{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T05:57:16Z","timestamp":1771048636954,"version":"3.50.1"},"reference-count":45,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2023,12,12]],"date-time":"2023-12-12T00:00:00Z","timestamp":1702339200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,12,12]],"date-time":"2023-12-12T00:00:00Z","timestamp":1702339200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"DOI":"10.13039\/501100012456","name":"National Social Science Fund of China","doi-asserted-by":"publisher","award":["20BGL108"],"award-info":[{"award-number":["20BGL108"]}],"id":[{"id":"10.13039\/501100012456","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Appl Intell"],"published-print":{"date-parts":[[2024,1]]},"DOI":"10.1007\/s10489-023-05199-8","type":"journal-article","created":{"date-parts":[[2023,12,12]],"date-time":"2023-12-12T18:02:35Z","timestamp":1702404155000},"page":"375-397","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":16,"title":["Few-shot defect detection using feature enhancement and image generation for manufacturing quality inspection"],"prefix":"10.1007","volume":"54","author":[{"given":"Yu","family":"Gong","sequence":"first","affiliation":[]},{"given":"Mingzhou","family":"Liu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0807-9203","authenticated-orcid":false,"given":"Xiaoqiao","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Conghu","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Hu","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,12,12]]},"reference":[{"key":"5199_CR1","doi-asserted-by":"publisher","first-page":"2319","DOI":"10.1007\/s10845-021-01765-4","volume":"32","author":"CA Escobar","year":"2021","unstructured":"Escobar CA, McGovern ME, Morales-Menendez R (2021) Quality 4.0: a review of big data challenges in manufacturing. J Intell Manuf 32:2319\u20132334. https:\/\/doi.org\/10.1007\/s10845-021-01765-4","journal-title":"J Intell Manuf"},{"key":"5199_CR2","doi-asserted-by":"publisher","first-page":"753","DOI":"10.1016\/j.jmsy.2021.05.008","volume":"62","author":"Y Gao","year":"2022","unstructured":"Gao Y, Li X, Wang XV et al (2022) A review on recent advances in vision-based defect recognition towards Industrial Intelligence. J Manuf Syst 62:753\u2013766. https:\/\/doi.org\/10.1016\/j.jmsy.2021.05.008","journal-title":"J Manuf Syst"},{"key":"5199_CR3","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.101882","volume":"55","author":"H Shang","year":"2023","unstructured":"Shang H, Sun C, Liu J et al (2023) Defect-aware transformer network for intelligent visual surface defect detection. Adv Eng Inform 55:101882. https:\/\/doi.org\/10.1016\/j.aei.2023.101882","journal-title":"Adv Eng Inform"},{"key":"5199_CR4","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2020.101105","volume":"45","author":"JK Chow","year":"2020","unstructured":"Chow JK, Su Z, Wu J et al (2020) Anomaly detection of defects on concrete structures with the convolutional autoencoder. Adv Eng Inform 45:101105. https:\/\/doi.org\/10.1016\/j.aei.2020.101105","journal-title":"Adv Eng Inform"},{"key":"5199_CR5","doi-asserted-by":"publisher","first-page":"53","DOI":"10.1186\/s40537-021-00444-8","volume":"8","author":"L Alzubaidi","year":"2021","unstructured":"Alzubaidi L, Zhang J, Humaidi AJ et al (2021) Review of deep learning: concepts, CNN architectures, challenges, applications, future directions. J Big Data 8:53. https:\/\/doi.org\/10.1186\/s40537-021-00444-8","journal-title":"J Big Data"},{"key":"5199_CR6","doi-asserted-by":"publisher","first-page":"929","DOI":"10.1109\/TCYB.2017.2668395","volume":"48","author":"R Ren","year":"2018","unstructured":"Ren R, Hung T, Tan KC (2018) A generic deep-learning-based approach for automated surface inspection. IEEE Trans Cybern 48:929\u2013940. https:\/\/doi.org\/10.1109\/TCYB.2017.2668395","journal-title":"IEEE