{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T07:25:05Z","timestamp":1648970705583},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2010,4,1]],"date-time":"2010-04-01T00:00:00Z","timestamp":1270080000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Elektrotech. Inftech."],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1007\/s00502-010-0704-7","type":"journal-article","created":{"date-parts":[[2010,6,7]],"date-time":"2010-06-07T11:41:58Z","timestamp":1275910918000},"page":"98-102","source":"Crossref","is-referenced-by-count":2,"title":["An 11-bit successive approximation analog-to-digital converter based on a combined capacitor-resistor network"],"prefix":"10.1007","volume":"127","author":[{"given":"M.","family":"Davidovic","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Zach","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Zimmermann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"704_CR1","unstructured":"Alpman, E., Lakdawala, H., Carley, L. R., Soumyanath, K. (2009): A 1.1 V 50 mW 2.5 GS\/s 7b Time-Interleaved C-2C SAR ADC in 45 nm LP Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 76\u201377"},{"key":"704_CR2","volume-title":"CMOS Circuit Design, Layout, and Simulation","author":"R. J. Baker","year":"2008","unstructured":"Baker, R. J. (2008): CMOS Circuit Design, Layout, and Simulation. 2nd ed. New York: Wiley-Interscience","edition":"2"},{"key":"704_CR3","unstructured":"Baschirotto, A. (2009): SAR ADCs. ISSCC 2009 Tutorial"},{"key":"704_CR4","unstructured":"Craninckx, J., Van der Plas, G. (2007): A 65 fJ\/Conversion-Step 0-to-50 MS\/s 0-to-0.7 mW 9b Charge-Sharing SAR ADC in 90 nm Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 246\u2013247"},{"key":"704_CR5","doi-asserted-by":"crossref","unstructured":"Davidovic, M., Nemecek, A., Zach, G., Zimmermann, H. (2008): A 20 MS\/s 11-bit Digital-to-Analog Converter Using a Combined Capacitor and Resistor Network. In: Proc. 26th IEEE Norchip Conf., 85\u201388","DOI":"10.1109\/NORCHP.2008.4738288"},{"key":"704_CR6","unstructured":"Giannini, V., Nuzzo, P., Chironi, V., Baschirotto, A., Van der Plas, G., Craninckx, J. (2008): An 820 \u00b5W 9b 40 MS\/s Noise-Tolerant Dynamic-SAR ADC in 90 nm Digital CMOS. IEEE ISSCC Dig. Tech. Papers: 238\u2013239"},{"key":"704_CR7","unstructured":"Hesener, M., Eichler, T., Hanneberg, A., Herbison, D., Kuttner, F., Wenske. H. (2008): A 14b 40 MS\/s Redundant SAR ADC with 480 MHz Clock in 0.13\u00b5m CMOS. IEEE ISSCC Dig. Tech. Papers: 248\u2013249"},{"key":"704_CR8","unstructured":"Jun, C., Feng, R., Mei-hua, X. (2007): IC Design of 2 Ms\/s 10-bit SAR ADC with Low Power. IEEE HDP 07: 1\u20133"},{"key":"704_CR9","unstructured":"Kester, W. (2006): ADC Input Noise: The Good, The Bad, and The Ugly. Is No Noise Good Noise? Analog Devices"},{"key":"704_CR10","doi-asserted-by":"crossref","first-page":"523","DOI":"10.1109\/4.210039","volume":"28","author":"T. Kobayashi","year":"1993","unstructured":"Kobayashi, T., Nogami, K., Shirotori, T., Fujimoto, Y. (1993): A current controlled latch sense amplifier and a static power-saving input buffer for low-power architecture. IEEE Journal of Solid-State Circuits, 28: 523\u2013527","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"704_CR11","first-page":"176","volume":"1","author":"F. Kuttner","year":"2002","unstructured":"Kuttner, F. (2002): A 1.2 V 10b 20 M Sample\/s Non-Binary Successive Approximation ADC in 0.13 \u00b5m CMOS. IEEE ISSCC Dig. Tech. Papers, 1: 176\u2013177","journal-title":"IEEE ISSCC Dig. Tech. Papers"},{"key":"704_CR12","doi-asserted-by":"crossref","first-page":"54","DOI":"10.1109\/JSSC.2002.806257","volume":"38","author":"C.