{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T02:58:23Z","timestamp":1761965903796,"version":"build-2065373602"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"3-4","license":[{"start":{"date-parts":[[2011,5,15]],"date-time":"2011-05-15T00:00:00Z","timestamp":1305417600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Des Autom Embed Syst"],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1007\/s10617-011-9078-2","type":"journal-article","created":{"date-parts":[[2011,5,14]],"date-time":"2011-05-14T08:43:21Z","timestamp":1305362601000},"page":"289-310","source":"Crossref","is-referenced-by-count":27,"title":["HVD: horizontal-vertical-diagonal error detecting and correcting code to protect against with soft errors"],"prefix":"10.1007","volume":"15","author":[{"given":"Mostafa","family":"Kishani","sequence":"first","affiliation":[]},{"given":"Hamid R.","family":"Zarandi","sequence":"additional","affiliation":[]},{"given":"Hossein","family":"Pedram","sequence":"additional","affiliation":[]},{"given":"Alireza","family":"Tajary","sequence":"additional","affiliation":[]},{"given":"Mohsen","family":"Raji","sequence":"additional","affiliation":[]},{"given":"Behnam","family":"Ghavami","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2011,5,15]]},"reference":[{"issue":"6","key":"9078_CR1","doi-asserted-by":"crossref","first-page":"2586","DOI":"10.1109\/23.903813","volume":"47","author":"P Hazucha","year":"2000","unstructured":"Hazucha P, Svensson C (2000) Impact of CMOS technology scaling on the atmospheric neutron soft error rate. IEEE Trans Nucl Sci 47(6):2586\u20132594","journal-title":"IEEE Trans Nucl Sci"},{"key":"9078_CR2","unstructured":"International Technology Road map for Semiconductors (2002) http:\/\/public.itrs.net\/"},{"issue":"1","key":"9078_CR3","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1109\/TNS.2005.845883","volume":"52","author":"PA Ferreyra","year":"2005","unstructured":"Ferreyra PA, Marques CA, Ferreyra RT, Gaspar JP (2005) Failure map functions and accelerated mean time to failure tests: new approaches for improving the reliability estimation in systems exposed to single event upsets. IEEE Trans Nucl Sci 52(1):494\u2013500","journal-title":"IEEE Trans Nucl Sci"},{"key":"9078_CR4","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/40.259894","volume":"14","author":"J Karlsson","year":"1994","unstructured":"Karlsson J, Liden P, Dahlgern P, Johansson R, Gunneflo U (1994) Using heavy-ion radiation to validate fault-handling mechanisms. IEEE MICRO 14:8\u201323","journal-title":"IEEE MICRO"},{"key":"9078_CR5","unstructured":"Imran M (2006) Using COTS components in space applications. Master Thesis, University of TUDelft"},{"key":"9078_CR6","doi-asserted-by":"crossref","first-page":"95","DOI":"10.1109\/SBCCI.2002.1137643","volume-title":"International symposium on integrated circuits and systems design","author":"R Hentschke","year":"2002","unstructured":"Hentschke R, Marques R, Lima F, Carro L, Susin A, Reis R (2002) Analyzing area and performance penalty of protecting different digital modules with hamming code and triple modular redundancy. In: International symposium on integrated circuits and systems design, pp\u00a095\u2013100"},{"key":"9078_CR7","first-page":"2224","volume-title":"IEEE nuclear and space radiation effects conference","author":"R Reed","year":"1997","unstructured":"Reed R (1997) Heavy ion and proton induced single event multiple upsets. In: IEEE nuclear and space radiation effects conference, pp\u00a02224\u20132229"},{"key":"9078_CR8","first-page":"259","volume-title":"Proceeding of 39th annual IEEE international reliability phys symp","author":"N Seifert","year":"2001","unstructured":"Seifert N, Moyer D, Leland N, Hokinson R (2001) Historical trend in alpha-particle induced soft error rates of the alpha microprocessor. In: Proceeding of 39th annual IEEE international reliability phys symp, pp\u00a0259\u2013265"},{"key":"9078_CR9","volume-title":"International symposium on circuits and system","author":"C Argyrides","year":"2007","unstructured":"Argyrides C, Zarandi HR, Pradhan DK (2007) Multiple upsets tolerance in SRAM memory. In: International symposium on circuits and system, New Orleans, LA, May 2007"},{"key":"9078_CR10","doi-asserted-by":"crossref","unstructured":"Rubinoff