Trans Cybern"},{"key":"5199_CR7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipm.2021.102863","volume":"59","author":"X Zhang","year":"2022","unstructured":"Zhang X, Cai F, Hu X et al (2022) A contrastive learning-based task adaptation model for few-shot intent recognition. Inf Process Manag 59:102863. https:\/\/doi.org\/10.1016\/j.ipm.2021.102863","journal-title":"Inf Process Manag"},{"key":"5199_CR8","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.119623","volume":"218","author":"SA Singh","year":"2023","unstructured":"Singh SA, Kumar AS, Desai KA (2023) Comparative assessment of common pre-trained CNNs for vision-based surface defect detection of machined components. Expert Syst Appl 218:119623. https:\/\/doi.org\/10.1016\/j.eswa.2023.119623","journal-title":"Expert Syst Appl"},{"key":"5199_CR9","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.117731","volume":"206","author":"F de la L\u00f3pez","year":"2022","unstructured":"de la L\u00f3pez F, G\u00f3mez-Sirvent JL, S\u00e1nchez-Reolid R et al (2022) Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network. Expert Syst Appl 206:117731. https:\/\/doi.org\/10.1016\/j.eswa.2022.117731","journal-title":"Expert Syst Appl"},{"key":"5199_CR10","doi-asserted-by":"publisher","DOI":"10.1002\/stc.2313","volume":"26","author":"Y Xu","year":"2019","unstructured":"Xu Y, Wei S, Bao Y, Li H (2019) Automatic seismic damage identification of reinforced concrete columns from images by a region-based deep convolutional neural network. Struct Control Health Monit 26:e2313. https:\/\/doi.org\/10.1002\/stc.2313","journal-title":"Struct Control Health Monit"},{"key":"5199_CR11","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3343440","volume":"52","author":"H Kaur","year":"2020","unstructured":"Kaur H, Pannu HS, Malhi AK (2020) A systematic review on imbalanced data challenges in machine learning: applications and solutions. ACM Comput Surv 52:1\u201336. https:\/\/doi.org\/10.1145\/3343440","journal-title":"ACM Comput Surv"},{"key":"5199_CR12","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.116200","volume":"191","author":"M Yousefan","year":"2022","unstructured":"Yousefan M, Najafabadi HE, Amirkhani H et al (2022) Deep anomaly detection in hyperspectral images based on membership maps and object area filtering. Expert Syst Appl 191:116200. https:\/\/doi.org\/10.1016\/j.eswa.2021.116200","journal-title":"Expert Syst Appl"},{"key":"5199_CR13","doi-asserted-by":"crossref","unstructured":"Bau D, Zhu JY, Wulff J et al (2019) Seeing What a GAN Cannot Generate. In: Proceedings of the IEEE\/CVF International Conference on Computer Vision, pp 4502\u20134511","DOI":"10.1109\/ICCV.2019.00460"},{"key":"5199_CR14","doi-asserted-by":"publisher","first-page":"6656","DOI":"10.1609\/aaai.v34i04.6142","volume":"34","author":"H Yao","year":"2020","unstructured":"Yao H, Zhang C, Wei Y et al (2020) Graph few-shot learning via knowledge transfer. AAAI 34:6656\u20136663. https:\/\/doi.org\/10.1609\/aaai.v34i04.6142","journal-title":"AAAI"},{"key":"5199_CR15","doi-asserted-by":"publisher","first-page":"86","DOI":"10.3847\/1538-3881\/ac4245","volume":"163","author":"C Zhou","year":"2022","unstructured":"Zhou C, Gu Y, Fang G, Lin Z (2022) Automatic morphological classification of galaxies: convolutional autoencoder and bagging-based multiclustering model. AJ 163:86. https:\/\/doi.org\/10.3847\/1538-3881\/ac4245","journal-title":"AJ"},{"key":"5199_CR16","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TPAMI.2021.3079209","volume":"1\u20131","author":"TM Hospedales","year":"2021","unstructured":"Hospedales TM, Antoniou A, Micaelli P, Storkey AJ (2021) Meta-learning in neural networks: a Survey. IEEE Trans Pattern Anal Mach Intell 1\u20131:1. https:\/\/doi.org\/10.1109\/TPAMI.2021.3079209","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"5199_CR17","doi-asserted-by":"crossref","unstructured":"Wu