{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,9]],"date-time":"2026-05-09T07:23:18Z","timestamp":1778311398545,"version":"3.51.4"},"reference-count":62,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2021,10,29]],"date-time":"2021-10-29T00:00:00Z","timestamp":1635465600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"},{"start":{"date-parts":[[2021,10,29]],"date-time":"2021-10-29T00:00:00Z","timestamp":1635465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springer.com\/tdm"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71777173"],"award-info":[{"award-number":["71777173"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Neural Comput & Applic"],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1007\/s00521-021-06575-6","type":"journal-article","created":{"date-parts":[[2021,10,29]],"date-time":"2021-10-29T13:03:54Z","timestamp":1635512634000},"page":"4343-4366","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["Sparse one-dimensional convolutional neural network-based feature learning for fault detection and diagnosis in multivariable manufacturing processes"],"prefix":"10.1007","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3204-2486","authenticated-orcid":false,"given":"Jianbo","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chengyi","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shijin","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2021,10,29]]},"reference":[{"key":"6575_CR1","doi-asserted-by":"crossref","first-page":"443","DOI":"10.1002\/qre.1064","volume":"26","author":"VK Butte","year":"2010","unstructured":"Butte VK, Tang LC (2010) Multivariate charting techniques: a review and a line-column approach. Qual Reliab Eng Int 26:443\u2013451","journal-title":"Qual Reliab Eng Int"},{"key":"6575_CR2","doi-asserted-by":"crossref","first-page":"3085","DOI":"10.1007\/s00521-020-05171-4","volume":"33","author":"J Yu","year":"2021","unstructured":"Yu J, Zhang C, Wang S (2021) Multichannel one-dimensional convolutional neural network-based feature learning for fault diagnosis of industrial processes. Neural Comput Appl 33:3085\u20133104","journal-title":"Neural Comput Appl"},{"key":"6575_CR3","doi-asserted-by":"crossref","first-page":"603","DOI":"10.1016\/j.cie.2017.12.006","volume":"115","author":"FAP Peres","year":"2018","unstructured":"Peres FAP, Fogliatto FS (2018) Variable selection methods in multivariate statistical process control: a systematic literature review. Comput Ind Eng 115:603\u2013619","journal-title":"Comput Ind Eng"},{"key":"6575_CR4","doi-asserted-by":"crossref","first-page":"75","DOI":"10.1016\/j.jprocont.2016.08.006","volume":"46","author":"Q Jiang","year":"2016","unstructured":"Jiang Q, Huang B (2016) Distributed monitoring for large-scale processes based on multivariate statistical analysis and Bayesian method. J Process Control 46:75\u201383","journal-title":"J Process Control"},{"key":"6575_CR5","doi-asserted-by":"crossref","first-page":"140","DOI":"10.1016\/j.cie.2015.05.012","volume":"87","author":"JMB de L\u00e1zaro","year":"2015","unstructured":"de L\u00e1zaro JMB, Moreno AP, Santiago OL, da Silva Neto AJ (2015) Optimizing kernel methods to reduce dimensionality in fault diagnosis of industrial systems. Comput Ind Eng 87:140\u2013149","journal-title":"Comput Ind Eng"},{"key":"6575_CR6","doi-asserted-by":"crossref","first-page":"188","DOI":"10.1016\/j.cie.2016.01.021","volume":"94","author":"B Wang","year":"2016","unstructured":"Wang B, Yan X, Jiang Q (2016) Independent component analysis model utilizing de-mixing information for improved non-Gaussian process monitoring. Comput Ind Eng 94:188\u2013200","journal-title":"Comput Ind Eng"},{"key":"6575_CR7","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1016\/j.jprocont.2021.02.007","volume":"100","author":"L Luo","year":"2021","unstructured":"Luo