{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T13:29:29Z","timestamp":1770989369306,"version":"3.50.1"},"reference-count":39,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2011,8,7]],"date-time":"2011-08-07T00:00:00Z","timestamp":1312675200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int J Parallel Prog"],"published-print":{"date-parts":[[2012,2]]},"DOI":"10.1007\/s10766-011-0183-4","type":"journal-article","created":{"date-parts":[[2011,8,6]],"date-time":"2011-08-06T07:28:32Z","timestamp":1312615712000},"page":"118-140","source":"Crossref","is-referenced-by-count":28,"title":["DAFT: Decoupled Acyclic Fault Tolerance"],"prefix":"10.1007","volume":"40","author":[{"given":"Yun","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Jae W.","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Nick P.","family":"Johnson","sequence":"additional","affiliation":[]},{"given":"David I.","family":"August","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2011,8,7]]},"reference":[{"key":"183_CR1","unstructured":"Hareland, S., Maiz, J., Alavi, M., Mistry, K., Walsta, S., Dai, C.: Impact of CMOS Scaling and SOI on Software Error Rates of Logic Processes. VLSI Technology Digest of Technical Papers (2001)"},{"issue":"1","key":"183_CR2","doi-asserted-by":"crossref","first-page":"17","DOI":"10.1109\/7298.946456","volume":"1","author":"R.C. Baumann","year":"2001","unstructured":"Baumann R.C.: Soft errors in advanced semiconductor devices-part I: the three radiation sources. IEEE Trans. Device Mater. Reliab. 1(1), 17\u201322 (2001)","journal-title":"IEEE Trans. Device Mater. Reliab."},{"key":"183_CR3","doi-asserted-by":"crossref","first-page":"41","DOI":"10.1147\/rd.401.0041","volume":"40","author":"T.J. O\u2019Gorman","year":"1996","unstructured":"O\u2019Gorman T.J., Ross J.M., Taber A.H., Ziegler J.F., Muhlfeld H.P., Montrose I.C.J., Curtis H.W., Walsh J.L.: Field testing for cosmic ray soft errors in semiconductor memories. IBM J. Res. Dev. 40, 41\u201349 (1996)","journal-title":"IBM J. Res. Dev."},{"key":"183_CR4","unstructured":"Reis, G.A., Chang, J., August, D.I., Cohn, R., Mukherjee, S.S.: Configurable transient fault detection via dynamic binary translation. In: Proceedings of the 2nd Workshop on Architectural Reliability (2006)"},{"key":"183_CR5","doi-asserted-by":"crossref","DOI":"10.1002\/0471728527","volume-title":"CMOS Electronics: How It Works, How It Fails","author":"J. Segura","year":"2004","unstructured":"Segura J., Hawkins C.F.: CMOS Electronics: How It Works, How It Fails. Wiley-IEEE Press, New York (2004)"},{"key":"183_CR6","unstructured":"Baumann, R.C.: Soft errors in commercial semiconductor technology: overview and scaling trends. In: IEEE 2002 Reliability Physics Tutorial Notes, Reliability Fundamentals, pp. 121_01.1\u2013121_01.14 (2002)"},{"issue":"3","key":"183_CR7","doi-asserted-by":"crossref","first-page":"329","DOI":"10.1109\/TDMR.2005.855685","volume":"5","author":"S.E. Michalak","year":"2005","unstructured":"Michalak S.E., Harris K.W., Hengartner N.W., Takala B.E., Wender S.A.: Predicting the number of fatal soft errors in Los Alamos national labratory\u2019s ASC Q computer. IEEE Trans. Device Mater. Reliab. 5(3), 329\u2013335 (2005)","journal-title":"IEEE Trans. Device Mater. Reliab."},{"issue":"2","key":"183_CR8","doi-asserted-by":"crossref","first-page":"160","DOI":"10.1109\/12.2145","volume":"37","author":"A. Mahmood","year":"1988","unstructured":"Mahmood A., McCluskey E.J.: Concurrent error detection using watchdog processors\u2014a survey. IEEE Trans. Comput. 37(2), 160\u2013174 (1988)","journal-title":"IEEE Trans. Comput."