{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T16:30:41Z","timestamp":1783096241775,"version":"3.54.6"},"reference-count":138,"publisher":"Springer Science and Business Media LLC","issue":"2","license":[{"start":{"date-parts":[[2024,2,24]],"date-time":"2024-02-24T00:00:00Z","timestamp":1708732800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"},{"start":{"date-parts":[[2024,2,24]],"date-time":"2024-02-24T00:00:00Z","timestamp":1708732800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.springernature.com\/gp\/researchers\/text-and-data-mining"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1908762"],"award-info":[{"award-number":["1908762"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Empir Software Eng"],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1007\/s10664-023-10418-4","type":"journal-article","created":{"date-parts":[[2024,2,24]],"date-time":"2024-02-24T09:02:01Z","timestamp":1708765321000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":13,"title":["When less is more: on the value of \u201cco-training\u201d for semi-supervised software defect predictors"],"prefix":"10.1007","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5673-1142","authenticated-orcid":false,"given":"Suvodeep","family":"Majumder","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Joymallya","family":"Chakraborty","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tim","family":"Menzies","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2024,2,24]]},"reference":[{"key":"10418_CR1","doi-asserted-by":"publisher","first-page":"28","DOI":"10.1016\/j.knosys.2014.10.017","volume":"74","author":"G Abaei","year":"2015","unstructured":"Abaei G, Selamat A, Fujita H (2015) An empirical study based on semi-supervised hybrid self-organizing map for software fault prediction. Knowl-Based Syst 74:28\u201339","journal-title":"Knowl-Based Syst"},{"key":"10418_CR2","doi-asserted-by":"crossref","unstructured":"Abney S (2002) Bootstrapping. In: Proceedings of the 40th annual meeting on association for computational linguistics. Association for Computational Linguistics, Philadelphia, pp 360\u2013367","DOI":"10.3115\/1073083.1073143"},{"key":"10418_CR3","doi-asserted-by":"crossref","unstructured":"Agrawal A, Menzies T (2017) \u201cbetter data\u201d is better than \u201cbetter data miners\u201d (benefits of tuning SMOTE for defect prediction). CoRR abs\/1705.03697","DOI":"10.1145\/3180155.3180197"},{"key":"10418_CR4","doi-asserted-by":"crossref","unstructured":"Arcuri A, Briand L (2011) A practical guide for using statistical tests to assess randomized algorithms in software engineering. In: 2011 33rd international conference on software engineering (ICSE). IEEE, pp 1\u201310","DOI":"10.1145\/1985793.1985795"},{"issue":"5","key":"10418_CR5","doi-asserted-by":"publisher","first-page":"349","DOI":"10.1002\/wics.1270","volume":"5","author":"E Bair","year":"2013","unstructured":"Bair E (2013) Semi-supervised clustering methods. Wiley Interdiscip Rev Comput Stat 5(5):349\u2013361","journal-title":"Wiley Interdiscip Rev Comput Stat"},{"key":"10418_CR6","first-page":"2","volume":"17","author":"MF Balcan","year":"2004","unstructured":"Balcan MF, Blum A, Yang K (2004) Co-training and expansion: Towards bridging theory and practice. Adv Neural Inf Process Syst 17:2\u20135","journal-title":"Adv Neural Inf Process Syst"},{"issue":"2","key":"10418_CR7","doi-asserted-by":"publisher","first-page":"50","DOI":"10.46792\/fuoyejet.v3i2.200","volume":"3","author":"AO Balogun","year":"2018","unstructured":"Balogun AO, Bajeh AO, Orie VA, Asaju WAY (2018) Software defect prediction using ensemble learning: an anp based evaluation method. FUOYE J Eng Technol 3(2):50\u201355","journal-title":"FUOYE J Eng Technol"},{"issue":"3","key":"10418_CR8","doi-asserted-by":"publisher","first-page":"478","DOI":"10.1007\/s10664-011-9178-4","volume":"18","author":"RM Bell","year":"2013","unstructured":"Bell RM, Ostrand TJ, Weyuker EJ (2013) The limited impact of individual developer data on software defect prediction. Empir Softw Eng 18(3):478\u2013505","journal-title":"Empir Softw Eng"},{"key":"10418_CR9","doi-asserted-by":"crossref","unstructured":"Bennett KP, Demiriz A, Maclin R (2002) Exploiting unlabeled data in ensemble methods. In: Proceedings of the eighth ACM SIGKDD international conference on knowledge discovery and data mining. Association for Computing Machinery, New York, pp 289\u2013296","DOI":"10.1145\/775047.775090"},{"key":"10418_CR10","doi-asserted-by":"crossref","unstructured":"Bennin KE, Toda K, Kamei Y et\u00a0al (2016) Empirical evaluation of cross-release effort-aware defect prediction models. In: 2016 IEEE International conference on software quality, reliability and security (QRS). IEEE, pp 214\u2013221","DOI":"10.1109\/QRS.2016.33"},{"key":"10418_CR11","doi-asserted-by":"crossref","unstructured":"Bird C, Nagappan N, Gall H, et\u00a0al (2009) Putting it all together: using socio-technical networks to predict failures. In: Proceedings of the 20th IEEE International conference on software reliability engineering (ISSRE\u201909). IEEE Press, Bengaluru-Mysuru, pp 109\u2013119","DOI":"10.1109\/ISSRE.2009.17"},{"key":"10418_CR12","doi-asserted-by":"crossref","unstructured":"Blum A, Mitchell T (1998) Combining labeled and unlabeled data with co-training. In: Proceedings of the eleventh annual conference on Computational learning theory. Association for Computing Machinery, New York, pp 92\u2013100","DOI":"10.1145\/279943.279962"},{"issue":"11","key":"10418_CR13","doi-asserted-by":"publisher","first-page":"1028","DOI":"10.1109\/32.256851","volume":"19","author":"LC Briand","year":"1993","unstructured":"Briand LC, Brasili V, Hetmanski CJ (1993) Developing interpretable models with optimized set reduction for identifying high-risk software components. IEEE Trans Softw