L, Peng X, Tong C (2021) A multigroup framework for fault detection and diagnosis in large-scale multivariate systems. J Process Control 100:65\u201379","journal-title":"J Process Control"},{"key":"6575_CR8","doi-asserted-by":"crossref","first-page":"116099","DOI":"10.1016\/j.ces.2020.116099","volume":"229","author":"W Bounoua","year":"2021","unstructured":"Bounoua W, Bakdi A (2021) Fault detection and diagnosis of nonlinear dynamical processes through correlation dimension and fractal analysis based dynamic kernel PCA. Chem Eng Sci 229:116099","journal-title":"Chem Eng Sci"},{"issue":"5","key":"6575_CR9","doi-asserted-by":"crossref","first-page":"467","DOI":"10.1016\/j.jprocont.2003.09.004","volume":"14","author":"JM Lee","year":"2004","unstructured":"Lee JM, Yoo CK, Lee IB (2004) Statistical process monitoring with independent component analysis. J Process Control 14(5):467\u2013485","journal-title":"J Process Control"},{"key":"6575_CR10","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1016\/j.cherd.2015.12.015","volume":"106","author":"Q Jia","year":"2016","unstructured":"Jia Q, Zhang Y (2016) Quality-related fault detection approach based on dynamic kernel partial least squares. Chem Eng Res Des 106:242\u2013252","journal-title":"Chem Eng Res Des"},{"key":"6575_CR11","doi-asserted-by":"crossref","unstructured":"Taqvi SAA, Zabiri H, Tufa LD, Uddin F, Fatima SA, Maulud AS (2021) A Review on data-driven learning approaches for fault detection and diagnosis in chemical processes, ChemBioEng Reviews","DOI":"10.1002\/cben.202000027"},{"issue":"13","key":"6575_CR12","doi-asserted-by":"crossref","first-page":"2975","DOI":"10.1080\/1352816031000075224","volume":"41","author":"RX Sun","year":"2003","unstructured":"Sun RX, Tsung F (2003) A kernel-distance-based multivariate control chart using support vector methods. Int J Prod Res 41(13):2975\u20132989","journal-title":"Int J Prod Res"},{"issue":"4","key":"6575_CR13","doi-asserted-by":"crossref","first-page":"3264","DOI":"10.1016\/j.eswa.2009.09.053","volume":"37","author":"CC Hsu","year":"2010","unstructured":"Hsu CC, Chen MC, Chen LS (2010) Intelligent ICA-SVM fault detector for non-Gaussian multivariate process monitoring. Expert Syst Appl 37(4):3264\u20133273","journal-title":"Expert Syst Appl"},{"issue":"8","key":"6575_CR14","doi-asserted-by":"crossref","first-page":"1389","DOI":"10.1016\/j.compchemeng.2003.10.002","volume":"28","author":"LH Chiang","year":"2004","unstructured":"Chiang LH, Kotanchek ME, Kordon AK (2004) Fault diagnosis based on Fisher discriminant analysis and support vector machines. Comput Chem Eng 28(8):1389\u20131401","journal-title":"Comput Chem Eng"},{"issue":"7","key":"6575_CR15","doi-asserted-by":"crossref","first-page":"1817","DOI":"10.1002\/aic.12392","volume":"57","author":"J Yu","year":"2011","unstructured":"Yu J (2011) Localized Fisher discriminant analysis based complex chemical process monitoring. AIChE J 57(7):1817\u20131828","journal-title":"AIChE J"},{"issue":"4","key":"6575_CR16","doi-asserted-by":"crossref","first-page":"1577","DOI":"10.1016\/j.cie.2008.10.006","volume":"56","author":"SK Gauri","year":"2009","unstructured":"Gauri SK, Chakraborty S (2009) Recognition of control chart patterns using improved selection of features. Comput Ind Eng 56(4):1577\u20131588","journal-title":"Comput Ind Eng"},{"issue":"3","key":"6575_CR17","doi-asserted-by":"crossref","first-page":"857","DOI":"10.1016\/j.ejor.2014.02.032","volume":"237","author":"S Huda","year":"2014","unstructured":"Huda S, Abdollahian M, Mammadov M, Yearwood J, Ahmed S, Sultan I (2014) A hybrid wrapper-filter approach to detect the source(s) of out-of-control signals in multivariate manufacturing process. Eur J Oper Res 237(3):857\u2013870","journal-title":"Eur J Oper