{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T09:30:23Z","timestamp":1766136623739},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2015,8,13]],"date-time":"2015-08-13T00:00:00Z","timestamp":1439424000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Elektrotech. Inftech."],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1007\/s00502-015-0315-4","type":"journal-article","created":{"date-parts":[[2015,8,12]],"date-time":"2015-08-12T08:59:21Z","timestamp":1439369961000},"page":"274-281","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":8,"title":["A netlist-level fault-injection tool for FPGAs"],"prefix":"10.1007","volume":"132","author":[{"given":"Christian","family":"Fibich","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peter","family":"R\u00f6ssler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stefan","family":"Tauner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herbert","family":"Taucher","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martin","family":"Matschnig","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,8,13]]},"reference":[{"key":"315_CR1","unstructured":"Altera Corporation (2014): Debugging single event upsets using the fault injection debugger. Application note, document No. QII53026, 2014-06-30."},{"issue":"6","key":"315_CR2","doi-asserted-by":"crossref","first-page":"693","DOI":"10.1109\/TVLSI.2008.2000254","volume":"16","author":"J. C. Baraza","year":"2008","unstructured":"Baraza, J. C., et al. (2008): Enhancement of fault injection techniques based on the modification of VHDL code. IEEE Trans. Very Large Scale Integr. (VLSI) Syst., 16(6), 693\u2013706.","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."},{"key":"315_CR3","volume-title":"Proceedings of the microelectronic systems symposium 2014","author":"C. Fibich","year":"2014","unstructured":"Fibich, C., Wenzl, M., R\u00f6ssler, P., Taucher, H., Matschnig, M. (2014): On automated generation of checker units from hardware assertion languages. In Proceedings of the microelectronic systems symposium 2014. MESS14, Vienna, 8\u20139 May 2014, 6 pp."},{"key":"315_CR4","isbn-type":"print","volume-title":"FPGA (Field-Programmable Gate Array) market analysis by application (automotive, consumer electronics, data processing, industrial, military and aerospace, Telecom) and segment forecasts to 2020. May 2014","author":"Grand View Research, Inc.","year":"2014","unstructured":"Grand View Research, Inc. (2014): FPGA (Field-Programmable Gate Array) market analysis by application (automotive, consumer electronics, data processing, industrial, military and aerospace, Telecom) and segment forecasts to 2020. May 2014. San Francisco: Grand View Research Inc. ISBN 978-1-68038-133-7.","ISBN":"http:\/\/id.crossref.org\/isbn\/9781680381337"},{"key":"315_CR5","volume-title":"Proceedings of the 6th international workshop on reconfigurable communication-centric systems-on-chip","author":"J. Grinschgl","year":"2011","unstructured":"Grinschgl, J., et al. (2011): Automatic saboteur placement for emulation-based multi-bit fault injection. In Proceedings of the 6th international workshop on reconfigurable communication-centric systems-on-chip. ReCoSoC, Montpellier, France, 2011, 8 pp."},{"key":"315_CR6","first-page":"525","volume-title":"Proceedings of the 2008 international symposium on parallel and distributed processing with applications","author":"Z. Hongchao","year":"2008","unstructured":"Hongchao, Z., Long, F., Yue, S. (2008): FITVS\u2014A FPGA-based emulation tool for high-efficiency hardness evaluation. In Proceedings of the 2008 international symposium on parallel and distributed processing with applications. ISPA08, Sydney, Australia, 10\u201312 Dec. 2008 (pp. 525\u2013531)."},{"key":"315_CR7","first-page":"89","volume-title":"Proceedings of the 5th southern conference on programmable logic","author":"M. Jeitler","year":"2009","unstructured":"Jeitler, M., Delvai, M., Reich\u00f6r, S. (2009): FuSE\u2014a hardware accelerated HDL fault injection tool. In Proceedings of the 5th southern conference on programmable logic. SPL, Sao Carlos, Brasilia, 1\u20133 April 2009 (pp. 89\u201394)."},{"key":"315_CR8","doi-asserted-by":"crossref","DOI":"10.1017\/CBO9780511816321","volume-title":"Testing of digital systems","author":"N. K. Jha","year":"2003","unstructured":"Jha, N. K., Gupta, S. (2003): Testing of digital systems (8th ed.). Cambridge: Cambridge University Press.","edition":"8"},{"key":"315_CR9","first-page":"267","volume-title":"Proceedings of the 5th IFIP working conference on dependable computing for critical applications","author":"J. Karlsson","year":"1995","unstructured":"Karlsson, J., Arlat, J., Leber, G. (1995): Application of three physical fault injection techniques to the experimental assessment of the MARS architecture. In Proceedings of the 5th IFIP working conference on dependable computing for critical applications. DCCA, Urbana-Champaign, USA, Sept. 1995 (pp. 267\u2013287). Los Alamitos: IEEE Computer Society Press."