{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T15:10:03Z","timestamp":1750173003186,"version":"3.41.0"},"reference-count":36,"publisher":"Springer Science and Business Media LLC","issue":"18","license":[{"start":{"date-parts":[[2025,4,9]],"date-time":"2025-04-09T00:00:00Z","timestamp":1744156800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,4,9]],"date-time":"2025-04-09T00:00:00Z","timestamp":1744156800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Neural Comput & Applic"],"published-print":{"date-parts":[[2025,6]]},"DOI":"10.1007\/s00521-025-11124-6","type":"journal-article","created":{"date-parts":[[2025,4,9]],"date-time":"2025-04-09T22:43:28Z","timestamp":1744238608000},"page":"12653-12671","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["An adversarial network based on anomaly domain decomposition and transformation for industrial PCBA defect inspection"],"prefix":"10.1007","volume":"37","author":[{"given":"Qianfeng","family":"Pan","sequence":"first","affiliation":[]},{"given":"Teng","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Yue","family":"Hou","sequence":"additional","affiliation":[]},{"given":"Jingyun","family":"Chang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5430-5630","authenticated-orcid":false,"given":"Hua","family":"Yang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,4,9]]},"reference":[{"issue":"5\u20136","key":"11124_CR1","doi-asserted-by":"publisher","first-page":"275","DOI":"10.1007\/s00138-002-0084-z","volume":"13","author":"O Silven","year":"2003","unstructured":"Silven O, Niskanen M, Kauppinen H (2003) Wood inspection with non-supervised clustering. Mach Vis Appl 13(5\u20136):275\u2013285","journal-title":"Mach Vis Appl"},{"issue":"5","key":"11124_CR2","doi-asserted-by":"publisher","first-page":"2798","DOI":"10.1109\/TII.2018.2887145","volume":"15","author":"H Wang","year":"2018","unstructured":"Wang H, Zhang J, Tian Y, Chen H, Sun H, Liu K (2018) A simple guidance template-based defect detection method for strip steel surfaces. IEEE Trans Industr Inf 15(5):2798\u20132809","journal-title":"IEEE Trans Industr Inf"},{"issue":"4","key":"11124_CR3","doi-asserted-by":"publisher","first-page":"1704","DOI":"10.1109\/TASE.2018.2823709","volume":"15","author":"H Yang","year":"2018","unstructured":"Yang H, Song K, Mei S, Yin Z (2018) An accurate mura defect vision inspection method using outlier-prejudging-based image background construction and region-gradient-based level set. IEEE Trans Autom Sci Eng 15(4):1704\u20131721","journal-title":"IEEE Trans Autom Sci Eng"},{"issue":"7","key":"11124_CR4","first-page":"419","volume":"4","author":"K Sundaraj","year":"2008","unstructured":"Sundaraj K (2008) Homogeneous pin-through-hole component inspection using fringe tracking. WSEAS Trans Signal Process 4(7):419\u2013429","journal-title":"WSEAS Trans Signal Process"},{"issue":"5","key":"11124_CR5","doi-asserted-by":"publisher","first-page":"689","DOI":"10.1109\/TCPMT.2011.2118208","volume":"1","author":"F Wu","year":"2011","unstructured":"Wu F, Zhang X (2011) Feature-extraction-based inspection algorithm for ic solder joints. IEEE Trans Comp, Pack Manufact Technol 1(5):689\u2013694","journal-title":"IEEE Trans Comp, Pack Manufact Technol"},{"issue":"1","key":"11124_CR6","doi-asserted-by":"crossref","first-page":"161","DOI":"10.1109\/TCPMT.2015.2501284","volume":"6","author":"N Cai","year":"2015","unstructured":"Cai N, Lin J, Ye Q, Wang H, Weng S, Ling BW-K (2015) A new ic solder joint inspection method for an automatic optical inspection system based on an improved visual background extraction algorithm. IEEE Trans Comp, Pack Manufact Technol 6(1):161\u2013172","journal-title":"IEEE Trans Comp, Pack