Res"},{"issue":"8","key":"6575_CR18","doi-asserted-by":"crossref","first-page":"1798","DOI":"10.1109\/TPAMI.2013.50","volume":"35","author":"Y Bengio","year":"2013","unstructured":"Bengio Y, Courville A, Vincent P (2013) Representation learning: a review and new perspectives. IEEE Trans Pattern Anal Mach Intell 35(8):1798\u20131828","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"6575_CR19","doi-asserted-by":"crossref","first-page":"144","DOI":"10.1016\/j.jmsy.2018.01.003","volume":"48","author":"J Wang","year":"2018","unstructured":"Wang J, Ma Y, Zhang L, Gao RX, Wu D (2018) Deep learning for smart manufacturing: methods and applications. J Manuf Syst 48:144\u2013156","journal-title":"J Manuf Syst"},{"key":"6575_CR20","doi-asserted-by":"crossref","first-page":"6009","DOI":"10.1007\/s00521-019-04085-0","volume":"32","author":"J Yu","year":"2020","unstructured":"Yu J, Liu H, Zheng X (2020) Two-dimensional joint local and nonlocal discriminant analysis-based 2D image feature extraction for deep learning. Neural Comput Appl 32:6009\u20136024","journal-title":"Neural Comput Appl"},{"key":"6575_CR21","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1016\/j.jprocont.2018.02.004","volume":"64","author":"Z Zhang","year":"2018","unstructured":"Zhang Z, Jiang T, Li S, Yang Y (2018) Automated feature learning for nonlinear process monitoring-An approach using stacked denoising autoencoder and k-nearest neighbor rule. J Process Control 64:49\u201361","journal-title":"J Process Control"},{"key":"6575_CR22","doi-asserted-by":"crossref","unstructured":"Ren H, Chai Y, Qu JF, Zhang K, Tang Q (2018) An intelligent fault detection method based on sparse auto-encoder for industrial process systems: a case study on tennessee eastman process chemical system. In: International conference on intelligent human-machine systems and cybernetics, pp 190\u2013193","DOI":"10.1109\/IHMSC.2018.00051"},{"key":"6575_CR23","doi-asserted-by":"crossref","unstructured":"Chen S, Yu J, Wang S (2020) Monitoring of complex profiles based on deep stacked denoising autoencoders. Comput Ind Eng, p 106402","DOI":"10.1016\/j.cie.2020.106402"},{"key":"6575_CR24","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1016\/j.compind.2019.04.015","volume":"109","author":"J Yu","year":"2019","unstructured":"Yu J, Zheng X (2019) Stacked convolutional sparse denoising auto-encoder for identification of defect patterns in semiconductor wafer map. Comput Ind 109:121\u2013133","journal-title":"Comput Ind"},{"issue":"8","key":"6575_CR25","doi-asserted-by":"crossref","first-page":"3085","DOI":"10.1007\/s00521-020-05171-4","volume":"33","author":"X Liu","year":"2021","unstructured":"Liu X, Jianbo Yu, Ye L (2021) Residual attention convolutional auto-encoder for feature learning and fault detection in nonlinear industrial processes. Neural Comput Appl 33(8):3085\u20133104","journal-title":"Neural Comput Appl"},{"issue":"45","key":"6575_CR26","first-page":"15479","volume":"57","author":"JB Yu","year":"2018","unstructured":"Yu JB, Yan X (2018) Layer-by-Layer enhancement strategy of favorable features of the deep belief network for industrial process monitoring. Ind Eng Chem Res 57(45):15479\u201315490","journal-title":"Ind Eng Chem Res"},{"key":"6575_CR27","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.07.001","author":"Y Wang","year":"2019","unstructured":"Wang Y, Pan Z, Yuan X, Yang C, Gui W (2019) A novel deep learning based fault diagnosis approach for chemical process with extended deep belief network. ISA Trans. https:\/\/doi.org\/10.1016\/j.isatra.2019.07.001","journal-title":"ISA Trans"},{"key":"6575_CR28","doi-asserted-by":"crossref","first-page":"287","DOI":"10.1016\/j.compind.2018.04.002","volume":"100","author":"G Hu","year":"2018","unstructured":"Hu G, Li H, Xia Y, Luo L (2018) A deep Boltzmann machine and multi-grained scanning forest ensemble collaborative method and its application to industrial fault diagnosis. Comput Ind 100:287\u2013296","journal-title":"Comput Ind"},{"key":"6575_CR29","unstructured":"LeCun Y, Bengio Y (1995) Convolutional networks for images, speech, and time series, Handb Brain Theory Neural Netw, 3361(10): 1995"},{"key":"6575_CR30","unstructured":"Ciresan DC, Meier U, Masci J, Gambardella LM, Schmidhuber J (2011) Flexible, high performance convolutional neural networks for image classification. In: Twenty-second international joint conference on artificial intelligence. pp 1237\u20131242."