},{"key":"315_CR10","volume-title":"Fault-tolerance techniques for SRAM-based FPGAs","author":"F. L. Kastensmidt","year":"2006","unstructured":"Kastensmidt, F. L., Carro, L., Reis, R. (2006): Fault-tolerance techniques for SRAM-based FPGAs. Berlin: Springer. 2006."},{"key":"315_CR11","doi-asserted-by":"crossref","first-page":"24","DOI":"10.1109\/DDECS.2010.5491825","volume-title":"Proceedings of the 13th international symposium on design and diagnostics of electronic circuits and systems","author":"U. Legat","year":"2010","unstructured":"Legat, U., Biasizzo, A., Novak, F. (2010): Automated SEU fault emulation using partial FPGA reconfiguration. In Proceedings of the 13th international symposium on design and diagnostics of electronic circuits and systems. DDECS, Vienna, Austria, 14\u201316 April 2010 (pp. 24\u201327)."},{"issue":"4","key":"315_CR12","doi-asserted-by":"crossref","first-page":"2728","DOI":"10.1109\/TNS.2013.2267097","volume":"60","author":"W. Mansour","year":"2013","unstructured":"Mansour, W., Velazco, R. (2013): An automated SEU fault-injection method and tool for HDL-based designs. IEEE Trans. Nucl. Sci., 60(4), 2728\u20132733.","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"315_CR13","doi-asserted-by":"crossref","first-page":"169","DOI":"10.1109\/RADECS.2011.6131392","volume-title":"12th European conference on radiation and its effects on components and systems","author":"J. M. Mogollon","year":"2011","unstructured":"Mogollon, J. M., et al. (2011): FTUNSHADES2: a novel platform for early evaluation of robustness against SEE. In 12th European conference on radiation and its effects on components and systems. RADECS, Sevilla, Spain, 19\u201323 Sept. 2011 (pp. 169\u2013174)."},{"key":"315_CR14","doi-asserted-by":"crossref","first-page":"152","DOI":"10.1109\/DFT.2012.6378216","volume-title":"Proceedings of the 2012 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems","author":"G. L. Nazar","year":"2012","unstructured":"Nazar, G. L., Carro, L. (2012): Fast single-FPGA fault injection platform. In Proceedings of the 2012 IEEE international symposium on defect and fault tolerance in VLSI and nanotechnology systems. DFT, Austin, USA, 3\u20135 Oct. 2012 (pp. 152\u2013157)."},{"key":"315_CR15","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-6993-4","volume-title":"Soft errors in modern electronic systems","author":"M. Nicolaidis","year":"2011","unstructured":"Nicolaidis, M. (2011): Soft errors in modern electronic systems. Berlin: Springer. 2011."},{"key":"315_CR16","first-page":"363","volume-title":"Proceedings of the IEEE international conference on computer design","author":"A. Pellegrini","year":"2008","unstructured":"Pellegrini, A., et al. (2008): CrashTest\u2014a fast high-fidelity FPGA-based resiliency analysis framework. In Proceedings of the IEEE international conference on computer design. ICCD 2008, Lake Tahoe, USA, 12\u201315 Oct. 2008 (pp. 363\u2013370)."},{"key":"315_CR17","unstructured":"Pomarlan, M. (2007): Evaluating the usefulness of USB for real-time robotics applications. Diploma thesis, Politehnica University Timisoara, Romania, 2007."},{"issue":"3","key":"315_CR18","doi-asserted-by":"crossref","first-page":"916","DOI":"10.1109\/TIM.2010.2078351","volume":"60","author":"U. Saranli","year":"2011","unstructured":"Saranli, U., Avci, A., \u00d6zt\u00fcrk, M. C. (2011): A modular real-time fieldbus architecture for mobile robotic platforms. IEEE Trans. Instrum. Meas., 60(3), 916\u2013927. 2011.","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"315_CR19","unstructured":"Snyder, W. (2015): Veripool: website with open-source Verilog and SystemC tools. Last visited 5\/2015. See http:\/\/www.veripool.org\/ ."},{"key":"315_CR20","unstructured":"Xilinx, Inc. (2014): Soft error mitigation controller v4.1. Application note, Document No. PG036, Nov. 19, 2014."}],"container-title":["e & i Elektrotechnik und Informationstechnik"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-015-0315-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00502-015-0315-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-015-0315-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,29]],"date-time":"2019-05-29T12:21:59Z","timestamp":1559132519000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00502-015-0315-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8,13]]},"references-count":20,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2015,9]]}},"alternative-id":["315"],"URL":"https:\/\/doi.org\/10.1007\/s00502-015-0315-4","relation":{},"ISSN":["0932-383X","1613-7620"],"issn-type":[{"value":"0932-383X","type":"print"},{"value":"1613-7620","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,8,13]]}}}