{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:59:00Z","timestamp":1780675140307,"version":"3.54.1"},"reference-count":24,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2004,11,17]],"date-time":"2004-11-17T00:00:00Z","timestamp":1100649600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Neural Comput & Applic"],"published-print":{"date-parts":[[2004,12]]},"DOI":"10.1007\/s00521-004-0423-2","type":"journal-article","created":{"date-parts":[[2004,11,16]],"date-time":"2004-11-16T14:18:05Z","timestamp":1100614685000},"page":"288-298","source":"Crossref","is-referenced-by-count":31,"title":["Neural network-based analog fault diagnosis using testability analysis"],"prefix":"10.1007","volume":"13","author":[{"given":"Barbara","family":"Cannas","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alessandra","family":"Fanni","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stefano","family":"Manetti","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Augusto","family":"Montisci","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maria Cristina","family":"Piccirilli","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2004,11,17]]},"reference":[{"key":"CR1","doi-asserted-by":"crossref","unstructured":"Liu RW (1991) Testing and diagnosis of analog circuits and systems. Van Nostrand Reinhold, New York","DOI":"10.1007\/978-1-4615-9747-6"},{"key":"CR2","doi-asserted-by":"crossref","first-page":"1279","DOI":"10.1109\/PROC.1985.13281","volume":"73","author":"Bandler","year":"1985","unstructured":"Bandler JW, Salama AE (1985) Fault diagnosis of analog circuits. P IEEE 73:1279?1325","journal-title":"P IEEE"},{"key":"CR3","doi-asserted-by":"crossref","first-page":"487","DOI":"10.1002\/cta.187","volume":"30","author":"Liu","year":"2002","unstructured":"Liu D, Starzyk JA (2002) A generalized fault diagnosis method in dynamic analog circuits. Int J Circ Theor App 30:487?510","journal-title":"Int J Circ Theor App"},{"key":"CR4","doi-asserted-by":"crossref","unstructured":"Spina R, Upadhyaya S (1997) Linear circuit fault diagnosis using neuromorphic analyzers. IEEE T Circuits?II 44:188?196","DOI":"10.1109\/82.558453"},{"key":"CR5","doi-asserted-by":"crossref","unstructured":"Aminian M, Aminian F (2000) Neural network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE T Circuits?II 47:151?156","DOI":"10.1109\/82.823545"},{"key":"CR6","doi-asserted-by":"crossref","first-page":"544","DOI":"10.1109\/TIM.2002.1017726","volume":"51","author":"Aminian","year":"2002","unstructured":"Aminian F, Aminian M, Collin HW (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE T Instrum Meas 51:544?550","journal-title":"IEEE T Instrum Meas"},{"key":"CR7","doi-asserted-by":"crossref","first-page":"196","DOI":"10.1109\/19.997811","volume":"51","author":"Catelani","year":"2002","unstructured":"Catelani M, Fort A (2002) Soft fault detection and isolation in analog circuits: some results and a comparison between a fuzzy approach and radial basis function networks. IEEE T Instrum Meas 51:196?202","journal-title":"IEEE T Instrum Meas"},{"key":"CR8","doi-asserted-by":"crossref","first-page":"1116","DOI":"10.1109\/TIM.2002.806004","volume":"51","author":"Alippi","year":"2002","unstructured":"Alippi C, Catelani M, Fort A, Mugnaini M (2002) SBT soft fault diagnosis in analog electronic circuits: a sensitivity-based approach by randomized algorithms. IEEE T Instrum Meas 51:1116?1125","journal-title":"IEEE T Instrum Meas"},{"key":"CR9","doi-asserted-by":"crossref","unstructured":"Alippi C, Catelani M, Fort A, Mugnaini M (2003) Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison. In: Proc 20th IEEE Instrumentation and Measurement Technology Conf, Vail, CO, 20?22 May, 2003, pp 60?64","DOI":"10.1109\/IMTC.2003.1208122"},{"key":"CR10","doi-asserted-by":"crossref","first-page":"457","DOI":"10.1109\/TCS.1979.1084659","volume":"26","author":"Sen","year":"1979","unstructured":"Sen N, Saeks R (1979) Fault diagnosis for linear systems via multifrequency measurement. IEEE T Circuits Syst 26:457?465","journal-title":"IEEE T Circuits Syst"},{"key":"CR11","doi-asserted-by":"crossref","first-page":"589","DOI":"10.1109\/TCS.1979.1084657","volume":"26","author":"Chen","year":"1979","unstructured":"Chen H, Saeks R (1979) A search algorithm for the solution of multifrequency fault