{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T15:21:57Z","timestamp":1759332117097,"version":"3.32.0"},"reference-count":22,"publisher":"Springer Science and Business Media LLC","issue":"3","license":[{"start":{"date-parts":[[2005,6,1]],"date-time":"2005-06-01T00:00:00Z","timestamp":1117584000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2005,6]]},"DOI":"10.1007\/s10836-005-6361-9","type":"journal-article","created":{"date-parts":[[2005,4,6]],"date-time":"2005-04-06T14:47:17Z","timestamp":1112798837000},"page":"323-339","source":"Crossref","is-referenced-by-count":33,"title":["Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications"],"prefix":"10.1007","volume":"21","author":[{"given":"Soumendu","family":"Bhattacharya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Achintya","family":"Halder","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ganesh","family":"Srinivasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","reference":[{"key":"CR1","unstructured":"?Agilent 84000 RFIC Series Test Systems?Product Overview,? Agilent Technologies."},{"key":"CR2","unstructured":"Autocorrelation?from Mathworld, website: http:\/\/mathworld.wolfram.com\/Autocorrelation.html."},{"key":"CR3","doi-asserted-by":"crossref","unstructured":"J.E., Jr. Dennis, and Robert B. Schnabel, ?Numerical Methods for Unconstrained Optimization and Nonlinear Equations,? Society for Industrial & Applied Mathematics, 1996.","DOI":"10.1137\/1.9781611971200"},{"key":"CR4","unstructured":"N. Despande, et al., ?ACPR Specs Place Demands on WCDMA Base-Station Amplifiers,? Wireless Systems Design Magazine, pp. 15?22, August 1999."},{"issue":"1","key":"CR5","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1214\/aos\/1176347963","volume":"19","author":"J.H. Friedman","year":"1991","unstructured":"J.H. Friedman, ?Multivariate Adaptive Regression Splines,? The Annals of Statistics, vol. 19, no. 1, pp. 1-141, 1991.","journal-title":"The Annals of Statistics"},{"key":"CR6","doi-asserted-by":"crossref","unstructured":"M. Jarwala, D. Le, and M.S. Heutmaker, ?End-to-End Test Strategy for Wireless Systems,? in Intl. Test Conference, 1995, pp. 940?946.","DOI":"10.1109\/TEST.1995.529940"},{"issue":"9","key":"CR7","doi-asserted-by":"crossref","first-page":"1298","DOI":"10.1109\/4.782091","volume":"34","author":"K.S. Kundert","year":"1999","unstructured":"K.S. Kundert, ?Introduction to RF Simulation and Its Application,? IEEE Journal of Solid-state Circuits, vol. 34, no. 9, pp. 1298?1319, 1999.","journal-title":"IEEE Journal of Solid-state Circuits"},{"key":"CR8","unstructured":"T.H. Lee, The Design of CMOS Radio-Frequency Integrated Circuits, Cambridge University Press, 2002, ch. 11?12, ch. 16, pp. 272?340."},{"key":"CR9","doi-asserted-by":"crossref","unstructured":"J. Lukez, ?Novel Techniques for Wideband RF Test,? in Proc. Electronics Manufacturing Tech. Symp., 2002, pp. 423?425.","DOI":"10.1109\/IEMT.2002.1032793"},{"key":"CR10","unstructured":"Neter, et al., ?Applied Linear Statistical Models,? fourth edition, pp. 497?555."},{"key":"CR11","unstructured":"Openbook Cadence Spectre Simulation Handbook, December 1999."},{"key":"CR12","unstructured":"A.V. Oppenheim and R.W. Schafer, ?Discrete-Time Signal Processing,? pp. 63?67."},{"key":"CR13","doi-asserted-by":"crossref","unstructured":"S. Ozev, A. Orailoglu, and H. Haggag, ?Automated Test Development and Test Time Reduction for RF Subsystems,? in IEEE Intl. Symp. on Circuits and Systems, 2002.","DOI":"10.1109\/ISCAS.2002.1009907"},{"key":"CR14","doi-asserted-by":"crossref","unstructured":"S. Ozev, C. Olgaard, and A. Oraioglu, ?Testability Implications in Low-Cost Integrated Radio Tranceivers: A Bluetooth Case Study,? in Proc. Int?l Test Conf., 2001, pp. 965?974.","DOI":"10.1109\/TEST.2001.966721"},{"key":"CR15","first-page":"1","volume-title":"RF Microelectronics","author":"B. Razavi","year":"1998","unstructured":"B. Razavi, RF Microelectronics, Prentice Hall, NJ, 1998, ch. 1-2, pp. 1?53."},{"key":"CR16","doi-asserted-by":"crossref","unstructured":"J.F. Sevic and Joseph Staudinger, ?Simulation of Power Amplifier Adjacent-Channel Power Ratio for Digital Wireless Communication Systems,? Vehicular Technology Conference, 1997 IEEE 47th, vol. 2, pp. 681?685, 1997.","DOI":"10.1109\/VETEC.1997.600415"},{"key":"CR17","doi-asserted-by":"crossref","unstructured":"W. Struble, et al., ?Understanding Linearity in Wireless Communication Amplifiers?, GaAs IC Symposium, pp. 295?298, 1996.","DOI":"10.1109\/GAAS.1996.567893"},{"key":"CR18","doi-asserted-by":"crossref","unstructured":"P.N. Variyam and A. Chatterjee, ?Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements,? in Proc. VLSI Test Symp., 1998, pp. 132?137.","DOI":"10.1109\/VTEST.1998.670860"},{"issue":"3","key":"CR19","doi-asserted-by":"crossref","first-page":"349","DOI":"10.1109\/43.986428","volume":"21","author":"P.N. Variyam","year":"1992","unstructured":"P.N. Variyam, S. Cherubal, and A. Chatterjee, ?Prediction of Analog Performance Parameters Using Fast Transient Testing,? in IEEE Trans. CAD of Integrated Circuits and Sys., vol. 21, no. 3, pp. 349?361, 1992.","journal-title":"IEEE Trans. CAD of Integrated Circuits and Sys."},{"key":"CR20","doi-asserted-by":"crossref","unstructured":"B.R. Veillette and G.W. Roberts, ?A built-in Self-Test Strategy for Wireless Communication Systems,? in Proc. Int?l Test Conf., 1995, pp. 930?939.","DOI":"10.1109\/TEST.1995.529939"},{"key":"CR21","doi-asserted-by":"crossref","unstructured":"R. Voorakaranam and A. Chatterjee, ?Test Generation for Accurate Prediction of Analog Specifications,? in Proc. VLSI Test Symp., 2000, pp. 137?142. J.E.Padgett, et al., ?Overview of Wireless Personal Communication,? IEEE Communications Magazine, pp. 28?41, 1995.","DOI":"10.1109\/VTEST.2000.843837"},{"key":"CR22","unstructured":"J. Zhao, ?Behavioral Modeling of RF Circuits in Spectre,? Cadence White paper, March 5, 1999."}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-6361-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-005-6361-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-005-6361-9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,31]],"date-time":"2024-12-31T01:25:27Z","timestamp":1735608327000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-005-6361-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,6]]},"references-count":22,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2005,6]]}},"alternative-id":["6361"],"URL":"https:\/\/doi.org\/10.1007\/s10836-005-6361-9","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2005,6]]}}}