{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,9]],"date-time":"2026-05-09T10:47:49Z","timestamp":1778323669154,"version":"3.51.4"},"reference-count":52,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2024,7,24]],"date-time":"2024-07-24T00:00:00Z","timestamp":1721779200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"},{"start":{"date-parts":[[2024,7,24]],"date-time":"2024-07-24T00:00:00Z","timestamp":1721779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"}],"funder":[{"name":"Ramony Cajal Fellowship","award":["RYC2021-031523-I"],"award-info":[{"award-number":["RYC2021-031523-I"]}]},{"DOI":"10.13039\/501100000781","name":"European Research Council","doi-asserted-by":"publisher","award":["741278"],"award-info":[{"award-number":["741278"]}],"id":[{"id":"10.13039\/501100000781","id-type":"DOI","asserted-by":"publisher"}]},{"name":"EPRSC","award":["EP\/P023991\/1"],"award-info":[{"award-number":["EP\/P023991\/1"]}]},{"DOI":"10.13039\/501100000923","name":"Australian Research Council","doi-asserted-by":"publisher","award":["DP210100041"],"award-info":[{"award-number":["DP210100041"]}],"id":[{"id":"10.13039\/501100000923","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Empir Software Eng"],"published-print":{"date-parts":[[2024,9]]},"abstract":"<jats:title>Abstract<\/jats:title><jats:p>Previous studies have shown that Automated Program Repair (<jats:sc>apr<\/jats:sc>) techniques suffer from the overfitting problem. Overfitting happens when a patch is run and the test suite does not reveal any error, but the patch actually does not fix the underlying bug or it introduces a new defect that is not covered by the test suite. Therefore, the patches generated by <jats:sc>apr<\/jats:sc> tools need to be validated by human programmers, which can be very costly, and prevents <jats:sc>apr<\/jats:sc> tool adoption in practice. Our work aims to minimize the number of plausible patches that programmers have to review, thereby reducing the time required to find a correct patch. We introduce a novel light-weight test-based patch clustering approach called <jats:sc>xTestCluster<\/jats:sc>, which clusters patches based on their dynamic behavior. <jats:sc>xTestCluster<\/jats:sc> is applied after the patch generation phase in order to analyze the generated patches from one or more repair tools and to provide more information about those patches for facilitating patch assessment. The novelty of <jats:sc>xTestCluster<\/jats:sc> lies in using information from execution of newly generated test cases to cluster patches generated by multiple APR approaches. A cluster is formed of patches that fail on the same generated test cases. The output from <jats:sc>xTestCluster<\/jats:sc> gives developers <jats:italic>a)<\/jats:italic> a way of reducing the number of patches to analyze, as they can focus on analyzing a sample of patches from each cluster, <jats:italic>b)<\/jats:italic> additional information (new test cases and their results) attached to each patch. After analyzing 902 plausible patches from 21 Java <jats:sc>apr<\/jats:sc> tools, our results show that <jats:sc>xTestCluster<\/jats:sc> is able to reduce the number of patches to review and analyze with a median of 50%. <jats:sc>xTestCluster<\/jats:sc> can save a significant amount of time for developers that have to review the multitude of patches generated by <jats:sc>apr<\/jats:sc> tools, and provides them with new test cases that expose the differences in behavior between generated patches. Moreover, <jats:sc>xTestCluster<\/jats:sc> can complement other patch assessment techniques that help detect patch misclassifications.