{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:16:28Z","timestamp":1762251388217},"reference-count":56,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2008,5,6]],"date-time":"2008-05-06T00:00:00Z","timestamp":1210032000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc\/2.0"},{"start":{"date-parts":[[2008,5,6]],"date-time":"2008-05-06T00:00:00Z","timestamp":1210032000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc\/2.0"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Int J Softw Tools Technol Transf"],"published-print":{"date-parts":[[2008,8]]},"DOI":"10.1007\/s10009-008-0075-0","type":"journal-article","created":{"date-parts":[[2008,5,5]],"date-time":"2008-05-05T09:40:17Z","timestamp":1209980417000},"update-policy":"http:\/\/dx.doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["An approach to quality engineering of TTCN-3 test specifications"],"prefix":"10.1007","volume":"10","author":[{"given":"Helmut","family":"Neukirchen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benjamin","family":"Zeiss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jens","family":"Grabowski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,5,6]]},"reference":[{"key":"75_CR1","doi-asserted-by":"publisher","unstructured":"Baker, P., Evans, D., Grabowski, J., Neukirchen, H., Zeiss, B.: TRex\u2014the refactoring and metrics tool for TTCN-3 test specifications. In: Proceedings of TAIC PART 2006 (Testing: Academic & Industrial Conference\u2014Practice And Research Techniques), Cumberland Lodge, Windsor Great Park, UK, 29\u201331 August 2006. IEEE Computer Society (2006). doi:10.1109\/TAIC-PART.2006.35","DOI":"10.1109\/TAIC-PART.2006.35"},{"key":"75_CR2","doi-asserted-by":"publisher","unstructured":"Baker, P., Loh, S., Weil, F.: Model-driven engineering in a large industrial context\u2014Motorola case study. In: Briand, L., Williams, C. (eds.) Model Driven Engineering Languages and Systems: 8th International Conference, MoDELS 2005, Montego Bay, Jamaica, October 2\u20137, 2005. Lecture Notes in Computer Science (LNCS), vol. 3713, pp. 476\u2013491. Springer, Berlin (2005). doi:10.1007\/11557432_36","DOI":"10.1007\/11557432_36"},{"issue":"6","key":"75_CR3","doi-asserted-by":"publisher","first-page":"728","DOI":"10.1109\/TSE.1984.5010301","volume":"10","author":"V.R. Basili","year":"1984","unstructured":"Basili, V.R., Weiss, D.M.: A methodology for collecting valid software engineering data. IEEE Trans. Softw. Eng. 10(6), 728\u2013738 (1984)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"75_CR4","unstructured":"Bisanz, M.: Pattern-based smell detection in TTCN-3 test suites. Master\u2019s thesis, Center for Computational Sciences, University of G\u00f6ttingen, Germany, ZFI-BM-2006-44 (2006). http:\/\/www.swe.informatik.uni-goettingen.de\/publications\/MB\/bisanz_mastersthesis.pdf"},{"key":"75_CR5","volume-title":"Characteristics of Software Quality","author":"B. Boehm","year":"1978","unstructured":"Boehm, B., Brown, J., Kaspar, J., Lipow, M., MacLead, C., Merrit, M.: Characteristics of Software Quality. North-Holland, Amsterdam (1978)"},{"issue":"4","key":"75_CR6","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"R.A. DeMillo","year":"1978","unstructured":"DeMillo, R.A., Lipton, R.J., Sayward, F.G.: Hints on test data selection: help for the practicing programmer. IEEE Comp. 11(4), 34\u201343 (1978). doi:10.1109\/C-M.1978.218136","journal-title":"IEEE Comp."