{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T17:43:42Z","timestamp":1775843022028,"version":"3.50.1"},"reference-count":58,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T00:00:00Z","timestamp":1682294400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T00:00:00Z","timestamp":1682294400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Autom Softw Eng"],"published-print":{"date-parts":[[2023,11]]},"DOI":"10.1007\/s10515-023-00383-z","type":"journal-article","created":{"date-parts":[[2023,4,24]],"date-time":"2023-04-24T04:02:40Z","timestamp":1682308960000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":29,"title":["GNet4FL: effective fault localization via graph convolutional neural network"],"prefix":"10.1007","volume":"30","author":[{"given":"Jie","family":"Qian","sequence":"first","affiliation":[]},{"given":"Xiaolin","family":"Ju","sequence":"additional","affiliation":[]},{"given":"Xiang","family":"Chen","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2023,4,24]]},"reference":[{"key":"383_CR1","doi-asserted-by":"crossref","unstructured":"Abreu, R., Zoeteweij, P., Van\u00a0Gemund, A.J.: An evaluation of similarity coefficients for software fault localization. In: 2006 12th Pacific Rim International Symposium on Dependable Computing (PRDC\u201906), pp. 39\u201346. IEEE (2006)","DOI":"10.1109\/PRDC.2006.18"},{"issue":"11","key":"383_CR2","doi-asserted-by":"publisher","first-page":"1780","DOI":"10.1016\/j.jss.2009.06.035","volume":"82","author":"R Abreu","year":"2009","unstructured":"Abreu, R., Zoeteweij, P., Golsteijn, R., Van Gemund, A.J.: A practical evaluation of spectrum-based fault localization. J. Syst. Softw. 82(11), 1780\u20131792 (2009)","journal-title":"J. Syst. Softw."},{"key":"383_CR3","doi-asserted-by":"crossref","unstructured":"Alon, U., Zilberstein, M., Levy, O., Yahav, E.: code2vec: learning distributed representations of code. In: Proceedings of the ACM on Programming Languages 3(POPL), pp. 1\u201329 (2019)","DOI":"10.1145\/3290353"},{"key":"383_CR4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cosrev.2021.100378","volume":"40","author":"F Anowar","year":"2021","unstructured":"Anowar, F., Sadaoui, S., Selim, B.: Conceptual and empirical comparison of dimensionality reduction algorithms (pca, kpca, lda, mds, svd, lle, isomap, le, ica, t-sne). Comput. Sci. Rev. 40, 100378 (2021)","journal-title":"Comput. Sci. Rev."},{"key":"383_CR5","unstructured":"Bruna, J., Zaremba, W., Szlam, A., LeCun, Y.: Spectral networks and locally connected networks on graphs (2013). arXiv preprint arXiv:1312.6203"},{"key":"383_CR6","doi-asserted-by":"crossref","unstructured":"Chung, H.M., Gey, F., Piramuthu, S.: Data mining and information retrieval. In: Proceedings of the 35th Annual Hawaii International Conference on System Sciences, vol. 7, pp. 841\u2013842. IEEE Computer Society (2002)","DOI":"10.1109\/HICSS.2002.993980"},{"key":"383_CR7","doi-asserted-by":"crossref","unstructured":"Dutta, A., Godboley, S.: Msfl: a model for fault localization using mutation-spectra technique. In: International Conference on Lean and Agile Software Development, pp. 156\u2013173 (2021). Springer","DOI":"10.1007\/978-3-030-67084-9_10"},{"issue":"5","key":"383_CR8","doi-asserted-by":"publisher","first-page":"3873","DOI":"10.1007\/s10664-020-09859-y","volume":"25","author":"F Feyzi","year":"2020","unstructured":"Feyzi, F.: CGT-FL: using cooperative game theory to effective fault localization in presence of coincidental correctness. Empir. Softw. Eng. 25(5), 3873\u20133927 (2020)","journal-title":"Empir. Softw. Eng."