{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T21:45:56Z","timestamp":1773697556353,"version":"3.50.1"},"reference-count":47,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T00:00:00Z","timestamp":1756425600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T00:00:00Z","timestamp":1756425600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Pattern Anal Applic"],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1007\/s10044-025-01526-6","type":"journal-article","created":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T11:05:55Z","timestamp":1756465555000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":3,"title":["MDUA-YOLO: an advanced deep learning approach for PCB surface defect detection"],"prefix":"10.1007","volume":"28","author":[{"given":"Xiaowei","family":"Liu","sequence":"first","affiliation":[]},{"given":"Haichao","family":"Wang","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,8,29]]},"reference":[{"key":"1526_CR1","doi-asserted-by":"publisher","first-page":"139017","DOI":"10.1109\/ACCESS.2023.3339561","volume":"11","author":"X Chen","year":"2023","unstructured":"Chen X, Wu Y, He X, Ming W (2023) A comprehensive review of deep learning-based PCB defect detection. IEEE Access 11:139017\u2013139038","journal-title":"IEEE Access"},{"key":"1526_CR2","doi-asserted-by":"publisher","first-page":"277","DOI":"10.1007\/s10044-017-0640-9","volume":"21","author":"VH Gaidhane","year":"2018","unstructured":"Gaidhane VH, Hote YV, Singh V (2018) An efficient similarity measure approach for PCB surface defect detection. Patt Anal Appl 21:277\u2013289","journal-title":"Patt Anal Appl"},{"key":"1526_CR3","doi-asserted-by":"publisher","first-page":"163","DOI":"10.1109\/TCPMT.2018.2873744","volume":"9","author":"DM Tsai","year":"2019","unstructured":"Tsai DM, Huang CK (2019) Defect detection in electronic surfaces using template-based Fourier image reconstruction. IEEE Trans Comp Packag Manuf Technol 9:163\u2013172","journal-title":"IEEE Trans Comp Packag Manuf Technol"},{"key":"1526_CR4","doi-asserted-by":"publisher","first-page":"34437","DOI":"10.1007\/s11042-019-08097-9","volume":"78","author":"AA-IM Hassanin","year":"2019","unstructured":"Hassanin AA-IM, Abd El-Samie F-E, El Banby GM (2019) A real-time approach for automatic defect detection from PCBs based on SURF features and morphological operations. Multim Tools Appl 78:34437\u201334457","journal-title":"Multim Tools Appl"},{"key":"1526_CR5","doi-asserted-by":"crossref","unstructured":"Pisner DA, Schnyer DM (2020) Support vector machine. Mach Learn 101\u2013121","DOI":"10.1016\/B978-0-12-815739-8.00006-7"},{"key":"1526_CR6","doi-asserted-by":"publisher","first-page":"197","DOI":"10.1007\/s11749-016-0481-7","volume":"25","author":"G Biau","year":"2016","unstructured":"Biau G, Scornet E (2016) A random forest guided tour. TEST 25:197\u2013227","journal-title":"TEST"},{"key":"1526_CR7","doi-asserted-by":"crossref","unstructured":"Kruse R, Mostaghim S, Borgelt C, Braune C, Steinbrecher M (2022) Multi-layer perceptrons. Computational intelligence: a methodological introduction, 53\u2013124","DOI":"10.1007\/978-3-030-42227-1_5"},{"key":"1526_CR8","doi-asserted-by":"publisher","first-page":"420","DOI":"10.1007\/s001700200172","volume":"20","author":"DM Tsai","year":"2002","unstructured":"Tsai DM, Lin CK (2002) Defect detection of gold-plated surfaces on PCB using entropy measures. Int J Adv Manuf Technol 20:420\u2013428","journal-title":"Int J Adv Manuf Technol"},{"key":"1526_CR9","doi-asserted-by":"publisher","first-page":"1741","DOI":"10.1049\/joe.2018.8270","volume":"16","author":"Z Lu","year":"2018","unstructured":"Lu Z, He Q, Xiang X, Liu H (2018) Defect detection of PCB based on Bayes feature fusion. J Eng 16:1741\u20131745","journal-title":"J Eng"},{"key":"1526_CR10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2020.102918","volume":"72","author":"L Xiao","year":"2020","unstructured":"Xiao L, Wu B, Hu Y (2020) OSED: object-specific edge detection. J Vis Commun Image Rep 72:102918","journal-title":"J Vis Commun Image Rep"},{"issue":"5","key":"1526_CR11","doi-asserted-by":"publisher","first-page":"2671","DOI":"10.1109\/JSEN.2019.2954124","volume":"20","author":"L Xiao","year":"2019","unstructured":"Xiao