{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,21]],"date-time":"2025-01-21T14:40:04Z","timestamp":1737470404536,"version":"3.33.0"},"reference-count":16,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2007,10,10]],"date-time":"2007-10-10T00:00:00Z","timestamp":1191974400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2007,12,3]]},"DOI":"10.1007\/s10836-007-5010-x","type":"journal-article","created":{"date-parts":[[2007,10,9]],"date-time":"2007-10-09T18:35:30Z","timestamp":1191954930000},"page":"549-558","source":"Crossref","is-referenced-by-count":3,"title":["Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST"],"prefix":"10.1007","volume":"23","author":[{"given":"Hsin-Wen","family":"Ting","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng-Wu","family":"Lin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bin-Da","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Soon-Jyh","family":"Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2007,10,10]]},"reference":[{"key":"5010_CR1","doi-asserted-by":"crossref","unstructured":"Azais F, Bernard S, Bertrand Y, Renovell M (2000) Towards an ADC BIST scheme using the histogram test technique. Proc IEEE European Test Workshop, pp 53\u201358, May","DOI":"10.1109\/ETW.2000.873779"},{"key":"5010_CR2","volume-title":"CMOS mixed-signal circuit design","author":"RJ Baker","year":"2002","unstructured":"Baker RJ (2002) CMOS Mixed-Signal Circuit Design. IEEE Press, New York"},{"key":"5010_CR3","volume-title":"An introduction to mixed-signal IC test and measurement","author":"M Burns","year":"2001","unstructured":"Burns M, Roberts GW (2001) An Introduction to Mixed-Signal IC Test and Measurement. Oxford, New York"},{"key":"5010_CR4","doi-asserted-by":"crossref","unstructured":"Huang JL, Ong CK, Cheng KT (2000) A BIST scheme for on-chip ADC and DAC testing. Proceedings of Design and Automation Conference, Europe, pp 216\u2013220, Mar","DOI":"10.1145\/343647.343762"},{"key":"5010_CR5","doi-asserted-by":"crossref","first-page":"627","DOI":"10.1109\/TCSII.2003.816932","volume":"50","author":"K Ishida","year":"2003","unstructured":"Ishida K, Fujishima M (2003) Chopper-stabilized high-pass sigma delta modulator utilizing a resonator structure. IEEE Trans Circuits Syst II 50:627\u2013631 (Sep)","journal-title":"IEEE Trans Circuits Syst II"},{"key":"5010_CR6","doi-asserted-by":"crossref","first-page":"1188","DOI":"10.1109\/TIM.2005.847240","volume":"54","author":"L Jin","year":"2006","unstructured":"Jin L, Parthasarathy K, Kuyel T, Chen D, Geiger RL (2006) Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans Instrum Meas 54:1188\u20131199 (June)","journal-title":"IEEE Trans Instrum Meas"},{"key":"5010_CR7","doi-asserted-by":"crossref","first-page":"233","DOI":"10.1109\/82.224314","volume":"40","author":"DA Johns","year":"1993","unstructured":"Johns DA, Lewis DM (1993) Design and analysis of delta\u2013sigma based IIR Filters. IEEE Trans Circuits Syst II 40:233\u2013240 (Apr)","journal-title":"IEEE Trans Circuits Syst II"},{"key":"5010_CR8","doi-asserted-by":"crossref","unstructured":"Lee KJ, Chang SJ, Tzeng RS (2003) A sigma\u2013delta modulation based BIST scheme for A\/D converters. Proc IEEE Asia Test Symp 124\u2013127 (Dec)","DOI":"10.1109\/ATS.2003.1250796"},{"key":"5010_CR9","doi-asserted-by":"crossref","first-page":"437","DOI":"10.1109\/82.298375","volume":"41","author":"AK Lu","year":"1994","unstructured":"Lu AK, Roberts GW, Jones DA (1994) A high-quality analog oscillator using oversampling D\/A conversion techniques. IEEE Trans Circuits Syst II 41:437\u2013444 (July)","journal-title":"IEEE Trans Circuits Syst II"},{"key":"5010_CR10","volume-title":"Discrete-time signal processing","author":"AV Oppenheim","year":"1999","unstructured":"Oppenheim AV, Schafer RW (1999) Discrete-time signal processing. Prentice-Hall, Englewood Cliffs, NJ"},{"key":"5010_CR11","volume-title":"Design of analog filters","author":"R Schaumann","year":"2001","unstructured":"Schaumann R, Valkenburg MV (2001) Design of analog filters. Oxford, New York"},{"key":"5010_CR12","doi-asserted-by":"crossref","first-page":"737","DOI":"10.1049\/el:20010542","volume":"37","author":"J Silva","year":"2001","unstructured":"Silva J, Moon U, Steensgaard J, Temes GC (2001) Wideband low-distortion delta\u2013sigma ADC topology. Electron Let 37:737\u2013738 (June)","journal-title":"Electron Let"},{"key":"5010_CR13","unstructured":"Ting HW, Liu BD, Chang SJ (2004) A time domain built-in self-test methodology for SNDR and ENOB tests of analog-to-digital converters. Proceedings of the IEEE Asia Test Symposium, pp 52\u201357, Nov"},{"key":"5010_CR14","unstructured":"Ting HW, Liu BD, Chang SJ (2004) An on-chip concurrent high frequency analog and digital sinusoidal signal generator. Proceedings of the IEEE Asia-Pacific Conference on Circuits and Systems, pp 173\u2013176, Dec"},{"key":"5010_CR15","doi-asserted-by":"crossref","unstructured":"Ting HW, Lin CW, Liu BD, Chang SJ (2005) Reconstructive oscillator based sinusoidal signal generator for ADC BIST. Proceedings of the IEEE Asia Solid-State Circuits Conference, pp 65\u201368, Nov","DOI":"10.1109\/ASSCC.2005.251808"},{"key":"5010_CR16","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1002\/(SICI)1097-007X(199709\/10)25:5<407::AID-CTA981>3.0.CO;2-B","volume":"25","author":"BR Veillette","year":"1998","unstructured":"Veillette BR, Roberts GW (1998) Delta-sigma oscillators: versatile building blocks. Int J Circuit Theory Appl 25:407\u2013418 (Dec)","journal-title":"Int J Circuit Theory Appl"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5010-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-007-5010-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5010-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,21]],"date-time":"2025-01-21T14:22:21Z","timestamp":1737469341000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-007-5010-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,10,10]]},"references-count":16,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2007,12,3]]}},"alternative-id":["5010"],"URL":"https:\/\/doi.org\/10.1007\/s10836-007-5010-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2007,10,10]]}}}