{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T13:49:54Z","timestamp":1762004994350,"version":"3.37.3"},"reference-count":31,"publisher":"Springer Science and Business Media LLC","issue":"S2","license":[{"start":{"date-parts":[[2018,3,12]],"date-time":"2018-03-12T00:00:00Z","timestamp":1520812800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Cluster Comput"],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1007\/s10586-018-2289-6","type":"journal-article","created":{"date-parts":[[2018,3,12]],"date-time":"2018-03-12T03:51:11Z","timestamp":1520826671000},"page":"4683-4692","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":27,"title":["Modelling the spice parameters of SOI MOSFET using a combinational algorithm"],"prefix":"10.1007","volume":"22","author":[{"given":"Moein","family":"Sarvaghad-Moghaddam","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ali A.","family":"Orouji","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zeinab","family":"Ramezani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6347-8368","authenticated-orcid":false,"given":"Mohamed","family":"Elhoseny","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ahmed","family":"Farouk","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Arun kumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2018,3,12]]},"reference":[{"key":"2289_CR1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4419-9106-5","volume-title":"Silicon-on-insulator technology: materials to VLSI: materials to Vlsi","author":"JP Colinge","year":"2004","unstructured":"Colinge, J.P.: Silicon-on-insulator technology: materials to VLSI: materials to Vlsi. Springer, New York (2004)"},{"key":"2289_CR2","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1016\/j.spmi.2014.04.010","volume":"72","author":"AA Orouji","year":"2014","unstructured":"Orouji, A.A., Anvarifard, M.K.: Novel reduced body charge technique in reliable nanoscale SOI MOSFETs for suppressing the kink effect. Superlattices Microstruct. 72, 111\u2013125 (2014)","journal-title":"Superlattices Microstruct."},{"key":"2289_CR3","doi-asserted-by":"crossref","first-page":"124","DOI":"10.1016\/j.mssp.2013.11.011","volume":"19","author":"Z Ramezani","year":"2014","unstructured":"Ramezani, Z., Orouji, A.A.: A silicon-on-insulator metal\u2013semiconductor field-effect transistor with an L-shaped buried oxide for high output-power density. Mater. Sci. Semicond. Process. 19, 124\u2013129 (2014)","journal-title":"Mater. Sci. Semicond. Process."},{"issue":"5","key":"2289_CR4","doi-asserted-by":"crossref","first-page":"775","DOI":"10.1016\/S0038-1101(99)00273-7","volume":"44","author":"A Pl\u00f6\u00dfl","year":"2000","unstructured":"Pl\u00f6\u00dfl, A., Kr\u00e4uter, G.: Silicon-on-insulator: materials aspects and applications. Solid State Electron. 44(5), 775\u2013782 (2000)","journal-title":"Solid State Electron."},{"key":"2289_CR5","unstructured":"Plouchart, J.O.: Applications of SOI technologies to communication. In: Compound Semiconductor Integrated Circuit Symposium (Csics), 2011 IEEE. pp. 1\u20134 (2011)"},{"key":"2289_CR6","volume-title":"MOSFET modeling & BSIM3 user\u2019s guide","author":"Y Cheng","year":"1999","unstructured":"Cheng, Y., Hu, C.: MOSFET modeling & BSIM3 user\u2019s guide. Springer, New York (1999)"},{"issue":"1","key":"2289_CR7","doi-asserted-by":"crossref","first-page":"82","DOI":"10.1109\/16.974753","volume":"49","author":"FG S\u00e1nchez","year":"2002","unstructured":"S\u00e1nchez, F.G., Ortiz-Conde, A., Cerdeira, A., Estrada, M., Flandre, D., Liou, J.J.: A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs. IEEE Trans. Electron Devices 49(1), 82\u201388 (2002)","journal-title":"IEEE Trans. Electron Devices"},{"issue":"6","key":"2289_CR8","doi-asserted-by":"crossref","first-page":"1317","DOI":"10.1109\/16.678559","volume":"45","author":"C-L Lou","year":"1998","unstructured":"Lou, C.-L., Chim, W.-K., Chan, D.