<\/jats:p>","DOI":"10.1007\/s10664-024-10503-2","type":"journal-article","created":{"date-parts":[[2024,7,24]],"date-time":"2024-07-24T08:02:56Z","timestamp":1721808176000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":5,"title":["Test-based patch clustering for automatically-generated patches assessment"],"prefix":"10.1007","volume":"29","author":[{"given":"Matias","family":"Martinez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maria","family":"Kechagia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anjana","family":"Perera","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Justyna","family":"Petke","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9146-442X","authenticated-orcid":false,"given":"Federica","family":"Sarro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aldeida","family":"Aleti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2024,7,24]]},"reference":[{"issue":"1","key":"10503_CR1","doi-asserted-by":"publisher","first-page":"34","DOI":"10.1109\/TSE.2017.2755013","volume":"45","author":"L Gazzola","year":"2017","unstructured":"Gazzola L, Micucci D, Mariani L (2017) Automatic software repair: A survey. IEEE Trans Software Eng 45(1):34\u201367","journal-title":"IEEE Trans Software Eng"},{"issue":"1","key":"10503_CR2","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1145\/3105906","volume":"51","author":"M Monperrus","year":"2018","unstructured":"Monperrus M (2018) Automatic software repair: a bibliography. ACM Computing Surveys (CSUR) 51(1):1\u201324","journal-title":"ACM Computing Surveys (CSUR)"},{"issue":"5","key":"10503_CR3","doi-asserted-by":"publisher","first-page":"3007","DOI":"10.1007\/s10664-017-9577-2","volume":"23","author":"XBD Le","year":"2018","unstructured":"Le XBD, Thung F, Lo D, Le Goues C (2018) Overfitting in semantics-based automated program repair. Empir Softw Eng 23(5):3007\u20133033","journal-title":"Empir Softw Eng"},{"key":"10503_CR4","doi-asserted-by":"crossref","unstructured":"Long F, Rinard M (2016) An analysis of the search spaces for generate and validate patch generation systems. In: 2016 IEEE\/ACM 38th International Conference on Software Engineering (ICSE). IEEE, pp 702\u2013713","DOI":"10.1145\/2884781.2884872"},{"issue":"4","key":"10503_CR5","doi-asserted-by":"publisher","first-page":"1936","DOI":"10.1007\/s10664-016-9470-4","volume":"22","author":"M Martinez","year":"2017","unstructured":"Martinez M, Durieux T, Sommerard R, Xuan J, Monperrus M (2017) Automatic repair of real bugs in java: a large-scale experiment on the defects4j dataset. Empir Softw Eng 22(4):1936\u20131964","journal-title":"Empir Softw Eng"},{"key":"10503_CR6","doi-asserted-by":"crossref","unstructured":"Smith EK, Barr ET, Le\u00a0Goues C, Brun Y (2015) Is the cure worse than the disease? overfitting in automated program repair. In: Proceedings of the 2015 10th joint meeting on foundations of software engineering, pp 532\u2013543","DOI":"10.1145\/2786805.2786825"},{"key":"10503_CR7","doi-asserted-by":"crossref","unstructured":"Qi Z, Long F, Achour S, Rinard M (2015) An analysis of patch plausibility and correctness for generate-and-validate patch generation systems. In: Proceedings of the 2015 international symposium on software testing and analysis, pp 24\u201336","DOI":"10.1145\/2771783.2771791"},{"key":"10503_CR8","doi-asserted-by":"publisher","unstructured":"Ye H, Martinez M, Monperrus M (2021) Automated patch assessment for program repair at scale. Emp Softw Eng 26(2):20. [Online]. Available: https:\/\/doi.org\/10.1007\/s10664-020-09920-w","DOI":"10.1007\/s10664-020-09920-w"},{"key":"10503_CR9","doi-asserted-by":"crossref","unstructured":"Martinez M, Monperrus M (2018) Ultra-large repair search space with automatically mined templates: the cardumen mode of astor. In: International symposium on search based software engineering. Springer, pp 65\u201386","DOI":"10.1007\/978-3-319-99241-9_3"},{"key":"10503_CR10","doi-asserted-by":"crossref","unstructured":"Long F, Rinard M (2016) Automatic patch generation by learning correct code. In: Proceedings of the 43rd Annual ACM SIGPLAN-SIGACT symposium on principles of programming languages, ser. POPL \u201916","DOI":"10.1145\/2837614.2837617"},{"key":"10503_CR11","unstructured":"Ye H, Gu J, Martinez M, Durieux T, Monperrus M (2021) Automated classification of overfitting patches with statically extracted code features. IEEE Trans Softw Eng:1\u20131"},{"key":"10503_CR12","doi-asserted-by":"crossref","unstructured":"Xiong Y, Liu X, Zeng M, Zhang L, Huang G (2018) Identifying patch correctness in test-based program repair. In: Proceedings of the 40th international conference on software engineering. ACM, pp. 789\u2013799","DOI":"10.1145\/3180155.3180182"},{"key":"10503_CR13","doi-asserted-by":"crossref","unstructured":"Xin Q, Reiss SP (2017) Identifying test-suite-overfitted patches through test case generation. In: Proceedings of the 26th ACM SIGSOFT international symposium on software testing and analysis, pp 226\u2013236","DOI":"10.1145\/3092703.3092718"},{"key":"10503_CR14","doi-asserted-by":"publisher","unstructured":"Mechtaev S, Gao X, Tan SH, Roychoudhury A (2018) Test-equivalence analysis for automatic patch generation. ACM Trans Softw Eng Methodol 27(4):15:1\u201315:37. [Online]. Available: https:\/\/doi.org\/10.1145\/3241980","DOI":"10.1145\/3241980"},{"key":"10503_CR15","doi-asserted-by":"publisher","unstructured":"Cashin P, Martinez C, Weimer W, Forrest S (2019) Understanding automatically-generated patches through symbolic invariant differences. In: Proceedings of the 34th IEEE\/ACM international conference on automated software engineering, ser. ASE \u201919. IEEE Press, pp 411\u2013414. [Online]. Available: https:\/\/doi.org\/10.1109\/ASE.2019.00046","DOI":"10.1109\/ASE.2019.00046"},{"key":"10503_CR16","doi-asserted-by":"publisher","unstructured":"Lin B, Wang S, Wen M, Mao X (2022) Context-aware code change embedding for better patch correctness assessment. ACM Trans Softw Eng Methodol 31(3). [Online]. Available: https:\/\/doi.org\/10.1145\/3505247","DOI":"10.1145\/3505247"},{"key":"10503_CR17","doi-asserted-by":"publisher","unstructured":"Just R, Jalali D, Ernst MD (2014) Defects4j: a database of existing faults to enable controlled testing studies for java programs. In: Proceedings of the 2014 international symposium on software testing and analysis, ser. ISSTA 2014. New York, NY, USA: Association for Computing Machinery, pp 437\u2013440. [Online]. Available: https:\/\/doi.org\/10.1145\/2610384.2628055","DOI":"10.1145\/2610384.2628055"},{"key":"10503_CR18","doi-asserted-by":"crossref","unstructured":"Wang S, Wen M, Lin B, Wu H, Qin Y, Zou D, Mao X, Jin H (2020) Automated patch correctness assessment: How far are we? In: Proceedings of the 35th IEEE\/ACM International Conference on Automated Software Engineering, ser. ASE \u201920. New York, NY, USA: Association for Computing Machinery, pp 968\u2013980","DOI":"10.1145\/3324884.3416590"},{"key":"10503_CR19","doi-asserted-by":"crossref","unstructured":"Fraser G, Arcuri A (2011) EvoSuite: automatic test suite generation for object-oriented software. In: Proceedings of the 19th ACM SIGSOFT symposium and the 13th european conference on foundations of software engineering, ser. ESEC\/FSE \u201911. New York, NY, USA: Association for Computing Machinery, pp 416\u2013419","DOI":"10.1145\/2025113.2025179"},{"key":"10503_CR20","doi-asserted-by":"crossref","unstructured":"Pacheco C, Ernst MD (2007) Randoop: feedback-directed random testing for Java. In: Companion to the 22nd ACM SIGPLAN conference on object-oriented programming systems and applications companion, ser. OOPSLA \u201907. New York, NY, USA: Association for Computing Machinery, pp 815\u2013816","DOI":"10.1145\/1297846.1297902"},{"key":"10503_CR21","unstructured":"xtestcluster appendix repository (2021) [Online]. Available: https:\/\/github.com\/UPCArtifacts\/xTestCluster"},{"key":"10503_CR22","doi-asserted-by":"crossref","unstructured":"Durieux T, Madeiral F, Martinez M, Abreu R (2019) Empirical review of java program repair tools: A