Y, Lin Y, Dong X et al (2018) Exploit the unknown gradually: one-shot video-based person re-identification by Stepwise Learning. In: 2018 IEEE\/CVF Conference on Computer Vision and Pattern Recognition. IEEE, Salt Lake City, UT, pp 5177\u20135186","DOI":"10.1109\/CVPR.2018.00543"},{"key":"5199_CR18","doi-asserted-by":"crossref","unstructured":"Xu Z, Zhu L, Yang Y (2017) Few-shot object recognition from machine-labeled web images. In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR). IEEE, Honolulu, HI, pp 5358\u20135366","DOI":"10.1109\/CVPR.2017.569"},{"key":"5199_CR19","doi-asserted-by":"crossref","unstructured":"Wang T, Zhang X, Yuan L, Feng J (2019) Few-shot adaptive faster R-CNN. In: Proceedings of the IEEE\/CVF Conference on Computer Vision and Pattern Recognition, pp 7166\u20137175","DOI":"10.1109\/CVPR.2019.00734"},{"key":"5199_CR20","doi-asserted-by":"crossref","unstructured":"Wang K, Liew JH, Zou Y et al (2019) PANet: few-shot image semantic segmentation with prototype alignment. In: 2019 IEEE\/CVF International Conference on Computer Vision (ICCV). IEEE, Seoul, Korea (South), pp 9196\u20139205","DOI":"10.1109\/ICCV.2019.00929"},{"key":"5199_CR21","doi-asserted-by":"publisher","unstructured":"Yong G, Jeon K, Gil D, Lee G (2022) Prompt engineering for zero-shot and few-shot defect detection and classification using a visual-language pretrained model. Comput Aided Civil Eng Mice 12954. https:\/\/doi.org\/10.1111\/mice.12954","DOI":"10.1111\/mice.12954"},{"key":"5199_CR22","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2021.3127648","volume":"71","author":"W Wang","year":"2022","unstructured":"Wang W, Mi C, Wu Z et al (2022) A real-time steel surface defect detection approach with high accuracy. IEEE Trans Instrum Meas 71:1\u201310. https:\/\/doi.org\/10.1109\/TIM.2021.3127648","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR23","doi-asserted-by":"crossref","unstructured":"Sheynin S, Benaim S, Wolf L (2021) A hierarchical transformation-discriminating generative model for few shot anomaly detection. In: 2021 IEEE\/CVF International Conference on Computer Vision (ICCV). IEEE, Montreal, QC, Canada, pp 8475\u20138484","DOI":"10.1109\/ICCV48922.2021.00838"},{"key":"5199_CR24","doi-asserted-by":"publisher","first-page":"612","DOI":"10.1016\/j.jmsy.2022.02.001","volume":"62","author":"Y Lu","year":"2022","unstructured":"Lu Y, Zheng H, Chand S et al (2022) Outlook on human-centric manufacturing towards industry 5.0. J Manuf Syst 62:612\u2013627. https:\/\/doi.org\/10.1016\/j.jmsy.2022.02.001","journal-title":"J Manuf Syst"},{"key":"5199_CR25","doi-asserted-by":"publisher","first-page":"577","DOI":"10.1016\/j.bushor.2018.03.007","volume":"61","author":"MH Jarrahi","year":"2018","unstructured":"Jarrahi MH (2018) Artificial intelligence and the future of work: human-AI symbiosis in organizational decision making. Bus Horiz 61:577\u2013586. https:\/\/doi.org\/10.1016\/j.bushor.2018.03.007","journal-title":"Bus Horiz"},{"key":"5199_CR26","doi-asserted-by":"publisher","first-page":"346","DOI":"10.1016\/j.cviu.2007.09.014","volume":"110","author":"H Bay","year":"2008","unstructured":"Bay H, Ess A, Tuytelaars T, Van Gool L (2008) Speeded-Up robust features (SURF). Comput Vis Image Underst 110:346\u2013359. https:\/\/doi.org\/10.1016\/j.cviu.2007.09.014","journal-title":"Comput Vis Image Underst"},{"key":"5199_CR27","doi-asserted-by":"publisher","first-page":"241","DOI":"10.1109\/TIM.2019.2893009","volume":"69","author":"DJ Pasadas","year":"2020","unstructured":"Pasadas DJ, Ramos HG, Feng B et al (2020) Defect classification with SVM and wideband excitation in Multilayer Aluminum plates. IEEE Trans Instrum Meas 69:241\u2013248. https:\/\/doi.org\/10.1109\/TIM.2019.2893009","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR28","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2020.3040485","volume":"70","author":"X