{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,18]],"date-time":"2026-07-18T05:08:43Z","timestamp":1784351323344,"version":"3.55.0"},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2008,8,21]],"date-time":"2008-08-21T00:00:00Z","timestamp":1219276800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Empir Software Eng"],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1007\/s10664-008-9083-7","type":"journal-article","created":{"date-parts":[[2008,8,20]],"date-time":"2008-08-20T12:07:33Z","timestamp":1219234053000},"page":"341-369","source":"Crossref","is-referenced-by-count":51,"title":["On guiding the augmentation of an automated test suite via mutation analysis"],"prefix":"10.1007","volume":"14","author":[{"given":"Ben H.","family":"Smith","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Laurie","family":"Williams","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2008,8,21]]},"reference":[{"key":"9083_CR1","doi-asserted-by":"crossref","unstructured":"Alexander RT, Bieman JM, Ghosh S, Bixia J (2002) Mutation of Java objects. 13th International Symposium on Software Reliability Engineering, Fort Collins, CO USA, pp 341\u2013351","DOI":"10.1109\/ISSRE.2002.1173285"},{"key":"9083_CR2","unstructured":"Andrews JH, Briand LC, Labiche Y (2005) Is mutation an appropriate tool for testing experiments? 27th International Conference on Software Engineering, St. Louis, MO, USA, pp 402\u2013411"},{"issue":"8","key":"9083_CR3","first-page":"608","volume":"32","author":"JH Andrews","year":"2006","unstructured":"Andrews JH, Briand LC, Labiche Y, Namin AS (2006) Using mutation analysis for assessing and comparing testing coverage criteria. Software Engineering. IEEE Trans 32(8):608\u2013624","journal-title":"IEEE Trans"},{"issue":"4","key":"9083_CR4","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1109\/C-M.1978.218136","volume":"11","author":"RA DeMillo","year":"1978","unstructured":"DeMillo RA, Lipton RJ, Sayward FG (1978) Hints on test data selection: help for the practicing programmer. Computer 11(4):34\u201341. doi: 10.1109\/C-M.1978.218136","journal-title":"Computer"},{"key":"9083_CR5","doi-asserted-by":"crossref","unstructured":"DeMillo RA, Guindi DS, McCracken WM, Offutt AJ, King KN (1988) An extended overview of the Mothra software testing environment. Proceedings of the Second Workshop on Software Testing, Verification, and Analysis, Banff, Alta., Canada, pp 142\u2013151","DOI":"10.1109\/WST.1988.5369"},{"issue":"3","key":"9083_CR6","doi-asserted-by":"crossref","first-page":"235","DOI":"10.1016\/S0164-1212(96)00154-9","volume":"38","author":"PG Frankl","year":"1997","unstructured":"Frankl PG, Weiss SN, Hu C (1997) All uses vs mutation testing: an experimental comparison of effectiveness. J Syst Softw 38(3):235\u2013253. doi: 10.1016\/S0164-1212(96)00154-9","journal-title":"J Syst Softw"},{"key":"9083_CR7","volume-title":"Design patterns: elements of reusable object-oriented software","author":"E Gamma","year":"1995","unstructured":"Gamma E, Helm R, Johnson R, Vlissides J (1995) Design patterns: elements of reusable object-oriented software. Addison-Wesley Longman, Boston, MA, USA"},{"issue":"4","key":"9083_CR8","doi-asserted-by":"crossref","first-page":"233","DOI":"10.1002\/(SICI)1099-1689(199912)9:4<233::AID-STVR191>3.0.CO;2-3","volume":"9","author":"RM Hierons","year":"1999","unstructured":"Hierons RM, Harman M, Danicic S (1999) Using program slicing to assist in the detection of equivalent mutants. Softw Test Verif Reliab 9(4):233\u2013262","journal-title":"Softw Test Verif Reliab"},{"issue":"12","key":"9083_CR9","doi-asserted-by":"crossref","first-page":"92","DOI":"10.1145\/1052883.1052895","volume":"39","author":"D Hovemeyer","year":"2004","unstructured":"Hovemeyer D, Pugh W (2004) Finding bugs is easy. ACM SIGPLAN Not 39(12):92\u2013106","journal-title":"ACM SIGPLAN Not"},{"key":"9083_CR10","unstructured":"IEEE (1990) IEEE Standard 610.12\u20131990, IEEE Standard Glossary of Software Engineering Terminology"},{"key":"9083_CR11","unstructured":"Irvine SA, Pavlinic T, Trigg L, Cleary JG, Inglis S, Utting M (2007) Jumble Java byte code to measure the effectiveness of unit tests. Testing: Academic and Industrial Conference Practice and Research Techniques-MUTATION, 2007. TAICPART-MUTATION 2007, pp 169\u2013175"},{"key":"9083_CR12","unstructured":"Kaner C (1996) Software negligence and testing coverage. Proceedings of STAR, Orlando, FL, pp 1\u201313"},{"key":"9083_CR13","unstructured":"Krishnamurthy