{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:30:55Z","timestamp":1760596255619,"version":"3.41.0"},"reference-count":46,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2015,4,28]],"date-time":"2015-04-28T00:00:00Z","timestamp":1430179200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Softw Syst Model"],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1007\/s10270-015-0462-4","type":"journal-article","created":{"date-parts":[[2015,4,27]],"date-time":"2015-04-27T06:17:07Z","timestamp":1430115427000},"page":"417-441","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":14,"title":["Automated product line test case selection: industrial case study and controlled experiment"],"prefix":"10.1007","volume":"16","author":[{"given":"Shuai","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shaukat","family":"Ali","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arnaud","family":"Gotlieb","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marius","family":"Liaaen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2015,4,28]]},"reference":[{"key":"462_CR1","doi-asserted-by":"publisher","first-page":"615","DOI":"10.1016\/j.is.2010.01.001","volume":"35","author":"D Benavides","year":"2010","unstructured":"Benavides, D., Segura, S., Cort\u00e9s, A.R.: Automated analysis of feature models 20 years later. A literature review. Inf. Syst. 35, 615\u2013636 (2010)","journal-title":"Inf. Syst."},{"key":"462_CR2","doi-asserted-by":"publisher","unstructured":"Czarnecki, K., Kim, C., Kalleberg, K.: Feature models are views on ontologies. In: Proceedings of the International Software Product Line Conference, pp. 41\u201351. (2006)","DOI":"10.1109\/SPLINE.2006.1691576"},{"key":"462_CR3","doi-asserted-by":"publisher","unstructured":"Ali, S., Yue, T., Briand, L.C., Walawege, S.: A product line modeling and configuration methodology to support model-based testing: an industrial case study. In: Proceedings of the ACM International Conference on Model Driven Engineering Languages and Systems (MODELS), pp. 726\u2013742. (2012)","DOI":"10.1007\/978-3-642-33666-9_46"},{"key":"462_CR4","unstructured":"Wang, S., Ali, S., Yue, T.: Product Line Modeling and configuration methodology using feature model for supporting model-based testing. Simula Research Laboratory. Technical Report, pp. 2012\u20132024. (2013)"},{"key":"462_CR5","doi-asserted-by":"crossref","unstructured":"McGregor, J.: Testing a Software Product Line. Technical Report. CMU\/SEI-2001-TR-022. Software Engineering Institute, Carnegie Mellon University, Pittsburgh, Pennsylvania. (2001)","DOI":"10.21236\/ADA401736"},{"key":"462_CR6","doi-asserted-by":"publisher","unstructured":"Engstr\u00f6m, E.: Regression test selection and product line system testing. In: Proceedings of Third International Conference on Software Testing, Verification and Validation (ICST), pp. 512\u2013515. (2010)","DOI":"10.1109\/ICST.2010.45"},{"issue":"1","key":"462_CR7","doi-asserted-by":"publisher","first-page":"14","DOI":"10.1016\/j.infsof.2009.07.001","volume":"52","author":"E Engstr\u00f6m","year":"2010","unstructured":"Engstr\u00f6m, E., Runeson, P., Skoglund, M.: A systematic review on regression test selection techniques. Inf. Softw. Technol. 52(1), 14\u201330 (2010)","journal-title":"Inf. Softw. Technol."},{"issue":"2","key":"462_CR8","doi-asserted-by":"publisher","first-page":"67","DOI":"10.1002\/stv.430","volume":"22","author":"S Yoo","year":"2012","unstructured":"Yoo, S., Harman, M.: Regression testing minimization, selection and prioritization: a survey. Softw. Test. Verif. Reliab. 22(2), 67\u2013120 (2012)","journal-title":"Softw. Test. Verif. Reliab."