-H., Pan, T.: A novel single-device DC method for extraction of the effective mobility and source-drain resistances of fresh and hot-carrier degraded drain-engineered MOSFET\u2019s. IEEE Trans. Electron Devices 45(6), 1317\u20131323 (1998)","journal-title":"IEEE Trans. Electron Devices"},{"key":"2289_CR9","unstructured":"Keser, M., Joardar, K., Motorola, M.: Genetic algorithm based MOSFET model parameter extraction. In: Technical Proceedings of the International Conference on Modeling and Simulation of Microsystems, pp. 341\u2013344 (2000)"},{"key":"2289_CR10","doi-asserted-by":"crossref","unstructured":"Xiao, Y., Trefzer, M.A., Walker, J.A., Bale, S.J., Tyrrell, A.M.: Two step evolution strategy for device motif BSIM model parameter extraction. In: Proceedings of 2014 IEEE Congress on Evolutionary Computation (CEC), pp. 2877\u20132884 (2014)","DOI":"10.1109\/CEC.2014.6900520"},{"issue":"5","key":"2289_CR11","first-page":"796","volume":"27","author":"L Ruizhen","year":"2006","unstructured":"Ruizhen, L., Duoli, L., Du Huan, H.C., Zhengsheng, H.: SOI MOSFET model parameter extraction via a compound genetic algorithm. Chin. J. Semicond. 27(5), 796\u2013803 (2006)","journal-title":"Chin. J. Semicond."},{"issue":"8","key":"2289_CR12","first-page":"1676","volume":"26","author":"L Ruizhen","year":"2005","unstructured":"Ruizhen, L., Zhengsheng, H.: Model parameters extraction of a BSIM SOI model based on the genetic algorithm. Chin. J. Semicond. 26(8), 1676 (2005)","journal-title":"Chin. J. Semicond."},{"issue":"2","key":"2289_CR13","doi-asserted-by":"crossref","first-page":"123","DOI":"10.1016\/j.aeue.2012.07.012","volume":"67","author":"M Hayati","year":"2013","unstructured":"Hayati, M., Akhlaghi, B.: An extraction technique for small signal intrinsic parameters of HEMTs based on artificial neural networks. AEU Int. J. Electron. Commun. 67(2), 123\u2013129 (2013)","journal-title":"AEU Int. J. Electron. Commun."},{"key":"2289_CR14","volume-title":"Adaptations in natural and artificial systems","author":"JH Holland","year":"1975","unstructured":"Holland, J.H.: Adaptations in natural and artificial systems. MIT press, Cambridge (1975)"},{"key":"2289_CR15","first-page":"372","volume-title":"Genetic algorithms in search, optimization and machine learning","author":"DE Goldberg","year":"1989","unstructured":"Goldberg, D.E.: Genetic algorithms in search, optimization and machine learning, p. 372. Addison-Wesley Longman Publishing Co.,Inc., Boston (1989)"},{"key":"2289_CR16","volume-title":"An introduction to genetic algorithms","author":"M Mitchell","year":"1999","unstructured":"Mitchell, M.: An introduction to genetic algorithms. The MIT Press, Cambridge (1999)"},{"issue":"1","key":"2289_CR17","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1007\/s10922-016-9379-7","volume":"25","author":"X Yuan","year":"2017","unstructured":"Yuan, X., Elhoseny, M., El-Minir, H.K., Riad, A.M.: A genetic algorithm-based, dynamic clustering method towards improved WSN longevity. J. Netw. Syst. Manage. 25(1), 21\u201346 (2017)","journal-title":"J. Netw. Syst. Manage."},{"issue":"12","key":"2289_CR18","doi-asserted-by":"crossref","first-page":"2194","DOI":"10.1109\/LCOMM.2014.2381226","volume":"19","author":"M Elhoseny","year":"2015","unstructured":"Elhoseny, M., Yuan, X., Yu, Z., Mao, C., El-Minir, H.K., Riad, A.M.: Balancing energy consumption in heterogeneous wireless sensor networks using genetic algorithm. IEEE Commun. Lett. 19(12), 2194\u20132197 (2015)","journal-title":"IEEE Commun. Lett."},{"issue":"4","key":"2289_CR19","doi-asserted-by":"crossref","first-page":"2305","DOI":"10.3233\/JIFS-17348","volume":"33","author":"M Elhoseny","year":"2017","unstructured":"Elhoseny, M., Shehab, A., Yuan, X.: Optimizing robot path in dynamic environments using genetic algorithm and bezier curve. J. Intell. Fuzzy Syst. 33(4), 2305\u20132316 (2017)","journal-title":"J. Intell. Fuzzy Syst."},{"issue":"4","key":"2289_CR20","doi-asserted-by":"crossref","first-page":"269","DOI":"10.1016\/j.inffus.2003.12.005","volume":"5","author":"X Yuan","year":"2004","unstructured":"Yuan, X., Zhang, J., Buckles, B.P.: Evolution strategies based image registration via feature matching. Inf. Fusion 5(4), 269\u2013282 (2004)","journal-title":"Inf. Fusion"},{"issue":"6","key":"2289_CR21","doi-asserted-by":"crossref","first-page":"580","DOI":"10.1109\/TEVC.2002.804320","volume":"6","author":"K-H Han","year":"2002","unstructured":"Han, K.-H., Kim, J.-H.: Quantum-inspired evolutionary algorithm for a class of combinatorial optimization. IEEE Trans. Evol. Comput. 6(6), 580\u2013593 (2002)","journal-title":"IEEE Trans. Evol. Comput."},{"issue":"3","key":"2289_CR22","doi-asserted-by":"crossref","first-page":"105","DOI":"10.1049\/cce:19990303","volume":"10","author":"T Hey","year":"1999","unstructured":"Hey, T.: Quantum computing: an introduction. Comput. Control Eng. J. 10(3), 105\u2013112 (1999)","journal-title":"Comput. Control Eng. J."