{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T21:42:57Z","timestamp":1648590177408},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2015,8,13]],"date-time":"2015-08-13T00:00:00Z","timestamp":1439424000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Elektrotech. Inftech."],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1007\/s00502-015-0319-0","type":"journal-article","created":{"date-parts":[[2015,8,12]],"date-time":"2015-08-12T05:02:19Z","timestamp":1439355739000},"page":"301-306","update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Building reliable systems-on-chip in nanoscale technologies"],"prefix":"10.1007","volume":"132","author":[{"given":"Andreas","family":"Steininger","sequence":"first","affiliation":[]},{"given":"Horst","family":"Zimmermann","sequence":"additional","affiliation":[]},{"given":"Axel","family":"Jantsch","sequence":"additional","affiliation":[]},{"given":"Michael","family":"Hofbauer","sequence":"additional","affiliation":[]},{"given":"Ulrich","family":"Schmid","sequence":"additional","affiliation":[]},{"given":"Kurt","family":"Schweiger","sequence":"additional","affiliation":[]},{"given":"Varadan","family":"Savulimedu\u00a0Veeravalli","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2015,8,13]]},"reference":[{"key":"319_CR1","first-page":"5B.4.1","volume-title":"Proc. IEEE international reliability physics symposium","author":"A. Dixit","year":"2011","unstructured":"Dixit, A., Wood, A. (2011): The impact of new technology on soft error rates. In Proc. IEEE international reliability physics symposium, IRPS\u201911, April (pp. 5B.4.1\u20135B.4.7)."},{"issue":"3","key":"319_CR2","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1109\/TDMR.2005.853449","volume":"5","author":"R. Baumann","year":"2005","unstructured":"Baumann, R. (2005): Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans. Device Mater. Reliab., 5(3), 305\u2013316.","journal-title":"IEEE Trans. Device Mater. Reliab."},{"key":"319_CR3","first-page":"8","volume-title":"Proceedings 15th Euromicro symposium on digital system design: architectures, methods and tools","author":"V. S. Veeravalli","year":"2012","unstructured":"Veeravalli, V. S., Polzer, T., Steininger, A., Schmid, U. (2012): Architecture and design analysis of a digital single event transient\/upset measurement chip. In Proceedings 15th Euromicro symposium on digital system design: architectures, methods and tools, DSD\u201912, Sep. (pp. 8\u201317)."},{"key":"319_CR4","doi-asserted-by":"crossref","first-page":"772","DOI":"10.1016\/j.micpro.2013.04.011","volume":"37","author":"V. S. Veeravalli","year":"2013","unstructured":"Veeravalli, V. S., Polzer, T., Schmid, U., Steininger, A., Hofbauer, M., Schweiger, K., Dietrich, H., Schneider-Hornstein, K., Zimmermann, H., Voss, K., Merk, B., Hajek, M. (2013): An infrastructure for accurate characterization of single-event transients in digital circuits. Microprocess. Microsyst., 37, 772\u2013791.","journal-title":"Microprocess. Microsyst."},{"key":"319_CR5","doi-asserted-by":"crossref","first-page":"2640","DOI":"10.1109\/TNS.2013.2245679","volume":"60","author":"M. Hofbauer","year":"2013","unstructured":"Hofbauer, M., Schweiger, K., Zimmermann, H., Giesen, U., Langner, F., Schmid, U., Steininger, A. (2013): Supply voltage dependent on-chip single-event transient pulse shape measurements in 90 nm bulk CMOS under alpha irradiation. IEEE Trans. Nucl. Sci., 60, 2640\u20132646.","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"319_CR6","doi-asserted-by":"crossref","first-page":"2778","DOI":"10.1109\/TNS.2012.2223233","volume":"59","author":"M. Hofbauer","year":"2012","unstructured":"Hofbauer, M., Schweiger, K., Dietrich, H., Zimmermann, H., Voss, K. O., Merk, B., Schmid, U., Steininger, A. (2012): Pulse shape measurements by on-chip sense amplifiers of single event transients propagating through a 90\u00a0nm bulk CMOS inverter chain. IEEE Trans. Nucl. Sci., 59, 2778\u20132784.","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"319_CR7","isbn-type":"print","volume-title":"15th international symposium & exhibit on quality electronic design","author":"V. S. Veeravalli","year":"2014","unstructured":"Veeravalli, V. S., Steininger, A., Schmid, U. (2014): Measuring SET pulsewidths in logic gates using digital infrastructure. In 15th international symposium & exhibit on quality electronic design. ISBN 978-1-4799-3946-6. 7 pp.","ISBN":"http:\/\/id.crossref.org\/isbn\/9781479939466"},{"key":"319_CR8","volume-title":"2012 single event effects symposium","author":"V. S. Veeravalli","year":"2012","unstructured":"Veeravalli, V. S., Steininger, A. (2012): Efficient radiation-hardening of a Muller C-element. In 2012 single event effects symposium, SEE 2012."},{"key":"319_CR9","first-page":"115","volume-title":"15th IEEE international conference on design and diagnostics of electronic circuits and systems","author":"V. S. Veeravalli","year":"2012","unstructured":"Veeravalli, V. S., Steininger, A. (2012): Radiation-tolerant combinational gates\u2014an implementation based comparison. In 15th IEEE international conference on design and diagnostics of electronic circuits and systems, DDECS 2012 (pp. 115\u2013120)."