},{"key":"75_CR7","unstructured":"van Deursen, A., Moonen, L., van den Bergh, A., Kok, G.: Extreme Programming Perspectives, Chap. Refactoring Test Code, pp. 141\u2013152. Addison-Wesley, Boston (2002)"},{"key":"75_CR8","unstructured":"Dixon-Peugh, D.: PMD (2007). http:\/\/pmd.sourceforge.net"},{"key":"75_CR9","unstructured":"Eclipse Foundation: Eclipse (2007). http:\/\/www.eclipse.org"},{"key":"75_CR10","unstructured":"Eclipse Foundation: Eclipse Graphical Editing Framework (2007). http:\/\/www.eclipse.org\/gef"},{"key":"75_CR11","unstructured":"Eclipse Foundation: Eclipse Test & Performance Tools Platform Project (TPTP) (2007). http:\/\/www.eclipse.org\/tptp"},{"key":"75_CR12","doi-asserted-by":"publisher","unstructured":"van Emden, E., Moonen, L.: Java quality assurance by detecting code smells. In: Proceedings Ninth Working Conference on Reverse Engineering WCRE 2002, pp. 97\u2013106. IEEE Computer Society Press, New York (2002). doi:10.1109\/WCRE.2002.1173068","DOI":"10.1109\/WCRE.2002.1173068"},{"key":"75_CR13","unstructured":"ETSI: Technical Specification (TS) 102 027-3 V4.1.1 (2006\u201307): SIP ATS & PIXIT; Part 3: Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (2006)"},{"key":"75_CR14","unstructured":"ETSI: Technical Specification (TS) 102 385-3 V2.2.1 (2006\u201304): Conformance Testing for WiMAX\/HiperMAN 1.2.1; Part 3: Abstract Test Suite (ATS). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (2006)"},{"key":"75_CR15","unstructured":"ETSI: Technical Specification (TS) 102 516 V1.1 (2006\u201304): IPv6 Core Protocol; Conformance Abstract Test Suite (ATS) and partial Protocol Implementation eXtra Information for Testing (PIXIT). European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France (2006)"},{"key":"75_CR16","unstructured":"ETSI: ETSI Standard (ES) 201 873 V3.2.1: The Testing and Test Control Notation version 3; Parts 1\u20138. European Telecommunications Standards Institute (ETSI), Sophia-Antipolis, France, also published as ITU-T Recommendation series. Z.140 (2007)"},{"key":"75_CR17","doi-asserted-by":"publisher","unstructured":"Fan, C.F., Yih, S.: Prescriptive metrics for software quality assurance. In: Proceedings of the First Asia-Pacific Software Engineering Conference, pp. 430\u2013438. IEEE-CS Press, Tokyo (1994). doi:10.1109\/APSEC.1994.465237","DOI":"10.1109\/APSEC.1994.465237"},{"key":"75_CR18","volume-title":"Software Metrics","author":"N.E. Fenton","year":"1997","unstructured":"Fenton, N.E., Pfleeger, S.L.: Software Metrics. PWS Publishing Company, Boston (1997)"},{"issue":"3","key":"75_CR19","doi-asserted-by":"publisher","first-page":"305","DOI":"10.1145\/356674.356676","volume":"8","author":"L.D. Fosdick","year":"1976","unstructured":"Fosdick, L.D., Osterweil, L.J.: Data flow analysis in software reliability. ACM Comput. Surv. 8(3), 305\u2013330 (1976). doi:10.1145\/356674.356676","journal-title":"ACM Comput. Surv."},{"key":"75_CR20","volume-title":"Refactoring\u2014Improving the Design of Existing Code","author":"M. Fowler","year":"1999","unstructured":"Fowler, M.: Refactoring\u2014Improving the Design of Existing Code. Addison-Wesley, Boston (1999)"},{"key":"75_CR21","unstructured":"Gamma, E., Beck, K.: JUnit (2007). http:\/\/junit.sourceforge.net"},{"issue":"3","key":"75_CR22","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1016\/S1389-1286(03)00249-4","volume":"42","author":"J. Grabowski","year":"2003","unstructured":"Grabowski, J., Hogrefe, D., R\u00e9thy, G., Schieferdecker, I., Wiles, A., Willcock, C.: An introduction to the testing and test control notation (TTCN-3). Comp. Netw. 42(3), 375\u2013403 (2003). doi:10.1016\/S1389-1286(03)00249-4","journal-title":"Comp. Netw."