large-scale experiment on 2,141 bugs and 23,551 repair attempts. In: Proceedings of the 2019 27th ACM joint meeting on european software engineering conference and symposium on the foundations of software engineering. ACM, pp 302\u2013313","DOI":"10.1145\/3338906.3338911"},{"key":"10503_CR23","doi-asserted-by":"publisher","unstructured":"Liu K, Wang S, Koyuncu A, Kim K, Bissyand\u00e9 TF, Kim D, Wu P, Klein J, Mao X, Traon YL (2020) On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs. In: Proceedings of the ACM\/IEEE 42nd International Conference on Software Engineering, ser. ICSE \u201920. New York, NY, USA: Association for Computing Machinery, pp 615\u2013627. [Online]. Available: https:\/\/doi.org\/10.1145\/3377811.3380338","DOI":"10.1145\/3377811.3380338"},{"key":"10503_CR24","doi-asserted-by":"crossref","unstructured":"Xiong Y, Wang J, Yan R, Zhang J, Han S, Huang G, Zhang L (2017) Precise condition synthesis for program repair. In: Proceedings of the 39th international conference on software engineering, ser. ICSE \u201917. IEEE Press, pp 416\u2013426","DOI":"10.1109\/ICSE.2017.45"},{"key":"10503_CR25","doi-asserted-by":"crossref","unstructured":"Liu K, Koyuncu A, Kim D, Bissyand\u00e9 TF (2018) AVATAR: fixing semantic bugs with fix patterns of static analysis violations. In: IEEE 26th International Conference on Software Analysis, Evolution and Reengineering (SANER), pp 1\u201312","DOI":"10.1109\/SANER.2019.8667970"},{"key":"10503_CR26","unstructured":"Yuan Y, Banzhaf W (2018) ARJA: automated repair of Java programs via multi-objective genetic programming. IEEE Trans Softw Eng:1\u20131"},{"key":"10503_CR27","doi-asserted-by":"crossref","unstructured":"Wen M, Chen J, Wu R, Hao D, Cheung S-C (2018) Context-aware patch generation for better automated program repair. In: 2018 IEEE\/ACM 40th International Conference on Software Engineering (ICSE), pp 1\u201311","DOI":"10.1145\/3180155.3180233"},{"key":"10503_CR28","doi-asserted-by":"crossref","unstructured":"Martinez M, Monperrus M (2016) ASTOR: a program repair library for Java (demo). In: Proceedings of the 25th International Symposium on Software Testing and Analysis (ISSTA). ACM, pp 441\u2013444","DOI":"10.1145\/2931037.2948705"},{"key":"10503_CR29","doi-asserted-by":"crossref","unstructured":"Durieux T, Monperrus M (2016) DynaMoth: dynamic code synthesis for automatic program repair. In: 2016 IEEE\/ACM 11th International Workshop in Automation of Software Test (AST), pp 85\u201391","DOI":"10.1145\/2896921.2896931"},{"key":"10503_CR30","doi-asserted-by":"crossref","unstructured":"Koyuncu A, Liu K, Bissyand\u00e9 TF, Kim D, Klein J, Monperrus M, Le\u00a0Traon Y (2020) FixMiner: mining relevant fix patterns for automated program repair. Emp Softw Eng:1\u201345","DOI":"10.1007\/s10664-019-09780-z"},{"key":"10503_CR31","doi-asserted-by":"crossref","unstructured":"Chen L, Pei Y, Furia CA (2017) Contract-based program repair without the contracts. In: 2017 32nd IEEE\/ACM International Conference on Automated Software Engineering (ASE), pp 637\u2013647","DOI":"10.1109\/ASE.2017.8115674"},{"key":"10503_CR32","doi-asserted-by":"crossref","unstructured":"Liu K, Koyuncu A, Bissyand\u00e9 TF, Kim D, Klein J, Le\u00a0Traon Y (2019) You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems. In: 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST), pp 102\u2013113","DOI":"10.1109\/ICST.2019.00020"},{"key":"10503_CR33","doi-asserted-by":"crossref","unstructured":"Xuan J, Martinez M, DeMarco F, Cl\u00e9ment M, Marcote SL, Durieux T, Berre DL, M (2017) Nopol: automatic repair of conditional statement bugs in Java programs. IEEE Trans Softw Eng 43(1):34\u201355","DOI":"10.1109\/TSE.2016.2560811"},{"key":"10503_CR34","doi-asserted-by":"crossref","unstructured":"Liu X, Zhong H (2018) Mining stackoverflow for program repair. In: 2018 IEEE 25th International Conference on Software Analysis, Evolution and