Eng 19(11):1028\u20131044","journal-title":"IEEE Trans Softw Eng"},{"issue":"4","key":"10418_CR14","doi-asserted-by":"publisher","first-page":"282","DOI":"10.1504\/IJBIC.2018.092808","volume":"11","author":"Y Cao","year":"2018","unstructured":"Cao Y, Ding Z, Xue F et al (2018) An improved twin support vector machine based on multi-objective cuckoo search for software defect prediction. Int J Bio-Inspired Comput 11(4):282\u2013291","journal-title":"Int J Bio-Inspired Comput"},{"key":"10418_CR15","doi-asserted-by":"crossref","unstructured":"Catolino G (2017a) Just-in-time bug prediction in mobile applications: the domain matters! In: 2017 IEEE\/ACM 4th international conference on mobile software engineering and systems (MOBILESoft). IEEE, pp 201\u2013202","DOI":"10.1109\/MOBILESoft.2017.58"},{"key":"10418_CR16","doi-asserted-by":"publisher","unstructured":"Catolino G (2017b) Just-in-time bug prediction in mobile applications: the domain matters! In: 2017 IEEE\/ACM 4th international conference on mobile software engineering and systems (MOBILESoft). pp 201\u2013202. https:\/\/doi.org\/10.1109\/MOBILESoft.2017.58","DOI":"10.1109\/MOBILESoft.2017.58"},{"key":"10418_CR17","doi-asserted-by":"crossref","unstructured":"Chapelle O, Zien A (2005) Semi-supervised classification by low density separation. In: International workshop on artificial intelligence and statistics. PMLR, pp 57\u201364","DOI":"10.7551\/mitpress\/9780262033589.001.0001"},{"key":"10418_CR18","doi-asserted-by":"publisher","first-page":"321","DOI":"10.1613\/jair.953","volume":"16","author":"NV Chawla","year":"2002","unstructured":"Chawla NV, Bowyer KW, Hall LO et al (2002) Smote: synthetic minority over-sampling technique. J Artif Intell Res 16:321\u2013357","journal-title":"J Artif Intell Res"},{"key":"10418_CR19","doi-asserted-by":"crossref","unstructured":"Chen D, Stolee KT, Menzies T (2019) Replication can improve prior results: a github study of pull request acceptance. In: 2019 IEEE\/ACM 27th international conference on program comprehension (ICPC). IEEE, pp 179\u2013190","DOI":"10.1109\/ICPC.2019.00037"},{"key":"10418_CR20","doi-asserted-by":"crossref","unstructured":"Cox MA, Cox TF (2008) Multidimensional scaling. In: Handbook of data visualization. Springer, pp 315\u2013347","DOI":"10.1007\/978-3-540-33037-0_14"},{"key":"10418_CR21","unstructured":"Demiriz A, Bennett KP, Embrechts MJ (1999) Semi-supervised clustering using genetic algorithms. Artif Neural Netw Eng (ANNIE-99) 809\u2013814"},{"issue":"5","key":"10418_CR22","doi-asserted-by":"publisher","first-page":"788","DOI":"10.1109\/TKDE.2010.158","volume":"23","author":"J Du","year":"2010","unstructured":"Du J, Ling CX, Zhou ZH (2010) When does cotraining work in real data? IEEE Trans Knowl Data Eng 23(5):788\u2013799","journal-title":"IEEE Trans Knowl Data Eng"},{"key":"10418_CR23","unstructured":"Gayatri N, Nickolas S, Reddy A et\u00a0al (2010) Feature selection using decision tree induction in class level metrics dataset for software defect predictions. In: Proceedings of the world congress on engineering and computer science. pp 124\u2013129"},{"key":"10418_CR24","doi-asserted-by":"publisher","unstructured":"Ghotra B, McIntosh S, Hassan AE (2015a) Revisiting the impact of classification techniques on the performance of defect prediction models. In: 2015 IEEE\/ACM 37th IEEE international conference on software engineering. pp 789\u2013800. https:\/\/doi.org\/10.1109\/ICSE.2015.91","DOI":"10.1109\/ICSE.2015.91"},{"key":"10418_CR25","doi-asserted-by":"crossref","unstructured":"Ghotra B, McIntosh S, Hassan AE (2015b) Revisiting the impact of classification techniques on the performance of defect prediction models. In: 37th ICSE-vol 1. IEEE Press, pp 789\u2013800","DOI":"10.1109\/ICSE.2015.91"},{"key":"10418_CR26","doi-asserted-by":"crossref","unstructured":"Ghotra B, McIntosh S, Hassan AE (2017) A large-scale study of the impact of feature selection techniques on defect classification models. In: 2017 IEEE\/ACM 14th international conference on mining software repositories (MSR). IEEE, pp 146\u2013157","DOI":"10.1109\/MSR.2017.18"},{"key":"10418_CR27","unstructured":"Goldberg A, Zhu X, Singh A, et\u00a0al (2009) Multi-manifold semi-supervised learning. In: Artificial intelligence and statistics. PMLR, pp 169\u2013176"},{"key":"10418_CR28","unstructured":"Goldman S, Zhou Y (2000) Enhancing supervised learning with unlabeled data. In: ICML. Citeseer, pp 327\u2013334"},{"key":"10418_CR29","doi-asserted-by":"crossref","unstructured":"Gong L, Jiang S, Wang R et\u00a0al (2019) Empirical evaluation of the impact of class overlap on software defect prediction. In: 2019 34th IEEE\/ACM International conference on automated software engineering (ASE). IEEE, pp 698\u2013709","DOI":"10.1109\/ASE.2019.00071"},{"issue":"3","key":"10418_CR30","doi-asserted-by":"publisher","first-page":"2023","DOI":"10.1007\/s10462-021-10044-w","volume":"55","author":"S Goyal","year":"2022","unstructured":"Goyal S (2022) Handling class-imbalance with knn (neighbourhood) under-sampling for software defect prediction. Artif Intell Rev 55(3):2023\u20132064","journal-title":"Artif Intell Rev"},{"issue":"4","key":"10418_CR31","doi-asserted-by":"publisher","first-page":"484","DOI":"10.1109\/TSE.2009.3","volume":"35","author":"M Hamill","year":"2009","unstructured":"Hamill M, Goseva-Popstojanova K (2009) Common trends in software fault and failure data. IEEE Trans Softw Eng 35(4):484\u2013496","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR32","doi-asserted-by":"crossref","unstructured":"He Q, Shen B, Chen Y (2016) Software defect prediction using semi-supervised learning with change burst information. In: 2016 IEEE 40th annual computer software and applications conference (COMPSAC). IEEE, pp 