{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,5]],"date-time":"2025-01-05T18:40:21Z","timestamp":1736102421674,"version":"3.32.0"},"reference-count":21,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2005,12,1]],"date-time":"2005-12-01T00:00:00Z","timestamp":1133395200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2005,12]]},"DOI":"10.1007\/s10836-005-3735-y","type":"journal-article","created":{"date-parts":[[2005,11,17]],"date-time":"2005-11-17T18:29:36Z","timestamp":1132252176000},"page":"571-581","source":"Crossref","is-referenced-by-count":13,"title":["Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit"],"prefix":"10.1007","volume":"21","author":[{"given":"Jee-Youl","family":"Ryu","sequence":"first","affiliation":[]},{"given":"Bruce C.","family":"Kim","sequence":"additional","affiliation":[]}],"member":"297","reference":[{"doi-asserted-by":"crossref","unstructured":"A.J. Bishop and A. Ivanov, \u201cOn the Testability of CMOS Feedback Amplifiers,\u201d IEEE Proceedings, pp. 65\u201373, 1994.","key":"3735_CR1","DOI":"10.1109\/DFTVS.1994.630015"},{"key":"3735_CR2","first-page":"31","volume-title":"Mathematical Methods in The Physical Sciences","author":"M.L. Boas","year":"1984","unstructured":"M.L. Boas, Mathematical Methods in The Physical Sciences, 2nd Edition, New York: John Wiley & Sons, 1984, pp. 31\u201332.","edition":"2"},{"doi-asserted-by":"crossref","unstructured":"K.C. Craig, S.P. Case, R.E. Neese, and C.D. DePriest, \u201cCurrent and Future Trusting in Automated RF and Microwave Testing,\u201d IEEE Proceedings, pp. 183\u2013186, 1994.","key":"3735_CR3","DOI":"10.1109\/AUTEST.1994.381512"},{"doi-asserted-by":"crossref","unstructured":"J. Dabrowski, \u201cBiST Model for IC RF-Transceiver Front-End,\u201d 2003 Proceedings of the 18th IEEE International Symposium on DEFECT and FAULT TOLERANCE in VLSI SYSTEMS, pp. 295\u2013302, 2003.","key":"3735_CR4","DOI":"10.1109\/DFTVS.2003.1250124"},{"unstructured":"A. Fathy, V. Pendrick, G. Ayers, B. Geller, Y. Narayan, B. Thaler, H. D. Chen, M. J. Liberators, J. Prokop, K. L. Choi, and M. Swaminathan, \u201cDesign of Embedded Passive Component in LTCC-M Technology,\u201d IEEE MTT-S Digest, pp. 1281\u20131284, 1998.","key":"3735_CR5"},{"key":"3735_CR6","first-page":"212","volume-title":"Microwave Transistor Amplifiers: Analysis and Design","author":"G. Gonzalez","year":"1997","unstructured":"G. Gonzalez, Microwave Transistor Amplifiers: Analysis and Design 2nd Edition, New Jersey: Prentice Hall, 1997, pp. 212\u2013293.","edition":"2"},{"unstructured":"Gray, Hurst, Lewis, and Meyer, Analog and Design of Analog Integrated Circuits 4th Edition, New York: John Wiley & Sons, Inc., 2001.","key":"3735_CR7"},{"unstructured":"Z.H. Liu, \u201cMixed-Signal Testing of Integrated Analog Circuits and Electronic Modules,\u201d PhD thesis, Ohio University, 1999.","key":"3735_CR8"},{"doi-asserted-by":"crossref","unstructured":"D. Lupea, U. Pursche, and H. -J. Jentschel, \u201cRF-BIST: Loopback Spectral Signature Analysis,\u201d in IEEE Proceedings of the 2003 Design, Automation and Test in Europe Conference and Exhibition, 2003, pp. 478\u2013483.","key":"3735_CR9","DOI":"10.1109\/DATE.2003.1253655"},{"doi-asserted-by":"crossref","unstructured":"D. Lupea, U. Pursche, and H. -J. Jentschel, \u201cSpectral Signature Analysis-BIST for RF Front-Ends,\u201d Advances in Radio Science, pp. 155\u2013160, 2003.","key":"3735_CR10","DOI":"10.5194\/ars-1-155-2003"},{"issue":"1","key":"3735_CR11","doi-asserted-by":"crossref","first-page":"65","DOI":"10.1109\/4.350192","volume":"30","author":"R.G. Meyer","year":"1995","unstructured":"R.G. Meyer, \u201cLow-Power Monolithic RF Peak Detector Analysis,\u201d IEEE J. of