diagnosis equations. IEEE T Circuits Syst 26:589?594","journal-title":"IEEE T Circuits Syst"},{"key":"CR12","doi-asserted-by":"crossref","unstructured":"Fedi G, Manetti S, Piccirilli MC, Starzyk J (1999) Determination of an optimum set of testable components in the fault diagnosis of analog linear circuit. IEEE T Circuits?I 46:779?787","DOI":"10.1109\/81.774222"},{"key":"CR13","unstructured":"Duda RO, Hart PE (1973) Pattern classification and scene analysis. Wiley, New York"},{"key":"CR14","doi-asserted-by":"crossref","first-page":"169","DOI":"10.1023\/A:1008376430315","volume":"11","author":"Fanni","year":"1999","unstructured":"Fanni A, Giua A, Marchesi M, Montisci A (1999) A neural network diagnosis approach for analog circuits. Appl Intell 11:169?186","journal-title":"Appl Intell"},{"key":"CR15","unstructured":"Dague Ph, Jehl O, Deves Ph, Luciani P, Taillibert P (1991) When oscillators stop oscillating. In: Proc 12th Int Joint Conf on Artificial Intelligence, Sydney, Australia, 24?30 August 1991, pp 1109?1115"},{"key":"CR16","unstructured":"Kirkland LV, Dean JS (1994) Monitoring power supply current and using a neural network routine to diagnose circuit faults. AUTOTESTCON?94, Anaheim, CA, 20?22 September 1994, pp 649?651"},{"key":"CR17","doi-asserted-by":"crossref","unstructured":"Spence HF, Burris DP, Lopez J, Houston RA (1991) An artificial neural network printed circuit board diagnostic system based on infrared energy emission. AUTOTESTCON?91 Anheim, CA, 24?26 September 1991, pp 41?45","DOI":"10.1109\/AUTEST.1991.197528"},{"key":"CR18","doi-asserted-by":"crossref","first-page":"20","DOI":"10.1109\/62.260037","volume":"9","author":"Spence","year":"1994","unstructured":"Spence HF (1994) Printed circuit board diagnosis using artificial neural networks and circuit magnetic fields. IEEE Aero El Sys Mag 9:20?24","journal-title":"IEEE Aero El Sys Mag"},{"key":"CR19","unstructured":"The Mathworks, Inc. (2004) Matlab user?s guide, Rel 13. The Mathworks, Inc., Natick, MA"},{"key":"CR20","doi-asserted-by":"crossref","unstructured":"Meador J, Wu A, Tseng CT, Lin TS (1991) Fast diagnosis of integrated circuit faults using feedforward neural networks. In: IEEE Int Joint Conf on Neural Networks, Seattle, WA, 18?21 November 1991, pp 269?273","DOI":"10.1109\/IJCNN.1991.155188"},{"key":"CR21","doi-asserted-by":"crossref","unstructured":"Rutkowsky G (1992) A neural network approach to fault location in non linear DC circuits. In: 3rd Int Conf on Artificial Neural Networks, Brighton, UK, 4?7 September 1992, pp 1123?1126","DOI":"10.1016\/B978-0-444-89488-5.50062-2"},{"key":"CR22","doi-asserted-by":"crossref","first-page":"97","DOI":"10.1109\/TIM.2003.809075","volume":"52","author":"Czaja","year":"2003","unstructured":"Czaja Z, Zielonko R (2003) Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces. IEEE T Instrum Meas 52:97?102","journal-title":"IEEE T Instrum Meas"},{"key":"CR23","doi-asserted-by":"crossref","unstructured":"Liberatore A, Manetti S, Piccirilli MC (1994) A new efficient method for analog circuit testability measurement. In: IEEE Instrumentation and Measurements Technology Conf (IMTC), Hamamatsu, Japan, 10?12 May 1994, pp 193?196","DOI":"10.1109\/IMTC.1994.352094"},{"key":"CR24","doi-asserted-by":"crossref","unstructured":"Manetti S, Piccirilli MC (2003) A singular-value decomposition approach for ambiguity group determination in analog circuits. IEEE T Circuit?I 50:477?487","DOI":"10.1109\/TCSI.2003.809811"}],"container-title":["Neural Computing and Applications"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-004-0423-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s00521-004-0423-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-004-0423-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,4,4]],"date-time":"2020-04-04T03:38:32Z","timestamp":1585971512000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s00521-004-0423-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,11,17]]},"references-count":24,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2004,12]]}},"alternative-id":["423"],"URL":"https:\/\/doi.org\/10.1007\/s00521-004-0423-2","relation":{},"ISSN":["0941-0643","1433-3058"],"issn-type":[{"value":"0941-0643","type":"print"},{"value":"1433-3058","type":"electronic"}],"subject":[],"published":{"date-parts":[[2004,11,17]]}}}