},{"key":"319_CR10","volume-title":"2013 IEEE aerospace conference","author":"V. S. Veeravalli","year":"2013","unstructured":"Veeravalli, V. S., Steininger, A. (2013): Performance of radiation hardening techniques under voltage and temperature variations. In 2013 IEEE aerospace conference, 6\u00a0pp."},{"key":"319_CR11","volume-title":"2nd workshop on manufacturable and dependable multicore architectures at nanoscale","author":"R. Najvirt","year":"2013","unstructured":"Najvirt, R., Veeravalli, V. S., Steininger, A. (2013): Particle strikes in C-gates: relevance of SET shapes. In 2nd workshop on manufacturable and dependable multicore architectures at nanoscale, 4 pp."},{"key":"319_CR12","isbn-type":"print","volume-title":"32nd IEEE international conference on computer design","author":"A. Steininger","year":"2014","unstructured":"Steininger, A., Veeravalli, V. S., Alexandrescu, D., Costenaro, E., Anghel, L. (2014): Exploring the state dependent SET sensitivity of asynchronous logic\u2014the Muller-pipeline example. In 32nd IEEE international conference on computer design, ICCD 2014. ISBN 978-1-4799-6492-5. Paper-Nr. 69, 7 pp.","ISBN":"http:\/\/id.crossref.org\/isbn\/9781479964925"},{"issue":"6","key":"319_CR13","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1109\/MM.2005.110","volume":"25","author":"S. Borkar","year":"2005","unstructured":"Borkar, S. (2005): Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE MICRO, 25(6), 10\u201316.","journal-title":"IEEE MICRO"},{"issue":"8","key":"319_CR14","doi-asserted-by":"crossref","first-page":"2197","DOI":"10.1109\/TED.2011.2121913","volume":"58","author":"K. J. Kuhn","year":"2011","unstructured":"Kuhn, K. J., Giles, M. D., Becher, D., Kolar, P., Kornfeld, A., Kotlyar, R., Ma, S. T., Maheshwari, A., Mudanai, S. (2011): Process technology variation. IEEE Trans. Electron Devices, 58(8), 2197\u20132208. doi: 10.1109\/TED.2011.2121913 , 0018-9383.","journal-title":"IEEE Trans. Electron Devices"},{"issue":"5","key":"319_CR15","doi-asserted-by":"crossref","first-page":"26","DOI":"10.1109\/MSPEC.2011.5753241","volume":"48","author":"J. Keane","year":"2011","unstructured":"Keane, J., Kim, C. (2011): An odometer for CPUs. IEEE Spectr., 48(5), 26\u201331.","journal-title":"IEEE Spectr."},{"issue":"1","key":"319_CR16","doi-asserted-by":"crossref","first-page":"8:1","DOI":"10.1145\/2522968.2522976","volume":"46","author":"M. Radetzki","year":"2013","unstructured":"Radetzki, M., Feng, C., Zhao, X., Jantsch, A. (2013): Methods for fault tolerance in networks-on-chip. ACM Comput. Surv., 46(1), 8:1\u20138:38. doi: 10.1145\/2522968.2522976 .","journal-title":"ACM Comput. Surv."},{"key":"319_CR17","volume-title":"Routing algorithms in networks-on-chip","year":"2014","unstructured":"Palesi, M., Daneshtalab, M. (Eds.) (2014): Routing algorithms in networks-on-chip. Berlin: Springer."},{"key":"319_CR18","volume-title":"International SOC conference","author":"C. Feng","year":"2010","unstructured":"Feng, C., Lu, Z., Jantsch, A., Li, J., Zhang, M. (2010): FoN: fault-on-neighbor aware routing algorithm for networks-on-chip. In International SOC conference, Las Vegas, Nevada, September."},{"key":"319_CR19","volume-title":"Proceedings of the international workshop on network on chip architectures","author":"C. Feng","year":"2010","unstructured":"Feng, C., Lu, Z., Jantsch, A., Li, J., Zhang, M. (2010): A reconfigurable fault-tolerant deflection routing algorithm based on reinforcement learning for networks-on-chip. In Proceedings of the international workshop on network on chip architectures, NoCArc, Atlanta, Gorgia, November."},{"issue":"6","key":"319_CR20","doi-asserted-by":"crossref","first-page":"1053","DOI":"10.1109\/TVLSI.2012.2204909","volume":"21","author":"C. Feng","year":"2013","unstructured":"Feng, C., Lu, Z., Jantsch, A., Zhang, M., Xing, Z. (2013): Addressing transient and permanent faults in NoC with efficient fault-tolerant deflection router. IEEE Trans. Very Large Scale Integr. (VLSI) Syst., 21(6), 1053\u20131066.","journal-title":"IEEE Trans. Very Large Scale Integr. (VLSI) Syst."}],"container-title":["e & i Elektrotechnik und Informationstechnik"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-015-0319-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00502-015-0319-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00502-015-0319-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,29]],"date-time":"2019-05-29T08:21:59Z","timestamp":1559118119000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00502-015-0319-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,8,13]]},"references-count":20,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2015,9]]}},"alternative-id":["319"],"URL":"https:\/\/doi.org\/10.1007\/s00502-015-0319-0","relation":{},"ISSN":["0932-383X","1613-7620"],"issn-type":[{"value":"0932-383X","type":"print"},{"value":"1613-7620","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,8,13]]}}}