},{"key":"6575_CR31","doi-asserted-by":"crossref","unstructured":"Hershey S, Chaudhuri S, Ellis DPW, Gemmeke JF, Jansen A, Moore RC, Plakal M, Platt D, Saurous RA, Seybold B, Slaney M, Weiss RJ, Wilson K (2017) CNN architectures for large-scale audio classification. In: 2017 IEEE international conference on acoustics, speech and signal processing (icassp). IEEE pp 131\u2013135","DOI":"10.1109\/ICASSP.2017.7952132"},{"issue":"2","key":"6575_CR32","doi-asserted-by":"crossref","first-page":"135","DOI":"10.1109\/TSM.2017.2676245","volume":"30","author":"KB Lee","year":"2017","unstructured":"Lee KB, Cheon S, Kim CO (2017) A convolutional neural network for fault classification and diagnosis in semiconductor manufacturing processes. IEEE Trans Semicond Manuf 30(2):135\u2013142","journal-title":"IEEE Trans Semicond Manuf"},{"key":"6575_CR33","doi-asserted-by":"crossref","first-page":"107172","DOI":"10.1016\/j.compchemeng.2020.107172","volume":"145","author":"X Ge","year":"2021","unstructured":"Ge X, Wang B, Yang X, Pan Y, Liu B, Liu B (2021) Fault detection and diagnosis for reactive distillation based on convolutional neural network. Comput Chem Eng 145:107172","journal-title":"Comput Chem Eng"},{"key":"6575_CR34","doi-asserted-by":"crossref","first-page":"185","DOI":"10.1016\/j.compchemeng.2018.04.009","volume":"115","author":"H Wu","year":"2018","unstructured":"Wu H, Zhao J (2018) Deep convolutional neural network model based chemical process fault diagnosis. Comput Chem Eng 115:185\u2013197","journal-title":"Comput Chem Eng"},{"key":"6575_CR35","doi-asserted-by":"crossref","first-page":"823","DOI":"10.1007\/s10845-020-01591-0","volume":"32","author":"CY Hsu","year":"2021","unstructured":"Hsu CY, Liu WC (2021) Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing. J Intell Manuf 32:823\u2013836","journal-title":"J Intell Manuf"},{"issue":"3","key":"6575_CR36","doi-asserted-by":"crossref","first-page":"664","DOI":"10.1109\/TBME.2015.2468589","volume":"63","author":"S Kiranyaz","year":"2015","unstructured":"Kiranyaz S, Ince T, Gabbouj M (2015) Real-time patient-specific ECG classification by 1-D convolutional neural networks. IEEE Trans Biomed Eng 63(3):664\u2013675","journal-title":"IEEE Trans Biomed Eng"},{"key":"6575_CR37","doi-asserted-by":"crossref","unstructured":"Chen S, Yu J, Wang S (2021) One-dimensional convolutional neural network-based active feature extraction for fault detection and diagnosis of industrial processes and its understanding via visualization, ISA transactions","DOI":"10.1016\/j.isatra.2021.04.042"},{"key":"6575_CR38","first-page":"1","volume":"72","author":"A Ng","year":"2011","unstructured":"Ng A (2011) Sparse autoencoder. CS294A Lecture notes. 72:1\u201319","journal-title":"CS294A Lecture notes."