},{"issue":"2","key":"383_CR9","doi-asserted-by":"publisher","first-page":"137","DOI":"10.1007\/s11222-009-9153-8","volume":"21","author":"T Fushiki","year":"2011","unstructured":"Fushiki, T.: Estimation of prediction error by using k-fold cross-validation. Stat. Comput. 21(2), 137\u2013146 (2011)","journal-title":"Stat. Comput."},{"key":"383_CR10","doi-asserted-by":"crossref","unstructured":"Gong, P., Zhao, R., Li, Z.: Faster mutation-based fault localization with a novel mutation execution strategy. In: 2015 IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW), pp. 1\u201310. IEEE (2015)","DOI":"10.1109\/ICSTW.2015.7107448"},{"issue":"1","key":"383_CR11","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1038\/s41467-021-23795-5","volume":"12","author":"W Gu","year":"2021","unstructured":"Gu, W., Tandon, A., Ahn, Y.-Y., Radicchi, F.: Principled approach to the selection of the embedding dimension of networks. Nat. Commun. 12(1), 1\u201310 (2021)","journal-title":"Nat. Commun."},{"key":"383_CR12","unstructured":"Hamilton, W.L., Ying, R., Leskovec, J.: Inductive representation learning on large graphs. In: Proceedings of the 31st International Conference on Neural Information Processing Systems, pp. 1025\u20131035 (2017)"},{"key":"383_CR13","doi-asserted-by":"crossref","unstructured":"Jones, J.A., Harrold, M.J.: Empirical evaluation of the tarantula automatic fault-localization technique. In: Proceedings of the 20th IEEE\/ACM International Conference on Automated Software Engineering, pp. 273\u2013282 (2005)","DOI":"10.1145\/1101908.1101949"},{"key":"383_CR14","doi-asserted-by":"publisher","first-page":"3","DOI":"10.1016\/j.jss.2013.11.1109","volume":"90","author":"X Ju","year":"2014","unstructured":"Ju, X., Jiang, S., Chen, X., Wang, X., Zhang, Y., Cao, H.: HSFal: effective fault localization using hybrid spectrum of full slices and execution slices. J. Syst. Softw. 90, 3\u201317 (2014)","journal-title":"J. Syst. Softw."},{"key":"383_CR15","doi-asserted-by":"crossref","unstructured":"Keller, F., Grunske, L., Heiden, S., Filieri, A., van Hoorn, A., Lo, D.: A critical evaluation of spectrum-based fault localization techniques on a large-scale software system. In: 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), pp. 114\u2013125. IEEE (2017)","DOI":"10.1109\/QRS.2017.22"},{"key":"383_CR16","unstructured":"Kipf, T.N., Welling, M.: Semi-supervised Learning with Graph Convolutional Networks. ICLR (2017)"},{"key":"383_CR17","doi-asserted-by":"crossref","unstructured":"K\u00fc\u00e7\u00fck, Y., Henderson, T.A., Podgurski, A.: Improving fault localization by integrating value and predicate based causal inference techniques. In: 2021 IEEE\/ACM 43rd International Conference on Software Engineering (ICSE), pp. 649\u2013660. IEEE (2021)","DOI":"10.1109\/ICSE43902.2021.00066"},{"key":"383_CR18","doi-asserted-by":"crossref","unstructured":"Lam, A.N., Nguyen, A.T., Nguyen, H.A., Nguyen, T.N.: Bug localization with combination of deep learning and information retrieval. In: 2017 IEEE\/ACM 25th International Conference on Program Comprehension (ICPC), pp. 218\u2013229 (2017). IEEE","DOI":"10.1109\/ICPC.2017.24"},{"key":"383_CR19","doi-asserted-by":"crossref","unstructured":"Li, X., Zhang, L.: Transforming programs and tests in tandem for fault localization. In: Proceedings of the ACM on Programming Languages 1(OOPSLA), pp. 1\u201330 (2017)","DOI":"10.1145\/3133916"},{"key":"383_CR20","doi-asserted-by":"crossref","unstructured":"Li, X., Li, W., Zhang, Y., Zhang, L.: DeepFL: integrating multiple fault diagnosis dimensions for deep