},{"key":"462_CR9","unstructured":"www.cisco.com"},{"key":"462_CR10","unstructured":"Cisco Systems: Cisco telepresence codec c90, Data sheet. Available from http:\/\/www.cisco.com . (2010)"},{"key":"462_CR11","doi-asserted-by":"publisher","unstructured":"Wang, S., Gotlieb, A., Ali, S., Liaaen, M.: Automated test case selection using feature model: an industrial case study. In: Proceedings of the ACM Model-Driven Engineering Languages and Systems (MODELS), pp. 237\u2013253. (2013)","DOI":"10.1007\/978-3-642-41533-3_15"},{"key":"462_CR12","doi-asserted-by":"crossref","unstructured":"Wang, S., Gotlieb, A., Liaaen, M., Briand, L.C.: Automated test case selection using feature model: an industrial case study. In: Proceedings of the ACM MODELS Workshop VARiability for You (VARY\u2019 12), pp. 32\u201337. (2012)","DOI":"10.1145\/2425415.2425422"},{"key":"462_CR13","doi-asserted-by":"crossref","unstructured":"Wang, S., Ali, S., Gotlieb, A., Liaaen, M.: A systematic test case selection methodology for product lines: results and insights from an industrial case study. Accepted in Empirical Software Engineering Journal. (2014)","DOI":"10.1007\/s10664-014-9345-5"},{"issue":"3","key":"462_CR14","doi-asserted-by":"publisher","first-page":"333","DOI":"10.1016\/j.scico.2003.04.005","volume":"53","author":"D Beuche","year":"2004","unstructured":"Beuche, D., Papajewski, H., Schr\u00f6der-Preikschat, W.: Variability management with feature models. Sci. Comput. Program. 53(3), 333\u2013352 (2004)","journal-title":"Sci. Comput. Program."},{"key":"462_CR15","unstructured":"Pure systems GmbH: Variant management with pure::variants. Technical white paper. Available from http:\/\/web.pure-systems.com . (2006)"},{"key":"462_CR16","unstructured":"Pure systems GmbH: Pure: Variants user\u2019s guide. Available from http:\/\/web.pure-systems.com . (2011)"},{"key":"462_CR17","doi-asserted-by":"publisher","unstructured":"Wang, S., Ali, S., Gotlieb, A.: Minimizing test suites in software product lines using weighted-based genetic algorithms. In: Proceedings of the 15th Annual Conference on Genetic and Evolutionary Computation Conference (GECCO), pp. 1493\u20131500. (2013)","DOI":"10.1145\/2463372.2463545"},{"key":"462_CR18","doi-asserted-by":"crossref","unstructured":"Wang, S., Ali, S., Gotlieb, A.: Cost-effective test suite minimization in product lines using search techniques. Accepted in Journal of Systems and Software. Available on http:\/\/www.sciencedirect.com\/science\/article\/pii\/S0164121214001757 . (2014)","DOI":"10.1016\/j.jss.2014.08.024"},{"key":"462_CR19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-29044-2","volume-title":"Experimentation in software engineering","author":"C Wohlin","year":"2012","unstructured":"Wohlin, C., Runeson, P., Host, M., Ohlsson, M.C., Regnell, B., Wesslen, A.: Experimentation in software engineering. Springer, New York (2012)"},{"key":"462_CR20","volume-title":"Experimentation in software engineering: an introduction","author":"C Wohlin","year":"1999","unstructured":"Wohlin, C., Runeson, P., H\u00f6st, M., Ohlsson, M.C., Regnell, B., Wessl\u00e9n, A.: Experimentation in software engineering: an introduction. Springer, New York (1999)"},{"key":"462_CR21","volume-title":"Handbook of parametric and nonparametric statistical procedures","author":"DJ Sheskin","year":"2007","unstructured":"Sheskin, D.J.: Handbook of parametric and nonparametric statistical procedures. Chapman and Hall\/CRC, London (2007)"},{"key":"462_CR22","doi-asserted-by":"publisher","first-page":"276","DOI":"10.1046\/j.1523-1739.1997.96102.x","volume":"11","author":"L Thomas","year":"1997","unstructured":"Thomas, L.: Retrospective power analysis. Conserv. Biol. 11, 276\u2013280 (1997)","journal-title":"Conserv. Biol."},{"key":"462_CR23","doi-asserted-by":"publisher","first-page":"1073","DOI":"10.1016\/j.infsof.2007.02.015","volume":"49","author":"T Dyb\u00e5","year":"2007","unstructured":"Dyb\u00e5, T., Kampenes, V.B., Hannay, J.E., Sj\u00f8berg, D.I.K.: Systematic review: a systematic review of effect size in software engineering experiments. Inf. Softw. Technol. 49, 1073\u20131086 (2007)","journal-title":"Inf. Softw. Technol."},{"key":"462_CR24","doi-asserted-by":"publisher","first-page":"201","DOI":"10.1023\/A:1026586415054","volume":"5","author":"M H\u00f6st","year":"2000","unstructured":"H\u00f6st, M., Regnell, B., Wohlin, C.: Using students as subjects\u2014a comparative study of students and professionals in lead-time impact assessment. Empir. Softw. Eng. 5, 201\u2013214 (2000)","journal-title":"Empir. Softw. Eng."