{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,29]],"date-time":"2025-12-29T18:45:35Z","timestamp":1767033935715,"version":"3.37.3"},"reference-count":39,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T00:00:00Z","timestamp":1699228800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T00:00:00Z","timestamp":1699228800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Neural Comput & Applic"],"published-print":{"date-parts":[[2024,1]]},"DOI":"10.1007\/s00521-023-09080-0","type":"journal-article","created":{"date-parts":[[2023,11,6]],"date-time":"2023-11-06T11:01:39Z","timestamp":1699268499000},"page":"1091-1103","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Unsupervised fabric defect detection with local spectra refinement (LSR)"],"prefix":"10.1007","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4598-4296","authenticated-orcid":false,"given":"Sahar","family":"Shakir","sequence":"first","affiliation":[]},{"given":"Cihan","family":"Topal","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,11,6]]},"reference":[{"key":"9080_CR1","doi-asserted-by":"crossref","unstructured":"Amelung J, Vogel K (1994) Automated window size determination for texture defect detection. In: Proceedings of the British machine vision conference, pp 10.1\u201310.10","DOI":"10.5244\/C.8.10"},{"key":"9080_CR2","unstructured":"Brodatz P (1966) Textures: a photographic album for artists and designers"},{"key":"9080_CR3","doi-asserted-by":"publisher","first-page":"4141","DOI":"10.1007\/s11042-015-3041-3","volume":"76","author":"J Cao","year":"2017","unstructured":"Cao J, Zhang J, Wen Z, Wang N, Liu X (2017) Fabric defect inspection using prior knowledge guided least squares regression. Multimed Tools Appl 76:4141\u20134157","journal-title":"Multimed Tools Appl"},{"key":"9080_CR4","doi-asserted-by":"publisher","first-page":"107473","DOI":"10.1016\/j.patcog.2020.107473","volume":"107","author":"L Cerkezi","year":"2020","unstructured":"Cerkezi L, Topal C (2020) Towards more discriminative features for texture recognition. Pattern Recogn 107:107473","journal-title":"Pattern Recogn"},{"key":"9080_CR5","doi-asserted-by":"publisher","first-page":"1267","DOI":"10.1109\/28.871274","volume":"36","author":"CH Chan","year":"2000","unstructured":"Chan CH, Pang GKH (2000) Fabric defect detection by Fourier analysis. IEEE Trans Ind Appl 36:1267\u20131276","journal-title":"IEEE Trans Ind Appl"},{"key":"9080_CR6","doi-asserted-by":"publisher","first-page":"2165","DOI":"10.1016\/S0031-3203(01)00188-1","volume":"35","author":"D Chetverikov","year":"2002","unstructured":"Chetverikov D, Hanbury A (2002) Finding defects in texture using regularity and local orientation. Pattern Recogn 35:2165\u20132180","journal-title":"Pattern Recogn"},{"key":"9080_CR7","unstructured":"Dot-patterned, box-patterned and star-patterned databases. Henry Y.T. Ngan, Grantham K.H. Pang, Industrial Automation Research Laboratory, Dept. of Electrical and Electronic Engineering, The University of Hong Kong"},{"key":"9080_CR8","volume-title":"The rating of chessplayers, past and present","author":"AE Elo","year":"1978","unstructured":"Elo AE (1978) The rating of chessplayers, past and present. Arco Pub, New York"},{"key":"9080_CR9","doi-asserted-by":"publisher","first-page":"1239","DOI":"10.1016\/j.imavis.2006.07.028","volume":"25","author":"Y Han","year":"2007","unstructured":"Han Y, Shi P (2007) An adaptive level-selecting wavelet transform for texture defect detection. Image Vis Comput 25:1239\u20131248","journal-title":"Image Vis