113\u2013122","DOI":"10.1109\/COMPSAC.2016.193"},{"issue":"2","key":"10418_CR33","doi-asserted-by":"publisher","first-page":"167","DOI":"10.1007\/s10515-011-0090-3","volume":"19","author":"Z He","year":"2012","unstructured":"He Z, Shu F, Yang Y et al (2012) An investigation on the feasibility of cross-project defect prediction. Autom Softw Eng 19(2):167\u2013199","journal-title":"Autom Softw Eng"},{"key":"10418_CR34","doi-asserted-by":"crossref","unstructured":"Hindle A, German DM, Holt R (2008) What do large commits tell us? a taxonomical study of large commits. In: Proceedings of the 2008 international working conference on mining software repositories. Association for Computing Machinery, New York, pp 99\u2013108","DOI":"10.1145\/1370750.1370773"},{"key":"10418_CR35","doi-asserted-by":"crossref","unstructured":"Hindle A, Barr ET, Su Z et\u00a0al (2012) On the naturalness of software. In: 2012 34th ICSE (ICSE). IEEE, pp 837\u2013847","DOI":"10.1109\/ICSE.2012.6227135"},{"key":"10418_CR36","doi-asserted-by":"publisher","first-page":"296","DOI":"10.1016\/j.infsof.2017.06.004","volume":"95","author":"S Hosseini","year":"2018","unstructured":"Hosseini S, Turhan B, M\u00e4ntyl\u00e4 M (2018) A benchmark study on the effectiveness of search-based data selection and feature selection for cross project defect prediction. Inf Softw Technol 95:296\u2013312","journal-title":"Inf Softw Technol"},{"key":"10418_CR37","doi-asserted-by":"publisher","unstructured":"Huang Q, Xia X, Lo D (2017) Supervised vs unsupervised models: a holistic look at effort-aware just-in-time defect prediction. In: 2017 IEEE international conference on software maintenance and evolution (ICSME). pp 159\u2013170. https:\/\/doi.org\/10.1109\/ICSME.2017.51","DOI":"10.1109\/ICSME.2017.51"},{"issue":"3","key":"10418_CR38","doi-asserted-by":"publisher","first-page":"545","DOI":"10.1007\/s10115-015-0861-4","volume":"47","author":"SF Hussain","year":"2016","unstructured":"Hussain SF, Bashir S (2016) Co-clustering of multi-view datasets. Knowl Inf Syst 47(3):545\u2013570","journal-title":"Knowl Inf Syst"},{"key":"10418_CR39","doi-asserted-by":"crossref","unstructured":"Ibrahim DR, Ghnemat R, Hudaib A (2017) Software defect prediction using feature selection and random forest algorithm. In: 2017 International conference on new trends in computing sciences (ICTCS). IEEE, pp 252\u2013257","DOI":"10.1109\/ICTCS.2017.39"},{"key":"10418_CR40","doi-asserted-by":"crossref","unstructured":"Iglesias EL, Vieira AS, Diz LB (2016) An hmm-based multi-view co-training framework for single-view text corpora. In: Hybrid artificial intelligent systems: 11th international conference, HAIS 2016, Seville, Spain, April 18-20, 2016, Proceedings 11. Springer, pp 66\u201378","DOI":"10.1007\/978-3-319-32034-2_6"},{"issue":"5","key":"10418_CR41","first-page":"301","volume":"10","author":"A Iqbal","year":"2019","unstructured":"Iqbal A, Aftab S, Ali U et al (2019) Performance analysis of machine learning techniques on software defect prediction using nasa datasets. Int J Adv Comput Sci Appl 10(5):301\u2013307","journal-title":"Int J Adv Comput Sci Appl"},{"issue":"23","key":"10418_CR42","first-page":"19","volume":"117","author":"SG Jacob","year":"2015","unstructured":"Jacob SG et al (2015) Improved random forest algorithm for software defect prediction through data mining techniques. Int J Comput Appl 117(23):19\u201321","journal-title":"Int J Comput Appl"},{"key":"10418_CR43","doi-asserted-by":"crossref","unstructured":"Jebara T, Wang J, Chang SF (2009) Graph construction and b-matching for semi-supervised learning. In: Proceedings of the 26th annual international conference on machine learning. Association for Computing Machinery, New York, pp 3\u201318","DOI":"10.1145\/1553374.1553432"},{"key":"10418_CR44","doi-asserted-by":"publisher","unstructured":"Kalliamvakou E, Gousios G, Blincoe K et al (2014) The promises and perils of mining github. MSR 2014. ACM. https:\/\/doi.org\/10.1145\/2597073.2597074","DOI":"10.1145\/2597073.2597074"},{"issue":"6","key":"10418_CR45","doi-asserted-by":"publisher","first-page":"757","DOI":"10.1109\/TSE.2012.70","volume":"39","author":"Y Kamei","year":"2012","unstructured":"Kamei Y, Shihab E, Adams B et al (2012) A large-scale empirical study of just-in-time quality assurance. IEEE Trans Softw Eng 39(6):757\u2013773","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR46","doi-asserted-by":"publisher","unstructured":"Kang HJ, Aw KL, Lo D (2022) Detecting false alarms from automatic static analysis tools: How far are we? In: Proceedings of the 44th international conference on software engineering (ICSE\u201922). Association for Computing Machinery, New York, pp 698\u2013709. https:\/\/doi.org\/10.1145\/3510003.3510214","DOI":"10.1145\/3510003.3510214"},{"key":"10418_CR47","doi-asserted-by":"crossref","unstructured":"Kim M, Cai D, Kim S (2011) An empirical investigation into the role of api-level refactorings during software evolution. In: Proceedings of the 33rd ICSE. ACM, pp 151\u2013160","DOI":"10.1145\/1985793.1985815"},{"key":"10418_CR48","doi-asserted-by":"crossref","unstructured":"Kim M, Nam J, Yeon J, et\u00a0al (2015) Remi: defect prediction for efficient api testing. In: Proceedings of the 2015 10th joint meeting on foundations of software engineering. Association for Computing Machinery, New York, pp 990\u2013993","DOI":"10.1145\/2786805.2804429"},{"issue":"2","key":"10418_CR49","doi-asserted-by":"publisher","first-page":"181","DOI":"10.1109\/TSE.2007.70773","volume":"34","author":"S Kim","year":"2008","unstructured":"Kim S, Whitehead EJ Jr, Zhang Y (2008) Classifying software changes: clean or buggy? IEEE Trans Softw Eng 34(2):181\u2013196","journal-title":"IEEE Trans Softw Eng"},{"issue":"6","key":"10418_CR50","doi-asserted-by":"publisher","first-page":"23","DOI":"10.1109\/MS.2005.149","volume":"22","author":"AG Koru","year":"2005","unstructured":"Koru AG, Liu H (2005) Building effective defect-prediction models in practice. IEEE Softw 22(6):23\u201329","journal-title":"IEEE Softw"},{"issue":"2","key":"10418_CR51","doi-asserted-by":"publisher","first-page":"293","DOI":"10.1109\/TSE.2008.90","volume":"35","author":"AG Koru","year":"2008","unstructured":"Koru AG, Zhang D, El Emam K, Liu H (2008) An investigation into the functional form of the size-defect relationship for software modules. IEEE Trans Softw Eng 35(2):293\u2013304","journal-title":"IEEE Trans Softw Eng"},{"issue":"2","key":"10418_CR52","doi-asserted-by":"publisher","first-page":"578","DOI":"10.1109\/TNN.2006.889495","volume":"18","author":"D Lee","year":"2007","unstructured":"Lee D, Lee J (2007) Equilibrium-based support vector machine for semisupervised classification. IEEE Trans Neural Netw 18(2):578\u2013583","journal-title":"IEEE Trans Neural Netw"},{"issue":"6","key":"10418_CR53","doi-asserted-by":"publisher","first-page":"1088","DOI":"10.1109\/TSMCA.2007.904745","volume":"37","author":"M Li","year":"2007","unstructured":"Li M, Zhou ZH (2007) Improve computer-aided diagnosis with machine learning techniques using undiagnosed samples. IEEE Trans Syst Man Cybern A Syst Hum 37(6):1088\u20131098","journal-title":"IEEE Trans Syst Man Cybern A Syst Hum"},{"issue":"2","key":"10418_CR54","doi-asserted-by":"publisher","first-page":"201","DOI":"10.1007\/s10515-011-0092-1","volume":"19","author":"M Li","year":"2012","unstructured":"Li M, Zhang H, Wu R et al (2012) Sample-based software defect prediction with active and semi-supervised learning. Autom Softw Eng 19(2):201\u2013230","journal-title":"Autom Softw Eng"},{"key":"10418_CR55","doi-asserted-by":"publisher","first-page":"106364","DOI":"10.1016\/j.infsof.2020.106364","volume":"126","author":"W Li","year":"2020","unstructured":"Li W, Zhang W, Jia X et al (2020) Effort-aware semi-supervised just-in-time defect prediction. Inf Softw Technol 126:106364","journal-title":"Inf Softw Technol"},{"issue":"1","key":"10418_CR56","first-page":"175","volume":"37","author":"YF Li","year":"2014","unstructured":"Li YF, Zhou ZH (2014) Towards making unlabeled data never hurt. IEEE Trans Pattern Anal Mach Intell 37(1):175\u2013188","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"10418_CR57","doi-asserted-by":"publisher","unstructured":"Lin Z, Whitehead J (2015) Why power laws? an explanation from fine-grained code changes. In: 2015 IEEE\/ACM 12th Working Conference on Mining Software Repositories. pp 68\u201375. https:\/\/doi.org\/10.1109\/MSR.2015.14","DOI":"10.1109\/MSR.2015.14"},{"key":"10418_CR58","doi-asserted-by":"crossref","unstructured":"Liu S, Li F, Li F et\u00a0al (2013) Adaptive co-training svm for sentiment classification on tweets. In: Proceedings of the 22nd ACM international conference on information & knowledge management. Association for Computing Machinery, New York, pp 2079\u20132088","DOI":"10.1145\/2505515.2505569"},{"key":"10418_CR59","doi-asserted-by":"crossref","unstructured":"Lu H, Cukic B, Culp M (2012) Software defect prediction using semi-supervised learning with dimension reduction. In: 2012 proceedings of the 27th IEEE\/ACM international conference on automated software engineering. IEEE, pp 314\u2013317","DOI":"10.1145\/2351676.2351734"},{"key":"10418_CR60","doi-asserted-by":"crossref","unstructured":"Mabayoje MA, Balogun AO, Jibril HA et\u00a0al (2019) Parameter tuning in knn for software defect prediction: an empirical analysis","DOI":"10.14710\/jtsiskom.7.4.2019.121-126"},{"issue":"3","key":"10418_CR61","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1007\/s10664-021-10068-4","volume":"27","author":"S Majumder","year":"2022","unstructured":"Majumder S, Mody P, Menzies T (2022) Revisiting process versus product metrics: a large scale analysis. Empir Softw Eng 27(3):1\u201342","journal-title":"Empir Softw Eng"},{"issue":"11","key":"10418_CR62","doi-asserted-by":"publisher","first-page":"2000","DOI":"10.1109\/TPAMI.2008.235","volume":"31","author":"PK Mallapragada","year":"2008","unstructured":"Mallapragada PK, Jin R, Jain AK et al (2008) Semiboost: boosting for semi-supervised learning. IEEE Trans Pattern Anal Mach Intell 31(11):2000\u20132014","journal-title":"IEEE Trans Pattern Anal Mach Intell"},{"key":"10418_CR63","doi-asserted-by":"crossref","unstructured":"Matsumoto S, Kamei Y, Monden A, et\u00a0al (2010) An analysis of developer metrics for fault prediction. In: Proceedings of the 6th international conference on predictive models in software engineering. Association for Computing Machinery, New York","DOI":"10.1145\/1868328.1868356"},{"issue":"4","key":"10418_CR64","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1007\/s10515-010-0069-5","volume":"17","author":"T Menzies","year":"2010","unstructured":"Menzies T, Milton Z, Turhan B, Cukic B, Jiang Y, Bener A (2010) Defect prediction from static code features: current results, limitations, new approaches. Autom Softw Eng 17(4):375\u2013407","journal-title":"Autom Softw Eng"},{"issue":"2","key":"10418_CR65","first-page":"57","volume":"32","author":"AT Misirli","year":"2011","unstructured":"Misirli AT, Bener A, Kale R (2011) Ai-based software defect predictors: applications and benefits in a case study. AI Mag 32(2):57\u201368","journal-title":"AI Mag"},{"issue":"4","key":"10418_CR66","doi-asserted-by":"publisher","first-page":"537","DOI":"10.1109\/TSE.2012.45","volume":"39","author":"N Mittas","year":"2013","unstructured":"Mittas N, Angelis L (2013) Ranking and clustering software cost estimation models through a multiple comparisons algorithm. IEEE Trans Softw Eng 39(4):537\u2013551","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR67","doi-asserted-by":"publisher","unstructured":"Mockus A, Votta LG (2000) Identifying reasons for software changes using historic databases. In: Proceedings 2000 international