{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T19:17:59Z","timestamp":1773688679444,"version":"3.50.1"},"reference-count":32,"publisher":"Springer Science and Business Media LLC","issue":"16","license":[{"start":{"date-parts":[[2021,2,20]],"date-time":"2021-02-20T00:00:00Z","timestamp":1613779200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,2,20]],"date-time":"2021-02-20T00:00:00Z","timestamp":1613779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Neural Comput & Applic"],"published-print":{"date-parts":[[2021,8]]},"DOI":"10.1007\/s00521-021-05810-4","type":"journal-article","created":{"date-parts":[[2021,2,20]],"date-time":"2021-02-20T16:28:11Z","timestamp":1613838491000},"page":"10537-10550","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":17,"title":["A novel fault diagnosis method for analog circuits with noise immunity and generalization ability"],"prefix":"10.1007","volume":"33","author":[{"given":"Tianyu","family":"Gao","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4865-0339","authenticated-orcid":false,"given":"Jingli","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Shouda","family":"Jiang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2021,2,20]]},"reference":[{"key":"5810_CR1","doi-asserted-by":"publisher","first-page":"104708","DOI":"10.1063\/1.5120560","volume":"90","author":"T Gao","year":"2019","unstructured":"Gao T, Yang J, Jiang S, Yang C (2019) A novel fault diagnostic method for analog circuits using frequency response features. Rev Sci Instrum 90:104708","journal-title":"Rev Sci Instrum"},{"key":"5810_CR2","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TIM.2018.2836058","volume":"68","author":"D Binu","year":"2019","unstructured":"Binu D, Shida KBS (2019) RideNN: a new rider optimization algorithm-based neural network for fault diagnosis in analog circuits. IEEE Trans Instrum Meas 68:2\u201326","journal-title":"IEEE Trans Instrum Meas"},{"key":"5810_CR3","doi-asserted-by":"publisher","first-page":"813","DOI":"10.1109\/TIM.2013.2289074","volume":"63","author":"C Yang","year":"2014","unstructured":"Yang C, Yang J, Liu Z, Tian S (2014) Complex field fault modeling-based optimal frequency selection in linear analog circuit fault diagnosis. IEEE Trans Instrum Meas 63:813\u2013825","journal-title":"IEEE Trans Instrum Meas"},{"key":"5810_CR4","doi-asserted-by":"publisher","first-page":"328","DOI":"10.1109\/TIM.2017.2775438","volume":"67","author":"M Tadeusiewicz","year":"2018","unstructured":"Tadeusiewicz M, Halgas S (2018) A method for local parametric fault diagnosis of a broad class of analog integrated circuits. IEEE Trans Instrum Meas 67:328\u2013337","journal-title":"IEEE Trans Instrum Meas"},{"key":"5810_CR5","doi-asserted-by":"publisher","first-page":"54969","DOI":"10.1109\/ACCESS.2019.2913049","volume":"7","author":"C Yang","year":"2019","unstructured":"Yang C, Liu Z, Hu C (2019) Fault diagnosis of analog filter circuit based on genetic algorithm. IEEE Access 7:54969\u201354980","journal-title":"IEEE Access"},{"key":"5810_CR6","doi-asserted-by":"publisher","first-page":"1957","DOI":"10.1109\/TIM.2014.2302236","volume":"63","author":"Z Li","year":"2014","unstructured":"Li Z (2014) A novel fault diagnostic method based on node-voltage vector ambiguity sets. IEEE Trans Instrum Meas 63:1957\u20131965","journal-title":"IEEE Trans Instrum Meas"},{"key":"5810_CR7","doi-asserted-by":"publisher","first-page":"26","DOI":"10.1016\/j.measurement.2015.11.041","volume":"81","author":"H Luo","year":"2016","unstructured":"Luo