Comput"},{"key":"9080_CR10","doi-asserted-by":"publisher","first-page":"11960","DOI":"10.1016\/j.ijleo.2016.09.110","volume":"127","author":"K Hanbay","year":"2016","unstructured":"Hanbay K, Talu MF, \u00d6zg\u00fcven \u00d6F (2016) Fabric defect detection systems and methods-a systematic literature review. Optik 127:11960\u201311973","journal-title":"Optik"},{"key":"9080_CR11","doi-asserted-by":"publisher","first-page":"84","DOI":"10.1016\/j.neucom.2017.01.039","volume":"238","author":"L Jia","year":"2017","unstructured":"Jia L, Chen C, Liang J, Hou Z (2017) Fabric defect inspection based on lattice segmentation and Gabor filtering. Neurocomputing 238:84\u2013102","journal-title":"Neurocomputing"},{"key":"9080_CR12","doi-asserted-by":"publisher","first-page":"1645","DOI":"10.1016\/S0031-3203(03)00005-0","volume":"36","author":"A Kumar","year":"2003","unstructured":"Kumar A (2003) Neural network based detection of local textile defects. Pattern Recogn 36:1645\u20131659","journal-title":"Pattern Recogn"},{"key":"9080_CR13","doi-asserted-by":"publisher","first-page":"348","DOI":"10.1109\/TIE.1930.896476","volume":"55","author":"A Kumar","year":"2008","unstructured":"Kumar A (2008) Computer-vision-based fabric defect detection: a survey. IEEE Trans Ind Electron 55:348\u2013363","journal-title":"IEEE Trans Ind Electron"},{"key":"9080_CR14","doi-asserted-by":"crossref","unstructured":"Kumar A, Shen HC (2002) Texture inspection for defects using neural networks and support vector machines. In: Proceedings of international conference on image processing, vol 3, pp III-353\u2013III-356","DOI":"10.1109\/ICIP.2002.1038978"},{"key":"9080_CR15","doi-asserted-by":"publisher","first-page":"1117","DOI":"10.1007\/s00521-010-0434-0","volume":"20","author":"AB Lale \u00d6zbakir","year":"2011","unstructured":"Lale \u00d6zbakir AB, Kulluk S (2011) Rule extraction from artificial neural networks to discover causes of quality defects in fabric production. Neural Comput Appl 20:1117\u20131128","journal-title":"Neural Comput Appl"},{"key":"9080_CR16","doi-asserted-by":"publisher","first-page":"1386","DOI":"10.1016\/j.neucom.2015.09.011","volume":"173","author":"WW Le Tong","year":"2016","unstructured":"Le Tong WW, Kwongb C (2016) Differential evolution-based optimal Gabor filter model for fabric inspection. Neurocomputing 173:1386\u20131401","journal-title":"Neurocomputing"},{"key":"9080_CR17","doi-asserted-by":"publisher","first-page":"329","DOI":"10.1016\/j.neucom.2018.10.070","volume":"329","author":"Y Li","year":"2019","unstructured":"Li Y, Zhang D, Lee DJ (2019) Automatic fabric defect detection with a wide-and-compact network. Neurocomputing 329:329\u2013338","journal-title":"Neurocomputing"},{"key":"9080_CR18","doi-asserted-by":"publisher","first-page":"447","DOI":"10.1007\/s00521-018-3911-5","volume":"32","author":"AAA Mohd Amiruddin","year":"2018","unstructured":"Mohd Amiruddin AAA, Zabiri H, Taqvi S (2018) Neural network applications in fault diagnosis and detection: an overview of implementations in engineering-related systems. Neural Comput Appl 32:447\u2013472","journal-title":"Neural Comput Appl"},{"key":"9080_CR19","doi-asserted-by":"publisher","first-page":"289","DOI":"10.1016\/S1077-2014(03)00041-X","volume":"9","author":"T M\u00e4enp\u00e4\u00e4","year":"2003","unstructured":"M\u00e4enp\u00e4\u00e4 T, Turtinen M, Pietik\u00e4inen M (2003) Real-time surface inspection by texture. Real-Time Imaging 9:289\u2013296","journal-title":"Real-Time Imaging"},{"key":"9080_CR20","doi-asserted-by":"publisher","first-page":"943","DOI":"10.1109\/TASE.2014.2314240","volume":"11","author":"MK