fault localization. In: Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 169\u2013180 (2019)","DOI":"10.1145\/3293882.3330574"},{"key":"383_CR21","doi-asserted-by":"crossref","unstructured":"Li, Y., Wang, S., Nguyen, T.N.: Fault localization with code coverage representation learning. In: 2021 IEEE\/ACM 43rd International Conference on Software Engineering (ICSE), pp. 661\u2013673. IEEE (2021)","DOI":"10.1109\/ICSE43902.2021.00067"},{"issue":"5","key":"383_CR22","doi-asserted-by":"publisher","first-page":"286","DOI":"10.1145\/1095430.1081753","volume":"30","author":"C Liu","year":"2005","unstructured":"Liu, C., Yan, X., Fei, L., Han, J., Midkiff, S.P.: SOBER: statistical model-based bug localization. SIGSOFT Softw. Eng. Notes 30(5), 286\u2013295 (2005). https:\/\/doi.org\/10.1145\/1095430.1081753","journal-title":"SIGSOFT Softw. Eng. Notes"},{"key":"383_CR23","doi-asserted-by":"crossref","unstructured":"Liu, Y., Li, Z., Wang, L., Hu, Z., Zhao, R.: Statement-oriented mutant reduction strategy for mutation based fault localization. In: 2017 IEEE International Conference on Software Quality, Reliability and Security (QRS), pp. 126\u2013137. IEEE (2017)","DOI":"10.1109\/QRS.2017.23"},{"key":"383_CR24","doi-asserted-by":"crossref","unstructured":"Lou, Y., Zhu, Q., Dong, J., Li, X., Sun, Z., Hao, D., Zhang, L., Zhang, L.: Boosting coverage-based fault localization via graph-based representation learning. In: Proceedings of the 29th ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp. 664\u2013676 (2021)","DOI":"10.1145\/3468264.3468580"},{"key":"383_CR25","doi-asserted-by":"publisher","first-page":"51","DOI":"10.1016\/j.jss.2013.08.031","volume":"89","author":"X Mao","year":"2014","unstructured":"Mao, X., Lei, Y., Dai, Z., Qi, Y., Wang, C.: Slice-based statistical fault localization. J. Syst. Softw. 89, 51\u201362 (2014)","journal-title":"J. Syst. Softw."},{"issue":"3","key":"383_CR26","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2000791.2000795","volume":"20","author":"L Naish","year":"2011","unstructured":"Naish, L., Lee, H.J., Ramamohanarao, K.: A model for spectra-based software diagnosis. ACM Trans. Softw. Eng. Methodol. (TOSEM) 20(3), 1\u201332 (2011)","journal-title":"ACM Trans. Softw. Eng. Methodol. (TOSEM)"},{"issue":"5\u20137","key":"383_CR27","doi-asserted-by":"publisher","first-page":"605","DOI":"10.1002\/stvr.1509","volume":"25","author":"M Papadakis","year":"2015","unstructured":"Papadakis, M., Le Traon, Y.: Metallaxis-FL: mutation-based fault localization. Softw. Test. Verif. Reliab. 25(5\u20137), 605\u2013628 (2015)","journal-title":"Softw. Test. Verif. Reliab."},{"key":"383_CR28","doi-asserted-by":"crossref","unstructured":"Park, S., Vuduc, R.W., Harrold, M.J.: Falcon: fault localization in concurrent programs. In: Proceedings of the 32nd ACM\/IEEE International Conference on Software Engineering, vol. 1, pp. 245\u2013254 (2010)","DOI":"10.1145\/1806799.1806838"},{"key":"383_CR29","doi-asserted-by":"crossref","unstructured":"Pearson, S., Campos, J., Just, R., Fraser, G., Abreu, R., Ernst, M.D., Pang, D., Keller, B.: Evaluating and improving fault localization. In: 2017 IEEE\/ACM 39th International Conference on Software Engineering (ICSE), pp. 609\u2013620 (2017). IEEE","DOI":"10.1109\/ICSE.2017.62"},{"key":"383_CR30","doi-asserted-by":"publisher","first-page":"108","DOI":"10.1016\/j.ins.2019.08.077","volume":"510","author":"Z Peng","year":"2020","unstructured":"Peng, Z., Xiao, X., Hu, G., Sangaiah, A.K., Atiquzzaman, M., Xia, S.: Abfl: an autoencoder based practical approach for software fault localization. Inf. Sci. 510, 108\u2013121 (2020)","journal-title":"Inf. Sci."