Reengineering (SANER), pp 118\u2013129","DOI":"10.1109\/SANER.2018.8330202"},{"key":"10503_CR35","doi-asserted-by":"crossref","unstructured":"Chen Z, Kommrusch SJ, Tufano M, Pouchet L, Poshyvanyk D, Monperrus M (2019) SEQUENCER: sequence-to-sequence learning for end-to-end program repair. IEEE Trans Softw Eng:1\u20131","DOI":"10.1109\/TSE.2019.2940179"},{"key":"10503_CR36","doi-asserted-by":"crossref","unstructured":"Jiang J, Xiong Y, Zhang H, Gao Q, Chen X (2018) Shaping program repair space with existing patches and similar code. In: Proceedings of the 27th ACM SIGSOFT international symposium on software testing and analysis, ser. ISSTA 2018. New York, NY, USA: Association for Computing Machinery, pp 298\u2013309","DOI":"10.1145\/3213846.3213871"},{"key":"10503_CR37","doi-asserted-by":"crossref","unstructured":"Hua J, Zhang M, Wang K, Khurshid S (2018) SketchFix: a tool for automated program repair approach using lazy candidate generation. In: Proceedings of the 2018 26th ACM joint meeting on european software engineering conference and symposium on the foundations of software engineering, ser. ESEC\/FSE 2018. New York, NY, USA: Association for Computing Machinery, pp 88\u2013891","DOI":"10.1145\/3236024.3264600"},{"key":"10503_CR38","doi-asserted-by":"crossref","unstructured":"Liu K, Koyuncu A, Kim D, Bissyand\u00e9 TF (2019) TBar: revisiting template-based automated program repair. In: Proceedings of the 28th ACM SIGSOFT international symposium on software testing and analysis, ser. ISSTA. ACM, pp 31\u201342","DOI":"10.1145\/3293882.3330577"},{"key":"10503_CR39","doi-asserted-by":"crossref","unstructured":"Le X-BD, Chu D-H, Lo D, Le\u00a0Goues C, Visser W (2017) S3: syntax- and semantic-guided repair synthesis via programming by examples. In: Proceedings of the 2017 11th joint meeting on foundations of software engineering, ser. ESEC\/FSE 2017. New York, NY, USA: Association for Computing Machinery, pp 593\u2013604","DOI":"10.1145\/3106237.3106309"},{"key":"10503_CR40","doi-asserted-by":"crossref","unstructured":"Xin Q, Reiss SP (2017) Leveraging syntax-related code for automated program repair. In: Proceedings of the 32nd IEEE\/ACM international conference on automated software engineering, ser. ASE. IEEE Press, pp 660\u2013670","DOI":"10.1109\/ASE.2017.8115676"},{"key":"10503_CR41","doi-asserted-by":"crossref","unstructured":"Liu K, Li L, Koyuncu A, Kim D, Liu Z, Klein J, Bissyand\u00e9 TF (2021) A critical review on the evaluation of automated program repair systems. J Syst Softw 171:110817. [Online]. Available: https:\/\/www.sciencedirect.com\/science\/article\/pii\/S0164121220302156","DOI":"10.1016\/j.jss.2020.110817"},{"key":"10503_CR42","doi-asserted-by":"publisher","unstructured":"Tian H, Li Y, Pian Y, Kabor\u00e9 AK, Liu K, Habib A, Klein J, Bissyand\u00e9 TF (2022) Predicting patch correctness based on the similarity of failing test cases. ACM Trans Softw Eng Methodol, just Accepted. [Online]. Available: https:\/\/doi.org\/10.1145\/3511096","DOI":"10.1145\/3511096"},{"key":"10503_CR43","doi-asserted-by":"crossref","unstructured":"Fry ZP, Landau B, Weimer W (2012) A human study of patch maintainability. In: Proceedings of the 2012 international symposium on software testing and analysis, ser. ISSTA 2012. 0.5em minus New York, NY, USA: Association for Computing Machinery, pp 177\u2013187. [Online]. Available: https:\/\/doi-org.recursos.biblioteca.upc.edu\/10.1145\/2338965.2336775","DOI":"10.1145\/2338965.2336775"},{"key":"10503_CR44","doi-asserted-by":"publisher","unstructured":"Arcuri A, Fraser G (2013) Parameter tuning or default values? an empirical investigation in search-based software engineering. Emp Softw Eng 18(3):594\u2013623. [Online]. Available: https:\/\/doi.org\/10.1007\/s10664-013-9249-9","DOI":"10.1007\/s10664-013-9249-9"},{"key":"10503_CR45","doi-asserted-by":"crossref","unstructured":"Ernst MD, Perkins JH, Guo PJ, McCamant