H, Lu W, Wang Y, Wang L, Zhao X (2016) A novel approach for analog fault diagnosis based on stochastic signal analysis and improved GHMM. Measurement 81:26\u201335","journal-title":"Measurement"},{"key":"5810_CR8","doi-asserted-by":"publisher","first-page":"586","DOI":"10.1109\/TIM.2009.2025068","volume":"59","author":"L Yuan","year":"2010","unstructured":"Yuan L, He Y, Huang J, Sun Y (2010) A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans Instrum Meas 59:586\u2013595","journal-title":"IEEE Trans Instrum Meas"},{"key":"5810_CR9","doi-asserted-by":"crossref","unstructured":"Xiong J, Tian S, Yang C (2016) Fault diagnosis for analog circuits by using eemd, relative entropy, and ELM. Comput Intelli Neurosci 7657054","DOI":"10.1155\/2016\/7657054"},{"key":"5810_CR10","doi-asserted-by":"publisher","first-page":"527","DOI":"10.1007\/s10470-018-1362-7","volume":"98","author":"SM Shokrolahi","year":"2019","unstructured":"Shokrolahi SM, Kazempour ATN (2019) A novel approach for fault detection of analog circuit by using improved EEMD. Analog Integr Circ Sig Process 98:527\u2013534","journal-title":"Analog Integr Circ Sig Process"},{"key":"5810_CR11","doi-asserted-by":"publisher","first-page":"92517","DOI":"10.1109\/ACCESS.2019.2923242","volume":"7","author":"X Gan","year":"2019","unstructured":"Gan X, Qu H, Meng X, Wang C, Zhu J (2019) Research on ELM soft fault diagnosis of analog circuit based on KSLPP feature extraction. IEEE Access 7:92517\u201392527","journal-title":"IEEE Access"},{"key":"5810_CR12","doi-asserted-by":"publisher","first-page":"697","DOI":"10.1007\/s10836-017-5697-2","volume":"33","author":"Z Yuan","year":"2017","unstructured":"Yuan Z, He Y, Yuan L, Cheng Z (2017) A diagnostics method for analog circuits based on improved kernel entropy component analysis. J Electron Test Theory Appl 33:697\u2013707","journal-title":"J Electron Test Theory Appl"},{"key":"5810_CR13","doi-asserted-by":"publisher","first-page":"291","DOI":"10.1007\/s10836-011-5275-y","volume":"28","author":"B Long","year":"2012","unstructured":"Long B, Tian S, Wang H (2012) Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features. J Electron Test Theory Appl 28:291\u2013300","journal-title":"J Electron Test Theory Appl"},{"key":"5810_CR14","doi-asserted-by":"publisher","first-page":"681","DOI":"10.1007\/s10836-016-5623-z","volume":"32","author":"Z Hu","year":"2016","unstructured":"Hu Z, Xiao M, Zhang L, Liu S, Ge Y (2016) Mahalanobis distance based approach for anomaly detection of analog filters using frequency features and parzen window density estimation. J Electron Test Theory Appl 32:681\u2013693","journal-title":"J Electron Test Theory Appl"},{"key":"5810_CR15","doi-asserted-by":"publisher","first-page":"318","DOI":"10.1049\/iet-smt.2018.5432","volume":"13","author":"W He","year":"2019","unstructured":"He W, He Y, Li B, Zhang C (2019) Feature extraction of analogue circuit fault signals via cross-wavelet transform and variational Bayesian matrix factorisation. IET Sci Meas Technol 13:318\u2013327","journal-title":"IET Sci Meas Technol"},{"key":"5810_CR16","doi-asserted-by":"publisher","first-page":"23053","DOI":"10.1109\/ACCESS.2018.2823765","volume":"6","author":"C Zhang","year":"2018","unstructured":"Zhang C, He Y, Yuan L, Xiang S (2018) Analog circuit incipient fault diagnosis method using DBN based features extraction. IEEE Access 6:23053\u201323064","journal-title":"IEEE Access"},{"key":"5810_CR17","doi-asserted-by":"publisher","first-page":"170","DOI":"10.1016\/j.measurement.2018.02.044","volume":"121","author":"G