},{"key":"462_CR25","doi-asserted-by":"publisher","first-page":"521","DOI":"10.1109\/TSE.2004.43","volume":"30","author":"E Arisholm","year":"2004","unstructured":"Arisholm, E., Sjoberg, D.I.K.: Evaluating the effect of a delegated versus centralized control style on the maintainability of object-oriented software. IEEE Trans. Softw. Eng. 30, 521\u2013534 (2004)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"462_CR26","unstructured":"Holt, R.W., Boehm-Davis, D.A., Shultz, A.C.: Mental representations of programs for student and professional programmers. Empirical Studies of Programmers: Second Workshop, pp. 33\u201346. (1987)"},{"issue":"6","key":"462_CR27","doi-asserted-by":"publisher","first-page":"99","DOI":"10.1016\/S1571-0661(04)81029-6","volume":"82","author":"H Muccini","year":"2003","unstructured":"Muccini, H., Van Der Hoek, A.: Towards testing product line architectures. Electron. Notes Theor. Comput. Sci. 82(6), 99\u2013109 (2003)","journal-title":"Electron. Notes Theor. Comput. Sci."},{"key":"462_CR28","doi-asserted-by":"publisher","unstructured":"Uzuncaova, E., Garcia, D., Khurshid, S., Batory, D.: Testing software product lines using incremental test generations. In: Proceedings of the IEEE International Symposium on Software Reliability Engineering (ISSRE), pp. 249\u2013258. (2008)","DOI":"10.1109\/ISSRE.2008.56"},{"key":"462_CR29","volume-title":"System testing of product lines: from requirements to test cases. Software Product Lines, Research Issues in Engineering and Management","author":"C Nebut","year":"2006","unstructured":"Nebut, C., Le Traon, Y., J\u00e9z\u00e9quel, J.M.: System testing of product lines: from requirements to test cases. Software Product Lines, Research Issues in Engineering and Management. Springer, New York (2006)"},{"key":"462_CR30","doi-asserted-by":"publisher","unstructured":"Olimpiew, E.M., Gomaa, H.: Reusable model-based testing. International Conference on Software Reuse (ICSR), pp. 76\u201385. (2009)","DOI":"10.1007\/978-3-642-04211-9_8"},{"key":"462_CR31","unstructured":"Olimpiew, E.M., Gomaa, H.: Model-based test design for software product lines. Software Product Line Conference (SPLC), pp. 173\u2013178 (2008)"},{"issue":"4","key":"462_CR32","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/1082983.1083279","volume":"30","author":"EM Olimpiew","year":"2005","unstructured":"Olimpiew, E.M., Gomaa, H.: Model-based testing for applications derived from software product lines. ACM SIGSOFT Softw. Eng. Notes 30(4), 1\u20137 (2005)","journal-title":"ACM SIGSOFT Softw. Eng. Notes"},{"key":"462_CR33","doi-asserted-by":"publisher","unstructured":"Olimpiew, E.M., Gomaa, H.: Model-based testing for applications derived from software product lines. In: Proceedings of the 1st International Workshop on Advances in Model-Based Testing (A-MOST \u201905), pp. 1\u20137. (2005)","DOI":"10.1145\/1083274.1083279"},{"key":"462_CR34","doi-asserted-by":"publisher","unstructured":"Wang, S., Ali, S., Tao, Y., Liaaen, M.: Using feature model to support model-based testing of product lines: an industrial case study. In: Proceedings of 13th International Conference on Quality Software (QSIC), pp 75\u201384. (2013)","DOI":"10.1109\/QSIC.2013.51"},{"key":"462_CR35","unstructured":"Iqbal, M.Z., Ali, S., Yue, T., Briand, L.C: Applying UML\/MARTE on industrial projects: challenges, experiences, and guidelines. Accepted in Software and Systems Modeling Journal. Available on http:\/\/link.springer.com\/article\/10.1007%2Fs10270-014-0405-5"},{"key":"462_CR36","doi-asserted-by":"publisher","unstructured":"Hutchins, M., Foster, H., Goradia, T., Ostrand, T.: Experiments on the effectiveness of dataflow- and controlflow-based test adequacy criteria. In: Proceedings of the 16th International Conference on Software Engineering. Sorrento, Italy: IEEE Computer Society Press, pp. 191\u2013200 May (1994)","DOI":"10.1109\/ICSE.1994.296778"},{"key":"462_CR37","doi-asserted-by":"publisher","unstructured":"Rothermel, G., Elbaum, S., Malishevsky, A., Kallakuri, P., Davia, B.: The impact of test suite granularity on the