S, Mathur A (1996) On predicting reliability of modules using code coverage. Proceedings of the 1996 conference of the Centre for Advanced Studies on Collaborative research, Toronto, Ontario, Canada, pp 1\u201312"},{"key":"9083_CR14","unstructured":"Ma YS, Offut J (2005a) Description of class mutation operators for Java, http:\/\/ise.gmu.edu\/~ofut\/mujava\/mutopsClass.pdf , accessed 4\/19\/2007"},{"key":"9083_CR15","unstructured":"Ma YS, Offut J (2005b) Description of method-level mutation operators for Java, http:\/\/ise.gmu.edu\/~ofut\/mujava\/mutopsMethod.pdf , accessed 4\/19\/2007"},{"key":"9083_CR16","doi-asserted-by":"crossref","unstructured":"Ma YS, Harrold MJ, Kwon YR (2006) Evaluation of mutation testing for object-oriented programs. 28th International Conference on Software Engineering, Shanghai, China, pp 869\u2013872","DOI":"10.1145\/1134285.1134437"},{"key":"9083_CR17","doi-asserted-by":"crossref","unstructured":"Murnane T, Reed K, Assoc T, Carlton V (2001) On the effectiveness of mutation analysis as a black box testing technique. Software Engineering Conference, Canberra, ACT, Australia, pp 12\u201320","DOI":"10.1109\/ASWEC.2001.948492"},{"key":"9083_CR18","doi-asserted-by":"crossref","unstructured":"Namin AS, Andrews JH (2006) Finding sufficient mutation operators via variable reduction. Mutation Analysis, 2006. Second Workshop on, pp 5\u20135","DOI":"10.1109\/MUTATION.2006.7"},{"issue":"2","key":"9083_CR19","doi-asserted-by":"crossref","first-page":"99","DOI":"10.1145\/227607.227610","volume":"5","author":"J Offutt","year":"1996","unstructured":"Offutt J, Lee A, Rothermel G, Untch RH, Zapf C (1996a) An experimental determination of sufficient mutant operators. ACM Trans Softw Eng Methodol 5(2):99\u2013118","journal-title":"ACM Trans Softw Eng Methodol"},{"issue":"2","key":"9083_CR20","doi-asserted-by":"crossref","first-page":"165","DOI":"10.1002\/(SICI)1097-024X(199602)26:2<165::AID-SPE5>3.0.CO;2-K","volume":"26","author":"J Offutt","year":"1996","unstructured":"Offutt J, Pan J, Tewary K, Zhang T (1996b) An experimental evaluation of data flow and mutation testing. Softw Pract Exp 26(2):165\u2013176","journal-title":"Softw Pract Exp"},{"issue":"5)","key":"9083_CR21","first-page":"1","volume":"29","author":"J Offutt","year":"2004","unstructured":"Offutt J, Ma YS, Kwon YR (2004) An experimental mutation system for Java. ACM SIGSOFT Softw Eng Notes 29(5):1\u20134","journal-title":"ACM SIGSOFT Softw Eng Notes"},{"key":"9083_CR22","doi-asserted-by":"crossref","unstructured":"Offutt J, Ma YS, Kwon YR (2006) The class-level mutants of MuJava. International Workshop on Automation of Software Testing, Shanghai, China, pp 78\u201384","DOI":"10.1145\/1138929.1138945"},{"key":"9083_CR23","doi-asserted-by":"crossref","unstructured":"Smith BH, Williams L (2007) An empirical evaluation of the MuJava mutation operators. Testing: Academic and Industrial Conference Practice and Research Techniques-MUTATION, 2007, Windsor, UK, pp 193\u2013202","DOI":"10.1109\/TAIC.PART.2007.12"},{"key":"9083_CR24","doi-asserted-by":"crossref","unstructured":"Voas J, Miller KW (1995) Using fault-injection to assess software engineering standards. Second IEEE International Software Engineering Standards Symposium \u2018Experience and Practice\u2019, Montreal, Que., Canada, pp 318\u2013336","DOI":"10.1109\/SESS.1995.525959"},{"issue":"4","key":"9083_CR25","doi-asserted-by":"crossref","first-page":"366","DOI":"10.1145\/267580.267590","volume":"29","author":"H Zhu","year":"1997","unstructured":"Zhu H, Hall PAV, May JHR (1997) Software unit test coverage and adequacy. ACM Comput Surv 29(4):366\u2013427","journal-title":"ACM Comput Surv"}],"container-title":["Empirical Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-008-9083-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10664-008-9083-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-008-9083-7","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:15:09Z","timestamp":1559250909000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10664-008-9083-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,8,21]]},"references-count":25,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2009,6]]}},"alternative-id":["9083"],"URL":"https:\/\/doi.org\/10.1007\/s10664-008-9083-7","relation":{},"ISSN":["1382-3256","1573-7616"],"issn-type":[{"value":"1382-3256","type":"print"},{"value":"1573-7616","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,8,21]]}}}