L, Wu B, Hu Y, Liu J (2019) A hierarchical features-based model for freight train defect inspection. IEEE Sens J 20(5):2671\u20132678","journal-title":"IEEE Sens J"},{"issue":"13","key":"1526_CR12","doi-asserted-by":"publisher","first-page":"7181","DOI":"10.1109\/JSEN.2020.2977366","volume":"20","author":"L Xiao","year":"2020","unstructured":"Xiao L, Wu B, Hu Y (2020) Surface defect detection using image pyramid. IEEE Sens J 20(13):7181\u20137188","journal-title":"IEEE Sens J"},{"key":"1526_CR13","doi-asserted-by":"publisher","first-page":"2485","DOI":"10.1007\/s00170-020-05205-0","volume":"107","author":"L Xiao","year":"2020","unstructured":"Xiao L, Lu M, Huang H (2020) Detection of powder bed defects in selective laser sintering using convolutional neural network. Int J Adv Manuf Technol 107:2485\u20132496","journal-title":"Int J Adv Manuf Technol"},{"key":"1526_CR14","first-page":"1","volume":"70","author":"L Xiao","year":"2020","unstructured":"Xiao L, Wu B, Hu Y (2020) Missing small fastener detection using deep learning. IEEE Trans Instrum Meas 70:1\u20139","journal-title":"IEEE Trans Instrum Meas"},{"key":"1526_CR15","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2024.112520","volume":"304","author":"H Zhong","year":"2024","unstructured":"Zhong H, Xiao L, Wang H, Zhang X, Wan C, Hu Y, Wu B (2024) LiFSO-Net: a lightweight feature screening optimization network for complex-scale flat metal defect detection. Knowl-Based Syst 304:112520","journal-title":"Knowl-Based Syst"},{"key":"1526_CR16","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.102437","volume":"61","author":"H Zhong","year":"2024","unstructured":"Zhong H, Fu D, Xiao L (2024) STFE-Net: a multi-stage approach to enhance statistical texture feature for defect detection on metal surfaces. Adv Eng Inform 61:102437","journal-title":"Adv Eng Inform"},{"key":"1526_CR17","unstructured":"Niu J, Huang J, Cui L, Zhang B, Zhu A (2022) A PCB defect detection algorithm with improved faster R-CNN. ICBASE 283\u2013292"},{"issue":"4","key":"1526_CR18","doi-asserted-by":"publisher","DOI":"10.1117\/1.JEI.30.4.043004","volume":"30","author":"G Liu","year":"2021","unstructured":"Liu G, Wen H (2021) Printed circuit board defect detection based on MobileNet-YOLO-Fast. J Electron Imag 30(4):043004","journal-title":"J Electron Imag"},{"key":"1526_CR19","doi-asserted-by":"crossref","unstructured":"Ran G, Lei X, Li D, Guo Z (2020) Research on PCB defect detection using deep convolutional nerual network. Int Conf Mech 1310\u20131314","DOI":"10.1109\/ICMCCE51767.2020.00287"},{"key":"1526_CR20","doi-asserted-by":"publisher","first-page":"108335","DOI":"10.1109\/ACCESS.2020.3001349","volume":"8","author":"B Hu","year":"2020","unstructured":"Hu B, Wang J (2020) Detection of PCB surface defects with improved faster-RCNN and feature pyramid network. IEEE Access 8:108335\u2013108345","journal-title":"IEEE Access"},{"key":"1526_CR21","first-page":"1","volume":"71","author":"N Zeng","year":"2022","unstructured":"Zeng N, Wu P, Wang Z, Li H, Liu W, Liu X (2022) A small-sized object detection oriented multi-scale feature fusion approach with application to defect detection. IEEE Trans Instrum Meas 71:1\u201314","journal-title":"IEEE Trans Instrum Meas"},{"key":"1526_CR22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115673","volume":"185","author":"H Zhang","year":"2021","unstructured":"Zhang H, Jiang L, Li C (2021) CS-ResNet: cost-sensitive residual convolutional neural network for PCB cosmetic defect detection. Expert Syst Appl 185:115673","journal-title":"Expert Syst Appl"},{"key":"1526_CR23","doi-asserted-by":"crossref","unstructured":"Kang L, Ge Y, Huang H, Zhao M (2022) Research on pcb surface defect detection based on SSD. In: 2022 IEEE 4th international conference on civil aviation safety and information technology 1315\u20131319","DOI":"10.1109\/ICCASIT55263.2022.9986754"},{"issue":"10","key":"1526_CR24","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac793d","volume":"33","author":"G Chen","year":"2022","unstructured":"Chen G, Xu F, Liu G, Chen CM, Liu M, Zhang J, Niu X (2022) ESDDNet: efficient small defect detection network of workpiece surface. Meas Sci Technol 33(10):105007","journal-title":"Meas Sci