Zhao","year":"2018","unstructured":"Zhao G, Liu X, Zhang B, Liu Y, Niu G, Hu C (2018) A novel approach for analog circuit fault diagnosis based on deep belief network. Measurement 121:170\u2013178","journal-title":"Measurement"},{"key":"5810_CR18","doi-asserted-by":"publisher","first-page":"252","DOI":"10.1016\/j.asoc.2016.11.012","volume":"50","author":"X Gan","year":"2017","unstructured":"Gan X, Gao W, Dai Z, Liu W (2017) Research on WNN soft fault diagnosis for analog circuit based on adaptive UKF algorithm. Appl Soft Comput 50:252\u2013259","journal-title":"Appl Soft Comput"},{"key":"5810_CR19","doi-asserted-by":"publisher","first-page":"228","DOI":"10.3390\/sym11020228","volume":"11","author":"L Wang","year":"2019","unstructured":"Wang L, Zhou D, Tian H, Zhang H, Zhang W (2019) Parametric fault diagnosis of analog circuits based on a semi-supervised algorithm. Symmetry Basel 11:228","journal-title":"Symmetry Basel"},{"key":"5810_CR20","first-page":"2485","volume":"13","author":"Y Wang","year":"2018","unstructured":"Wang Y, Ma Y, Cui S, Yan Y (2018) A novel approach of feature extraction for analog circuit fault diagnosis based on WPD-LLE-CSA. J Electron Eng Technol 13:2485\u20132492","journal-title":"J Electron Eng Technol"},{"key":"5810_CR21","doi-asserted-by":"publisher","first-page":"297","DOI":"10.1016\/j.measurement.2011.11.018","volume":"45","author":"Y Xiao","year":"2012","unstructured":"Xiao Y, Feng L (2012) A novel linear ridgelet network approach for analog fault diagnosis using wavelet-based fractal analysis and kernel PCA as preprocessors. Measurement 45:297\u2013310","journal-title":"Measurement"},{"key":"5810_CR22","doi-asserted-by":"publisher","first-page":"2251","DOI":"10.1007\/s11432-010-4077-7","volume":"53","author":"Y Xiao","year":"2010","unstructured":"Xiao Y, He Y (2010) A linear ridgelet network approach for fault diagnosis of analog circuit. Sci China Inf Sci 53:2251\u20132264","journal-title":"Sci China Inf Sci"},{"key":"5810_CR23","doi-asserted-by":"crossref","unstructured":"Zhao G, Liu Y, Gao Y, Jiang Z, Hu C (2018) A new approach for analog circuit fault diagnosis based on extreme learning machine. In: Prognostics and system health management conference, pp 196\u2013200","DOI":"10.1109\/PHM-Chongqing.2018.00040"},{"key":"5810_CR24","doi-asserted-by":"publisher","first-page":"045004","DOI":"10.1088\/1361-6501\/aaa33a","volume":"29","author":"W He","year":"2018","unstructured":"He W, He Y, Luo Q, Zhang C (2018) Fault diagnosis for analog circuits utilizing time-frequency features and improved VVRKFA. Meas Sci Technol 29:045004","journal-title":"Meas Sci Technol"},{"key":"5810_CR25","doi-asserted-by":"publisher","first-page":"074702","DOI":"10.1063\/1.5025342","volume":"89","author":"W He","year":"2018","unstructured":"He W, He Y, Zhang C (2018) A new fault diagnosis approach for analog circuits based on spectrum image and feature weighted kernel Fisher discriminant analysis. Rev Sci Instrum 89:074702","journal-title":"Rev Sci Instrum"},{"key":"5810_CR26","doi-asserted-by":"publisher","first-page":"50","DOI":"10.1016\/j.vlsi.2018.08.001","volume":"64","author":"A Arabi","year":"2019","unstructured":"Arabi A, Bourouba N, Belaout A, Ayad M (2019) An accurate classifier based on adaptive neuro-fuzzy and features selection techniques for fault classification in analog circuits. Integeration VLST J 64:50\u201359","journal-title":"Integeration VLST