},{"key":"183_CR9","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1109\/40.755464","volume":"19","author":"T.J. Slegel","year":"1999","unstructured":"Slegel T.J., Averill R.M. III, Check M.A., Giamei B.C., Krumm B.W., Krygowski C.A., Li W.H., Liptay J.S., MacDougall J.D., McPherson T.J., Navarro J.A., Schwarz E.M., Shum K., Webb C.F.: IBM\u2019s S\/390 G5 microprocessor design. IEEE Micro 19, 12\u201323 (1999)","journal-title":"IEEE Micro"},{"key":"183_CR10","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1109\/AERO.1996.495891","volume":"1","author":"Y. Yeh","year":"1996","unstructured":"Yeh Y.: Triple-triple redundant 777 primary flight computer. Proc. IEEE Aeros. Appl. Conf. 1, 293\u2013307 (1996)","journal-title":"Proc. IEEE Aeros. Appl. Conf."},{"key":"183_CR11","doi-asserted-by":"crossref","unstructured":"Yeh, Y.: Design considerations in Boeing 777 fly-by-wire computers. In: Proceedings of the Third IEEE International High-Assurance Systems Engineering Symposium, pp. 64\u201372 (November 1998)","DOI":"10.1109\/HASE.1998.731596"},{"key":"183_CR12","doi-asserted-by":"crossref","unstructured":"Horst, R.W., Harris, R.L., Jardine, R.L.: Multiple instruction issue in the nonstop cyclone processor. In: Proceedings of the 17th International Symposium on Computer Architecture, pp. 216\u2013226 (May 1990)","DOI":"10.1145\/325096.325147"},{"key":"183_CR13","doi-asserted-by":"crossref","unstructured":"Ando, H., Yoshida, Y., Inoue, A., Sugiyama, I., Asakawa, T., Morita, K., Muta, T., Motokurumada, T., Okada, S., Yamashita, H., Satsukawa, Y., Konmoto, A., Yamashita, R., Sugiyama, H.: A 1.3GHz Fifth Generation SPARC64 Microprocessor. International Solid-State Circuits Conference (2003)","DOI":"10.1145\/776008.776010"},{"key":"183_CR14","doi-asserted-by":"crossref","unstructured":"Reinhardt, S.K., Mukherjee, S.S.: Transient fault detection via simultaneous multithreading. In: Proceedings of the 27th Annual International Symposium on Computer Architecture, pp. 25\u201336, ACM Press (2000)","DOI":"10.1145\/339647.339652"},{"key":"183_CR15","doi-asserted-by":"crossref","unstructured":"Wang, C., Kim, H.-S., Wu, Y., Ying, V.: Compiler-managed software-based redundant multi-threading for transient fault detection. In: CGO \u201907: Proceedings of the International Symposium on Code Generation and Optimization, pp. 244\u2013258, IEEE Computer Society, Washington, DC, USA (2007)","DOI":"10.1109\/CGO.2007.7"},{"key":"183_CR16","unstructured":"Reis, G.A., Chang, J., Vachharajani, N., Rangan, R., August, D.I.: SWIFT: software implemented fault tolerance. In: Proceedings of the 3rd International Symposium on Code Generation and Optimization (March 2005)"},{"key":"183_CR17","doi-asserted-by":"crossref","unstructured":"Shye, A., Moseley, T., Reddi, V.J., Blomstedt, J., Connors, D.A.: Using process-level redundancy to exploit multiple cores for transient fault tolerance. In: International Conference on Dependable Systems and Networks, IEEE Computer Society, Los Alamitos, CA, USA (2007)","DOI":"10.1109\/DSN.2007.98"},{"key":"183_CR18","doi-asserted-by":"crossref","unstructured":"Rotenberg, E.: AR-SMT: A microarchitectural approach to fault tolerance in microprocessors. In: Proceedings of the Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing, p. 84, IEEE Computer Society (1999)","DOI":"10.1109\/FTCS.1999.781037"},{"issue":"2","key":"183_CR19","doi-asserted-by":"crossref","first-page":"99","DOI":"10.1145\/545214.545227","volume":"30","author":"S.S. Mukherjee","year":"2002","unstructured":"Mukherjee S.S., Kontz M., Reinhardt S.K.: Detailed design and evaluation of redundant multithreading alternatives. SIGARCH