{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T07:25:54Z","timestamp":1648711554401},"reference-count":37,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2013,7,11]],"date-time":"2013-07-11T00:00:00Z","timestamp":1373500800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int J Softw Tools Technol Transfer"],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1007\/s10009-013-0283-0","type":"journal-article","created":{"date-parts":[[2013,7,10]],"date-time":"2013-07-10T06:35:01Z","timestamp":1373438101000},"page":"247-267","source":"Crossref","is-referenced-by-count":3,"title":["Testing hybrid systems with TTCN-3 embedded"],"prefix":"10.1007","volume":"16","author":[{"given":"Juergen","family":"Grossmann","sequence":"first","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2013,7,11]]},"reference":[{"key":"283_CR1","doi-asserted-by":"crossref","unstructured":"Alur, R., Courcoubetis, C., Henzinger, T.A., Ho, P-H.: Hybrid automata: an algorithmic approach to the specification and verification of hybrid systems. In: Hybrid Systems, 209\u2013229 (1992)","DOI":"10.1007\/3-540-57318-6_30"},{"key":"283_CR2","doi-asserted-by":"crossref","unstructured":"Alur, R., Henzinger, T.A.: Modularity for timed and hybrid systems, Springer, Berlin, 74\u201388 (1997)","DOI":"10.1007\/3-540-63141-0_6"},{"key":"283_CR3","unstructured":"ASAM. ASAM HIL V1.0.0. URL: http:\/\/www.asam.net\/nc\/home\/standards\/standard-detail.html?tx &start="},{"key":"283_CR4","unstructured":"Autosar Consortium. Web Site of the Autosar Consortium (2012)"},{"key":"283_CR5","doi-asserted-by":"crossref","unstructured":"B\u00f6rger, E., Schulte, W.: A programmer friendly modular definition of the semantics of Java. In: Formal Syntax and Semantics of Java. Springer, London (1999). ISBN 3-540-66158-1, 353\u2013404","DOI":"10.1007\/3-540-48737-9_10"},{"key":"283_CR6","doi-asserted-by":"crossref","unstructured":"Bringmann, E., Kraemer, A.: Systematic testing of the continuous behavior of automotive systems. In: SEAS \u201906: Proc. of the 2006 international workshop on Software engineering for automotive systems. ACM Press, New York (2006). ISBN 1-59593-402-2, 13\u201320","DOI":"10.1145\/1138474.1138479"},{"key":"283_CR7","doi-asserted-by":"crossref","unstructured":"Broy, M.: Refinement of time. In: Bertran, M. (Hrsg.); Rus, Th. (Hrsg.): Transformation-based reactive system development, ARTS\u201997, TCS, 44\u201363 (1997)","DOI":"10.1007\/3-540-63010-4_4"},{"key":"283_CR8","doi-asserted-by":"crossref","unstructured":"Conrad, M.: Modell-basierter Test eingebetteter Software im Automobil. Diss, TU-Berlin (2004)","DOI":"10.1007\/978-3-322-81246-9"},{"key":"283_CR9","unstructured":"dSpace AG. dSPACE AutomationDesk (2012)"},{"key":"283_CR10","unstructured":"ETAS Group. ETAS\u2014Hardware in the loop (HiL)\u2014ECU Testing\u2014Applications and Solutions\u2014ETAS Products (2012)"},{"key":"283_CR11","unstructured":"ETSI. Methods for testing and specification (MTS). The Testing and Test Control Notation Version 3, Part 1: TTCN-3 Core Language (ETSI Std. ES 201 873\u20131 V4.3.1) (2011)"},{"key":"283_CR12","unstructured":"ETSI. Methods for testing and specification (MTS). The Testing and Test Control Notation Version 3, Part 4: TTCN-3 Operational Semantics (ETSI Std. ES 201 873\u20134 V4.3.1) (2011)"},{"key":"283_CR13","unstructured":"ETSI. Methods for testing and specification (MTS). The Testing and Test Control Notation Version 3, TTCN-3 Language Extensions: Support of interfaces with continuous signals (ETSI Std. ES 202 786 V1.1.1) (2012)"},{"key":"283_CR14","doi-asserted-by":"crossref","unstructured":"Gl\u00e4sser, U.; Gotzhein, R., Prinz, A.: Towards a new formal SDL semantics based on abstract state machines. In: SDL \u201999\u2014The Next Millenium, 9th SDL Forum Proceedings (1999)","DOI":"10.1016\/B978-044450228-5\/50013-8"},{"key":"283_CR15","unstructured":"Grossmann, J., Conrad, M., Fey, I., Wewetzer, C., Lamberg, K., Krupp. A.: TestML a language for exchange of Tests (2006)"},{"key":"283_CR16","doi-asserted-by":"crossref","unstructured":"Grossmann, J., Makedonski, P., Wiesbrock, H-W., Svacina, J., Schieferdecker, I., Grabowski, J.: Model-based X-in-the-loop testing. CRC Press, Boca Raton (2011)","DOI":"10.1201\/b11321-13"},{"key":"283_CR17","unstructured":"Gurevich, Y.: Evolving algebras 1993: Lipari guide. Oxford University Press Inc., New York (1995) 9\u201336 ISBN 0-19-853854-5"},{"key":"283_CR18","unstructured":"IEEE: The Institute of Electrical and Electronics Engineers, Inc. IEEE Standard VHDL (IEEE Std. 1076\u20131993) (1993)"},{"key":"283_CR19","unstructured":"IEEE: The