Cheng","year":"2021","unstructured":"Cheng X, Yu J (2021) RetinaNet with difference channel attention and adaptively spatial feature fusion for steel surface defect detection. IEEE Trans Instrum Meas 70:1\u201311. https:\/\/doi.org\/10.1109\/TIM.2020.3040485","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR29","doi-asserted-by":"publisher","first-page":"1051","DOI":"10.1109\/TIM.2019.2909940","volume":"69","author":"X Jin","year":"2020","unstructured":"Jin X, Wang Y, Zhang H et al (2020) DM-RIS: deep multimodel rail inspection system with improved MRF-GMM and CNN. IEEE Trans Instrum Meas 69:1051\u20131065. https:\/\/doi.org\/10.1109\/TIM.2019.2909940","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR30","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105628","volume":"117","author":"Y Zhang","year":"2023","unstructured":"Zhang Y, Wang W, Li Z et al (2023) Development of a cross-scale weighted feature fusion network for hot-rolled steel surface defect detection. Eng Appl Artif Intell 117:105628. https:\/\/doi.org\/10.1016\/j.engappai.2022.105628","journal-title":"Eng Appl Artif Intell"},{"key":"5199_CR31","doi-asserted-by":"publisher","first-page":"1833","DOI":"10.1007\/s10845-020-01670-2","volume":"32","author":"R Hao","year":"2021","unstructured":"Hao R, Lu B, Cheng Y et al (2021) A steel surface defect inspection approach towards smart industrial monitoring. J Intell Manuf 32:1833\u20131843. https:\/\/doi.org\/10.1007\/s10845-020-01670-2","journal-title":"J Intell Manuf"},{"key":"5199_CR32","doi-asserted-by":"publisher","first-page":"1007","DOI":"10.1007\/s10845-020-01710-x","volume":"33","author":"S Jain","year":"2022","unstructured":"Jain S, Seth G, Paruthi A et al (2022) Synthetic data augmentation for surface defect detection and classification using deep learning. J Intell Manuf 33:1007\u20131020. https:\/\/doi.org\/10.1007\/s10845-020-01710-x","journal-title":"J Intell Manuf"},{"key":"5199_CR33","doi-asserted-by":"publisher","first-page":"6743","DOI":"10.1109\/TII.2021.3126098","volume":"18","author":"B Yang","year":"2022","unstructured":"Yang B, Liu Z, Duan G, Tan J (2022) Mask2Defect: a prior knowledge-based data augmentation method for metal surface defect inspection. IEEE Trans Ind Inf 18:6743\u20136755. https:\/\/doi.org\/10.1109\/TII.2021.3126098","journal-title":"IEEE Trans Ind Inf"},{"key":"5199_CR34","doi-asserted-by":"publisher","first-page":"10844","DOI":"10.1109\/JSEN.2021.3059860","volume":"21","author":"R Guo","year":"2021","unstructured":"Guo R, Liu H, Xie G, Zhang Y (2021) Weld defect detection from imbalanced radiographic images based on contrast enhancement conditional generative adversarial network and transfer learning. IEEE Sens J 21:10844\u201310853. https:\/\/doi.org\/10.1109\/JSEN.2021.3059860","journal-title":"IEEE Sens J"},{"key":"5199_CR35","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TASE.2020.2967415","volume":"1\u201312","author":"S Niu","year":"2020","unstructured":"Niu S, Li B, Wang X, Lin H (2020) Defect image sample generation with GAN for improving defect recognition. IEEE Trans Automat Sci Eng 1\u201312:1. https:\/\/doi.org\/10.1109\/TASE.2020.2967415","journal-title":"IEEE Trans Automat Sci Eng"},{"key":"5199_CR36","doi-asserted-by":"publisher","first-page":"104837","DOI":"10.1016\/j.knosys.2019.07.008","volume":"187","author":"F Zhou","year":"2020","unstructured":"Zhou F, Yang S, Fujita H et al (2020) Deep learning fault diagnosis method based on global optimization GAN for unbalanced data. Knowl Based Syst 187:104837. https:\/\/doi.org\/10.1016\/j.knosys.2019.07.008","journal-title":"Knowl Based Syst"},{"key":"5199_CR37","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2021.3087826","volume":"70","author":"D-M Tsai","year":"2021","unstructured":"Tsai