Comput. Archit. News 30(2), 99\u2013110 (2002)","journal-title":"SIGARCH Comput. Archit. News"},{"key":"183_CR20","doi-asserted-by":"crossref","unstructured":"Weaver, C., Emer, J., Mukherjee, S.S., Reinhardt, S.K.: Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor. In: Proceedings of the 31st Annual International Symposium on Computer Architecture (2004)","DOI":"10.1145\/1028176.1006723"},{"key":"183_CR21","doi-asserted-by":"crossref","unstructured":"Vijaykumar, T.N., Pomeranz, I., Cheng, K.: Transient-fault recovery using simultaneous multithreading. In: The 29th Annual International Symposium on Computer Architecture, pp. 87\u201398, IEEE Computer Society (2002)","DOI":"10.1145\/545214.545226"},{"key":"183_CR22","doi-asserted-by":"crossref","first-page":"63","DOI":"10.1109\/24.994913","volume":"51","author":"N. Oh","year":"2002","unstructured":"Oh N., Shirvani P.P., McCluskey E.J.: Error detection by duplicated instructions in super-scalar processors. IEEE Trans. Reliab. 51, 63\u201375 (2002)","journal-title":"IEEE Trans. Reliab."},{"key":"183_CR23","doi-asserted-by":"crossref","unstructured":"Gomaa, M., Scarbrough, C., Vijaykumar, T.N., Pomeranz, I.: Transient-fault recovery for chip multiprocessors. In: Proceedings of the 30th annual international symposium on Computer architecture, pp. 98\u2013109. ACM Press (2003)","DOI":"10.1145\/859630.859631"},{"key":"183_CR24","doi-asserted-by":"crossref","unstructured":"Reis, G.A., Chang, J., Vachharajani, N., Rangan, R., August, D.I., Mukherjee, S.S.: Design and evaluation of hybrid fault-detection systems. In: Proceedings of the 32th Annual International Symposium on Computer Architecture, pp. 148\u2013159 (June 2005)","DOI":"10.1145\/1080695.1069983"},{"key":"183_CR25","doi-asserted-by":"crossref","first-page":"1491","DOI":"10.1109\/TSE.1985.231893","volume":"11","author":"A. Avizienis","year":"1985","unstructured":"Avizienis A.: The N-version approach to fault-tolerant software. IEEE Trans. Softw. Eng. 11, 1491\u20131501 (1985)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"183_CR26","doi-asserted-by":"crossref","unstructured":"Berger, E.D., Zorn, B.G.: DieHard: probabilistic memory safety for unsafe languages. In: Proceedings of the ACM SIGPLAN \u201906 Conference on Programming Language Design and Implementation (June 2006)","DOI":"10.1145\/1133981.1134000"},{"issue":"2","key":"183_CR27","doi-asserted-by":"crossref","first-page":"238","DOI":"10.1109\/32.44387","volume":"16","author":"S.S. Brilliant","year":"1990","unstructured":"Brilliant S.S., Knight J.C., Leveson N.G.: Analysis of faults in an N-version software experiment. IEEE Trans. Softw. Eng. 16(2), 238\u2013247 (1990)","journal-title":"IEEE Trans. Softw. Eng."},{"key":"183_CR28","doi-asserted-by":"crossref","unstructured":"Novark, G., Berger, E.D., Zorn, B.G.: Exterminator: automatically correcting memory errors with high probability. In: PLDI \u201907: Proceedings of the 2007 ACM SIGPLAN conference on Programming language design and implementation, pp. 1\u201311. ACM, New York, NY, USA (2007)","DOI":"10.1145\/1250734.1250736"},{"key":"183_CR29","unstructured":"James, W.D., Jr, J.E.L.: A user-level checkpointing library for POSIX threads programs. In: The Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing (1999)"},{"key":"183_CR30","unstructured":"Whisnant, K., Kalbarczyk, Z., Iyer, R.K.: Micro-checkpointing: checkpointing for multithreaded applications. In: Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW), IEEE Computer Society, Washington, DC, USA (2000)"},{"key":"183_CR31","unstructured":"Rieker, M., Ansel, J.: Transparent user-level checkpointing for