cost-effectiveness of regression testing. In: Proceedings of International Conference on Software Engineering, pp. 130\u2013140. (2002)","DOI":"10.1145\/581356.581358"},{"key":"462_CR38","doi-asserted-by":"publisher","unstructured":"Wong, W.E., Horgan, J.R., Mathur, A.P., Pasquini, A.: Test set size minimization and fault detection effectiveness: a case study in a space application. In: Proceeding of the Computer Software Applications Conference, pp. 522\u2013528. (1997)","DOI":"10.1109\/CMPSAC.1997.625062"},{"key":"462_CR39","unstructured":"Chen, Y.F., Rosenblum, D.S., Vo, K.P.: Test tube: a system for selective regression testing. In: Proceedings of IEEE International Conference on Software Engineering (ICSE), pp. 211\u2013220. Los Alamitos, CA, USA (1994)"},{"issue":"1","key":"462_CR40","doi-asserted-by":"publisher","first-page":"31","DOI":"10.1109\/52.43047","volume":"7","author":"J Hartmann","year":"1990","unstructured":"Hartmann, J., Robson, D.J.: Techniques for selective revalidation. IEEE Softw. 7(1), 31\u201336 (1990)","journal-title":"IEEE Softw."},{"key":"462_CR41","doi-asserted-by":"publisher","unstructured":"Harrold, M.J., Souffa, M.L.: An incremental approach to unit testing during maintenance. In: Proceedings of IEEE International Conference on Software Maintenance (ICSM), pp. 362\u2013367. (1988)","DOI":"10.1109\/ICSM.1988.10188"},{"key":"462_CR42","doi-asserted-by":"publisher","unstructured":"Orso, A., Harrold, M.J., Rosenblum, D., Rothermel, G., Soffa, M.L., Do, H.: Using component metacontent to support the regression testing of component-based software. In: Proceedings of IEEE International Conference on Software Maintenance (ICSM), pp. 716\u2013725. (2001)","DOI":"10.1109\/ICSM.2001.972790"},{"key":"462_CR43","unstructured":"Chen, Y., Probert, R.L., Sims, D.P.: Specification-based regression test selection with risk analysis. In: Proceedings of Conference of the Centre for Advanced Studies on Collaborative research. IBM Press, Indianapolis (2002)"},{"issue":"2","key":"462_CR44","doi-asserted-by":"publisher","first-page":"149","DOI":"10.1145\/367008.367015","volume":"10","author":"J Bible","year":"2001","unstructured":"Bible, J., Rothermel, G., Rosenblum, D.S.: A comparative study of coarse- and fine-grained safe regression test-selection techniques. ACM Trans. Softw. Eng. Methodol. 10(2), 149\u2013183 (2001)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"issue":"2","key":"462_CR45","doi-asserted-by":"publisher","first-page":"184","DOI":"10.1145\/367008.367020","volume":"10","author":"TL Graves","year":"2001","unstructured":"Graves, T.L., Harrold, M.J., Kim, J.M., Porter, A., Rothermel, G.: An empirical study of regression test selection techniques. ACM Trans. Softw. Eng. Methodol. 10(2), 184\u2013208 (2001)","journal-title":"ACM Trans. Softw. Eng. Methodol."},{"issue":"1","key":"462_CR46","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1016\/S0164-1212(00)00119-9","volume":"57","author":"N Mansour","year":"2001","unstructured":"Mansour, N., Bahsoon, R., Baradhi, G.: Empirical comparison of regression test selection algorithms. J. Syst. Softw. 57(1), 79\u201390 (2001)","journal-title":"J. Syst. Softw."}],"container-title":["Software & Systems Modeling"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10270-015-0462-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10270-015-0462-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10270-015-0462-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10270-015-0462-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,27]],"date-time":"2025-05-27T15:23:31Z","timestamp":1748359411000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10270-015-0462-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4,28]]},"references-count":46,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2017,5]]}},"alternative-id":["462"],"URL":"https:\/\/doi.org\/10.1007\/s10270-015-0462-4","relation":{},"ISSN":["1619-1366","1619-1374"],"issn-type":[{"type":"print","value":"1619-1366"},{"type":"electronic","value":"1619-1374"}],"subject":[],"published":{"date-parts":[[2015,4,28]]}}}