Solid-State Circuits, vol. 30, no. 1, pp. 65\u201367, 1995.","journal-title":"IEEE J. of Solid-State Circuits"},{"doi-asserted-by":"crossref","unstructured":"W.A. Pleskacz, D. Kasprowicz, T. Oleszczak, and W. Kuzmicz, \u201cCMOS Standard Cells Characterization for Defect Based Testing,\u201d in IEEE International Symposium on DFT in VLSI Systems, 2001, pp. 384\u2013392.","key":"3735_CR12","DOI":"10.1109\/DFTVS.2001.966792"},{"key":"3735_CR13","first-page":"11","volume-title":"RF Microelectronics","author":"B. Razavi","year":"1998","unstructured":"B. Razavi, RF Microelectronics, New Jersey: Prentice Hall, 1998, pp. 11\u201353."},{"unstructured":"J.-Y. Ryu, and B.C. Kim, \u201cA New BIST Scheme for 5 GHz Low Noise Amplifiers,\u201d in 9th IEEE European Test Symposium 2004, submitted.","key":"3735_CR14"},{"unstructured":"J.Y. Ryu and B.C. Kim, \u201cA New Design for Built-In Self-Test of 5 GHz Low Noise Amplifiers,\u201d Proceedings of IEEE International System-On-Chip Conference, 2004, pp. 324\u2013327.","key":"3735_CR15"},{"unstructured":"J.-Y. Ryu, B.C. Kim, S.-T. Kim, and V. Varadarajan \u201cNovel Defect Testing of RF Front End Using Input Matching Measurement,\u201d 9th IEEE International Mixed-Signal Testing Workshop, vol. 9, pp. 31\u201334, 2003.","key":"3735_CR16"},{"doi-asserted-by":"crossref","unstructured":"M. Soma, \u201cChallenges and Approaches in Mixed Signal RF Testing,\u201d IEEE Proceedings, pp. 33\u201337, 1997.","key":"3735_CR17","DOI":"10.1109\/ASIC.1997.616973"},{"issue":"4","key":"3735_CR18","doi-asserted-by":"crossref","first-page":"137","DOI":"10.1109\/16.915712","volume":"48","author":"E.P. Vandamme","year":"2001","unstructured":"E.P. Vandamme, M.P. Schreurs, and C. van Dinther, \u201cImproved Three-Step De-Embedding Method to Accurately Account for the Influence of Pad Parasitics in Silicon On-Wafer RF Test-Structures,\u201d IEEE Tran. Electronic Devices, vol. 48, no. 4, pp. 137\u2013142, 2001.","journal-title":"IEEE Tran. Electronic Devices"},{"doi-asserted-by":"crossref","unstructured":"B.R. Veillette and G.W. Roberts, \u201cA Built-in Self-Test Strategy for Wireless Communication Systems,\u201d in Proceedings of the 1995 International Test Conference, 1995, pp. 930\u2013939.","key":"3735_CR19","DOI":"10.1109\/TEST.1995.529939"},{"doi-asserted-by":"crossref","unstructured":"R. Voorakaranam, S. Cherubal, and A. Chatterjee, \u201cA Signature Test Framework for Rapid Production Testing of RF Circuits,\u201d in Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition, March 2003, pp. 186\u2013191.","key":"3735_CR20","DOI":"10.1109\/DATE.2002.998268"},{"issue":"9","key":"3735_CR21","doi-asserted-by":"crossref","first-page":"695","DOI":"10.1049\/el:19940472","volume":"30","author":"S. Yu","year":"1994","unstructured":"S. Yu, B.W. Jervis, K.R. Eckersall, I.M. Bell, A.G. Hall, and G.E. Taylor, \u201cNeural Network Approach to Fault Diagnosis in CMOS Opamp with Gate Oxide Short,\u201d Electronics Letters, vol. 30, no. 9, pp. 695\u2013696, 1994.","journal-title":"Electronics Letters"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-3735-y.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-005-3735-y\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-3735-y","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,5]],"date-time":"2025-01-05T18:17:38Z","timestamp":1736101058000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-005-3735-y"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,12]]},"references-count":21,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2005,12]]}},"alternative-id":["3735"],"URL":"https:\/\/doi.org\/10.1007\/s10836-005-3735-y","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2005,12]]}}}