp. 869-881, 2005.","DOI":"10.1088\/0957-4484\/16\/6\/043"},{"key":"10_CR11","doi-asserted-by":"crossref","unstructured":"Lee, J., Peper, F., Adachi, S., Morita, K., and Mashiko, S., \u201cReversible Computation in Asynchronous Cellular Automata,\u201d in Proc. of the Third International Conference on Unconventional Models of Computation 2002, Springer, pp. 220-229. 2002","DOI":"10.1007\/3-540-45833-6_19"},{"key":"10_CR12","doi-asserted-by":"crossref","unstructured":"Mishra, M., and Goldstein, S. C., \u201cDefect Tolerance at the End of the Roadmap,\u201d in Proc. of the IEEE International Test Conference (ITC), 1, pp. 1201-1210, 2003","DOI":"10.1109\/TEST.2003.1271109"},{"key":"10_CR13","doi-asserted-by":"crossref","unstructured":"Morita, K., \u201cA Simple Universal Logic Element and Cellular Automata for Reversible Computing,\u201d LNCS, 2055, Springer pp.102-113, 2003.","DOI":"10.1007\/3-540-45132-3_6"},{"key":"10_CR14","unstructured":"Patwardhan, J. P., Dwyer, C., Lebeck, A. R., \u201cDesign and Evaluation of Fail-Stop Self-Assembled Nanoscale Processing Elements,\u201d in Proc. of 2nd IEEE International Workshop on Defect and Fault Tolerant Nanoscale Architectures (NanoArch 2006), 2006."},{"key":"10_CR15","doi-asserted-by":"crossref","unstructured":"Peper, F., Isokawa, T., Kouda, N., and Matsui, N., \u201cSelf-Timed Cellular Automata and their Computational Ability,\u201d Future Generation Computer Systems, 18, pp. 893-904, 2002.","DOI":"10.1016\/S0167-739X(02)00069-9"},{"key":"10_CR16","doi-asserted-by":"crossref","unstructured":"Peper, F., Lee, J., Abo, F., Isokawa, T., Adachi, S., Matsui, N., and Mashiko, S., \u201cFault-Tolerance in Nanocomputers: A Cellular Array Approach,\u201d IEEE Transaction on Nanotechnology, 3, 1, pp. 187-201, 2004.","DOI":"10.1109\/TNANO.2004.824034"},{"key":"10_CR17","doi-asserted-by":"crossref","unstructured":"Peper, F., Lee, J., Adachi, S., and Mashiko, S., \u201cLaying out Circuits on Asynchronous Cellular Arrays: A Step towards Feasible Nanocomputers?,\u201d Nano-technology, 14, pp. 469-485, 2003.","DOI":"10.1088\/0957-4484\/14\/4\/312"},{"key":"10_CR18","doi-asserted-by":"crossref","unstructured":"Sadek, A. S., Nikolic, K., and Forshaw, M., \u201cParallel Information and Computation with Restitution for Noise-tolerant Nanoscale Logic Networks,\u201d Nano-technology, 15, pp. 192-210, 2004.","DOI":"10.1088\/0957-4484\/15\/1\/037"},{"key":"10_CR19","doi-asserted-by":"crossref","unstructured":"Stapper, C. H., Armstrong, F. M., and Saji, K., \u201cIntegrated Circuit Yield Statistics,\u201d Proc. of the IEEE, 71, 4, pp. 453-470, 1983.","DOI":"10.1109\/PROC.1983.12619"},{"key":"10_CR20","doi-asserted-by":"crossref","unstructured":"Takada, Y., Isokawa, T., Peper, F., and Matsui, N., \u201cUniversal Construction and Self-Reproduction on Self-Timed Cellular Automata,\u201d International Journal of Modern Physics C, 17, 7, pp. 985-1007, 2006.","DOI":"10.1142\/S0129183106009497"},{"key":"10_CR21","unstructured":"Wang, T., Bennaser, M., Guo, Y., and Moritz, C. A., \u201cCombining Circuit Level and System Level Techniques for Defect-Tolerant Nanoscale Architectures,\u201d in Proc. of 2 nd International Workshop on Defect and Fault Tolerant Nanoscale Auchitecutures (NanoArch 2006), 2006."},{"key":"10_CR22","doi-asserted-by":"crossref","unstructured":"Zhang, R., Li, J. F., and Viehland, D., \u201cSelf-assembly of Point Defects into Clusters and Defect-free Regions: A Simulation Study of Higher-valent Substituted Ferroelectric Perovskites,\u201d Computational Materials Science, 29, 1, pp. 67-75, 2004.","DOI":"10.1016\/S0927-0256(03)00096-X"}],"container-title":["New Generation Computing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00354-007-0010-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00354-007-0010-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00354-007-0010-z","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,28]],"date-time":"2025-01-28T22:59:17Z","timestamp":1738105157000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00354-007-0010-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,2]]},"references-count":22,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2007,2]]}},"alternative-id":["10"],"URL":"https:\/\/doi.org\/10.1007\/s00354-007-0010-z","relation":{},"ISSN":["0288-3635","1882-7055"],"issn-type":[{"type":"print","value":"0288-3635"},{"type":"electronic","value":"1882-7055"}],"subject":[],"published":{"date-parts":[[2007,2]]}}}