{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T21:13:46Z","timestamp":1783804426468,"version":"3.55.0"},"reference-count":74,"publisher":"Springer Science and Business Media LLC","issue":"4","license":[{"start":{"date-parts":[[2010,5,20]],"date-time":"2010-05-20T00:00:00Z","timestamp":1274313600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Autom Softw Eng"],"published-print":{"date-parts":[[2010,12]]},"DOI":"10.1007\/s10515-010-0069-5","type":"journal-article","created":{"date-parts":[[2010,5,19]],"date-time":"2010-05-19T13:56:34Z","timestamp":1274277394000},"page":"375-407","source":"Crossref","is-referenced-by-count":386,"title":["Defect prediction from static code features: current\u00a0results, limitations, new approaches"],"prefix":"10.1007","volume":"17","author":[{"given":"Tim","family":"Menzies","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zach","family":"Milton","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Burak","family":"Turhan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bojan","family":"Cukic","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yue","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ay\u015fe","family":"Bener","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2010,5,20]]},"reference":[{"key":"69_CR1","unstructured":"Arisholm, E., Briand, L.: Predicting fault-prone components in a java legacy system. In: 5th ACM-IEEE International Symposium on Empirical Software Engineering (ISESE), Rio de Janeiro, Brazil, September 21\u201322 (2006). Available from http:\/\/simula.no\/research\/engineering\/publications\/Arisholm.2006.4"},{"key":"69_CR2","unstructured":"Blake, C., Merz, C.: UCI repository of machine learning databases (1998). URL: http:\/\/www.ics.uci.edu\/~mlearn\/MLRepository.html"},{"key":"69_CR3","unstructured":"Bradley, P.S., Fayyad, U.M., Reina, C.: Scaling clustering algorithms to large databases. In: Knowledge Discovery and Data Mining, pp. 9\u201315 (1998). Available from http:\/\/citeseer.ist.psu.edu\/bradley98scaling.html"},{"key":"69_CR4","unstructured":"Breiman, L., Friedman, J.H., Olshen, R.A., Stone, C.J.: Classification and regression trees. Tech. rep., Wadsworth International, Monterey, CA (1984)"},{"key":"69_CR5","doi-asserted-by":"crossref","first-page":"5","DOI":"10.1023\/A:1010933404324","volume":"45","author":"L. Breimann","year":"2001","unstructured":"Breimann, L.: Random forests. Mach. Learn. 45, 5\u201332 (2001)","journal-title":"Mach. Learn."},{"issue":"2","key":"69_CR6","first-page":"123","volume":"24","author":"L. Brieman","year":"1996","unstructured":"Brieman, L.: Bagging predictors. Mach. Learn. 24(2), 123\u2013140 (1996)","journal-title":"Mach. Learn."},{"key":"69_CR7","unstructured":"Chapman, M., Solomon, D.: The relationship of cyclomatic complexity, essential complexity and error rates. In: Proceedings of the NASA Software Assurance Symposium, Coolfont Resort and Conference Center in Berkley Springs, West Virginia (2002). Available from http:\/\/www.ivv.nasa.gov\/business\/research\/osmasas\/conclusion2002\/Mike_Chapman_The_Relationship_of_Cyclomatic_Complexity_Essential_Complexity_and_Error_Rates.ppt"},{"key":"69_CR8","volume-title":"Empirical Methods for Artificial Intelligence","author":"P. Cohen","year":"1995","unstructured":"Cohen, P.: Empirical Methods for Artificial Intelligence. MIT Press, Cambridge (1995a)"},{"key":"69_CR9","doi-asserted-by":"crossref","unstructured":"Cohen, W.: Fast effective rule induction. In: ICML\u201995, pp. 115\u2013123 (1995b). Available on-line from http:\/\/www.cs.cmu.edu\/~wcohen\/postscript\/ml-95-ripper.ps","DOI":"10.1016\/B978-1-55860-377-6.50023-2"},{"key":"69_CR10","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1109\/TIT.1967.1053964","volume":"iT-13","author":"T.M. Cover","year":"1967","unstructured":"Cover, T.M., Hart, P.E.: Nearest neighbour pattern classification. IEEE Trans. Inf. Theory iT-13, 21\u201327 (1967)","journal-title":"IEEE Trans. Inf. Theory"},{"key":"69_CR11","first-page":"1","volume":"7","author":"J. Demsar","year":"2006","unstructured":"Demsar, J.: Statistical comparisons of clasifiers over multiple data sets. J. Mach. Learn. Res. 7, 1\u201330 (2006). Available from http:\/\/jmlr.csail.mit.edu\/papers\/v7\/demsar06a.html","journal-title":"J. Mach. Learn. Res."},{"issue":"4","key":"69_CR12","first-page":"97","volume":"18","author":"T. Dietterich","year":"1997","unstructured":"Dietterich, T.: Machine learning research: four current directions. AI Mag. 18(4), 97\u2013136 (1997)","journal-title":"AI Mag."},{"issue":"2\u20133","key":"69_CR13","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1023\/A:1007413511361","volume":"29","author":"P. Domingos","year":"1997","unstructured":"Domingos, P., Pazzani, M.J.: On the optimality of the simple Bayesian classifier under zero-one loss. Mach. Learn. 29(2\u20133), 103\u2013130 (1997)","journal-title":"Mach. Learn."},{"key":"69_CR14","unstructured":"Elkan, C.: The foundations of cost-sensitive learning. In: Proceedings of the Seventeenth International Joint Conference on Artificial Intelligence (IJCAI\u201901) (2001). Available from http:\/\/www-cse.ucsd.edu\/users\/elkan\/rescale.pdf"},{"issue":"3","key":"69_CR15","doi-asserted-by":"crossref","first-page":"182","DOI":"10.1147\/sj.153.0182","volume":"15","author":"M. Fagan","year":"1976","unstructured":"Fagan, M.: Design and code inspections to reduce errors in program development. IBM Syst. J. 15(3), 182\u2013211 (1976)","journal-title":"IBM Syst. J."},{"key":"69_CR16","doi-asserted-by":"crossref","first-page":"744","DOI":"10.1109\/TSE.1986.6312976","volume":"SE-12","author":"M. Fagan","year":"1986","unstructured":"Fagan, M.: Advances in software inspections. IEEE Trans. Softw. Eng. SE-12, 744\u2013751 (1986)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"69_CR17","unstructured":"Fawcett, T.: Using rule sets to maximize roc performance. In: 2001 IEEE International Conference on Data Mining (ICDM-01) (2001). Available from http:\/\/home.comcast.net\/~tom.fawcett\/public_html\/papers\/ICDM-final.pdf"},{"issue":"5","key":"69_CR18","doi-asserted-by":"crossref","first-page":"675","DOI":"10.1109\/32.815326","volume":"25","author":"N.E. Fenton","year":"1999","unstructured":"Fenton, N.E., Neil, M.: A\u00a0critique of software defect prediction models. IEEE Trans. Softw. Eng. 25(5), 675\u2013689 (1999). Available from http:\/\/citeseer.nj.nec.com\/fenton99critique.html","journal-title":"IEEE Trans. Softw. Eng."},{"key":"69_CR19","unstructured":"Fenton, N.E., Pfleeger, S.: Software Metrics: A Rigorous & Practical Approach, 2nd edn. International Thompson Press (1995)"},{"key":"69_CR20","unstructured":"Fenton, N.E., Pfleeger, S.: Software Metrics: A\u00a0Rigorous & Practical Approach. International Thompson Press (1997)"},{"key":"69_CR21","doi-asserted-by":"crossref","unstructured":"Fenton, N., Pfleeger, S., Glass, R.: Science and substance: a challenge to software engineers. IEEE Softw., 86\u201395 (1994)","DOI":"10.1109\/52.300094"},{"key":"69_CR22","doi-asserted-by":"crossref","unstructured":"Freund, Y., Schapire, R.: A decision-theoretic generalization of on-line learning and an application to boosting. JCSS: J. Comput. Syst. Sci. 55 (1997)","DOI":"10.1006\/jcss.1997.1504"},{"key":"69_CR23","doi-asserted-by":"crossref","unstructured":"Hall, G., Munson, J.: Software evolution: code delta and code churn. J. Syst. Softw. 