},{"issue":"3","key":"75_CR23","doi-asserted-by":"publisher","first-page":"226","DOI":"10.1109\/TSE.1979.234184","volume":"5","author":"J.C. Huang","year":"1979","unstructured":"Huang, J.C.: Detection of data flow anomaly through program instrumentation. IEEE Trans. Softw. Eng. 5(3), 226\u2013236 (1979). doi:10.1109\/TSE.1979.234184","journal-title":"IEEE Trans. Softw. Eng."},{"key":"75_CR24","unstructured":"Instantiations: CodePro AnalytiX (2007). http:\/\/www.instantiations.com\/codepro\/"},{"key":"75_CR25","unstructured":"ISO\/IEC: ISO\/IEC Standard No. 14598: Information technology\u2014Software product evaluation; Parts 1\u20136. International Organization for Standardization (ISO)\/International Electrotechnical Commission (IEC), Geneva, Switzerland (1999\u20132001)"},{"key":"75_CR26","unstructured":"ISO\/IEC: ISO\/IEC Standard No. 9126: Software engineering\u2014Product quality; Parts 1\u20134. International Organization for Standardization (ISO)\/International Electrotechnical Commission (IEC), Geneva, Switzerland (2001\u20132004)"},{"key":"75_CR27","unstructured":"JetBrains: IntelliJ IDEA (2007). http:\/\/www.jetbrains.com"},{"key":"75_CR28","volume-title":"Lint, a C Program Checker. Unix Programmer\u2019s Manual","author":"S. Johnson","year":"1978","unstructured":"Johnson, S.: Lint, a C Program Checker. Unix Programmer\u2019s Manual. AT&T Bell Laboratories, (1978)"},{"issue":"4","key":"75_CR29","doi-asserted-by":"publisher","first-page":"308","DOI":"10.1109\/TSE.1976.233837","volume":"2","author":"T.J. McCabe","year":"1976","unstructured":"McCabe, T.J.: A complexity measure. IEEE Trans. Softw. Eng. 2(4), 308\u2013320 (1976)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"75_CR30","unstructured":"McCall, J., Richards, P., Walters, G.: Factors in software quality. Technical Report RADC TR-77-369, US Rome Air Development Center (1977)"},{"key":"75_CR31","volume-title":"XUnit Test Patterns","author":"G. Meszaros","year":"2007","unstructured":"Meszaros, G.: XUnit Test Patterns. Addison-Wesley, Boston (2007)"},{"key":"75_CR32","doi-asserted-by":"publisher","unstructured":"Moha, N., Gu\u00e9h\u00e9neuc, Y.G., Leduc, P.: Automatic generation of detection algorithms for design defects. In: 21st IEEE\/ACM International Conference on Automated Software Engineering (ASE 2006), 18\u201322 September 2006, Tokyo, Japan, pp. 297\u2013300. IEEE Computer Society, New york (2006). doi:10.1109\/ASE.2006.22","DOI":"10.1109\/ASE.2006.22"},{"key":"75_CR33","doi-asserted-by":"publisher","unstructured":"Munro, M.: Product metrics for automatic identification of \u201cBad Smell\u201d design problems in Java source-code. In: 11th IEEE International Symposium on Software Metrics (METRICS 2005), 19\u201322 September 2005, Como, Italy. IEEE Computer Society, New York (2005). doi:10.1109\/METRICS.2005.38","DOI":"10.1109\/METRICS.2005.38"},{"key":"75_CR34","volume-title":"The Art of Software Testing","author":"G. Myers","year":"1979","unstructured":"Myers, G.: The Art of Software Testing. Wiley, New York (1979)"},{"key":"75_CR35","doi-asserted-by":"publisher","unstructured":"Neukirchen, H., Bisanz, M.: Utilising code smells to detect quality problems in TTCN-3 test suites. In: Petrenko, A., Veanes, M., Tretmans, J., Grieskamp, W. (eds.) Testing of Communicating Systems\/Formal Approaches to Testing of Software 2007, Tallinn, Estonia, June 26\u201329, 2007. Lecture