{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,22]],"date-time":"2025-01-22T07:40:03Z","timestamp":1737531603886,"version":"3.33.0"},"reference-count":5,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2007,11,13]],"date-time":"2007-11-13T00:00:00Z","timestamp":1194912000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2007,12,3]]},"DOI":"10.1007\/s10836-007-5011-9","type":"journal-article","created":{"date-parts":[[2007,11,12]],"date-time":"2007-11-12T13:23:11Z","timestamp":1194873791000},"page":"559-567","source":"Crossref","is-referenced-by-count":0,"title":["A Design-Based Structural Test Method for a Switched-Resistor DAC"],"prefix":"10.1007","volume":"23","author":[{"given":"Lei","family":"Ma","sequence":"first","affiliation":[]},{"given":"Geert","family":"Seuren","sequence":"additional","affiliation":[]},{"given":"Robert van","family":"Rijsinge","sequence":"additional","affiliation":[]},{"given":"Corn\u00e9","family":"Bastiaansen","sequence":"additional","affiliation":[]},{"given":"Leon van der","family":"Dussen","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2007,11,13]]},"reference":[{"key":"5011_CR1","unstructured":"Csizmadia N, Janssen AJEM (1999) Estimating the Integral Non-Linearity of Ad-Converters via the Frequency Domain. International Test Conference (ITC\u201999) 757"},{"key":"5011_CR2","doi-asserted-by":"crossref","unstructured":"Kuijstermans FCM, Sachdev M, Thijssen AP (1995) Defect-Oriented Test Methodology for Complex Mixed-Signal Circuits. European Design and Test Conference 1995. ED&TC, Proceedings 18\u201323, 6\u20139 March","DOI":"10.1109\/EDTC.1995.470425"},{"key":"5011_CR3","doi-asserted-by":"crossref","unstructured":"Lindermeir WM, Graeb HE, Antreich KJ (1995) Design based analog testing by Characteristic Observation Inference. Proc. of the 1995 IEEE\/ACM Int. Conf. on Computer-Aided Design San Jose, California, USA, 05\u201309 November, pp 620\u2013626","DOI":"10.1109\/ICCAD.1995.480193"},{"issue":"1","key":"5011_CR4","first-page":"196","volume":"51","author":"JA Starzyk","year":"2004","unstructured":"Starzyk JA, Mohn RP, Liang J (2004) A Cost-Effective Approach to the Design and Layout of a 14-bit Current Steering Dac Macrocell. IEEE TCAS-I 51(1):196\u2013200, January","journal-title":"IEEE TCAS-I"},{"key":"5011_CR5","volume-title":"CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters","author":"RJ Plassche Van de","year":"2003","unstructured":"Van de Plassche RJ (2003) CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters, 2nd edn. Springer, Heidelberg","edition":"2"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5011-9.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-007-5011-9\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5011-9","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,22]],"date-time":"2025-01-22T06:57:42Z","timestamp":1737529062000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-007-5011-9"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,11,13]]},"references-count":5,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2007,12,3]]}},"alternative-id":["5011"],"URL":"https:\/\/doi.org\/10.1007\/s10836-007-5011-9","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2007,11,13]]}}}