{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T23:23:01Z","timestamp":1705188181939},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"1-3","license":[{"start":{"date-parts":[[2008,1,5]],"date-time":"2008-01-05T00:00:00Z","timestamp":1199491200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2008,6]]},"DOI":"10.1007\/s10836-007-5018-2","type":"journal-article","created":{"date-parts":[[2008,1,4]],"date-time":"2008-01-04T17:13:00Z","timestamp":1199466780000},"page":"45-56","source":"Crossref","is-referenced-by-count":24,"title":["Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs"],"prefix":"10.1007","volume":"24","author":[{"given":"Eduardo Luis","family":"Rhod","sequence":"first","affiliation":[]},{"given":"Carlos Arthur Lang","family":"Lisb\u00f4a","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Carro","sequence":"additional","affiliation":[]},{"given":"Matteo","family":"Sonza Reorda","sequence":"additional","affiliation":[]},{"given":"Massimo","family":"Violante","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2008,1,5]]},"reference":[{"key":"5018_CR1","volume-title":"Compilers: principles, techniques and tools","author":"A Aho","year":"1986","unstructured":"Aho A, Sethi R, Ullman J (1986) Compilers: principles, techniques and tools. Addison-Wesley, Reading, MA"},{"issue":"6","key":"5018_CR2","doi-asserted-by":"crossref","first-page":"627","DOI":"10.1109\/71.774911","volume":"10","author":"Z Alkhalifa","year":"1999","unstructured":"Alkhalifa Z, Nair VSS, Krishnamurthy N, Abraham JA (1999) Design and evaluation of system-level checks for on-line control flow error detection. IEEE Trans Parallel Distrib Syst 10(6):627\u2013641 (Jun)","journal-title":"IEEE Trans Parallel Distrib Syst"},{"key":"5018_CR3","unstructured":"Austin TM (2000) DIVA: a dynamic approach to microprocessor verification. Journal of Instruction Level Parallelism 2(May)1\u20136 http:\/\/www.jilp.org\/vol2"},{"key":"5018_CR4","doi-asserted-by":"crossref","unstructured":"Beck F, Mattos JCB, Wagner FR, Carro L (2003) CACO-PS: a general purpose cycle-accurate configurable power-simulator. In: Proceedings of the 16th Brazilian symposium on integrated circuits and systems design (SBCCI 2003), September 2003","DOI":"10.1109\/SBCCI.2003.1232852"},{"issue":"2","key":"5018_CR5","doi-asserted-by":"crossref","first-page":"185","DOI":"10.1109\/TC.2006.15","volume":"55","author":"P Bernardi","year":"2006","unstructured":"Bernardi P, Bolzani LMV, Rebaudengo M, Sonza Reorda M, Vargas FL, Violante M (2006) A new hybrid fault detection technique for Systems-on-a-Chip. IEEE Trans Comput 55(2):185\u2013198 (Feb)","journal-title":"IEEE Trans Comput"},{"issue":"6","key":"5018_CR6","doi-asserted-by":"crossref","first-page":"2231","DOI":"10.1109\/23.903758","volume":"47","author":"P Cheynet","year":"2000","unstructured":"Cheynet P, Nicolescu B, Velazco R, Rebaudengo M, Sonza Reorda M, Violante M (2000) Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors. IEEE Trans Nucl Sci 47(6 part 3):2231\u20132236 (Dec)","journal-title":"IEEE Trans Nucl Sci"},{"issue":"6","key":"5018_CR7","doi-asserted-by":"crossref","first-page":"2210","DOI":"10.1109\/23.983197","volume":"48","author":"P Civera","year":"2001","unstructured":"Civera P, Macchiarulo L, Rebaudengo M, Sonza Reorda M, Violante M (2001) Exploiting circuit emulation for fast hardness evaluation. IEEE Trans Nucl Sci 48(6):2210\u20132216 (Dec)","journal-title":"IEEE Trans Nucl Sci"},{"key":"5018_CR8","doi-asserted-by":"crossref","unstructured":"Eto A, Hidaka M, Okuyama Y, Kimura K, Hosono M (1998) Impact of neutron flux on soft errors in MOS memories. In: Proceedings of the IEEE international electronic devices meeting (IEDM), IEEE Computer Society, Los Alamitos, CA, pp 367\u2013380","DOI":"10.1109\/IEDM.1998.746376"},{"key":"5018_CR9","doi-asserted-by":"crossref","unstructured":"Goloubeva O, Rebaudengo M, Sonza Reorda M, Violante M (2003) Soft-error detection using control flow assertions. In: Proceedings of the 18th IEEE international symposium on defect and fault tolerance in VLSI systems\u2014DFT 2003, November 2003, pp 581\u2013588","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"5018_CR10","doi-asserted-by":"crossref","first-page":"518","DOI":"10.1109\/TC.1984.1676475","volume":"33","author":"KH Huang","year":"1984","unstructured":"Huang KH, Abraham JA (1984) Algorithm-based fault tolerance for matrix operations. IEEE Trans Comput 33:518\u2013528 (Dec)","journal-title":"IEEE