Technol"},{"key":"1526_CR25","doi-asserted-by":"crossref","unstructured":"Tan M, Pang R, Le QV (2020) Efficientdet: Scalable and efficient object detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition 10781\u201310790","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"1526_CR26","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.106359","volume":"123","author":"W Jiang","year":"2023","unstructured":"Jiang W, Li T, Zhang S, Chen W, Yang J (2023) PCB defects target detection combining multi-scale and attention mechanism. Eng Appl Artif Intell 123:106359","journal-title":"Eng Appl Artif Intell"},{"issue":"13","key":"1526_CR27","doi-asserted-by":"publisher","first-page":"2821","DOI":"10.3390\/electronics12132821","volume":"12","author":"B Du","year":"2023","unstructured":"Du B, Wan F, Lei G, Xu L, Xu C, Xiong Y (2023) YOLO-MBBi: PCB surface defect detection method based on enhanced YOLOv5. Electronics 12(13):2821","journal-title":"Electronics"},{"issue":"2","key":"1526_CR28","doi-asserted-by":"publisher","first-page":"5451","DOI":"10.1007\/s11042-023-15495-7","volume":"83","author":"Q Zhao","year":"2024","unstructured":"Zhao Q, Ji T, Liang S, Yu W (2024) PCB surface defect fast detection method based on attention and multi-source fusion. Multim Tools Appl 83(2):5451\u20135472","journal-title":"Multim Tools Appl"},{"key":"1526_CR29","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107628","volume":"129","author":"L Zhang","year":"2024","unstructured":"Zhang L, Chen J, Chen J, Wen Z, Zhou X (2024) LDD-Net: lightweight printed circuit board defect detection network fusing multi-scale features. Eng Appl Artif Intell 129:107628","journal-title":"Eng Appl Artif Intell"},{"issue":"1","key":"1526_CR30","doi-asserted-by":"publisher","first-page":"9805","DOI":"10.1038\/s41598-023-36854-2","volume":"13","author":"K Xia","year":"2023","unstructured":"Xia K, Lv Z, Liu K, Lu Z, Zhou C, Zhu H, Chen X (2023) Global contextual attention augmented YOLO with ConvMixer prediction heads for PCB surface defect detection. Sci Rep 13(1):9805","journal-title":"Sci Rep"},{"key":"1526_CR31","first-page":"1","volume":"73","author":"M Yuan","year":"2024","unstructured":"Yuan M, Zhou Y, Ren X, Zhi H, Zhang J, Chen H (2024) YOLO-HMC: an improved method for PCB surface defect detection. IEEE Trans Instrum Meas 73:1\u201311","journal-title":"IEEE Trans Instrum Meas"},{"issue":"1","key":"1526_CR32","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s11760-024-03646-8","volume":"19","author":"LJ Liu","year":"2025","unstructured":"Liu LJ, Zhang Y, Karimi HR (2025) Defect detection of printed circuit board Surface based on an improved YOLOv8 with FasterNet backbone algorithms. SIViP 19(1):1\u20139","journal-title":"SIViP"},{"issue":"7","key":"1526_CR33","doi-asserted-by":"publisher","first-page":"1915","DOI":"10.1049\/ipr2.13073","volume":"18","author":"F Chen","year":"2024","unstructured":"Chen F, Deng M, Gao H, Yang X, Zhang D (2024) NHD-YOLO: improved YOLOv8 using optimized neck and head for product surface defect detection with data augmentation. IET Image Proc 18(7):1915\u20131926","journal-title":"IET Image Proc"},{"key":"1526_CR34","doi-asserted-by":"crossref","unstructured":"Lin TY, Doll\u00e1r P, Girshick R, He K, Hariharan B, Belongie S (2017) Feature pyramid networks for object detection. Proc IEEE Conf Comput Vis Pattern Recognit 2117\u20132125","DOI":"10.1109\/CVPR.2017.106"},{"key":"1526_CR35","doi-asserted-by":"crossref","unstructured":"Yang J, Fu X, Hu Y, Huang Y, Ding X, Paisley J (2017) PanNet: A deep network architecture for pan-sharpening. In: Proceedings of the IEEE international conference on computer vision 5449\u20135457","DOI":"10.1109\/ICCV.2017.193"},{"key":"1526_CR37","doi-asserted-by":"publisher","first-page":"1968","DOI":"10.1109\/TMM.2021.3074273","volume":"24","author":"C Deng","year":"2021","unstructured":"Deng C, Wang M, Liu L, Liu Y (2021) Extended feature pyramid network for small object detection. IEEE Trans Multim 24:1968\u20131979","journal-title":"IEEE Trans Multim"},{"key":"1526_CR38","doi-asserted-by":"crossref","unstructured":"Liu S, Di H (2018) Receptive field block net for accurate and fast object detection. In: Proceedings of the European conference on computer vision (ECCV) 