D-M, Fan S-KS, Chou Y-H (2021) Auto-annotated deep segmentation for surface defect detection. IEEE Trans Instrum Meas 70:1\u201310. https:\/\/doi.org\/10.1109\/TIM.2021.3087826","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR38","doi-asserted-by":"publisher","first-page":"29799","DOI":"10.1007\/s11042-018-5772-4","volume":"77","author":"L Yan","year":"2018","unstructured":"Yan L, Zheng Y, Cao J (2018) Few-shot learning for short text classification. Multimed Tools Appl 77:29799\u201329810. https:\/\/doi.org\/10.1007\/s11042-018-5772-4","journal-title":"Multimed Tools Appl"},{"key":"5199_CR39","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2022.3196447","volume":"71","author":"R Yu","year":"2022","unstructured":"Yu R, Guo B, Yang K (2022) Selective prototype network for few-shot metal surface defect segmentation. IEEE Trans Instrum Meas 71:1\u201310. https:\/\/doi.org\/10.1109\/TIM.2022.3196447","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR40","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2022.3169547","volume":"71","author":"W Xiao","year":"2022","unstructured":"Xiao W, Song K, Liu J, Yan Y (2022) Graph embedding and optimal transport for few-shot classification of metal surface defect. IEEE Trans Instrum Meas 71:1\u201310. https:\/\/doi.org\/10.1109\/TIM.2022.3169547","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR41","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TIM.2022.3193204","volume":"71","author":"Y Song","year":"2022","unstructured":"Song Y, Liu Z, Ling S et al (2022) Coarse-to-fine few-shot defect recognition with dynamic weighting and joint metric. IEEE Trans Instrum Meas 71:1\u201310. https:\/\/doi.org\/10.1109\/TIM.2022.3193204","journal-title":"IEEE Trans Instrum Meas"},{"key":"5199_CR42","doi-asserted-by":"crossref","unstructured":"Yun S, Han D, Chun S et al (2019) CutMix: regularization strategy to train strong classifiers with localizable features. In: 2019 IEEE\/CVF International Conference on Computer Vision (ICCV). IEEE, Seoul, Korea (South), pp 6022\u20136031","DOI":"10.1109\/ICCV.2019.00612"},{"key":"5199_CR43","doi-asserted-by":"publisher","first-page":"13001","DOI":"10.1609\/aaai.v34i07.7000","volume":"34","author":"Z Zhong","year":"2020","unstructured":"Zhong Z, Zheng L, Kang G et al (2020) Random erasing data Augmentation. AAAI 34:13001\u201313008. https:\/\/doi.org\/10.1609\/aaai.v34i07.7000","journal-title":"AAAI"},{"key":"5199_CR44","unstructured":"Arjovsky M, Chintala S, Bottou L (2017) Wasserstein generative adversarial networks. In: International Conference on Machine Learning, pp. 214\u2013223. PMLR"},{"key":"5199_CR45","unstructured":"Zhang H, Goodfellow I, Metaxas D, Odena A (2019) Self-attention generative adversarial networks. In: International conference on machine learning, pp. 7354\u20137363. PMLR"}],"container-title":["Applied Intelligence"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10489-023-05199-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10489-023-05199-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10489-023-05199-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T10:16:16Z","timestamp":1705140976000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10489-023-05199-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,12]]},"references-count":45,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2024,1]]}},"alternative-id":["5199"],"URL":"https:\/\/doi.org\/10.1007\/s10489-023-05199-8","relation":{},"ISSN":["0924-669X","1573-7497"],"issn-type":[{"value":"0924-669X","type":"print"},{"value":"1573-7497","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12,12]]},"assertion":[{"value":"24 November 2023","order":1,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"12 December 2023","order":2,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interests"}}]}}