{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,13]],"date-time":"2025-01-13T11:40:03Z","timestamp":1736768403797,"version":"3.32.0"},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2007,2,1]],"date-time":"2007-02-01T00:00:00Z","timestamp":1170288000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2007,2]]},"DOI":"10.1007\/s10836-006-9524-4","type":"journal-article","created":{"date-parts":[[2007,2,3]],"date-time":"2007-02-03T07:18:09Z","timestamp":1170487089000},"page":"35-45","source":"Crossref","is-referenced-by-count":0,"title":["Isolation of Failing Scan Cells through Convolutional Test Response Compaction"],"prefix":"10.1007","volume":"23","author":[{"given":"Grzegorz","family":"Mrugalski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Rajski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chen","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Artur","family":"Pogiel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jerzy","family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2007,2,6]]},"reference":[{"key":"9524_CR1","doi-asserted-by":"crossref","unstructured":"I. Bayraktaroglu and A. Orailoglu, \u201cDeterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST,\u201d Proc. ITC, 2000, pp. 273\u2013282.","DOI":"10.1109\/TEST.2000.894215"},{"key":"9524_CR2","doi-asserted-by":"crossref","unstructured":"S. Edirisooriya and G. Edirisooriya, \u201cDiagnosis of Scan Path Failures,\u201d Proc. VTS., 1995, pp. 250\u2013255.","DOI":"10.1109\/VTEST.1995.512645"},{"key":"9524_CR3","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-3552-9","volume-title":"Discrete-Event Simulation","author":"G.S. Fishman","year":"2001","unstructured":"G.S. Fishman, Discrete-Event Simulation, New York: Springer, Berlin Heidelberg New York, 2001."},{"key":"9524_CR4","doi-asserted-by":"crossref","unstructured":"J. Ghosh-Dastidar and N.A. Touba, \u201cA Rapid and Scalable Diagnosis Scheme for BIST Environments with a Large Number of Scan Chains,\u201d Proc. VTS., 2000, pp. 79\u201385.","DOI":"10.1109\/VTEST.2000.843830"},{"key":"9524_CR5","unstructured":"R. Guo and S. Venkataraman, \u201cA Technique for Fault Diagnosis of Defects in Scan Chains,\u201d Proc. ITC, 2001, pp. 268\u2013277."},{"issue":"9","key":"9524_CR6","doi-asserted-by":"crossref","first-page":"1035","DOI":"10.1109\/12.241593","volume":"42","author":"M.G. Karpovsky","year":"1993","unstructured":"M.G. Karpovsky and S.M. Chaudhry, \u201cDesign of Self-Diagnostic Boards by Multiple Signature Analysis,\u201d IEEE Transactions on Computers, vol. 42, no.9, 1993, pp. 1035\u20131044.","journal-title":"IEEE Transactions on Computers"},{"key":"9524_CR7","doi-asserted-by":"crossref","unstructured":"S. Kundu, \u201cOn Diagnosis of Faults in a Scan-Chain,\u201d Proc. VTS., 1993, pp. 303\u2013308.","DOI":"10.1109\/VTEST.1993.313363"},{"issue":"10","key":"9524_CR8","doi-asserted-by":"crossref","first-page":"1447","DOI":"10.1109\/TCAD.2004.833620","volume":"23","author":"C. Liu","year":"2004","unstructured":"C. Liu and K. Chakrabarty, \u201cIdentification of Error-Capturing Scan Cells in Scan-BIST with Applications to System-On-Chip,\u201d IEEE Transactions on CAD, vol. 23, no.10, 2004, pp. 1447\u20131459.","journal-title":"IEEE Transactions, CAD"},{"key":"9524_CR9","doi-asserted-by":"crossref","unstructured":"G. Mrugalski, A. Pogiel, J. Rajski, J. Tyszer, and C. Wang, \u201cConvolutional Compaction-Driven Diagnosis of Scan Failures,\u201d Proc. ETS, 2005, pp. 176\u2013181.","DOI":"10.1109\/ETS.2005.11"},{"key":"9524_CR10","doi-asserted-by":"crossref","unstructured":"G. Mrugalski, A. Pogiel, J. Rajski, J. Tyszer, and C. Wang, \u201cFault Diagnosis in Designs with Convolutional Compactors,\u201d Proc. ITC, 2004, pp. 98\u2013507.","DOI":"10.1109\/TEST.2004.1386986"},{"key":"9524_CR11","unstructured":"G. Mrugalski, A. Pogiel, J. Rajski, J. Tyszer, and C. Wang, \u201cFault Diagnosis in Designs with Convolutional Compactors,\u201d US patent application, 2004."