{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T10:43:40Z","timestamp":1752230620488,"version":"3.32.0"},"reference-count":12,"publisher":"Springer Science and Business Media LLC","issue":"4-6","license":[{"start":{"date-parts":[[2006,12,1]],"date-time":"2006-12-01T00:00:00Z","timestamp":1164931200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2006,12]]},"DOI":"10.1007\/s10836-006-0186-z","type":"journal-article","created":{"date-parts":[[2006,12,7]],"date-time":"2006-12-07T06:04:36Z","timestamp":1165471476000},"page":"351-357","source":"Crossref","is-referenced-by-count":9,"title":["A First Step for an INL Spectral-Based BIST: The Memory Optimization"],"prefix":"10.1007","volume":"22","author":[{"given":"V.","family":"Kerz\u00e9rho","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bernard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Cauvet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. M.","family":"Janik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2006,12,8]]},"reference":[{"issue":"5","key":"10186_CR1","doi-asserted-by":"crossref","first-page":"1050","DOI":"10.1109\/TIM.2002.807795","volume":"51","author":"F. Adamo","year":"Oct. 2002","unstructured":"F. Adamo, F. Attivissimo, N. Giaquinto, and M. Savino, \u201cFFT Test of A\/D Converters to Determine the Integral Nonlinearity,\u201d IEEE Trans. Instrum. Meas., vol. 51, no. 5, pp. 1050\u20131054, Oct. 2002.","journal-title":"IEEE Trans. Instrum. Meas."},{"doi-asserted-by":"crossref","unstructured":"S. Bernard, M. Comte, F. Aza\u00efs, Y. Bertrand, and M. Renovell, \u201cA New Methodology for ADC Test Flow Optimization,\u201d Proc. IEEE International Test Conference, pp. 201\u2013209, 2003.","key":"10186_CR2","DOI":"10.1109\/TEST.2003.1270841"},{"doi-asserted-by":"crossref","unstructured":"N. Csizmadia and A.J.E.M. Janssen, \u201cEstimating the Integral Non-Linearity of AD-Converters via the Frequency Domain,\u201d Proc. IEEE International Test Conference, pp. 757\u2013761, 1999.","key":"10186_CR3","DOI":"10.1109\/TEST.1999.805805"},{"unstructured":"Datasheet of TDA8769 converter: http:\/\/www.nxp.com\/pip\/TDA8769HW_8_C1.html .","key":"10186_CR4"},{"issue":"6","key":"10186_CR5","doi-asserted-by":"crossref","first-page":"820","DOI":"10.1109\/JSSC.1984.1052232","volume":"SC-19","author":"J. Doernberg","year":"1984","unstructured":"J. Doernberg, H.S. Lee, and D.A. Hodges, \u201cFull-Speed Testing of A\/D Converters,\u201d IEEE J. Solid-State Circuits, vol. SC-19, no. 6, pp. 820\u2013827, 1984.","journal-title":"IEEE J. Solid-State Circuits"},{"unstructured":"J.M. Janik, \u201cEstimation of A\/D Converter Nonlinearities from complex Spectrum,\u201d Proc. International Workshop on ADC Modeling and Testing, pp. 8\u201310, September 2003.","key":"10186_CR6"},{"unstructured":"M. Mahoney, \u201cDSP-Based Testing of Analog and Mixed-signal Circuits,\u201d IEEE Computer Society Press, ISBN 0-8186-0785-8, 1987.","key":"10186_CR7"},{"doi-asserted-by":"crossref","unstructured":"S. Max, \u201cFast Accurate and Complete ADC Testing,\u201d Proc IEEE International Test Conference, pp. 111\u2013117, 1989.","key":"10186_CR8","DOI":"10.1109\/TEST.1989.82284"},{"unstructured":"G. Prenat, S. Mir, D. Vasquez, L. Rolindez, \u201cA Low-Cost Digital Frequency Testing Approach for Mixed-Signal Devices Using \u03c3\u0394 Modulation\u201d, Proc. IEEE International Mixed Signal Testing Workshop, pp. 1080\u20131090, 2004.","key":"10186_CR9"},{"doi-asserted-by":"crossref","unstructured":"S.K. Sunter and N. Nagi, \u201cA Simplified Polynomial-fitting Algorithm for DAC and ADC BIST,\u201d Proc. IEEE International Test Conference, pp. 389\u2013395, 1997.","key":"10186_CR10","DOI":"10.1109\/TEST.1997.639641"},{"doi-asserted-by":"crossref","unstructured":"D. Vasquez, G. Leger, G. Huertas, A. Rueda, and J.L. Huerteas, \u201cA Method for Parameter Extraction of Analog Sine-wave Signals for Mixed-signal Built-in-Self-Test Applications,\u201d Proc. IEEE Design, Automation and Test in Europe Conference, pp, 298\u2013303, 2004.","key":"10186_CR11","DOI":"10.1109\/DATE.2004.1268864"},{"unstructured":"F. Xu, \u201cA New Approach for the Nonlinearity Test of ADCs\/DACs and its application for BIST,\u201d Proc. IEEE European Test Workshop, pp. 34\u201339, 1999.","key":"10186_CR12"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-006-0186-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-006-0186-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-006-0186-z","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,12]],"date-time":"2025-01-12T07:33:11Z","timestamp":1736667191000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-006-0186-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,12]]},"references-count":12,"journal-issue":{"issue":"4-6","published-print":{"date-parts":[[2006,12]]}},"alternative-id":["10186"],"URL":"https:\/\/doi.org\/10.1007\/s10836-006-0186-z","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2006,12]]}}}