},{"issue":"10","key":"2289_CR23","doi-asserted-by":"crossref","first-page":"1482","DOI":"10.1109\/TAC.1997.633847","volume":"42","author":"JSR Jang","year":"1997","unstructured":"Jang, J.S.R., Sun, C.T., Mizutani, E.: Neuro-fuzzy and soft computing; a computational approach to learning and machine intelligence. IEEE Trans. Automat. Contr. 42(10), 1482\u20131484 (1997)","journal-title":"IIEEE Trans. Automat. Contr."},{"issue":"2","key":"2289_CR24","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1109\/66.216928","volume":"6","author":"CD Himmel","year":"1993","unstructured":"Himmel, C.D., May, G.S.: Advantages of plasma etch modeling using neural networks over statistical techniques. IEEE Trans. Semicond. Manuf. 6(2), 103\u2013111 (1993)","journal-title":"IEEE Trans. Semicond. Manuf."},{"issue":"3","key":"2289_CR25","doi-asserted-by":"crossref","first-page":"333","DOI":"10.1109\/66.311337","volume":"7","author":"Y Huang","year":"1994","unstructured":"Huang, Y., Edgar, T.F., Himmelblau, D.M., Trachtenberg, I.: Constructing a reliable neural network model for a plasma etching process using limited experimental data. IEEE Trans. Semicond. Manuf. 7(3), 333\u2013344 (1994)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"2289_CR26","doi-asserted-by":"crossref","unstructured":"Mocella, M.T., Bondur, J.A., Turner, T.R.: Etch process characterization using neural network methodology: a case study. In: International conference on Process Module Metrology, Control and Clustering. International Society for Optics and Photonics, pp. 232\u2013242 (1992)","DOI":"10.1117\/12.56637"},{"key":"2289_CR27","doi-asserted-by":"crossref","unstructured":"Bose C.B., Lord, H.A.: Neural network models in wafer fabrication. In: International Conference on Optical Engineering and Photonics in Aerospace Sensing. International Society for Optics and Photonics, pp. 521\u2013530 (1993)","DOI":"10.1117\/12.152552"},{"issue":"4","key":"2289_CR28","doi-asserted-by":"crossref","first-page":"343","DOI":"10.1109\/66.267644","volume":"6","author":"E Rietman","year":"1993","unstructured":"Rietman, E., Lory, E.R.: Use of neural networks in modeling semiconductor manufacturing processes: an example for plasma etch modeling. IEEE Trans. Semicond. Manuf. 6(4), 343\u2013347 (1993)","journal-title":"IEEE Trans. Semicond. Manuf."},{"key":"2289_CR29","volume-title":"3-D device simulator","author":"AUS Manual","year":"2012","unstructured":"Manual, A.U.S.: 3-D device simulator. Silvaco Inc., Santa Clara (2012)"},{"issue":"1","key":"2289_CR30","doi-asserted-by":"crossref","first-page":"134","DOI":"10.1016\/j.physe.2006.01.011","volume":"33","author":"M Jagadesh Kumar","year":"2006","unstructured":"Jagadesh Kumar, M., Orouji, A.A.: Investigation of a new modified source\/drain for diminished self-heating effects in nanoscale MOSFETs using computer simulation. Physica E 33(1), 134\u2013138 (2006)","journal-title":"Physica E"},{"key":"2289_CR31","doi-asserted-by":"crossref","first-page":"359","DOI":"10.1016\/j.spmi.2016.08.043","volume":"98","author":"Z Ramezani","year":"2016","unstructured":"Ramezani, Z., Orouji, A.A.: Investigation of veritcal graded channel doping in nanoscale fully-depleted SOI-MOSFET. Superlattices Microstruct. 98, 359\u2013370 (2016)","journal-title":"Superlattices Microstruct."}],"container-title":["Cluster Computing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10586-018-2289-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10586-018-2289-6\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10586-018-2289-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,10,25]],"date-time":"2019-10-25T17:40:14Z","timestamp":1572025214000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10586-018-2289-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3,12]]},"references-count":31,"journal-issue":{"issue":"S2","published-print":{"date-parts":[[2019,3]]}},"alternative-id":["2289"],"URL":"https:\/\/doi.org\/10.1007\/s10586-018-2289-6","relation":{},"ISSN":["1386-7857","1573-7543"],"issn-type":[{"type":"print","value":"1386-7857"},{"type":"electronic","value":"1573-7543"}],"subject":[],"published":{"date-parts":[[2018,3,12]]},"assertion":[{"value":"10 January 2018","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"14 February 2018","order":2,"name":"revised","label":"Revised","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"22 February 2018","order":3,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"12 March 2018","order":4,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}}]}}