},{"issue":"12","key":"6575_CR39","doi-asserted-by":"crossref","first-page":"2438","DOI":"10.1109\/LGRS.2015.2482520","volume":"12","author":"C Tao","year":"2015","unstructured":"Tao C, Pan H, Li Y, Zou Z (2015) Unsupervised spectral-spatial feature learning with stacked sparse autoencoder for hyperspectral imagery classification. IEEE Geosci Remote Sens Lett 12(12):2438\u20132442","journal-title":"IEEE Geosci Remote Sens Lett"},{"issue":"9","key":"6575_CR40","doi-asserted-by":"crossref","first-page":"1359","DOI":"10.1109\/LGRS.2016.2586109","volume":"13","author":"L Zhang","year":"2016","unstructured":"Zhang L, Ma W, Zhang D (2016) Stacked sparse autoencoder in PolSAR data classification using local spatial information. IEEE Geosci Remote Sens Lett 13(9):1359\u20131363","journal-title":"IEEE Geosci Remote Sens Lett"},{"key":"6575_CR41","first-page":"113","volume-title":"European conference on computer vision","author":"S Agarwal","year":"2002","unstructured":"Agarwal S, Roth D (2002) Learning a sparse representation for object detection. European conference on computer vision. Springer, Berlin, pp 113\u2013127"},{"key":"6575_CR42","unstructured":"Boureau Y, Cun YL (2008) Sparse feature learning for deep belief networks. Adv Neural Inf Process Syst, pp 1185\u20131192"},{"issue":"6","key":"6575_CR43","doi-asserted-by":"crossref","first-page":"1016","DOI":"10.1002\/cjce.21945","volume":"92","author":"Y Peng","year":"2014","unstructured":"Peng Y, Chen X, Ye Q, Jiao J (2014) Fault detection and classification in chemical processes using NMFSC and structural SVMs. Can J Chem Eng 92(6):1016\u20131023","journal-title":"Can J Chem Eng"},{"key":"6575_CR44","unstructured":"Liu B, Wang M, Foroosh H, Hassan F, Marshall T, Marianna P (2015) Sparse convolutional neural networks. In: Proceedings of the IEEE conference on computer vision and pattern recognition. pp 806\u2013814"},{"key":"6575_CR45","doi-asserted-by":"crossref","unstructured":"Parashar A, Rhu M, Mukkara A, Puglielli A, Venkatesan R, Khailany B, Emer J, Keckler SW, Dally WJ (2017) An accelerator for compressed-sparse convolutional neural networks. In: 2017 ACM\/IEEE 44th annual international symposium on computer architecture (ISCA). IEEE. pp 27\u201340","DOI":"10.1145\/3140659.3080254"},{"key":"6575_CR46","unstructured":"Poultney C, Chopra S, Cun YL (2007) Efficient learning of sparse representations with an energy-based mode. In: Adv Neural Inf Process Syst. pp 1137\u20131144."},{"issue":"2","key":"6575_CR47","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1086\/254195","volume":"39","author":"H Hotelling","year":"1931","unstructured":"Hotelling H (1931) The economics of exhaustible resources. J Polit Econ 39(2):137\u2013175","journal-title":"J Polit Econ"},{"issue":"11","key":"6575_CR48","doi-asserted-by":"crossref","first-page":"2657","DOI":"10.1080\/03610928508829069","volume":"14","author":"JE Jackson","year":"1985","unstructured":"Jackson JE (1985) Multivariate quality control. Commun Statistics-Theory Methods 14(11):2657\u20132688","journal-title":"Commun Statistics-Theory Methods"},{"issue":"3","key":"6575_CR49","doi-asserted-by":"crossref","first-page":"403","DOI":"10.1016\/0967-0661(95)00014-L","volume":"3","author":"JF MacGregor","year":"1995","unstructured":"MacGregor JF, Kourti T (1995) Statistical process control of multivariate processes. Control Eng Pract 3(3):403\u2013414","journal-title":"Control Eng Pract"},{"key":"6575_CR50","unstructured":"Montgomery DC (2012) Statistical quality control, Wiley Global Education"},{"issue":"3","key":"6575_CR51","doi-asserted-by":"crossref","first-page":"245","DOI":"10.1016\/0098-1354(93)80018-I","volume":"17","author":"JJ Downs","year":"1993","unstructured":"Downs JJ, Vogel EF (1993) A plant-wide industrial process control problem. Comput Chem Eng 17(3):245\u2013255","journal-title":"Comput Chem Eng"},{"issue":"11","key":"6575_CR52","doi-asserted-by":"crossref","first-page":"1543","DOI":"10.1016\/S0098-1354(98)00243-9","volume":"22","author":"TJ McAvoy","year":"1998","unstructured":"McAvoy TJ (1998) A methodology for screening level control structures in plantwide control systems. Comput Chem Eng 22(11):1543\u20131552","journal-title":"Comput Chem Eng"},{"issue":"7","key":"6575_CR53","doi-asserted-by":"crossref","first-page":"1817","DOI":"10.1002\/aic.12392","volume":"57","author":"J