S, Pacheco C, Tschantz MS, Xiao C (2007) The Daikon system for dynamic detection of likely invariants. Sci Comput Program 69(1):35\u201345, special issue on Experimental Software and Toolkits","DOI":"10.1016\/j.scico.2007.01.015"},{"key":"10503_CR46","doi-asserted-by":"crossref","unstructured":"Yang J, Zhikhartsev A, Liu Y, Tan L (2017) Better test cases for better automated program repair. In: Proceedings of 2017 11th joint meeting of the european software engineering conference and the ACM SIGSOFT symposium on the foundations of software engineering, Paderborn, Germany, September 4\u20138, 2017 (ESEC\/FSE\u201917), 11 pages","DOI":"10.1145\/3106237.3106274"},{"key":"10503_CR47","doi-asserted-by":"crossref","unstructured":"Ghanbari A (2020) Objsim: lightweight automatic patch prioritization via object similarity","DOI":"10.1145\/3395363.3404362"},{"key":"10503_CR48","doi-asserted-by":"crossref","unstructured":"Tian H, Liu K, Kabor\u00e9 AK, Koyuncu A, Li L, Klein J, Bissyand\u00e9 TF (2020) Evaluating representation learning of code changes for predicting patch correctness in program repair. In: Proceedings of the 35th IEEE\/ACM international conference on automated software engineering. ACM","DOI":"10.1145\/3324884.3416532"},{"key":"10503_CR49","doi-asserted-by":"crossref","unstructured":"Kang S, Yoo S (2022) Language models can prioritize patches for practical program patching","DOI":"10.1145\/3524459.3527343"},{"key":"10503_CR50","doi-asserted-by":"crossref","unstructured":"Liang J, Ji R, Jiang J, Zhou S, Lou Y, Xiong Y, Huang G (2021) Interactive patch filtering as debugging aid. In: IEEE International Conference on Software Maintenance and Evolution (ICSME), pp 239\u2013250","DOI":"10.1109\/ICSME52107.2021.00028"},{"key":"10503_CR51","doi-asserted-by":"publisher","unstructured":"Wen M, Chen J, Wu R, Hao D, Cheung S-C (2018) Context-aware patch generation for better automated program repair. In: Proceedings of the 40th international conference on software engineering, ser. ICSE \u201918. New York, NY, USA: Association for Computing Machinery, pp 1\u201311. [Online]. Available: https:\/\/doi.org\/10.1145\/3180155.3180233","DOI":"10.1145\/3180155.3180233"},{"key":"10503_CR52","doi-asserted-by":"crossref","unstructured":"Gao X, Mechtaev S, Roychoudhury A (2019) Crash-avoiding program repair. In: Proceedings of the 28th ACM SIGSOFT international symposium on software testing and analysis, ser. ISSTA 2019","DOI":"10.1145\/3293882.3330558"}],"container-title":["Empirical Software Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-024-10503-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1007\/s10664-024-10503-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1007\/s10664-024-10503-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:50:39Z","timestamp":1725594639000},"score":1,"resource":{"primary":{"URL":"https:\/\/link.springer.com\/10.1007\/s10664-024-10503-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7,24]]},"references-count":52,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2024,9]]}},"alternative-id":["10503"],"URL":"https:\/\/doi.org\/10.1007\/s10664-024-10503-2","relation":{},"ISSN":["1382-3256","1573-7616"],"issn-type":[{"value":"1382-3256","type":"print"},{"value":"1573-7616","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7,24]]},"assertion":[{"value":"17 May 2024","order":1,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"24 July 2024","order":2,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare that they have no conflict of interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Conflict of Interests"}},{"value":"To satisfy UKRI funder requirements, for the purpose of open access, the authors have applied a Creative Commons Attribution (CC BY) license to any accepted manuscript version arising.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Copyright"}}],"article-number":"116"}}