conference on software maintenance. pp 120\u2013130. https:\/\/doi.org\/10.1109\/ICSM.2000.883028","DOI":"10.1109\/ICSM.2000.883028"},{"issue":"6","key":"10418_CR68","doi-asserted-by":"publisher","first-page":"3219","DOI":"10.1007\/s10664-017-9512-6","volume":"22","author":"N Munaiah","year":"2017","unstructured":"Munaiah N, Kroh S, Cabrey C et al (2017) Curating github for engineered software projects. Empir Softw Eng 22(6):3219\u20133253. https:\/\/doi.org\/10.1007\/s10664-017-9512-6","journal-title":"Empir Softw Eng"},{"key":"10418_CR69","doi-asserted-by":"crossref","unstructured":"Nagappan N, Zeller A, Zimmermann T, et\u00a0al (2010) Change bursts as defect predictors. In: 2010 IEEE 21st international symposium on software reliability engineering. IEEE, pp 309\u2013318","DOI":"10.1109\/ISSRE.2010.25"},{"key":"10418_CR70","doi-asserted-by":"crossref","unstructured":"Nam J, Pan SJ, Kim S (2013) Transfer defect learning. In: 2013 35th international conference on software engineering (ICSE). IEEE, pp 382\u2013391","DOI":"10.1109\/ICSE.2013.6606584"},{"issue":"9","key":"10418_CR71","doi-asserted-by":"publisher","first-page":"874","DOI":"10.1109\/TSE.2017.2720603","volume":"44","author":"J Nam","year":"2018","unstructured":"Nam J, Fu W, Kim S et al (2018) Heterogeneous defect prediction. IEEE Trans Softw Eng 44(9):874\u2013896","journal-title":"IEEE Trans Softw Eng"},{"issue":"1","key":"10418_CR72","doi-asserted-by":"publisher","first-page":"154","DOI":"10.1007\/s10664-012-9218-8","volume":"19","author":"A Okutan","year":"2014","unstructured":"Okutan A, Y\u0131ld\u0131z OT (2014) Software defect prediction using bayesian networks. Empir Softw Eng 19(1):154\u2013181","journal-title":"Empir Softw Eng"},{"issue":"4","key":"10418_CR73","doi-asserted-by":"publisher","first-page":"86","DOI":"10.1145\/1013886.1007524","volume":"29","author":"TJ Ostrand","year":"2004","unstructured":"Ostrand TJ, Weyuker EJ, Bell RM (2004) Where the bugs are. ACM SIGSOFT Softw Eng Notes 29(4):86\u201396","journal-title":"ACM SIGSOFT Softw Eng Notes"},{"issue":"2","key":"10418_CR74","doi-asserted-by":"publisher","first-page":"199","DOI":"10.1109\/TNN.2010.2091281","volume":"22","author":"SJ Pan","year":"2010","unstructured":"Pan SJ, Tsang IW, Kwok JT et al (2010) Domain adaptation via transfer component analysis. IEEE Trans Neural Netw 22(2):199\u2013210","journal-title":"IEEE Trans Neural Netw"},{"key":"10418_CR75","doi-asserted-by":"crossref","unstructured":"Pelayo L, Dick S (2007) Applying novel resampling strategies to software defect prediction. In: NAFIPS 2007-2007 annual meeting of the North American fuzzy information processing society. IEEE, pp 69\u201372","DOI":"10.1109\/NAFIPS.2007.383813"},{"key":"10418_CR76","doi-asserted-by":"crossref","unstructured":"Rahman F, Devanbu P (2013a) How, and why, process metrics are better. In: Proceedings of the 2013 ICSE. IEEE Press, pp 432\u2013441","DOI":"10.1109\/ICSE.2013.6606589"},{"key":"10418_CR77","doi-asserted-by":"crossref","unstructured":"Rahman F, Devanbu P (2013b) How, and why, process metrics are better. In: Proceedings of the 2013 ICSE, ICSE\u201913. IEEE Press, p 432-441","DOI":"10.1109\/ICSE.2013.6606589"},{"key":"10418_CR78","doi-asserted-by":"crossref","unstructured":"Rahman F, Khatri S, Barr ET, et\u00a0al (2014) Comparing static bug finders and statistical prediction. In: Proceedings of the 36th ICSE. ACM, pp 424\u2013434","DOI":"10.1145\/2568225.2568269"},{"key":"10418_CR79","doi-asserted-by":"crossref","unstructured":"Ray B, Hellendoorn V, Godhane S, et\u00a0al (2016) On the \u201cnaturalness\u201d of buggy code. In: Proceedings of the 38th international conference on software engineering. Association for Computing Machinery, New York, pp 428\u2013439","DOI":"10.1145\/2884781.2884848"},{"key":"10418_CR80","doi-asserted-by":"crossref","unstructured":"Rosen C, Grawi B, Shihab E (2015b) Commit guru: analytics and risk prediction of software commits. In: Proceedings of the 2015 10th joint meeting on foundations of software engineering. ACM, pp 966\u2013969","DOI":"10.1145\/2786805.2803183"},{"issue":"1","key":"10418_CR81","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1007\/s10664-014-9346-4","volume":"21","author":"D Ryu","year":"2016","unstructured":"Ryu D, Choi O, Baik J (2016) Value-cognitive boosting with a support vector machine for cross-project defect prediction. Empir Softw Eng 21(1):43\u201371","journal-title":"Empir Softw Eng"},{"issue":"3","key":"10418_CR82","doi-asserted-by":"publisher","first-page":"363","DOI":"10.1109\/TIT.1965.1053799","volume":"11","author":"H Scudder","year":"1965","unstructured":"Scudder H (1965) Probability of error of some adaptive pattern-recognition machines. IEEE Trans Inf Theory 11(3):363\u2013371","journal-title":"IEEE Trans Inf Theory"},{"key":"10418_CR83","doi-asserted-by":"publisher","first-page":"571","DOI":"10.1016\/j.ins.2010.12.016","volume":"259","author":"C Seiffert","year":"2014","unstructured":"Seiffert C, Khoshgoftaar TM, Van Hulse J et al (2014) An empirical study of the classification performance of learners on imbalanced and noisy software quality data. Inf Sci 259:571\u2013595","journal-title":"Inf Sci"},{"key":"10418_CR84","doi-asserted-by":"crossref","unstructured":"Seliya N, Khoshgoftaar TM, Van\u00a0Hulse J (2010) Predicting faults in high assurance software. In: 2010 IEEE 12th International Symposium on High Assurance Systems Engineering. IEEE, pp 26\u201334","DOI":"10.1109\/HASE.2010.29"},{"key":"10418_CR85","doi-asserted-by":"publisher","first-page":"1208","DOI":"10.1109\/TSE.2013.11","volume":"39","author":"M Shepperd","year":"2013","unstructured":"Shepperd M, Song Q, Sun Z et al (2013) Data quality: some comments on the nasa software defect datasets. IEEE Trans Softw Eng 