},{"key":"9524_CR12","doi-asserted-by":"crossref","unstructured":"S. Narayanan and A. Das \u201cAn Efficient Scheme to Diagnose Scan Chains,\u201d Proc. ITC, 1997, pp. 704\u2013713.","DOI":"10.1109\/TEST.1997.639683"},{"issue":"7","key":"9524_CR13","doi-asserted-by":"crossref","first-page":"724","DOI":"10.1109\/12.780879","volume":"48","author":"J. Rajski","year":"1999","unstructured":"J. Rajski and J. Tyszer, \u201cDiagnosis of Scan Cells in BIST Environment,\u201d IEEE Transactions on Computers, vol. 48, No. 7, 1999, pp. 724\u2013731.","journal-title":"IEEE Transactions on Computers"},{"issue":"5","key":"9524_CR14","doi-asserted-by":"crossref","first-page":"776","DOI":"10.1109\/TCAD.2004.826558","volume":"23","author":"J. Rajski","year":"2004","unstructured":"J. Rajski, J. Tyszer, M. Kassab, and N. Mukherjee, \u201cEmbedded Deterministic Test,\u201d IEEE Transactions on CAD, vol. 23, no.5, 2004, pp. 776\u2013792.","journal-title":"IEEE Transactions, CAD"},{"key":"9524_CR15","doi-asserted-by":"crossref","unstructured":"J. Rajski, J. Tyszer, C. Wang, and S. Reddy, \u201cConvolutional Compaction of Test Responses,\u201d Proc. ITC, 2003, pp. 745\u2013754.","DOI":"10.1109\/TEST.2003.1270904"},{"key":"9524_CR16","doi-asserted-by":"crossref","unstructured":"C.E. Stroud and T. Damarla, \u201cImproving the Efficiency of Error Identification via Signature Analysis,\u201d Proc. VTS., 1995, pp. 244\u2013249.","DOI":"10.1109\/VTEST.1995.512644"},{"key":"9524_CR17","doi-asserted-by":"crossref","unstructured":"R.C. Tekumalla, \u201cOn Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures,\u201d Proc. ITC, 2003, pp. 737\u2013744.","DOI":"10.1109\/TEST.2003.1270903"},{"key":"9524_CR18","unstructured":"J.A. Waicukauski, V.P. Gupta, and S.T. Patel, \u201cDiagnosis of BIST Failures by PPSFP Simulation,\u201d Proc. ITC, 1987, pp. 480\u2013484."},{"key":"9524_CR19","doi-asserted-by":"crossref","unstructured":"J.A. Waicukauski and E. Lindbloom, \u201cFailure Diagnosis of Structured VLSI,\u201d IEEE Design and Test of Computers, 1989, pp. 49\u201360.","DOI":"10.1109\/54.32421"},{"issue":"2","key":"9524_CR20","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1109\/43.743733","volume":"18","author":"Y. Wu","year":"1999","unstructured":"Y. Wu and S. Adham, \u201cScan-Based BIST Fault Diagnosis,\u201d IEEE Transactions on CAD, vol. 18, no. 2, 1999, pp. 203\u2013211.","journal-title":"IEEE Transactions, CAD"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-006-9524-4.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-006-9524-4\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-006-9524-4","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,13]],"date-time":"2025-01-13T10:40:58Z","timestamp":1736764858000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-006-9524-4"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,2]]},"references-count":20,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2007,2]]}},"alternative-id":["9524"],"URL":"https:\/\/doi.org\/10.1007\/s10836-006-9524-4","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2007,2]]}}}