111\u2013118 (2000)","DOI":"10.1016\/S0164-1212(00)00031-5"},{"key":"69_CR24","volume-title":"Elements of Software Science","author":"M. Halstead","year":"1977","unstructured":"Halstead, M.: Elements of Software Science. Elsevier, Amsterdam (1977)"},{"issue":"3","key":"69_CR25","doi-asserted-by":"crossref","first-page":"299","DOI":"10.1109\/TKDE.2005.50","volume":"17","author":"J. Huang","year":"2005","unstructured":"Huang, J., Ling, C.: Using AUC and accuracy in evaluating learning algorithms. IEEE Trans. Knowledge Data Eng. 17(3), 299\u2013310 (2005)","journal-title":"IEEE Trans. Knowledge Data Eng."},{"key":"69_CR26","doi-asserted-by":"crossref","unstructured":"Jiang, Y., Cukic, B., Ma, Y.: Techniques for evaluating fault prediction models. Empir. Softw. Eng., 561\u2013595 (2008a)","DOI":"10.1007\/s10664-008-9079-3"},{"key":"69_CR27","unstructured":"Jiang, Y., Cukic, B., Menzies, T.: Does transformation help? In: Defects (2008b). Available from http:\/\/menzies.us\/pdf\/08transform.pdf"},{"key":"69_CR28","doi-asserted-by":"crossref","unstructured":"Khoshgoftaar, T.: An application of zero-inflated Poisson regression for software fault prediction. In: Proceedings of the 12th International Symposium on Software Reliability Engineering, Hong Kong, pp. 66\u201373 (2001)","DOI":"10.1109\/ISSRE.2001.989459"},{"key":"69_CR29","doi-asserted-by":"crossref","first-page":"247","DOI":"10.1142\/9789812811868_0015","volume-title":"Recent Advances in Reliability and Quality Engineering","author":"T. Khoshgoftaar","year":"2001","unstructured":"Khoshgoftaar, T., Allen, E.: Model software quality with classification trees. In: Pham, H. (ed.): Recent Advances in Reliability and Quality Engineering, pp. 247\u2013270. World Scientific, Singapore (2001)"},{"issue":"3","key":"69_CR30","doi-asserted-by":"crossref","first-page":"255","DOI":"10.1023\/A:1024424811345","volume":"8","author":"T.M. Khoshgoftaar","year":"2003","unstructured":"Khoshgoftaar, T.M., Seliya, N.: Fault prediction modeling for software quality estimation: comparing commonly used techniques. Empir. Softw. Eng. 8(3), 255\u2013283 (2003)","journal-title":"Empir. Softw. Eng."},{"key":"69_CR31","unstructured":"Koru, A., Zhang, D., Liu, H.: Modeling the effect of size on defect proneness for open-source software. In: Proceedings PROMISE\u201907 (ICSE) (2007). Available from http:\/\/promisedata.org\/pdf\/mpls2007KoruZhangLiu.pdf"},{"key":"69_CR32","doi-asserted-by":"crossref","unstructured":"Koru, A., Emam, K.E., Zhang, D., Liu, H., Mathew, D.: Theory of relative defect proneness: replicated studies on the functional form of the size-defect relationship. Empir. Softw. Eng., 473\u2013498 (2008)","DOI":"10.1007\/s10664-008-9080-x"},{"issue":"2","key":"69_CR33","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1109\/TSE.2008.90","volume":"35","author":"A. Koru","year":"2009","unstructured":"Koru, A., Zhang, D., El Emam, K., Liu, H.: An investigation into the functional form of the size-defect relationship for software modules. Softw. Eng. IEEE Trans. 35(2), 293\u2013304 (2009)","journal-title":"Softw. Eng. IEEE Trans."},{"key":"69_CR34","doi-asserted-by":"crossref","unstructured":"Lessmann, S., Baesens, B., Mues, C., Pietsch, S.: Benchmarking classification models for software defect prediction: a\u00a0proposed framework and novel findings. IEEE Trans. Softw. Eng. (2008)","DOI":"10.1109\/TSE.2008.35"},{"key":"69_CR35","volume-title":"Safeware System Safety and Computers","author":"N. Leveson","year":"1995","unstructured":"Leveson, N.: Safeware System Safety and Computers. Addison-Wesley, Reading (1995)"},{"issue":"11","key":"69_CR36","doi-asserted-by":"crossref","first-page":"673","DOI":"10.1109\/32.637384","volume":"23","author":"B. Littlewood","year":"1997","unstructured":"Littlewood, B., Wright, D.: Some conservative stopping rules for the operational testing of safety-critical software. IEEE Trans. Softw. Eng. 23(11), 673\u2013683 (1997)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"69_CR37","doi-asserted-by":"crossref","unstructured":"Lowry, M., Boyd, M., Kulkarni, D.: Towards a theory for integration of mathematical verification and empirical testing. In: Proceedings, ASE\u201998: Automated Software Engineering, pp. 322\u2013331 (1998)","DOI":"10.1109\/ASE.1998.732690"},{"key":"69_CR38","unstructured":"Lutz, R., Mikulski, C.: Operational anomalies as a cause of safety-critical requirements evolution. J. Syst. Softw. (2003). Available from http:\/\/www.cs.iastate.edu\/~rlutz\/publications\/JSS02.ps"},{"issue":"4","key":"69_CR39","doi-asserted-by":"crossref","first-page":"308","DOI":"10.1109\/TSE.1976.233837","volume":"2","author":"T. McCabe","year":"1976","unstructured":"McCabe, T.: A complexity measure. IEEE Trans. Softw. Eng. 2(4), 308\u2013320 (1976)","journal-title":"IEEE Trans. Softw. Eng."},{"issue":"5","key":"69_CR40","doi-asserted-by":"crossref","first-page":"107","DOI":"10.1109\/52.877876","volume":"17","author":"T. Menzies","year":"2000","unstructured":"Menzies, T., Cukic, B.: When to test less. IEEE Softw. 17(5), 107\u2013112 (2000). Available from http:\/\/menzies.us\/pdf\/00iesoft.pdf","journal-title":"IEEE Softw."},{"key":"69_CR41","unstructured":"Menzies, T., Stefano, J.S.D.: How good is your blind spot sampling policy? In: 2004 IEEE Conference on High Assurance Software Engineering (2003). Available from http:\/\/menzies.us\/pdf\/03blind.pdf"},{"key":"69_CR42","unstructured":"Menzies, T., Raffo, D., Setamanit, S., Hu, Y., Tootoonian, S.: Model-based tests of truisms. In: Proceedings of IEEE ASE 2002 (2002). Available from http:\/\/menzies.us\/pdf\/02truisms.pdf"},{"key":"69_CR43","unstructured":"Menzies, T., Dekhtyar, A., Distefano, J., Greenwald, J.: Problems with precision. IEEE Trans. Softw. Eng. (2007a). http:\/\/menzies.us\/pdf\/07precision.pdf"},{"key":"69_CR44","doi-asserted-by":"crossref","unstructured":"Menzies, T., Greenwald, J., Frank, A.: Data mining static code attributes to learn defect predictors. IEEE Trans. Softw. Eng. (2007b). Available from http:\/\/menzies.us\/pdf\/06learnPredict.pdf","DOI":"10.1109\/TSE.2007.256941"},{"key":"69_CR45","unstructured":"Milton, Z.: Which rules. M.S. thesis (2008)"},{"key":"69_CR46","first-page":"225","volume-title":"ICSE \u201905: Proceedings of the 27th International Conference on Software Engineering","author":"A. Mockus","year":"2005","unstructured":"Mockus, A., Zhang, P., Li, P.L.: Predictors of customer perceived software quality. In: ICSE \u201905: Proceedings of the 27th International Conference on Software Engineering, pp. 225\u2013233. ACM, New York (2005)"},{"key":"69_CR47","volume-title":"Software Reliability: Measurement, Prediction, Application","author":"J. Musa","year":"1987","unstructured":"Musa, J., Iannino, A., Okumoto, K.: Software Reliability: Measurement, Prediction, Application. McGraw-Hill, New York (1987)"},{"key":"69_CR48","doi-asserted-by":"crossref","unstructured":"Nagappan, N., Ball, T.: Static analysis tools as early indicators of pre-release defect density. In: ICSE 2005, St. Louis (2005a)","DOI":"10.1145\/1062455.1062558"},{"key":"69_CR49","doi-asserted-by":"crossref","unstructured":"Nagappan, N., Ball, T.: Static analysis tools as early indicators of pre-release defect density. In: ICSE, pp. 580\u2013586 (2005b)","DOI":"10.1145\/1062455.1062558"},{"key":"69_CR50","doi-asserted-by":"crossref","unstructured":"Nagappan, N., Murphy, B.: Basili, V.: The influence of organizational structure