},{"key":"383_CR31","unstructured":"Planning, S.: The economic impacts of inadequate infrastructure for software testing. National Institute of Standards and Technology (2002)"},{"key":"383_CR32","doi-asserted-by":"crossref","unstructured":"Qian, J., Ju, X., Chen, X., Shen, H., Shen, Y.: AGFL: a graph convolutional neural network-based method for fault localization. In: 2021 IEEE 21st International Conference on Software Quality, Reliability and Security (QRS), pp. 672\u2013680 (2021). IEEE","DOI":"10.1109\/QRS54544.2021.00077"},{"key":"383_CR33","unstructured":"Raunak, V.: Simple and effective dimensionality reduction for word embeddings (2017). arXiv preprint arXiv:1708.03629"},{"key":"383_CR34","doi-asserted-by":"crossref","unstructured":"Sohn, J., Yoo, S.: Fluccs: Using code and change metrics to improve fault localization. In: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis, pp. 273\u2013283 (2017)","DOI":"10.1145\/3092703.3092717"},{"issue":"3","key":"383_CR35","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s10664-020-09931-7","volume":"26","author":"E Soremekun","year":"2021","unstructured":"Soremekun, E., Kirschner, L., B\u00f6hme, M., Zeller, A.: Locating faults with program slicing: an empirical analysis. Empir. Softw. Eng. 26(3), 1\u201345 (2021)","journal-title":"Empir. Softw. Eng."},{"issue":"11","key":"383_CR36","first-page":"2579","volume":"9","author":"L Van der Maaten","year":"2008","unstructured":"Van der Maaten, L., Hinton, G.: Visualizing data using t-SNE. J. Mach. Learn. Res. 9(11), 2579\u20132605 (2008)","journal-title":"J. Mach. Learn. Res."},{"key":"383_CR37","doi-asserted-by":"publisher","first-page":"111429","DOI":"10.1016\/j.jss.2022.111429","volume":"193","author":"B Vancsics","year":"2022","unstructured":"Vancsics, B., Horv\u00e1th, F., Szatm\u00e1ri, A., Besz\u00e9des, \u00c1.: Fault localization using function call frequencies. J. Syst. Softw. 193, 111429 (2022)","journal-title":"J. Syst. Softw."},{"key":"383_CR38","doi-asserted-by":"crossref","unstructured":"Wang, X., Ji, H., Shi, C., Wang, B., Ye, Y., Cui, P., Yu, P.S.: Heterogeneous graph attention network. In: The World Wide Web Conference, pp. 2022\u20132032 (2019)","DOI":"10.1145\/3308558.3313562"},{"issue":"04","key":"383_CR39","doi-asserted-by":"publisher","first-page":"573","DOI":"10.1142\/S021819400900426X","volume":"19","author":"WE Wong","year":"2009","unstructured":"Wong, W.E., Qi, Y.: BP neural network-based effective fault localization. Int. J. Softw. Eng. Knowl. Eng. 19(04), 573\u2013597 (2009)","journal-title":"Int. J. Softw. Eng. Knowl. Eng."},{"issue":"2","key":"383_CR40","doi-asserted-by":"publisher","first-page":"188","DOI":"10.1016\/j.jss.2009.09.037","volume":"83","author":"WE Wong","year":"2010","unstructured":"Wong, W.E., Debroy, V., Choi, B.: A family of code coverage-based heuristics for effective fault localization. J. Syst. Softw. 83(2), 188\u2013208 (2010). https:\/\/doi.org\/10.1016\/j.jss.2009.09.037","journal-title":"J. Syst. Softw."},{"issue":"1","key":"383_CR41","doi-asserted-by":"publisher","first-page":"290","DOI":"10.1109\/TR.2013.2285319","volume":"63","author":"WE Wong","year":"2013","unstructured":"Wong, W.E., Debroy, V., Gao, R., Li, Y.: The DStar method for effective software fault localization. IEEE Trans. Reliab. 63(1), 290\u2013308 (2013)","journal-title":"IEEE Trans. Reliab."