Institute of Electrical and Electronics Engineers, Inc. IEEE Standard Test Language for all Systems-Common\/Abbreviated Test Language for All Systems (C\/ATLAS) (IEEE Std.716-1995) (1995)"},{"key":"283_CR20","unstructured":"IEEE: The Institute of Electrical and Electronics Engineers, Inc. User\u2019s Manual for the Signal and Method Modeling Language. (1998)"},{"key":"283_CR21","unstructured":"IEEE: The Institute of Electrical and Electronics Engineers, Inc. IEEE Standard VHDL Analog and Mixed-Signal Extensions (IEEE Std. 1076.1-1999) (1999)"},{"key":"283_CR22","unstructured":"IEEE: The Institute of Electrical and Electronics Engineers, Inc. IEEE Standard Test Access Port and Boundary-Scan Architecture (IEEE Std.1149.1 -2001) (2001)"},{"key":"283_CR23","unstructured":"Lim, J.S., Oppenheim, A.V.: Advanced topics in signal processing. Prentice-Hall Inc., NJ (1987). ISBN 0-13-013129-6"},{"key":"283_CR24","unstructured":"Lynch, N.A., Segala, R., Vaandrager, F.W., Weinberg, H.B.: Hybrid I\/O Automata. In: Alur, R., Henzinger, T.A., Sontag, E.D. (eds.) Hybrid Systems Bd. 1066, Springer, Berlin (1995). ISBN 3-540-61155-X, 496\u2013510"},{"key":"283_CR25","unstructured":"Mauel, M., Nissen, H.W., Hartung, G.: An Application of TTCN-3 Embedded in the Automotive Sector. URL: http:\/\/www.ttcn-3.org\/TTCN3UC2011\/Pres\/26_T3UC-Mauel_AnApplicationOfTTC N3EmbeddedInTheAutomotiveSector.ppt. 2011"},{"key":"283_CR26","unstructured":"MBtech Group. PROVEtech: TA\u2014\u00dcberblick. (2012)"},{"key":"283_CR27","unstructured":"National Instruments. NI TestStand\u2014Products and Services\u2014National Instruments (2012)"},{"key":"283_CR28","unstructured":"Parker, K.P., Oresjo, S.: A language for describing boundary scan devices. J. Electron. Test. 2(1), 43\u201375 (1991). ISSN 0923\u20138174"},{"key":"283_CR29","unstructured":"SCC20 ATML Group. IEEE ATML Specification Drafts and IEEE ATML Status reports (2006)"},{"key":"283_CR30","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-642-59495-3","volume-title":"Java and the Java virtual machine: definition, verification, validation","author":"RF St\u00e4rk","year":"2001","unstructured":"St\u00e4rk, R.F., Schmid, J., B\u00f6rger, E.: Java and the Java virtual machine: definition, verification, validation. Springer, Berlin (2001)"},{"issue":"7","key":"283_CR31","doi-asserted-by":"crossref","first-page":"491","DOI":"10.1007\/s002360050095","volume":"34","author":"R Stephens","year":"1997","unstructured":"Stephens, R.: A survey of stream processing. Acta Informatica 34(7), 491\u2013541 (1997)","journal-title":"Acta Informatica"},{"key":"283_CR32","doi-asserted-by":"crossref","unstructured":"Suparjo, B., Ley, A., Cron, A., Ehrenberg, H.: Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test. In: International Test Conference, 152\u2013160 (2006)","DOI":"10.1109\/TEST.2006.297708"},{"key":"283_CR33","unstructured":"TEMEA.TEMEA Project (Testing Methods for Embedded Systems of the Automotive Industry), founded by the European Community (EFRE) (2009)"},{"key":"283_CR34","unstructured":"The MathWorks. Web Pages of Simulink\u2014Simulation and Model-Based Design (2006)"},{"key":"283_CR35","unstructured":"The MathWorks. Modeling an Automatic Transmission Controller. URL: http:\/\/www.mathworks.de\/de\/help\/simulink\/examples\/modeling-an-automatic-transmission-controller.html . (2013)"},{"key":"283_CR36","unstructured":"Vector Informatik GmbH. Vector[Portfolio-\u00dcbersicht \u201dSteuerger \u00e4te-Test\u201d]. (2007)"},{"key":"283_CR37","unstructured":"Wallace, C.: The Semantics of the C++ Programming Language. In: B\u00f6rger, E. (ed.) Specification and Validation Methods. Oxford University Press, New York (1994)"}],"container-title":["International Journal on Software Tools for Technology Transfer"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10009-013-0283-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10009-013-0283-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10009-013-0283-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,17]],"date-time":"2019-07-17T19:42:59Z","timestamp":1563392579000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10009-013-0283-0"}},"subtitle":["An extension of the TTCN-3 language"],"short-title":[],"issued":{"date-parts":[[2013,7,11]]},"references-count":37,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2014,6]]}},"alternative-id":["283"],"URL":"https:\/\/doi.org\/10.1007\/s10009-013-0283-0","relation":{},"ISSN":["1433-2779","1433-2787"],"issn-type":[{"value":"1433-2779","type":"print"},{"value":"1433-2787","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,7,11]]}}}