Manufact Technol"},{"key":"11124_CR7","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107697","volume":"130","author":"D Bai","year":"2024","unstructured":"Bai D, Li G, Jiang D, Yun J, Tao B, Jiang G, Sun Y, Ju Z (2024) Surface defect detection methods for industrial products with imbalanced samples: a review of progress in the 2020s. Eng Appl Artif Intell 130:107697. https:\/\/doi.org\/10.1016\/j.engappai.2023.107697","journal-title":"Eng Appl Artif Intell"},{"key":"11124_CR8","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673","volume":"185","author":"H Zhang","year":"2021","unstructured":"Zhang H, Jiang L, Li C (2021) Cs-resnet: cost-sensitive residual convolutional neural network for pcb cosmetic defect detection. Expert Syst Appl 185:115673. https:\/\/doi.org\/10.1016\/j.eswa.2021.115673","journal-title":"Expert Syst Appl"},{"key":"11124_CR9","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2021.3117357","volume":"70","author":"Z Tu","year":"2021","unstructured":"Tu Z, Wu S, Kang G, Lin J (2021) Real-time defect detection of track components: Considering class imbalance and subtle difference between classes. IEEE Trans Instr Measure 70:1\u201312. https:\/\/doi.org\/10.1109\/TIM.2021.3117357","journal-title":"IEEE Trans Instr Measure"},{"key":"11124_CR10","doi-asserted-by":"publisher","unstructured":"Li C, Sohn K, Yoon J, Pfister T: (2021) Cutpaste: Self-supervised learning for anomaly detection and localization. In: 2021 IEEE\/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp. 9659\u20139669 https:\/\/doi.org\/10.1109\/CVPR46437.2021.00954","DOI":"10.1109\/CVPR46437.2021.00954"},{"key":"11124_CR11","doi-asserted-by":"publisher","first-page":"2176","DOI":"10.1109\/TCSVT.2022.3218587","volume":"33","author":"Q Zhou","year":"2022","unstructured":"Zhou Q, He S, Liu H, Chen T, Chen J (2022) Pull & push: Leveraging differential knowledge distillation for efficient unsupervised anomaly detection and localization. IEEE Trans Circuits and Syst Video Technol 33:2176\u20132189","journal-title":"IEEE Trans Circuits and Syst Video Technol"},{"key":"11124_CR12","doi-asserted-by":"publisher","first-page":"1374","DOI":"10.1109\/TCSVT.2022.3211839","volume":"33","author":"K Wu","year":"2022","unstructured":"Wu K, Zhu L, Shi W, Wang W, Wu J (2022) Self-attention memory-augmented wavelet-cnn for anomaly detection. IEEE Trans Circuits and Syst Video Technol 33:1374\u20131385","journal-title":"IEEE Trans Circuits and Syst Video Technol"},{"issue":"3","key":"11124_CR13","doi-asserted-by":"publisher","first-page":"929","DOI":"10.1109\/TCYB.2017.2668395","volume":"48","author":"R Ren","year":"2017","unstructured":"Ren R, Hung T, Tan KC (2017) A generic deep-learning-based approach for automated surface inspection. IEEE Trans Cybernet 48(3):929\u2013940","journal-title":"IEEE Trans Cybernet"},{"key":"11124_CR14","doi-asserted-by":"publisher","first-page":"15884","DOI":"10.1109\/ACCESS.2019.2894420","volume":"7","author":"L Qiu","year":"2019","unstructured":"Qiu L, Wu X, Yu Z (2019) A high-efficiency fully convolutional networks for pixelwise surface defect detection. IEEE Access 7:15884\u201315893","journal-title":"IEEE Access"},{"key":"11124_CR15","doi-asserted-by":"publisher","first-page":"3596","DOI":"10.1109\/TCSVT.2023.3237562","volume":"33","author":"P Xing","year":"2023","unstructured":"Xing P, Li Z (2023) Visual anomaly detection via partition memory bank module and error estimation. IEEE Trans Circuits and Syst Video Technol 33:3596\u20133607","journal-title":"IEEE Trans Circuits and Syst Video Technol"},{"issue":"3","key":"11124_CR16","doi-asserted-by":"publisher","first-page":"2220","DOI":"10.1109\/TII.2020.3015765","volume":"17","author":"H