J"},{"key":"5810_CR27","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1007\/s10836-016-5616-y","volume":"32","author":"C Zhang","year":"2016","unstructured":"Zhang C, He Y, Yuan L, He W, Xiang S, Li Z (2016) A novel approach for diagnosis of analog circuit fault by using GMKL-SVM and PSO. J Electron Test Theory Appl 32:531\u2013540","journal-title":"J Electron Test Theory Appl"},{"key":"5810_CR28","doi-asserted-by":"publisher","first-page":"427","DOI":"10.1007\/s10470-016-0721-5","volume":"87","author":"P Song","year":"2016","unstructured":"Song P, He Y, Cui W (2016) Statistical property feature extraction based on FRFT for fault diagnosis of analog circuits. Analog Integr Circ Sig Process 87:427\u2013436","journal-title":"Analog Integr Circ Sig Process"},{"key":"5810_CR29","doi-asserted-by":"publisher","first-page":"191","DOI":"10.1007\/s10064-016-0924-0","volume":"77","author":"N Hoang","year":"2018","unstructured":"Hoang N, Hui D (2018) Predicting earthquake-induced soil liquefaction based on a hybridization of kernel Fisher discriminant analysis and a least squares support vector machine: a multi-dataset study. Bull Eng Geol Environ 77:191\u2013204","journal-title":"Bull Eng Geol Environ"},{"key":"5810_CR30","doi-asserted-by":"publisher","first-page":"2441","DOI":"10.1109\/TIE.2013.2273471","volume":"61","author":"X Jin","year":"2014","unstructured":"Jin X, Zhao M, Chow T, Pecht M (2014) Motor bearing fault diagnosis using trace ratio linear discriminant analysis. IEEE Trans Ind Electron 61:2441\u20132451","journal-title":"IEEE Trans Ind Electron"},{"key":"5810_CR31","doi-asserted-by":"publisher","first-page":"3391","DOI":"10.1016\/j.eswa.2013.11.026","volume":"41","author":"M Zhao","year":"2014","unstructured":"Zhao M, Jin X, Zhang Z, Li B (2014) Fault diagnosis of rolling element bearings via discriminative subspace learning: visualization and classification. Expert Syst Appl 41:3391\u20133401","journal-title":"Expert Syst Appl"},{"key":"5810_CR32","doi-asserted-by":"publisher","first-page":"163","DOI":"10.1016\/j.advengsoft.2017.07.002","volume":"114","author":"S Mirjalili","year":"2017","unstructured":"Mirjalili S, Gandomi A, Mirjalili S, Saremi S, Faris H, Mirjalili S (2017) Salp swarm algorithm: a bio-inspired optimizer for engineering design problems. Adv Eng Softw 114:163\u2013191","journal-title":"Adv Eng Softw"}],"container-title":["Neural Computing and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-021-05810-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00521-021-05810-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-021-05810-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,8]],"date-time":"2021-07-08T07:20:46Z","timestamp":1625728846000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00521-021-05810-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2,20]]},"references-count":32,"journal-issue":{"issue":"16","published-print":{"date-parts":[[2021,8]]}},"alternative-id":["5810"],"URL":"https:\/\/doi.org\/10.1007\/s00521-021-05810-4","relation":{},"ISSN":["0941-0643","1433-3058"],"issn-type":[{"value":"0941-0643","type":"print"},{"value":"1433-3058","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,2,20]]},"assertion":[{"value":"8 May 2020","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"5 February 2021","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"20 February 2021","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Compliance with ethical standards"}},{"value":"The authors declare that they have no conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}