39:1208\u20131215. https:\/\/doi.org\/10.1109\/TSE.2013.11","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR86","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-011-9190-8","author":"Y Shin","year":"2013","unstructured":"Shin Y, Williams L (2013) Can traditional fault prediction models be used for vulnerability prediction? EMSE. https:\/\/doi.org\/10.1007\/s10664-011-9190-8","journal-title":"EMSE"},{"key":"10418_CR87","unstructured":"Singh PD, Chug A (2017) Software defect prediction analysis using machine learning algorithms. In: 2017 7th international conference on cloud computing, data science & engineering-confluence. IEEE, pp 775\u2013781"},{"key":"10418_CR88","doi-asserted-by":"crossref","unstructured":"Sucholutsky I, Schonlau M (2021) \u2018Less than one\u2019-shot learning: learning n classes from m $$<$$ n samples. In: Proceedings of the AAAI conference on artificial intelligence. pp 9739\u20139746","DOI":"10.1609\/aaai.v35i11.17171"},{"issue":"6","key":"10418_CR89","doi-asserted-by":"publisher","first-page":"1806","DOI":"10.1109\/TSMCC.2012.2226152","volume":"42","author":"Z Sun","year":"2012","unstructured":"Sun Z, Song Q, Zhu X (2012) Using coding-based ensemble learning to improve software defect prediction. IEEE Trans Syst Man Cybern Part C (Appl Rev) 42(6):1806\u20131817","journal-title":"IEEE Trans Syst Man Cybern Part C (Appl Rev)"},{"issue":"1","key":"10418_CR90","doi-asserted-by":"publisher","first-page":"355","DOI":"10.1007\/s13042-015-0328-7","volume":"8","author":"J Tanha","year":"2017","unstructured":"Tanha J, Van Someren M, Afsarmanesh H (2017) Semi-supervised self-training for decision tree classifiers. Int J Mach Learn Cybern 8(1):355\u2013370","journal-title":"Int J Mach Learn Cybern"},{"key":"10418_CR91","doi-asserted-by":"crossref","unstructured":"Tantithamthavorn C, McIntosh S, Hassan AE, et\u00a0al (2016a) Automated parameter optimization of classification techniques for defect prediction models. In: ICSE 2016. ACM, pp 321\u2013332","DOI":"10.1145\/2884781.2884857"},{"issue":"1","key":"10418_CR92","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1109\/TSE.2016.2584050","volume":"43","author":"C Tantithamthavorn","year":"2016","unstructured":"Tantithamthavorn C, McIntosh S, Hassan AE et al (2016) An empirical comparison of model validation techniques for defect prediction models. IEEE Trans Softw Eng 43(1):1\u201318","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR93","doi-asserted-by":"publisher","unstructured":"Tantithamthavorn C, McIntosh S, Hassan AE et al (2018) The impact of automated parameter optimization on defect prediction models. IEEE Trans Softw Eng 1\u20131. https:\/\/doi.org\/10.1109\/TSE.2018.2794977","DOI":"10.1109\/TSE.2018.2794977"},{"issue":"4","key":"10418_CR94","first-page":"331","volume":"17","author":"MK Thota","year":"2020","unstructured":"Thota MK, Shajin FH, Rajesh P et al (2020) Survey on software defect prediction techniques. Int J Appl Sci Eng 17(4):331\u2013344","journal-title":"Int J Appl Sci Eng"},{"key":"10418_CR95","doi-asserted-by":"publisher","first-page":"131","DOI":"10.1016\/j.knosys.2015.02.009","volume":"81","author":"D Tomar","year":"2015","unstructured":"Tomar D, Agarwal S (2015) A comparison on multi-class classification methods based on least squares twin support vector machine. Knowl Based Syst 81:131\u2013147","journal-title":"Knowl Based Syst"},{"key":"10418_CR96","doi-asserted-by":"crossref","unstructured":"Tosun A, Bener A, Kale R (2010) Ai-based software defect predictors: applications and benefits in a case study. In: Twenty-second IAAI conference on artificial intelligence, vol 24, pp 1748\u20131755","DOI":"10.1609\/aaai.v24i2.18807"},{"key":"10418_CR97","unstructured":"Tu H, Menzies T (2021) FRUGAL: unlocking SSL for software analytics. ASE CoRR, abs\/2108.09"},{"key":"10418_CR98","doi-asserted-by":"publisher","first-page":"278","DOI":"10.1109\/TSE.2020.2986415","volume":"48","author":"H Tu","year":"2020","unstructured":"Tu H, Yu Z, Menzies T (2020) Better data labelling with emblem (and how that impacts defect prediction). IEEE Trans Softw Eng 48:278\u2013294","journal-title":"IEEE Trans Softw Eng"},{"issue":"2","key":"10418_CR99","doi-asserted-by":"publisher","first-page":"373","DOI":"10.1007\/s10994-019-05855-6","volume":"109","author":"JE Van Engelen","year":"2020","unstructured":"Van Engelen JE, Hoos HH (2020) A survey on semi-supervised learning. Mach Learn 109(2):373\u2013440","journal-title":"Mach Learn"},{"issue":"5","key":"10418_CR100","doi-asserted-by":"publisher","first-page":"988","DOI":"10.1109\/72.788640","volume":"10","author":"VN Vapnik","year":"1999","unstructured":"Vapnik VN (1999) An overview of statistical learning theory. IEEE Trans Neural Netw 10(5):988\u2013999","journal-title":"IEEE Trans Neural Netw"},{"key":"10418_CR101","unstructured":"Vasilescu B (2018) Personnel communication at fse\u201918. Found Softw Eng"},{"key":"10418_CR102","doi-asserted-by":"crossref","unstructured":"Vasilescu B, Yu Y, Wang H et\u00a0al (2015) Quality and productivity outcomes relating to continuous integration in github. In: Proceedings of the 2015 10th joint meeting on foundations of software engineering. ACM, pp 805\u2013816","DOI":"10.1145\/2786805.2786850"},{"issue":"10\u201311","key":"10418_CR103","doi-asserted-by":"publisher","first-page":"1945","DOI":"10.1166\/asl.2014.5640","volume":"20","author":"RS Wahono","year":"2014","unstructured":"Wahono RS, Herman NS, Ahmad S (2014) A comparison framework of classification models for software defect prediction. Adv Sci Lett 20(10\u201311):1945\u20131950","journal-title":"Adv Sci Lett"},{"issue":"11","key":"10418_CR104","doi-asserted-by":"publisher","first-page":"1241","DOI":"10.1109\/TSE.2018.2877678","volume":"46","author":"Z Wan","year":"2018","unstructured":"Wan Z, Xia X, Hassan AE et al (2018) Perceptions, expectations, and challenges in defect prediction. IEEE Trans Softw Eng 46(11):1241\u20131266","journal-title":"IEEE Trans Softw Eng"},{"key":"10418_CR105","doi-asserted-by":"crossref","unstructured":"Wang J, Shen B, Chen Y (2012) Compressed c4. 