M N-dimensional codes for detecting and correcting multiple errors. Comun ACM 545\u2013551","DOI":"10.1145\/366853.366878"},{"key":"9078_CR11","unstructured":"http:\/\/www.eccpage.com\/golay23.c"},{"key":"9078_CR12","volume-title":"Algebraic coding theory","author":"ER Berlekamp","year":"1968","unstructured":"Berlekamp ER (1968) Algebraic coding theory. McGraw-Hill, New York"},{"key":"9078_CR13","volume-title":"Signal processing systems","author":"TS Fill","year":"2002","unstructured":"Fill TS, Glenn Gulak P (2002) An assessment of VLSI and embedded software implementations for reed-Solomon decoders. In: Signal processing systems"},{"key":"9078_CR14","unstructured":"http:\/\/mathworld.wolfram.com\/GolayCode.html"},{"key":"9078_CR15","isbn-type":"print","volume-title":"Error control coding: fundamentals and applications","author":"S Lin","year":"1983","unstructured":"Lin S, Costello DJ Jr (1983) Error control coding: fundamentals and applications. Prentice-Hall, Englewood Cliffs. ISBN 0-13-283796-X","ISBN":"https:\/\/id.crossref.org\/isbn\/013283796X"},{"key":"9078_CR16","first-page":"480","volume-title":"International conference on information technology: coding and computing","author":"U Thirunavukkarasu","year":"2004","unstructured":"Thirunavukkarasu U, Babu Anne N, Latifi S (2004) Three and four-dimensional parity-check codes for correction and detection of multiple errors. In: International conference on information technology: coding and computing, p\u00a0480"},{"key":"9078_CR17","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1109\/24.914544","volume":"3","author":"PP Shirvani","year":"2000","unstructured":"Shirvani PP, Saxena NR, McCluskey EJ (2000) Software-implemented EDAC protection against SEUs. IEEE Trans Reliab 3:273\u2013284","journal-title":"IEEE Trans Reliab"},{"key":"9078_CR18","doi-asserted-by":"crossref","first-page":"647","DOI":"10.1109\/23.856493","volume":"47","author":"CI Underwood","year":"2000","unstructured":"Underwood CI, Oldfield MK (2000) Observations on the reliability of COTS-device-based solid state data recorders operating in low-earth orbit. IEEE Trans Nucl Sci 47:647\u2013653","journal-title":"IEEE Trans Nucl Sci"},{"key":"9078_CR19","isbn-type":"print","volume-title":"Fundamentals of information theory and coding design, discrete mathematics and its applications","author":"R Togneri","year":"2002","unstructured":"Togneri R, deSilva CJS (2002) Fundamentals of information theory and coding design, discrete mathematics and its applications. CRC Press, New York. ISBN 1-58488-310-3","ISBN":"https:\/\/id.crossref.org\/isbn\/1584883103"},{"key":"9078_CR20","author":"M Pflanz","year":"2004","unstructured":"Pflanz M, Walther K, Galke C, Vierhaus HT (2004) On-line techniques for error detection and correction in processor registers with cross-parity check. J Electron Test Appl doi: 10.1023\/A:1025165712071","journal-title":"J Electron Test Appl"},{"issue":"3","key":"9078_CR21","doi-asserted-by":"crossref","first-page":"116","DOI":"10.1145\/1555815.1555771","volume":"37","author":"D Hyun Yoon","year":"2009","unstructured":"Hyun Yoon D, Erez M (2009) Memory mapped ECC: low-cost error protection for last level caches. ACM SIGARCH Comput Archit News 37(3):116\u2013127","journal-title":"ACM SIGARCH Comput Archit News"},{"key":"9078_CR22","unstructured":"http:\/\/www.synopsys.com\/home.aspx"}],"container-title":["Design Automation for Embedded Systems"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10617-011-9078-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10617-011-9078-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10617-011-9078-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,10]],"date-time":"2019-06-10T20:00:50Z","timestamp":1560196850000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10617-011-9078-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5,15]]},"references-count":22,"journal-issue":{"issue":"3-4","published-print":{"date-parts":[[2011,12]]}},"alternative-id":["9078"],"URL":"https:\/\/doi.org\/10.1007\/s10617-011-9078-2","relation":{},"ISSN":["0929-5585","1572-8080"],"issn-type":[{"type":"print","value":"0929-5585"},{"type":"electronic","value":"1572-8080"}],"subject":[],"published":{"date-parts":[[2011,5,15]]}}}