on software quality: An empirical case study. In: ICSE\u201908 (2008)","DOI":"10.1145\/1368088.1368160"},{"key":"69_CR51","unstructured":"Nikora, A.: Personnel communication on the accuracy of severity determinations in NASA databases (2004)"},{"key":"69_CR52","unstructured":"Nikora, A., Munson, J.: Developing fault predictors for evolving software systems. In: Ninth International Software Metrics Symposium (METRICS\u201903) (2003)"},{"key":"69_CR53","doi-asserted-by":"crossref","first-page":"86","DOI":"10.1145\/1007512.1007524","volume-title":"ISSTA\u201904: Proceedings of the 2004 ACM SIGSOFT International Symposium on Software Testing and Analysis","author":"T.J. Ostrand","year":"2004","unstructured":"Ostrand, T.J., Weyuker, E.J., Bell, R.M.: Where the bugs are. In: ISSTA\u201904: Proceedings of the 2004 ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 86\u201396. ACM, New York (2004)"},{"key":"69_CR54","doi-asserted-by":"crossref","unstructured":"Porter, A., Selby, R.: Empirically guided software development using metric-based classification trees. IEEE Softw. 46\u201354 (1990)","DOI":"10.1109\/52.50773"},{"issue":"6","key":"69_CR55","doi-asserted-by":"crossref","first-page":"668","DOI":"10.1145\/78973.78977","volume":"33","author":"W. Pugh","year":"1990","unstructured":"Pugh, W.: Skip lists: a\u00a0probabilistic alternative to balanced trees. Commun. ACM 33(6), 668\u2013676 (1990). Available from ftp:\/\/ftp.cs.umd.edu\/pub\/skipLists\/skiplists.pdf","journal-title":"Commun. ACM"},{"key":"69_CR56","unstructured":"Quinlan, J.R.: Learning with continuous classes. In: 5th Australian Joint Conference on Artificial Intelligence, pp. 343\u2013348 (1992a). Available from http:\/\/citeseer.nj.nec.com\/quinlan92learning.html"},{"key":"69_CR57","isbn-type":"print","volume-title":"C4.5: Programs for Machine Learning","author":"J.R. Quinlan","year":"1992","unstructured":"Quinlan, J.R.: C4.5: Programs for Machine Learning. Morgan Kaufman, San Mateo (1992b). ISBN: 1558602380","ISBN":"https:\/\/id.crossref.org\/isbn\/1558602380"},{"key":"69_CR58","unstructured":"Raffo, D.: Personnel communication (2005)"},{"key":"69_CR59","volume-title":"Software Verification and Validation for Practitioners and Managers","author":"S. Rakitin","year":"2001","unstructured":"Rakitin, S.: Software Verification and Validation for Practitioners and Managers, 2nd edn. Artech House, Norwood (2001)","edition":"2"},{"issue":"3","key":"69_CR60","doi-asserted-by":"crossref","first-page":"197","DOI":"10.1016\/0164-1212(94)90011-6","volume":"26","author":"M. Shepperd","year":"1994","unstructured":"Shepperd, M., Ince, D.: A critique of three metrics. J. Syst. Softw. 26(3), 197\u2013210 (1994)","journal-title":"J. Syst. Softw."},{"issue":"7","key":"69_CR61","doi-asserted-by":"crossref","first-page":"73","DOI":"10.1109\/2.869376","volume":"33","author":"F. Shull","year":"2000","unstructured":"Shull, F., Rus, I., Basili, V.: How perspective-based reading can improve requirements inspections. IEEE Comput. 33(7), 73\u201379 (2000). Available from http:\/\/www.cs.umd.edu\/projects\/SoftEng\/ESEG\/papers\/82.77.pdf","journal-title":"IEEE Comput."},{"key":"69_CR62","unstructured":"Shull, F., Boehm, B., B., V., Brown, A., Costa, P., Lindvall, M., Port, D., Rus, I., Tesoriero, R., Zelkowitz, M.: What we have learned about fighting defects. In: Proceedings of 8th International Software Metrics Symposium, Ottawa, Canada, pp. 249\u2013258 (2002). Available from http:\/\/fc-md.umd.edu\/fcmd\/Papers\/shull_defects.ps"},{"key":"69_CR63","doi-asserted-by":"crossref","unstructured":"Srinivasan, K., Fisher, D.: Machine learning approaches to estimating software development effort. IEEE Trans. Soft. Eng. 126\u2013137 (1995)","DOI":"10.1109\/32.345828"},{"key":"69_CR64","doi-asserted-by":"crossref","unstructured":"Tang, W., Khoshgoftaar, T.M.: Noise identification with the k-means algorithm. In: ICTAI, pp. 373\u2013378 (2004)","DOI":"10.1109\/ICTAI.2004.93"},{"issue":"8","key":"69_CR65","doi-asserted-by":"crossref","first-page":"641","DOI":"10.1109\/32.403788","volume":"21","author":"J. Tian","year":"1995","unstructured":"Tian, J., Zelkowitz, M.: Complexity measure evaluation and selection. IEEE Trans. Softw. Eng. 21(8), 641\u2013649 (1995)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"69_CR66","doi-asserted-by":"crossref","unstructured":"Tosun, A., Bener, A.: Ai-based software defect predictors: Applications and benefits in a case study. In: IAAI\u201910 (2010)","DOI":"10.1609\/aaai.v24i2.18807"},{"key":"69_CR67","doi-asserted-by":"crossref","unstructured":"Tosun, A., Bener, A., Turhan, B.: Practical considerations of deploying ai in defect prediction: a\u00a0case study within the Turkish telecommunication industry. In: PROMISE\u201909 (2009)","DOI":"10.1145\/1540438.1540453"},{"issue":"2","key":"69_CR68","first-page":"278","volume":"68","author":"B. Turhan","year":"2009","unstructured":"Turhan, B., Menzies, T., Bener, A., Distefano, J.: On the relative value of cross-company and within-company data for defect prediction. Empir. Softw. Eng. 68(2), 278\u2013290 (2009). Available from http:\/\/menzies.us\/pdf\/08ccwc.pdf","journal-title":"Empir. Softw. Eng."},{"key":"69_CR69","unstructured":"Turner, J.: A predictive approach to eliminating errors in software code (2006). Available from http:\/\/www.sti.nasa.gov\/tto\/Spinoff2006\/ct_1.html"},{"key":"69_CR70","doi-asserted-by":"crossref","unstructured":"Voas, J., Miller, K.: Software testability: the new verification. IEEE Softw. 17\u201328 (1995). Available from http:\/\/www.cigital.com\/papers\/download\/ieeesoftware95.ps","DOI":"10.1109\/52.382180"},{"key":"69_CR71","doi-asserted-by":"crossref","unstructured":"Weyuker, E., Ostrand, T., Bell, R.: Do too many cooks spoil the broth? Using the number of developers to enhance defect prediction models. Empir. Softw. Eng. (2008)","DOI":"10.1007\/s10664-008-9082-8"},{"key":"69_CR72","volume-title":"Data Mining","author":"I.H. Witten","year":"2005","unstructured":"Witten, I.H., Frank, E.: Data Mining, 2nd edn. Morgan Kaufmann, Los Altos (2005)","edition":"2"},{"key":"69_CR73","doi-asserted-by":"crossref","unstructured":"Yang, Y., Webb, G.I., Cerquides, J., Korb, K.B., Boughton, J.R., Ting, K.M.: To select or to weigh: a\u00a0comparative study of model selection and model weighing for spode ensembles. In: ECML, pp. 533\u2013544 (2006)","DOI":"10.1007\/11871842_50"},{"key":"69_CR74","doi-asserted-by":"crossref","unstructured":"Zimmermann, T., Nagappan, N., E.G., H.G., Murphy, B., Cross-project defect prediction. In: ESEC\/FSE\u201909 (2009)","DOI":"10.1145\/1595696.1595713"}],"container-title":["Automated Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10515-010-0069-5.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10515-010-0069-5\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10515-010-0069-5","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T06:41:14Z","timestamp":1685601674000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10515-010-0069-5"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5,20]]},"references-count":74,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2010,12]]}},"alternative-id":["69"],"URL":"https:\/\/doi.org\/10.1007\/s10515-010-0069-5","relation":{},"ISSN":["0928-8910","1573-7535"],"issn-type":[{"value":"0928-8910","type":"print"},{"value":"1573-7535","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,5,20]]}}}