Ng","year":"2014","unstructured":"Ng MK, Ngan HY, Yuan X, Zhang W (2014) Patterned fabric inspection and visualization by the method of image decomposition. IEEE Trans Autom Sci Eng 11:943\u2013947","journal-title":"IEEE Trans Autom Sci Eng"},{"key":"9080_CR21","doi-asserted-by":"publisher","first-page":"559","DOI":"10.1016\/j.patcog.2004.07.009","volume":"38","author":"HY Ngan","year":"2005","unstructured":"Ngan HY, Pang GK, Yung SP, Ng MK (2005) Wavelet based methods on patterned fabric defect detection. Pattern Recogn 38:559\u2013576","journal-title":"Pattern Recogn"},{"key":"9080_CR22","doi-asserted-by":"publisher","first-page":"58","DOI":"10.1109\/TASE.2008.2005418","volume":"7","author":"HYT Ngan","year":"2010","unstructured":"Ngan HYT, Pang GKH, Yung NHC (2010) Performance evaluation for motif-based patterned texture defect detection. IEEE Trans Autom Sci Eng 7:58\u201372","journal-title":"IEEE Trans Autom Sci Eng"},{"key":"9080_CR23","doi-asserted-by":"publisher","first-page":"442","DOI":"10.1016\/j.imavis.2011.02.002","volume":"29","author":"HYT Ngan","year":"2011","unstructured":"Ngan HYT, Pang GKH, Yung NHC (2011) Review article: automated fabric defect detection-a review. Image Vis Comput 29:442\u2013458","journal-title":"Image Vis Comput"},{"key":"9080_CR24","doi-asserted-by":"crossref","unstructured":"Rasheed A, Zafar B, Rasheed A, Ali N, Sajid M, Dar SH, Habib U, Shehryar T, Mahmood MT (2020) Fabric defect detection using computer vision techniques: a comprehensive review. Math Prob Eng 2020","DOI":"10.1155\/2020\/8189403"},{"key":"9080_CR25","doi-asserted-by":"crossref","unstructured":"Ren Z, Fang F, Yan N, Wu Y (2021) State of the art in defect detection based on machine vision. Int J Precis Eng Manuf-Green Technol 1\u201331","DOI":"10.1007\/s40684-021-00343-6"},{"key":"9080_CR26","unstructured":"Rohrmus D (2000) Invariant web defect detection and classification system. In: Proceedings IEEE conference on computer vision and pattern recognition. CVPR 2000 (Cat. No.PR00662), vol 2, pp 794\u2013795"},{"key":"9080_CR27","doi-asserted-by":"crossref","unstructured":"Ojala T, Maenpaa T, Pietikainen M, Viertola J, Kyllonen J, Huovinen S (2002) Outex\u2014new framework for empirical evaluation of texture analysis algorithms. In: Proceedings of 16th international conference on pattern recognition, Quebec, vol 1, pp 701\u2013706","DOI":"10.1109\/ICPR.2002.1044854"},{"key":"9080_CR28","doi-asserted-by":"publisher","first-page":"608","DOI":"10.1016\/j.ins.2020.08.100","volume":"546","author":"B Shi","year":"2021","unstructured":"Shi B, Liang J, Di L, Chen C, Hou Z (2021) Fabric defect detection via low-rank decomposition with gradient information and structured graph algorithm. Inf Sci 546:608\u2013626","journal-title":"Inf Sci"},{"key":"9080_CR29","doi-asserted-by":"publisher","first-page":"232","DOI":"10.1016\/j.neucom.2017.02.021","volume":"239","author":"S Susan","year":"2017","unstructured":"Susan S, Sharma M (2017) Automatic texture defect detection using gaussian mixture entropy modeling. Neurocomputing 239:232\u2013237","journal-title":"Neurocomputing"},{"key":"9080_CR30","doi-asserted-by":"crossref","unstructured":"Tajeripour F, Kabir E, Sheikhi A (2008) Fabric defect detection using modified local binary patterns. EURASIP J Adv Signal Process Article ID 783898, p 12","DOI":"10.1155\/2008\/783898"},{"key":"9080_CR31","unstructured":"Tilda textile texture-database (2017). http:\/\/lmb.informatik.uni-freiburg.de\/resources\/datasets\/tilda.en.html"},{"key":"9080_CR32","doi-asserted-by":"publisher","first-page":"1285","DOI":"10.1016\/S0031-3203(00)00071-6","volume":"34","author":"DM