385\u2013400","DOI":"10.1007\/978-3-030-01252-6_24"},{"issue":"6","key":"1526_CR40","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2016","unstructured":"Ren S, He K, Girshick R, Sun J (2016) Faster r-cnn: towards real-time object detection with region proposal networks. IEEE Trans Pattern Anal Mach Intell 39(6):1137\u20131149","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"1526_CR41","doi-asserted-by":"crossref","unstructured":"Liu W, Anguelov D, Erhan D, Szegedy C (2016) Ssd: single shot multibox detector. Computer Vision-ECCV, 14th European Conference. Amsterdam The Netherlands 2016:11\u201314","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"1526_CR42","doi-asserted-by":"crossref","unstructured":"Lin T (2017) Focal loss for dense object detection. arXiv preprint arXiv:1708.02002","DOI":"10.1109\/ICCV.2017.324"},{"key":"1526_CR43","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.123199","volume":"246","author":"Q Liu","year":"2024","unstructured":"Liu Q, Liu M, Jonathan QM, Shen W (2024) A real-time anchor-free defect detector with global and local feature enhancement for surface defect detection. Expert Syst Appl 246:123199","journal-title":"Expert Syst Appl"},{"issue":"7","key":"1526_CR44","doi-asserted-by":"publisher","first-page":"5963","DOI":"10.3390\/su15075963","volume":"15","author":"J Tang","year":"2023","unstructured":"Tang J, Liu S, Zhao D, Tang L, Zou W, Zheng B (2023) PCB-YOLO: an improved detection algorithm of PCB surface defects based on YOLOv5. Sustainability 15(7):5963","journal-title":"Sustainability"},{"key":"1526_CR45","doi-asserted-by":"crossref","unstructured":"Tan M, Pang R, Le QV (2020) Efficientdet: Scalable and efficient object detection. In: Proceedings of the IEEE\/CVF conference on computer vision and pattern recognition 10781\u201310790","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"1526_CR46","doi-asserted-by":"crossref","unstructured":"Ye M, Wang H, Xiao H (2023) Light-YOLOv5: A lightweight algorithm for improved YOLOv5 in PCB defect detection. In: 2023 IEEE 2nd International Conference on Electrical Engineering, Big Data and Algorithms (EEBDA). 523\u2013528","DOI":"10.1109\/EEBDA56825.2023.10090731"},{"key":"1526_CR47","doi-asserted-by":"crossref","unstructured":"Li Q, Wu L, Xiao H, Huang C (2024) PCB-DETR: a detection network of PCB surface defect with spatial attention offset module. IEEE Access","DOI":"10.1109\/ACCESS.2024.3486176"},{"key":"1526_CR48","doi-asserted-by":"publisher","first-page":"110","DOI":"10.1049\/trit.2019.0019","volume":"4","author":"R Ding","year":"2019","unstructured":"Ding R, Dai L, Li G, Liu H (2019) TDD-net: a tiny defect detection network for printed circuit boards. CAAI Trans Intell Technol 4:110\u2013116","journal-title":"CAAI Trans Intell Technol"},{"key":"1526_CR49","unstructured":"Cui C, Gao T, Wei S, Du Y, Guo R, Dong S, Lu B, Zhou Y, Lv X, Liu Q, Hu X, Yu D, Ma Y (2021) PP-LCNet: a lightweight CPU convolutional neural network. arXiv preprint arXiv:2109.15099 15099"}],"container-title":["Pattern Analysis and Applications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10044-025-01526-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10044-025-01526-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10044-025-01526-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T08:00:34Z","timestamp":1765008034000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10044-025-01526-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8,29]]},"references-count":47,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["1526"],"URL":"https:\/\/doi.org\/10.1007\/s10044-025-01526-6","relation":{},"ISSN":["1433-7541","1433-755X"],"issn-type":[{"value":"1433-7541","type":"print"},{"value":"1433-755X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,8,29]]},"assertion":[{"value":"25 December 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"5 July 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"29 August 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no Conflict of interest.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}},{"value":"This declaration is not applicable.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Ethical approval"}}],"article-number":"164"}}