the native POSIX thread library for Linux. In: International Conference on Parallel and Distributed Processing Techniques and Applications (2006)"},{"key":"183_CR32","doi-asserted-by":"crossref","unstructured":"Vachharajani, N., Rangan, R., Raman, E., Bridges, M.J., Ottoni, G., August, D.I.: Speculative Decoupled Software Pipelining. In: PACT \u201907: Proceedings of the 16th International Conference on Parallel Architecture and Compilation Techniques, pp. 49\u201359. IEEE Computer Society, Washington, DC, USA (2007)","DOI":"10.1109\/PACT.2007.4336199"},{"key":"183_CR33","unstructured":"ISO\/IEC 9899-1999 Programming Languages \u2013 C, Second Edition (1999)"},{"key":"183_CR34","unstructured":"Jablin, T.B., Zhang, Y., Jablin, J.A., Huang, J., Kim, H., August, D.I.: Liberty queues for EPIC architectures. In: Proceedings of the 8th Workshop on Explicitly Parallel Instruction Computing Techniques (April 2010)"},{"key":"183_CR35","doi-asserted-by":"crossref","unstructured":"Lattner, C., Adve, V.: LLVM: A compilation framework for lifelong program analysis & transformation. In: CGO \u201904: Proceedings of the International Symposium on Code Generation and Optimization, p. 75. IEEE Computer Society, Washington, DC, USA (2004)","DOI":"10.1109\/CGO.2004.1281665"},{"key":"183_CR36","doi-asserted-by":"crossref","first-page":"319","DOI":"10.1145\/24039.24041","volume":"9","author":"J. Ferrante","year":"1987","unstructured":"Ferrante J., Ottenstein K.J., Warren J.D.: The program dependence graph and its use in optimization. ACM Trans. Program. Lang. Syst. 9, 319\u2013349 (1987)","journal-title":"ACM Trans. Program. Lang. Syst."},{"key":"183_CR37","doi-asserted-by":"crossref","unstructured":"Ottoni, G., Rangan, R., Stoler, A., August, D.I.: Automatic thread extraction with decoupled software pipelining. In: MICRO \u201905: Proceedings of the 38th Annual IEEE\/ACM International Symposium on Microarchitecture, pp. 105\u2013118, IEEE Computer Society, Washington, DC, USA (2005)","DOI":"10.1109\/MICRO.2005.13"},{"key":"183_CR38","doi-asserted-by":"crossref","unstructured":"Luk, C.-K., Cohn, R., Muth, R., Patil, H., Klauser, A., Lowney, G., Wallace, S., Reddi, V.J., Hazelwood, K.: Pin: building customized program analysis tools with dynamic instrumentation. In: Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation, PLDI \u201905, pp. 190\u2013200. ACM, New York, NY, USA (2005)","DOI":"10.1145\/1064978.1065034"},{"issue":"9","key":"183_CR39","doi-asserted-by":"crossref","first-page":"38","DOI":"10.1145\/1160074.1159809","volume":"41","author":"D. Walker","year":"2006","unstructured":"Walker D., Mackey L., Ligatti J., Reis G.A., August D.I.: Static typing for a faulty lambda calculus. SIGPLAN Not. 41(9), 38\u201349 (2006)","journal-title":"SIGPLAN Not."}],"container-title":["International Journal of Parallel Programming"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10766-011-0183-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10766-011-0183-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10766-011-0183-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,8]],"date-time":"2025-03-08T08:25:19Z","timestamp":1741422319000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10766-011-0183-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,8,7]]},"references-count":39,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2012,2]]}},"alternative-id":["183"],"URL":"https:\/\/doi.org\/10.1007\/s10766-011-0183-4","relation":{},"ISSN":["0885-7458","1573-7640"],"issn-type":[{"value":"0885-7458","type":"print"},{"value":"1573-7640","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,8,7]]}}}