},{"issue":"8","key":"383_CR42","doi-asserted-by":"publisher","first-page":"707","DOI":"10.1109\/TSE.2016.2521368","volume":"42","author":"WE Wong","year":"2016","unstructured":"Wong, W.E., Gao, R., Li, Y., Abreu, R., Wotawa, F.: A survey on software fault localization. IEEE Trans. Softw. Eng. 42(8), 707\u2013740 (2016)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"383_CR43","doi-asserted-by":"crossref","unstructured":"Woolson, R.F.: Wilcoxon signed-rank test. In: Wiley Encyclopedia of Clinical Trials, pp. 1\u20133 (2007)","DOI":"10.1002\/9780471462422.eoct979"},{"key":"383_CR44","unstructured":"Wu, F., Souza, A., Zhang, T., Fifty, C., Yu, T., Weinberger, K.: Simplifying graph convolutional networks. In: International Conference on Machine Learning, pp. 6861\u20136871. PMLR (2019)"},{"issue":"1","key":"383_CR45","doi-asserted-by":"publisher","first-page":"4","DOI":"10.1109\/TNNLS.2020.2978386","volume":"32","author":"Z Wu","year":"2020","unstructured":"Wu, Z., Pan, S., Chen, F., Long, G., Zhang, C., Philip, S.Y.: A comprehensive survey on graph neural networks. IEEE Trans. Neural Netw. Learn. Syst. 32(1), 4\u201324 (2020)","journal-title":"IEEE Trans. Neural Netw. Learn. Syst."},{"key":"383_CR46","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2021.106653","volume":"139","author":"X Xiao","year":"2021","unstructured":"Xiao, X., Pan, Y., Zhang, B., Hu, G., Li, Q., Lu, R.: ALBFL: a novel neural ranking model for software fault localization via combining static and dynamic features. Inf. Softw. Technol. 139, 106653 (2021)","journal-title":"Inf. Softw. Technol."},{"issue":"4","key":"383_CR47","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/2522920.2522924","volume":"22","author":"X Xie","year":"2013","unstructured":"Xie, X., Chen, T.Y., Kuo, F.-C., Xu, B.: A theoretical analysis of the risk evaluation formulas for spectrum-based fault localization. ACM Trans. Softw. Eng. Methodol. (TOSEM) 22(4), 1\u201340 (2013a)","journal-title":"ACM Trans. Softw. Eng. Methodol. (TOSEM)"},{"issue":"5","key":"383_CR48","doi-asserted-by":"publisher","first-page":"866","DOI":"10.1016\/j.infsof.2012.08.008","volume":"55","author":"X Xie","year":"2013","unstructured":"Xie, X., Wong, W.E., Chen, T.Y., Xu, B.: Metamorphic slice: an application in spectrum-based fault localization. Inf. Softw. Technol. 55(5), 866\u2013879 (2013b)","journal-title":"Inf. Softw. Technol."},{"issue":"2","key":"383_CR49","doi-asserted-by":"publisher","first-page":"613","DOI":"10.1109\/TR.2020.3040191","volume":"70","author":"J Xu","year":"2020","unstructured":"Xu, J., Wang, F., Ai, J.: Defect prediction with semantics and context features of codes based on graph representation learning. IEEE Trans. Reliab. 70(2), 613\u2013625 (2020)","journal-title":"IEEE Trans. Reliab."},{"issue":"1","key":"383_CR50","doi-asserted-by":"publisher","first-page":"264","DOI":"10.1109\/TKDE.2014.2324590","volume":"27","author":"J Xuan","year":"2014","unstructured":"Xuan, J., Jiang, H., Hu, Y., Ren, Z., Zou, W., Luo, Z., Wu, X.: Towards effective bug triage with software data reduction techniques. IEEE Trans. Knowl. Data Eng. 27(1), 264\u2013280 (2014)","journal-title":"IEEE Trans. Knowl. Data Eng."