Yang","year":"2020","unstructured":"Yang H, Zhou Q, Song K, Yin Z (2020) An anomaly-feature-editing-based adversarial network for texture defect visual inspection. IEEE Trans Industr Inf 17(3):2220\u20132230","journal-title":"IEEE Trans Industr Inf"},{"key":"11124_CR17","doi-asserted-by":"crossref","unstructured":"Bergmann P, L\u00a8owe S, Fauser M, Sattlegger D, Steger C: (2018) Improving unsupervised defect segmentation by applying structural similarity to autoencoders. arXiv preprint arXiv:1807.02011","DOI":"10.5220\/0007364503720380"},{"issue":"3","key":"11124_CR18","doi-asserted-by":"publisher","first-page":"1450","DOI":"10.1109\/TASE.2018.2886031","volume":"16","author":"H Yang","year":"2019","unstructured":"Yang H, Chen Y, Song K, Yin Z (2019) Multiscale feature-clustering-based fully convolutional autoencoder for fast accurate visual inspection of texture surface defects. IEEE Trans Autom Sci Eng 16(3):1450\u20131467","journal-title":"IEEE Trans Autom Sci Eng"},{"key":"11124_CR19","doi-asserted-by":"crossref","unstructured":"Zhu J, Park T, Isola P, Efros AA: (2017) Unpaired image-to-image translation using cycle-consistent adversarial networks. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 2223\u20132232","DOI":"10.1109\/ICCV.2017.244"},{"key":"11124_CR20","doi-asserted-by":"crossref","unstructured":"Lu B, Chen J, Chellappa R: (2019) Unsupervised domain-specific deblurring via disentangled representations. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 10225\u201310234","DOI":"10.1109\/CVPR.2019.01047"},{"key":"11124_CR21","unstructured":"Cohen N, Hoshen Y: (2020) Sub-Image Anomaly Detection with Deep Pyramid Correspondences"},{"key":"11124_CR22","doi-asserted-by":"crossref","unstructured":"Defard T, Setkov A, Loesch A, Audigier R: Padim: (2021) a patch distribution modeling framework for anomaly detection and localization. In: ICPR 202025th International Conference on Pattern Recognition Workshops and Challenges","DOI":"10.1007\/978-3-030-68799-1_35"},{"key":"11124_CR23","unstructured":"Liznerski P, Ruff L, Vandermeulen RA, Franks BJ, Kloft M, Muller KR: (2021) Explainable deep one-class classification. In: International Conference on Learning Representations. https:\/\/openreview.net\/forum?id=A5VV3UyIQz"},{"issue":"5786","key":"11124_CR24","doi-asserted-by":"publisher","first-page":"504","DOI":"10.1126\/science.1127647","volume":"313","author":"GE Hinton","year":"2006","unstructured":"Hinton GE, Salakhutdinov RR (2006) Reducing the dimensionality of data with neural networks. Science 313(5786):504\u2013507","journal-title":"Science"},{"key":"11124_CR25","unstructured":"Goodfellow I, Pouget-Abadie, J., Mirza, M., Xu, B., Warde-Farley, D., Ozair, S., Courville, A., Bengio, Y.: (2014) Generative adversarial nets. Advances in neural information processing systems 27"},{"key":"11124_CR26","first-page":"13","volume":"70","author":"C Lv","year":"2020","unstructured":"Lv C, Shen F, Zhang Z, Xu D, He Y (2020) A novel pixel-wise defect inspection method based on stable background reconstruction. IEEE Trans Instr Measure 70:13","journal-title":"IEEE Trans Instr Measure"},{"issue":"6","key":"11124_CR27","doi-asserted-by":"publisher","first-page":"1266","DOI":"10.1109\/TIM.2018.2795178","volume":"67","author":"S Mei","year":"2018","unstructured":"Mei S, Yang H, Yin Z (2018) An unsupervised-learning-based approach for automated defect inspection on textured surfaces. IEEE Trans Instrum Meas 67(6):1266\u20131277","journal-title":"IEEE Trans Instrum Meas"},{"issue":"8","key":"11124_CR28","first-page":"3074","volume":"49","author":"M Nicolau","year":"2018","unstructured":"Nicolau M, McDermott J et al (2018) Learning neural representations