-S. Lin","year":"2003","unstructured":"Lin, C.-S., Liu, B.-D. (2003): A new successive approximation architecture for low-power low-cost CMOS A\/D converter. IEEE Journal of Solid-State Circuits, 38: 54\u201362","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"704_CR13","doi-asserted-by":"crossref","unstructured":"McCreary, J. L., Gray, P. R. (1975): All-MOS charge redistribution analog-to-digital conversion techniques \u2013 Part I. IEEE Journal of Solid-State Circuits, SC-10 (6), 371\u2013379","DOI":"10.1109\/JSSC.1975.1050629"},{"issue":"7","key":"704_CR14","doi-asserted-by":"crossref","first-page":"1138","DOI":"10.1109\/4.933473","volume":"36","author":"G. Promitzer","year":"2001","unstructured":"Promitzer, G. (2001): 12-bit low-power fully differential switched capacitor noncalibrating successive approximation ADC with 1 MS\/s. IEEE Journal of Solid-State Circuits, 36 (7): 1138\u20131143","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"704_CR15","doi-asserted-by":"crossref","unstructured":"Ting, H.-W., Liu, B.-D., Chang, S.-J. (2006): Histogram Based Testing Strategy for ADC. IEEE 15th Asian Test Symp: 51\u201354","DOI":"10.1109\/ATS.2006.260992"},{"key":"704_CR16","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-3768-4","volume-title":"CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters","author":"R. Van de Plassche","year":"2003","unstructured":"Van de Plassche, R. (2003): CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters. 2nd ed. Dordrecht: Kluwer Academic Publishers"},{"key":"704_CR17","unstructured":"Van Elzakker, M., van Tuijl, E., Geraedts, P., Schinkel, D., Klumperink, E., Nauta, B. (2008): A 1.9 \u00b5W 4.4 fJ\/Conversion-step 10b 1 MS\/s Charge-Redistribution ADC. IEEE ISSCC Dig. Tech. Papers: 243\u2013244"},{"key":"704_CR18","doi-asserted-by":"crossref","first-page":"770","DOI":"10.1109\/19.85350","volume":"40","author":"M. F. Wagdy","year":"1991","unstructured":"Wagdy, M. F., Awad, S. S. (1991): Determining ADC effective number of bits via histogram testing. IEEE Transactions on Instrumentation and Measurement, 40: 770\u2013772","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"issue":"7","key":"704_CR19","doi-asserted-by":"crossref","first-page":"1148","DOI":"10.1109\/JSSC.2004.829399","volume":"39","author":"B. Wicht","year":"2004","unstructured":"Wicht, B., Nirschl, T., Schmitt-Landsiedel, D. (2004): Yield and Speed Optimization of a Latch-Type Voltage Sense Amplifier. IEEE Journal of Solid-State Circuits, 39 (7): 1148\u20131158","journal-title":"IEEE Journal of Solid-State Circuits"},{"key":"704_CR20","doi-asserted-by":"crossref","unstructured":"Zach, G., Davidovic, M., Zimmermann, H. (2009): Extraneous-Light Resistant Multipixel Range Sensor Based on a Low-Power Correlating Pixel-Circuit. IEEE ESSCIRC, 2009","DOI":"10.1109\/ESSCIRC.2009.5326018"}],"container-title":["e & i Elektrotechnik und Informationstechnik"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-010-0704-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00502-010-0704-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-010-0704-7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,29]],"date-time":"2019-05-29T21:55:22Z","timestamp":1559166922000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00502-010-0704-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":20,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2010,4]]}},"alternative-id":["704"],"URL":"https:\/\/doi.org\/10.1007\/s00502-010-0704-7","relation":{},"ISSN":["0932-383X","1613-7620"],"issn-type":[{"value":"0932-383X","type":"print"},{"value":"1613-7620","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,4]]}}}