},{"key":"383_CR51","doi-asserted-by":"crossref","unstructured":"Yang, Y., Zhou, Y., Liu, J., Zhao, Y., Lu, H., Xu, L., Xu, B., Leung, H.: Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models. In: Proceedings of the 2016 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering, pp. 157\u2013168 (2016)","DOI":"10.1145\/2950290.2950353"},{"key":"383_CR52","doi-asserted-by":"publisher","DOI":"10.1145\/3505243","author":"Y Yang","year":"2021","unstructured":"Yang, Y., Xia, X., Lo, D., Grundy, J.: A survey on deep learning for software engineering. ACM Comput. Surv. (CSUR) (2021). https:\/\/doi.org\/10.1145\/3505243","journal-title":"ACM Comput. Surv. (CSUR)"},{"key":"383_CR53","doi-asserted-by":"crossref","unstructured":"Zhang, J., Wang, X., Zhang, H., Sun, H., Wang, K., Liu, X.: A novel neural source code representation based on abstract syntax tree. In: 2019 IEEE\/ACM 41st International Conference on Software Engineering (ICSE), pp. 783\u2013794. IEEE (2019a)","DOI":"10.1109\/ICSE.2019.00086"},{"issue":"6","key":"383_CR54","doi-asserted-by":"publisher","first-page":"1089","DOI":"10.1109\/TSE.2019.2911283","volume":"47","author":"M Zhang","year":"2019","unstructured":"Zhang, M., Li, Y., Li, X., Chen, L., Zhang, Y., Zhang, L., Khurshid, S.: An empirical study of boosting spectrum-based fault localization via pagerank. IEEE Trans. Softw. Eng. 47(6), 1089\u20131113 (2019b)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"383_CR55","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TSE.2019.2962027","volume":"48","author":"JM Zhang","year":"2020","unstructured":"Zhang, J.M., Harman, M., Ma, L., Liu, Y.: Machine learning testing: survey, landscapes and horizons. IEEE Trans. Softw. Eng. 48, 1\u201336 (2020)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"383_CR56","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2020.106486","volume":"131","author":"Z Zhang","year":"2021","unstructured":"Zhang, Z., Lei, Y., Mao, X., Yan, M., Xu, L., Zhang, X.: A study of effectiveness of deep learning in locating real faults. Inf. Softw. Technol. 131, 106486 (2021)","journal-title":"Inf. Softw. Technol."},{"key":"383_CR57","doi-asserted-by":"crossref","unstructured":"Zhou, J., Zhang, H., Lo, D.: Where should the bugs be fixed? More accurate information retrieval-based bug localization based on bug reports. In: 2012 34th International Conference on Software Engineering (ICSE), pp. 14\u201324 (2012). IEEE","DOI":"10.1109\/ICSE.2012.6227210"},{"issue":"2","key":"383_CR58","doi-asserted-by":"publisher","first-page":"332","DOI":"10.1109\/TSE.2019.2892102","volume":"47","author":"D Zou","year":"2019","unstructured":"Zou, D., Liang, J., Xiong, Y., Ernst, M.D., Zhang, L.: An empirical study of fault localization families and their combinations. IEEE Trans. Softw. Eng. 47(2), 332\u2013347 (2019)","journal-title":"IEEE Trans. Softw. Eng."}],"container-title":["Automated Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10515-023-00383-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10515-023-00383-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10515-023-00383-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,18]],"date-time":"2024-10-18T22:09:07Z","timestamp":1729289347000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10515-023-00383-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,24]]},"references-count":58,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2023,11]]}},"alternative-id":["383"],"URL":"https:\/\/doi.org\/10.1007\/s10515-023-00383-z","relation":{"has-preprint":[{"id-type":"doi","id":"10.21203\/rs.3.rs-2000722\/v1","asserted-by":"object"}]},"ISSN":["0928-8910","1573-7535"],"issn-type":[{"value":"0928-8910","type":"print"},{"value":"1573-7535","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,4,24]]},"assertion":[{"value":"26 August 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"9 April 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 April 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no competing interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of interest"}}],"article-number":"16"}}