5 models for software defect prediction. In: 2012 12th international conference on quality software. IEEE, pp 13\u201316","DOI":"10.1109\/QSIC.2012.19"},{"issue":"2","key":"10418_CR106","doi-asserted-by":"publisher","first-page":"434","DOI":"10.1109\/TR.2013.2259203","volume":"62","author":"S Wang","year":"2013","unstructured":"Wang S, Yao X (2013) Using class imbalance learning for software defect prediction. IEEE Trans Reliab 62(2):434\u2013443","journal-title":"IEEE Trans Reliab"},{"key":"10418_CR107","doi-asserted-by":"crossref","unstructured":"Williams C, Spacco J (2008) Szz revisited: verifying when changes induce fixes. In: Proceedings of the 2008 workshop on Defects in large software systems. ACM, pp 32\u201336","DOI":"10.1145\/1390817.1390826"},{"issue":"1\u20133","key":"10418_CR108","doi-asserted-by":"publisher","first-page":"37","DOI":"10.1016\/0169-7439(87)80084-9","volume":"2","author":"S Wold","year":"1987","unstructured":"Wold S, Esbensen K, Geladi P (1987) Principal component analysis. Chemometr Intell Lab Syst 2(1\u20133):37\u201352","journal-title":"Chemometr Intell Lab Syst"},{"issue":"7","key":"10418_CR109","doi-asserted-by":"publisher","first-page":"2541","DOI":"10.1109\/TSE.2021.3063727","volume":"48","author":"X Wu","year":"2022","unstructured":"Wu X, Zheng W, Xia X et al (2022) Data quality matters: a case study on data label correctness for security bug report prediction. IEEE Trans Softw Eng 48(7):2541\u20132556. https:\/\/doi.org\/10.1109\/TSE.2021.3063727","journal-title":"IEEE Trans Softw Eng"},{"issue":"4","key":"10418_CR110","doi-asserted-by":"publisher","first-page":"1810","DOI":"10.1109\/TR.2016.2588139","volume":"65","author":"X Xia","year":"2016","unstructured":"Xia X, Lo D, Wang X et al (2016) Collective personalized change classification with multiobjective search. IEEE Trans Reliab 65(4):1810\u20131829","journal-title":"IEEE Trans Reliab"},{"key":"10418_CR111","doi-asserted-by":"crossref","unstructured":"Xie J, Szymanski BK (2011) Community detection using a neighborhood strength driven label propagation algorithm. In: 2011 IEEE Network Science Workshop. IEEE, pp 188\u2013195","DOI":"10.1109\/NSW.2011.6004645"},{"key":"10418_CR112","unstructured":"Xu C, Tao D, Xu C (2013) A survey on multi-view learning. arXiv:1304.5634"},{"key":"10418_CR113","doi-asserted-by":"crossref","unstructured":"Xu Z, Liu J, Yang Z, et\u00a0al (2016) The impact of feature selection on defect prediction performance: an empirical comparison. In: 2016 IEEE 27th international symposium on software reliability engineering (ISSRE). IEEE, pp 309\u2013320","DOI":"10.1109\/ISSRE.2016.13"},{"key":"10418_CR114","doi-asserted-by":"crossref","unstructured":"Yang X, Lo D, Xia X, et\u00a0al (2015) Deep learning for just-in-time defect prediction. In: 2015 IEEE International Conference on Software Quality, Reliability and Security. IEEE, pp 17\u201326","DOI":"10.1109\/QRS.2015.14"},{"key":"10418_CR115","doi-asserted-by":"publisher","first-page":"206","DOI":"10.1016\/j.infsof.2017.03.007","volume":"87","author":"X Yang","year":"2017","unstructured":"Yang X, Lo D, Xia X et al (2017) Tlel: a two-layer ensemble learning approach for just-in-time defect prediction. Inf Softw Technol 87:206\u2013220","journal-title":"Inf Softw Technol"},{"key":"10418_CR116","doi-asserted-by":"crossref","unstructured":"Yang Y, Zhou Y, Liu J, et\u00a0al (2016) Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models. In: Proceedings of the 2016 24th ACM SIGSOFT international symposium on foundations of software engineering. Association for Computing Machinery, New York, pp 157\u2013168","DOI":"10.1145\/2950290.2950353"},{"key":"10418_CR117","doi-asserted-by":"crossref","unstructured":"Yarowsky D (1995) Unsupervised word sense disambiguation rivaling supervised methods. In: 33rd annual meeting of the association for computational linguistics. Association for Computational Linguistics, Cambridge, pp 189\u2013196","DOI":"10.3115\/981658.981684"},{"issue":"13","key":"10418_CR118","doi-asserted-by":"publisher","first-page":"1975","DOI":"10.1016\/j.patrec.2010.06.010","volume":"31","author":"Z Yu","year":"2010","unstructured":"Yu Z, Su L, Li L et al (2010) Question classification based on co-training style semi-supervised learning. Pattern Recogn Lett 31(13):1975\u20131980","journal-title":"Pattern Recogn Lett"},{"issue":"11","key":"10418_CR119","doi-asserted-by":"publisher","first-page":"2401","DOI":"10.1109\/TSE.2019.2949275","volume":"47","author":"Z Yu","year":"2019","unstructured":"Yu Z, Theisen C, Williams L et al (2019) Improving vulnerability inspection efficiency using active learning. IEEE Trans Softw Eng 47(11):2401\u20132420","journal-title":"IEEE Trans Softw Eng"},{"issue":"5","key":"10418_CR120","doi-asserted-by":"publisher","first-page":"1676","DOI":"10.1109\/TSE.2020.3031401","volume":"48","author":"Z Yu","year":"2022","unstructured":"Yu Z, Fahid FM, Tu H, Menzies T (2022) Identifying self-admitted technical debts with jitterbug: a two-step approach. IEEE Trans Softw Eng 48(5):1676\u20131691","journal-title":"IEEE Trans Softw Eng"},{"issue":"5","key":"10418_CR121","doi-asserted-by":"publisher","first-page":"2107","DOI":"10.1007\/s10664-015-9396-2","volume":"21","author":"F Zhang","year":"2016","unstructured":"Zhang F, Mockus A, Keivanloo I et al (2016) Towards building a universal defect prediction model with rank transformed predictors. Empir Softw Engg 21(5):2107\u20132145. https:\/\/doi.org\/10.1007\/s10664-015-9396-2","journal-title":"Empir Softw Engg"},{"key":"10418_CR122","doi-asserted-by":"crossref","unstructured":"Zhang F, Zheng Q, Zou Y, et\u00a0al (2016b) Cross-project defect prediction using