Notes in Computer Science (LNCS), vol. 4581, pp. 228\u2013243. Springer, Berlin (2007). doi:10.1007\/978-3-540-73066-8_16","DOI":"10.1007\/978-3-540-73066-8_16"},{"key":"75_CR36","unstructured":"N\u00f6dler, J.: An XML-based approach for software analysis\u2014applied to detect bad smells in TTCN-3 test suites. Master\u2019s thesis, Center for Computational Sciences, University of G\u00f6ttingen, Germany, ZFI-BM-2007-36 (2007). http:\/\/www.swe.informatik.uni-goettingen.de\/publications\/JN\/noedler-masters-thesis.pdf"},{"key":"75_CR37","unstructured":"OMG: UML Testing Profile (Version 1.0 formal\/05-07-07). Object Management Group (OMG) (2005)"},{"key":"75_CR38","unstructured":"Opdyke, W.: Refactoring object-oriented frameworks. Ph.D. thesis, University of Illinois at Urbana-Champaign, USA (1992)"},{"key":"75_CR39","unstructured":"Parnas, D.: Software aging. In: Proceedings of the 16th International Conference on Software Engineering (ICSE), May 16\u201321, 1994, Sorrento, Italy, pp. 279\u2013287. IEEE Computer Society\/ACM Press, New York (1994)"},{"key":"75_CR40","unstructured":"Parr, T.: ANTLR parser generator v2 (2007). http:\/\/www.antlr2.org"},{"key":"75_CR41","unstructured":"Pugh, B.: FindBugs (2007). http:\/\/findbugs.sourceforge.net"},{"issue":"4","key":"75_CR42","doi-asserted-by":"publisher","first-page":"253","DOI":"10.1002\/(SICI)1096-9942(1997)3:4<253::AID-TAPO3>3.0.CO;2-T","volume":"3","author":"D. Roberts","year":"1997","unstructured":"Roberts, D., Brant, J., Johnson, R.: A refactoring tool for smalltalk. theory and practice of object systems 3(4), 253\u2013263 (1997). doi:10.1002\/(SICI)1096-9942(1997)3:4<253::AID-TAPO3>3.3.CO;2-I","journal-title":"theory and practice of object systems"},{"key":"75_CR43","doi-asserted-by":"publisher","unstructured":"van Rompaey, B., du Bois, B., Demeyer, S.: Characterizing the relative significance of a test smell. In: Proceedings of the 22nd IEEE International Conference on Software Maintenance (ICSM 2006), Philadelphia, Pennsylvania, September 25\u201327, 2006, pp. 391\u2013400. IEEE Computer Society (2006). doi:10.1109\/ICSM.2006.18","DOI":"10.1109\/ICSM.2006.18"},{"key":"75_CR44","unstructured":"Sauer, F.: Eclipse Metrics Plugin (2007). http:\/\/metrics.sourceforge.net"},{"key":"75_CR45","unstructured":"Sneed, H.M.: Measuring the effectiveness of software testing. In: Beydeda, S., Gruhn, V., Mayer, J., Reussner, R., Schweiggert, F. (eds.) Proceedings of SOQUA 2004 (First International Workshop on Software Quality) and TECOS 2004 (Workshop Testing Component-Based Systems). Lecture Notes in Informatics (LNI), vol. 58. Gesellschaft f\u00fcr Informatik, K\u00f6llen Verlag, Bonn (2004)"},{"key":"75_CR46","unstructured":"Telelogic: Logiscope (2007). http:\/\/www.telelogic.de\/products\/logiscope\/"},{"key":"75_CR47","unstructured":"Testing Technologies: TTworkbench (2007). http:\/\/www.testingtech.de\/products_services\/ttwb_intro.php"},{"key":"75_CR48","unstructured":"TRex Team: TRex Website (2007). http:\/\/www.trex.informatik.uni-goettingen.de"},{"key":"75_CR49","unstructured":"Vega, D.E., Schieferdecker, I.: Towards quality of TTCN-3 tests. In: Proceedings of SAM\u201906: Fifth Workshop on System Analysis and Modelling, May 31\u2013June 2, 2006, University of Kaiserslautern, Germany. University of Kaiserslautern, Germany (2006)"},{"key":"75_CR50","unstructured":"XQuery 1.0: An XML Query Language. World Wide Web Consortium (W3C) Recommendation 23 January 2007 (2007)"},{"key":"75_CR51","unstructured":"Watson, A.H., McCabe, T.J.: