{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,24]],"date-time":"2024-07-24T09:56:55Z","timestamp":1721815015717},"reference-count":10,"publisher":"Springer Science and Business Media LLC","issue":"5","license":[{"start":{"date-parts":[[2005,10,1]],"date-time":"2005-10-01T00:00:00Z","timestamp":1128124800000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2005,10]]},"DOI":"10.1007\/s10836-005-1169-1","type":"journal-article","created":{"date-parts":[[2005,8,25]],"date-time":"2005-08-25T11:04:45Z","timestamp":1124967885000},"page":"551-561","source":"Crossref","is-referenced-by-count":26,"title":["Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories"],"prefix":"10.1007","volume":"21","author":[{"given":"Luigi","family":"Dilillo","sequence":"first","affiliation":[]},{"given":"Patrick","family":"Girard","sequence":"additional","affiliation":[]},{"given":"Serge","family":"Pravossoudovitch","sequence":"additional","affiliation":[]},{"given":"Arnaud","family":"Virazel","sequence":"additional","affiliation":[]},{"given":"Simone","family":"Borri","sequence":"additional","affiliation":[]},{"given":"Magali","family":"Hage-Hassan","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"key":"1169_CR1","unstructured":"R.D. Adams and E.S. Cooley, \u201cAnalysis of a Deceptive Destructive Read Memory Fault Model and Recommended Testing,\u201d Proc. IEEE North Atlantic Test Workshop, 1996."},{"key":"1169_CR2","doi-asserted-by":"crossref","unstructured":"Z. Al-Ars and A.J. van de Goor, \u201cStatic and Dynamic Behavior of Memory Cell Array Opens and Shorts in Embedded DRAMs,\u201d Proc. Design, Automation and Test in Europe, 2001, pp. 496\u2013503.","DOI":"10.1109\/DATE.2001.915069"},{"key":"1169_CR3","doi-asserted-by":"crossref","unstructured":"S. Borri, M. Hage-Hassan, P. Girard, S. Pravossoudovitch, and A. Virazel, \u201cDefect-Oriented Dynamic Fault Models for Embedded-SRAMs,\u201d Proc. IEEE European Test Workshop, 2003, pp. 23\u201328.","DOI":"10.1109\/ETW.2003.1231664"},{"key":"1169_CR4","unstructured":"A.J. van de Goor, \u201cTesting Semiconductor Memories: Theory and Practice,\u201d COMTEX Publishing, Gouda, The Netherlands, 1998."},{"key":"1169_CR5","doi-asserted-by":"crossref","unstructured":"A.J. van de Goor and Z. Al-Ars, \u201cFunctional Memory Faults: A Formal Notation and a Taxonomy,\u201d Proc. IEEE VLSI Test Symposium, May 2000, pp. 281\u2013289.","DOI":"10.1109\/VTEST.2000.843856"},{"key":"1169_CR6","doi-asserted-by":"crossref","unstructured":"S. Hamdioui, Z Al-Ars, and A.J. van de Goor, \u201cTesting Static and Dynamic Faults in Random Access Memories,\u201d Proc. IEEE VLSI Test Symposium, 2002, pp. 395\u2013400.","DOI":"10.1109\/VTS.2002.1011170"},{"key":"1169_CR7","doi-asserted-by":"crossref","unstructured":"S. Hamdioui, R. Wadsworth, J.D. Reyes, and A.J. van de Goor, \u201cImportance of Dynamic Faults for New SRAM Technologies,\u201d Proc. IEEE European Test Workshop, 2003, pp. 29\u201334.","DOI":"10.1109\/ETW.2003.1231665"},{"key":"1169_CR8","unstructured":"M. Marinescu, \u201cSimple and Efficient Algorithms for Functional RAM Testing,\u201d Proc. Int. Test Conf., 1982, pp. 236\u2013239."},{"key":"1169_CR9","doi-asserted-by":"crossref","unstructured":"D. Niggemeyer, M. Redeker and J. Otterstedt, \u201cIntegration of Non-classical Faults in Standard March Tests,\u201d Records of the IEEE Int. Workshop on Memory Technology, Design and Testing, 1998, pp. 91\u201396.","DOI":"10.1109\/MTDT.1998.705953"},{"key":"1169_CR10","unstructured":"Semiconductor Industry Association (SIA), \u201cInternational Technology Roadmap for Semiconductors (ITRS),\u201d http:\/\/www.sia-online.org\/home.cfm, 2003 Edition."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-1169-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-005-1169-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-1169-1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T01:57:39Z","timestamp":1559267859000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-005-1169-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,10]]},"references-count":10,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2005,10]]}},"alternative-id":["1169"],"URL":"https:\/\/doi.org\/10.1007\/s10836-005-1169-1","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2005,10]]}}}