for network anomaly detection. IEEE Trans Cybernet 49(8):3074\u20133087","journal-title":"IEEE Trans Cybernet"},{"key":"11124_CR29","doi-asserted-by":"crossref","unstructured":"Schlegl T, Seebck P, Waldstein SM, Schmidt-Erfurth U, Langs G: (2017) Unsupervised anomaly detection with generative adversarial networks to guide marker discovery. In: International Conference on Information Processing in Medical Imaging","DOI":"10.1007\/978-3-319-59050-9_12"},{"key":"11124_CR30","unstructured":"Kingma DP, Welling M: (2014) Auto-encoding variational bayes. International Conference on Learning Representations"},{"key":"11124_CR31","doi-asserted-by":"crossref","unstructured":"Yun S, Han D, Oh SJ, Chun S, Choe J, Yoo Y: (2019) Cutmix: Regularization strategy to train strong classifiers with localizable features. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp. 6023\u20136032","DOI":"10.1109\/ICCV.2019.00612"},{"key":"11124_CR32","doi-asserted-by":"crossref","unstructured":"Ronneberger O, Fischer P, Brox T: (2015) U-net: Convolutional networks for biomedical image segmentation. In: International Conference on Medical Image Computing and Computer-assisted Intervention, pp. 234\u2013241. Springer","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"11124_CR33","doi-asserted-by":"crossref","unstructured":"Bergmann P, Fauser M, Sattlegger D, Steger C: (2019) Mvtec ad\u2013a comprehensive real-world dataset for unsupervised anomaly detection. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp. 9592\u2013 9600","DOI":"10.1109\/CVPR.2019.00982"},{"issue":"8","key":"11124_CR34","doi-asserted-by":"publisher","first-page":"1454","DOI":"10.1109\/TPAMI.2007.1038","volume":"29","author":"X Xie","year":"2007","unstructured":"Xie X, Mirmehdi M (2007) Texems: texture exemplars for defect detection on random textured surfaces. IEEE Trans Pattern Anal Mach Intell 29(8):1454\u20131464","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"issue":"1","key":"11124_CR35","doi-asserted-by":"publisher","first-page":"209","DOI":"10.3390\/s18010209","volume":"18","author":"P Napoletano","year":"2018","unstructured":"Napoletano P, Piccoli F, Schettini R (2018) Anomaly detection in nanofibrous materials by cnn-based self-similarity. Sensors 18(1):209","journal-title":"Sensors"},{"key":"11124_CR36","doi-asserted-by":"crossref","unstructured":"Yi J, Yoon S: (2020) Patch svdd: Patch-level svdd for anomaly detection and segmentation. In: Proceedings of the Asian Conference on Computer Vision","DOI":"10.1007\/978-3-030-69544-6_23"}],"container-title":["Neural Computing and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-025-11124-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s00521-025-11124-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s00521-025-11124-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T14:55:31Z","timestamp":1750172131000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s00521-025-11124-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,9]]},"references-count":36,"journal-issue":{"issue":"18","published-print":{"date-parts":[[2025,6]]}},"alternative-id":["11124"],"URL":"https:\/\/doi.org\/10.1007\/s00521-025-11124-6","relation":{},"ISSN":["0941-0643","1433-3058"],"issn-type":[{"type":"print","value":"0941-0643"},{"type":"electronic","value":"1433-3058"}],"subject":[],"published":{"date-parts":[[2025,4,9]]},"assertion":[{"value":"6 April 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"15 February 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"9 April 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"No potential conflict of interest was reported by the authors.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}]}}