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Accurate defect characterisation in Infrared Thermography (IRT), as one of the widely used Non-Destructive Testing (NDT) techniques, always demands adequate pre-knowledge which poses a challenge to automatic decision-making in maintenance. This paper presents an automatic and accurate defect profile reconstruction method, taking advantage of deep learning Neural Networks (NN). Initially, a fast Finite Element Modelling (FEM) simulation of IRT is introduced for defective specimen simulation. Mask Region-based Convolution NN (Mask-RCNN) is proposed to detect and segment the defect using a single thermal frame. A dataset with a single-type-shape defect is tested to validate the feasibility. Then, a dataset with three mixed shapes of defect is inspected to evaluate the method\u2019s capability on the defect profile reconstruction, where an accuracy over 90% on Intersection over Union (IoU) is achieved. The results are compared with several state-of-the-art of post-processing methods in IRT to demonstrate the superiority at detailed defect corners and edges. This research lays solid evidence that AI deep learning algorithms can be utilised to provide accurate defect profile reconstruction in thermography NDT, which will contribute to the research community in material degradation analysis and structural health monitoring.<\/jats:p>","DOI":"10.1007\/s00521-022-07622-6","type":"journal-article","created":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:02:50Z","timestamp":1658779370000},"page":"21701-21714","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":20,"title":["Automatic reconstruction of irregular shape defects in pulsed thermography using deep learning neural network"],"prefix":"10.1007","volume":"34","author":[{"given":"Haochen","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenhan","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lichao","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kailun","family":"Deng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2383-5724","authenticated-orcid":false,"given":"Yifan","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2022,7,25]]},"reference":[{"issue":"11","key":"7622_CR1","doi-asserted-by":"publisher","first-page":"1251","DOI":"10.3390\/math9111251","volume":"9","author":"A Niccolai","year":"2021","unstructured":"Niccolai A, Caputo D, Chieco L, Grimaccia F, Mussetta M (2021) Machine learning-based detection technique for NDT in industrial manufacturing. 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