Tsai","year":"2001","unstructured":"Tsai DM, Hsiao B (2001) Automatic surface inspection using wavelet reconstruction. Pattern Recogn 34:1285\u20131305","journal-title":"Pattern Recogn"},{"key":"9080_CR33","doi-asserted-by":"publisher","first-page":"49","DOI":"10.1016\/S0262-8856(99)00009-8","volume":"18","author":"DM Tsai","year":"1999","unstructured":"Tsai DM, Hsieh CY (1999) Automated surface inspection for directional textures. Image Vis Comput 18:49\u201362","journal-title":"Image Vis Comput"},{"key":"9080_CR34","doi-asserted-by":"publisher","first-page":"307","DOI":"10.1016\/S0262-8856(03)00007-6","volume":"21","author":"DM Tsai","year":"2003","unstructured":"Tsai DM, Huang TY (2003) Automated surface inspection for statistical textures. Image Vis Comput 21:307\u2013323","journal-title":"Image Vis Comput"},{"key":"9080_CR35","doi-asserted-by":"publisher","first-page":"378","DOI":"10.1016\/j.patcog.2015.09.022","volume":"51","author":"CS Tsang","year":"2016","unstructured":"Tsang CS, Ngan HY, Pang GK (2016) Fabric inspection based on the Elo rating method. Pattern Recogn 51:378\u2013394","journal-title":"Pattern Recogn"},{"key":"9080_CR36","doi-asserted-by":"publisher","first-page":"3539","DOI":"10.1177\/0040517518813656","volume":"89","author":"B Wei","year":"2019","unstructured":"Wei B, Hao K, Tang XS, Ding Y (2019) A new method using the convolutional neural network with compressive sensing for fabric defect classification based on small sample sizes. Text Res J 89:3539\u20133555","journal-title":"Text Res J"},{"key":"9080_CR37","doi-asserted-by":"crossref","unstructured":"Liu Y, Collins RT, Tsin Y (2004) A computational model for periodic pattern perception based on frieze and wallpaper group. IEEE Trans Pattern Anal Mach Intell 354\u2013371","DOI":"10.1109\/TPAMI.2004.1262332"},{"key":"9080_CR38","doi-asserted-by":"publisher","first-page":"871","DOI":"10.3390\/s20030871","volume":"20","author":"Y Wu","year":"2020","unstructured":"Wu Y, Zhang X, Fang F (2020) Automatic fabric defect detection using cascaded mixed feature pyramid with guided localization. Sensors 20:871","journal-title":"Sensors"},{"key":"9080_CR39","doi-asserted-by":"publisher","first-page":"889","DOI":"10.1016\/j.patcog.2003.10.011","volume":"37","author":"X Yang","year":"2004","unstructured":"Yang X, Pang G, Yung N (2004) Discriminative training approaches to fabric defect classification based on wavelet transform. Pattern Recogn 37:889\u2013899","journal-title":"Pattern Recogn"}],"container-title":["Neural Computing and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-023-09080-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00521-023-09080-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-023-09080-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,5]],"date-time":"2024-01-05T08:11:22Z","timestamp":1704442282000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00521-023-09080-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,11,6]]},"references-count":39,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2024,1]]}},"alternative-id":["9080"],"URL":"https:\/\/doi.org\/10.1007\/s00521-023-09080-0","relation":{},"ISSN":["0941-0643","1433-3058"],"issn-type":[{"type":"print","value":"0941-0643"},{"type":"electronic","value":"1433-3058"}],"subject":[],"published":{"date-parts":[[2023,11,6]]},"assertion":[{"value":"25 May 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"20 September 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 November 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}