{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,27]],"date-time":"2023-01-27T16:37:34Z","timestamp":1674837454312},"reference-count":0,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2004,12,1]],"date-time":"2004-12-01T00:00:00Z","timestamp":1101859200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2004,12]]},"DOI":"10.1007\/s10677-004-4247-z","type":"journal-article","created":{"date-parts":[[2005,3,23]],"date-time":"2005-03-23T04:22:35Z","timestamp":1111551755000},"page":"575-589","source":"Crossref","is-referenced-by-count":8,"title":["Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation"],"prefix":"10.1007","volume":"20","author":[{"given":"Zainalabedin","family":"Navabi","sequence":"first","affiliation":[]},{"given":"Shahrzad","family":"Mirkhani","sequence":"additional","affiliation":[]},{"given":"Meisam","family":"Lavasani","sequence":"additional","affiliation":[]},{"given":"Fabrizio","family":"Lombardi","sequence":"additional","affiliation":[]}],"member":"297","container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10677-004-4247-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10677-004-4247-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10677-004-4247-z","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T07:57:07Z","timestamp":1559289427000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10677-004-4247-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,12]]},"references-count":0,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2004,12]]}},"alternative-id":["4247"],"URL":"https:\/\/doi.org\/10.1007\/s10677-004-4247-z","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2004,12]]}}}