a connectivity-based unsupervised classifier. In: 2016 IEEE\/ACM 38th ICSE (ICSE). IEEE, pp 309\u2013320","DOI":"10.1145\/2884781.2884839"},{"issue":"6","key":"10418_CR123","doi-asserted-by":"publisher","first-page":"3186","DOI":"10.1007\/s10664-017-9516-2","volume":"22","author":"F Zhang","year":"2017","unstructured":"Zhang F, Keivanloo I, Zou Y (2017) Data transformation in cross-project defect prediction. Empir Softw Eng 22(6):3186\u20133218","journal-title":"Empir Softw Eng"},{"key":"10418_CR124","doi-asserted-by":"crossref","unstructured":"Zhang H, Zhang X, Gu M (2007) Predicting defective software components from code complexity measures. In: 13th Pacific RIM international symposium on dependable computing (PRDC 2007). IEEE, pp 93\u201396","DOI":"10.1109\/PRDC.2007.28"},{"key":"10418_CR125","doi-asserted-by":"crossref","unstructured":"Zhang Q, Wang J, Gulzar MA et\u00a0al (2020) Bigfuzz: Efficient fuzz testing for data analytics using framework abstraction. In: Proceedings of the 35th IEEE\/ACM international conference on automated software engineering. pp 722\u2013733","DOI":"10.1145\/3324884.3416641"},{"key":"10418_CR126","doi-asserted-by":"crossref","unstructured":"Zhang W, Li W, Jia X (2019) Effort-aware tri-training for semi-supervised just-in-time defect prediction. In: Pacific-Asia conference on knowledge discovery and data mining. Springer, pp 293\u2013304","DOI":"10.1007\/978-3-030-16145-3_23"},{"issue":"1","key":"10418_CR127","doi-asserted-by":"publisher","first-page":"47","DOI":"10.1007\/s10515-016-0194-x","volume":"24","author":"ZW Zhang","year":"2017","unstructured":"Zhang ZW, Jing XY, Wang TJ (2017) Label propagation based semi-supervised learning for software defect prediction. Autom Softw Eng 24(1):47\u201369","journal-title":"Autom Softw Eng"},{"key":"10418_CR128","unstructured":"Zhong S, Khoshgoftaar TM, Seliya N (2004) Unsupervised learning for expert-based software quality estimation. In: HASE. Citeseer, pp 149\u2013155"},{"key":"10418_CR129","unstructured":"Zhou D, Bousquet O, Lal T, et\u00a0al (2003) Learning with local and global consistency. Adv Neural Inf Process Syst 16"},{"key":"10418_CR130","doi-asserted-by":"crossref","unstructured":"Zhou Y, Goldman S (2004) Democratic co-learning. In: 16th IEEE international conference on tools with artificial intelligence. IEEE, pp 594\u2013602","DOI":"10.1109\/ICTAI.2004.48"},{"issue":"4","key":"10418_CR131","doi-asserted-by":"publisher","first-page":"660","DOI":"10.1016\/j.jss.2009.11.704","volume":"83","author":"Y Zhou","year":"2010","unstructured":"Zhou Y, Xu B, Leung H (2010) On the ability of complexity metrics to predict fault-prone classes in object-oriented systems. J Syst Softw 83(4):660\u2013674","journal-title":"J Syst Softw"},{"key":"10418_CR132","doi-asserted-by":"crossref","unstructured":"Zhou ZH (2012) Ensemble methods: foundations and algorithms. CRC Press","DOI":"10.1201\/b12207"},{"issue":"11","key":"10418_CR133","doi-asserted-by":"publisher","first-page":"1529","DOI":"10.1109\/TKDE.2005.186","volume":"17","author":"ZH Zhou","year":"2005","unstructured":"Zhou ZH, Li M (2005) Tri-training: exploiting unlabeled data using three classifiers. IEEE Trans Knowl Data Eng 17(11):1529\u20131541","journal-title":"IEEE Trans Knowl Data Eng"},{"key":"10418_CR134","unstructured":"Zhu X, Ghahramani Z (2002) Learning from labeled and unlabeled data with label propagation. ProQuest Number: INFORMATION TO ALL USERS"},{"issue":"1","key":"10418_CR135","first-page":"1","volume":"3","author":"X Zhu","year":"2009","unstructured":"Zhu X, Goldberg AB (2009) Introduction to semi-supervised learning. Synth Lect Artif Intell Mach Learn 3(1):1\u2013130","journal-title":"Synth Lect Artif Intell Mach Learn"},{"key":"10418_CR136","unstructured":"Zhu XJ (2005) Semi-supervised learning literature survey"},{"key":"10418_CR137","doi-asserted-by":"crossref","unstructured":"Zimmermann T, Premraj R, Zeller A (2007) Predicting defects for eclipse. In: Proceedings of the Third international workshop on predictor models in software engineering. IEEE Computer Society, p\u00a09","DOI":"10.1109\/PROMISE.2007.10"},{"key":"10418_CR138","doi-asserted-by":"crossref","unstructured":"Zimmermann T, Nagappan N, Gall H et\u00a0al (2009b) Cross-project defect prediction: a large scale experiment on data vs. domain vs. process. In: Proceedings of the 7th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on the foundations of software engineering. Association for Computing Machinery, New York, pp 91\u2013100","DOI":"10.1145\/1595696.1595713"}],"container-title":["Empirical Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-023-10418-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10664-023-10418-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-023-10418-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,23]],"date-time":"2024-03-23T02:24:42Z","timestamp":1711160682000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10664-023-10418-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2,24]]},"references-count":138,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2024,3]]}},"alternative-id":["10418"],"URL":"https:\/\/doi.org\/10.1007\/s10664-023-10418-4","relation":{},"ISSN":["1382-3256","1573-7616"],"issn-type":[{"value":"1382-3256","type":"print"},{"value":"1573-7616","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,2,24]]},"assertion":[{"value":"25 October 2023","order":1,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 February 2024","order":2,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"We wish to confirm that there are no known conflicts of interest associated with this publication, and there has been no significant financial support for this work that could have influenced its outcome.","order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}}],"article-number":"51"}}