Structured testing: a testing methodology using the cyclomatic complexity metricy. NIST Special Publication 500\u2013235, National Institute of Standards and Technology, Computer Systems Laboratory, Gaithersburg (1996)"},{"key":"75_CR52","doi-asserted-by":"publisher","unstructured":"Werner, E., Grabowski, J., Neukirchen, H., R\u00f6ttger, N., Waack, S., Zeiss, B.: TTCN-3 quality engineering: using learning techniques to evaluate metric sets. In: Gaudin, E., Najm, E., Reed, R. (eds.) SDL 2007: Design for Dependable Systems, 13th International SDL Forum, Paris, France, September 18\u201321, 2007, Proceedings. Lecture Notes in Computer Science (LNCS), vol. 4745, pp. 54\u201368. Springer, Berlin (2007). doi:10.1007\/978-3-540-74984-4_4","DOI":"10.1007\/978-3-540-74984-4_4"},{"key":"75_CR53","unstructured":"Zeiss, B.: A refactoring tool for TTCN-3. Master\u2019s thesis, Center for Computational Sciences, University of G\u00f6ttingen, Germany, ZFI-BM-2006-05 (2006). http:\/\/www.swe.informatik.uni-goettingen.de\/publications\/BZ\/zeiss_mastersthesis.pdf"},{"key":"75_CR54","doi-asserted-by":"publisher","unstructured":"Zeiss, B., Neukirchen, H., Grabowski, J., Evans, D., Baker, P.: Refactoring and Metrics for TTCN-3 Test Suites. In: Gotzhein, R., Reed, R. (eds.) System Analysis and Modeling: Language Profiles. 5th International Workshop, SAM 2006, Kaiserslautern, Germany, May 31\u2013June 2, 2006, Revised Selected Papers, Lecture Notes in Computer Science (LNCS), vol. 4320, pp. 148\u2013165. Springer, Berlin (2006). doi:10.1007\/11951148_10","DOI":"10.1007\/11951148_10"},{"key":"75_CR55","unstructured":"Zeiss, B., Neukirchen, H., Grabowski, J., Evans, D., Baker, P.: TRex\u2014an open-source tool for quality assurance of TTCN-3 test suites. In: Proceedings of CONQUEST 2006\u20149th International Conference on Quality Engineering in Software Technology, September 27\u201329, Berlin, Germany, pp. 117\u2013128. dpunkt.Verlag, Heidelberg (2006)"},{"key":"75_CR56","unstructured":"Zeiss, B., Vega, D., Schieferdecker, I., Neukirchen, H., Grabowski, J.: Applying the ISO 9126 quality model to test specifications\u2014exemplified for TTCN-3 test specifications. In: Bleeck, W.G., Rasch, J. Z\u00fcllighoven, H. (eds.) Proceedings of Software Engineering 2007 (SE 2007). Lecture Notes in Informatics (LNI), vol. 105, pp. 231\u2013242. Gesellschaft f\u00fcr Informatik, K\u00f6llen, Bonn (2007)"}],"container-title":["International Journal on Software Tools for Technology Transfer"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10009-008-0075-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10009-008-0075-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10009-008-0075-0.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10009-008-0075-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,8,31]],"date-time":"2021-08-31T19:55:07Z","timestamp":1630439707000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10009-008-0075-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5,6]]},"references-count":56,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2008,8]]}},"alternative-id":["75"],"URL":"https:\/\/doi.org\/10.1007\/s10009-008-0075-0","relation":{},"ISSN":["1433-2779","1433-2787"],"issn-type":[{"value":"1433-2779","type":"print"},{"value":"1433-2787","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,5,6]]},"assertion":[{"value":"6 May 2008","order":1,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}],"article-number":"309"}}