Yu","year":"2011","unstructured":"Yu J (2011) Localized fisher discriminant analysis based complex process monitoring. AIChE J 57(7):1817\u20131828","journal-title":"AIChE J"},{"key":"6575_CR54","first-page":"3371","volume":"11","author":"P Vincent","year":"2010","unstructured":"Vincent P, Larochelle H, Lajoie I (2010) Stacked denoising autoencoders: Learning useful representations in a deep network with a local denoising criterion. J Mach Learn Res 11:3371\u20133408","journal-title":"J Mach Learn Res"},{"issue":"5786","key":"6575_CR55","doi-asserted-by":"crossref","first-page":"504","DOI":"10.1126\/science.1127647","volume":"313","author":"GE Hinton","year":"2006","unstructured":"Hinton GE, Salakhutdinov RR (2006) Reducing the dimensionality of data with neural networks. Science 313(5786):504\u2013507","journal-title":"Science"},{"issue":"10","key":"6575_CR56","doi-asserted-by":"crossref","first-page":"1550","DOI":"10.1109\/5.58337","volume":"78","author":"PJ Werbos","year":"1990","unstructured":"Werbos PJ (1990) Backpropagation through time: what it does and how to do it. Proc IEEE 78(10):1550\u20131560","journal-title":"Proc IEEE"},{"key":"6575_CR57","unstructured":"Drucker H, Burges CJC, Kaufman L, Smola A, Vapnik V (1997) Support vector regression machines. Adv Neural Inf Process Syst, pp 155\u2013161"},{"key":"6575_CR58","doi-asserted-by":"crossref","first-page":"54","DOI":"10.1016\/j.jprocont.2020.01.004","volume":"87","author":"SM Chen","year":"2020","unstructured":"Chen SM, Yu JB, Wang SJ (2020) One-dimensional Convolutional auto-encoder-based feature learning for fault diagnosis of multivariate processes. J Process Control 87:54\u201367","journal-title":"J Process Control"},{"key":"6575_CR59","doi-asserted-by":"crossref","unstructured":"Hu J, Shen L, Sun G (2018) Squeeze-and-excitation networks. In: Proceedings of the IEEE conference on computer vision and pattern recognition. pp 7132\u20137141","DOI":"10.1109\/CVPR.2018.00745"},{"key":"6575_CR60","unstructured":"Iandola F, Moskewicz M, Karayev S, Girshick R, Darrell T, Keutzer K (2014) Implementing efficient convnet descriptor pyramids, arXiv preprint arXiv:1404.1869"},{"issue":"11","key":"6575_CR61","first-page":"1457","volume":"5","author":"PO Hoyer","year":"2004","unstructured":"Hoyer PO (2004) Non-negative matrix factorization with sparseness constraints. J Mach Learn Res 5(11):1457\u20131469","journal-title":"J Mach Learn Res"},{"key":"6575_CR62","doi-asserted-by":"crossref","first-page":"117","DOI":"10.1016\/j.neucom.2016.01.027","volume":"190","author":"C Yang","year":"2016","unstructured":"Yang C, Hou J (2016) Fed-batch fermentation penicillin process fault diagnosis and detection based on support vector machine. Neurocomputing 190:117\u2013123","journal-title":"Neurocomputing"}],"container-title":["Neural Computing and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-021-06575-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00521-021-06575-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-021-06575-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,3,2]],"date-time":"2022-03-02T16:10:26Z","timestamp":1646237426000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00521-021-06575-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,29]]},"references-count":62,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2022,3]]}},"alternative-id":["6575"],"URL":"https:\/\/doi.org\/10.1007\/s00521-021-06575-6","relation":{},"ISSN":["0941-0643","1433-3058"],"issn-type":[{"value":"0941-0643","type":"print"},{"value":"1433-3058","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,10,29]]},"assertion":[{"value":"12 April 2021","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"21 September 2021","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 October 2021","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}