Trans Comput"},{"key":"5018_CR11","unstructured":"Lisb\u00f4a CAL, Carro L, Sonza Reorda M, Violante M (2006) Online hardening of programs against SEUs and SETs. In: Proceedings of the 21st IEEE international symposium on defect and fault tolerance in VLSI systems\u2014DFT 2006, IEEE Computer Society, Los Alamitos, CA, October 2006, pp 280\u2013288"},{"issue":"2","key":"5018_CR12","doi-asserted-by":"crossref","first-page":"160","DOI":"10.1109\/12.2145","volume":"37","author":"A Mahmood","year":"1988","unstructured":"Mahmood A, McCluskey EJ (1988) Concurrent error detection using watchdog processors\u2014a survey. IEEE Trans Comput 37(2):160\u2013174 (Feb)","journal-title":"IEEE Trans Comput"},{"key":"5018_CR13","unstructured":"Mahmood A, Lu DJ, McCluskey EJ (1983) Concurrent fault detection using a watchdog processor and assertions. In Proceedings of the IEEE international test conference 1983 (ITC \u201983), pp. 622\u2013628"},{"key":"5018_CR14","unstructured":"Namjoo M (1983) CERBERUS-16: an architecture for a general purpose watchdog processor. In: Proceedings of the 13th international symposium on fault-tolerant computing (FTCS-13), pp 216\u2013219"},{"key":"5018_CR15","unstructured":"Namjoo M, McCluskey EJ (1982) Watchdog processors and capability checking. In: Proceedings of the 12th international symposium on fault-tolerant computing (FTCS-12), pp 245\u2013248"},{"issue":"2","key":"5018_CR16","doi-asserted-by":"crossref","first-page":"180","DOI":"10.1109\/12.980007","volume":"51","author":"N Oh","year":"2002","unstructured":"Oh N, Mitra S, McCluskey EJ (2002) ED4I: error detection by diverse data and duplicated instructions. IEEE Trans Comput 51(2):180\u2013199 (Feb)","journal-title":"IEEE Trans Comput"},{"issue":"2","key":"5018_CR17","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1109\/24.994926","volume":"51","author":"N Oh","year":"2002","unstructured":"Oh N, Shirvani PP, McCluskey EJ (2002) Control flow Checking by Software Signatures. IEEE Trans Reliab 51(2):111\u2013112 (Mar)","journal-title":"IEEE Trans Reliab"},{"key":"5018_CR18","doi-asserted-by":"crossref","unstructured":"Ohlsson J, Rimen M (1995) Implicit signature checking. In: Digest of papers of the 25th international symposium on fault-tolerant computing (FTCS-25), pp 218\u2013227","DOI":"10.1109\/FTCS.1995.466976"},{"issue":"5","key":"5018_CR19","doi-asserted-by":"crossref","first-page":"61","DOI":"10.1109\/40.877951","volume":"20","author":"N Quach","year":"2000","unstructured":"Quach N (2000) High availability and reliability in the Itanium processor. IEEE MICRO 20(5):61\u201369 (Sep\u2013Oct)","journal-title":"IEEE MICRO"},{"key":"5018_CR20","unstructured":"Schillaci M, Sonza Reorda M, Violante M (2006) A new approach to cope with single event upsets in processor-based systems. In: Proceedings of the 7th IEEE Latin\u2013American test workshop\u2014LATW 2006, March 2006, pp 145\u2013150"},{"issue":"3","key":"5018_CR21","doi-asserted-by":"crossref","first-page":"264","DOI":"10.1109\/TC.1987.1676899","volume":"36","author":"MA Schuette","year":"1987","unstructured":"Schuette MA, Shen JP (1987) Processor control flow monitoring using signatured instruction streams. IEEE Trans Comput 36(3):264\u2013276 (Mar)","journal-title":"IEEE Trans Comput"},{"issue":"5","key":"5018_CR22","doi-asserted-by":"crossref","first-page":"164","DOI":"10.1109\/MDT.2006.45","volume":"20","author":"C Stolicny","year":"2006","unstructured":"Stolicny C (2006) ITC 2005 panels. IEEE Des Test Comput 20(5):164\u2013166 (Mar\u2013Apr)","journal-title":"IEEE Des Test Comput"},{"key":"5018_CR23","doi-asserted-by":"crossref","unstructured":"Vijaykrishnan N (2005) Soft-errors: is the concern for soft errors overblown? In: Proceedings of the IEEE international test conference 2005 (ITC 2005), November 2005 (2 pages)","DOI":"10.1109\/TEST.2005.1584102"},{"key":"5018_CR24","unstructured":"Weaver C, Gebara FF, Austin T, Brown R (2002) Remora: a dynamic self-tuning processor. University of Michigan CSE Technical Report CSE-TR-460-02, July 2002. University of Michigan, MI, USA"},{"issue":"6","key":"5018_CR25","doi-asserted-by":"crossref","first-page":"629","DOI":"10.1109\/43.55193","volume":"9","author":"K Wilken","year":"1990","unstructured":"Wilken K, Shen JP (1990) Continuous signature monitoring: low-cost concurrent detection of processor control errors. IEEE Trans Comput-Aided Des Integr Circuits Syst 9(6):629\u2013641 (Jun)","journal-title":"IEEE Trans Comput-Aided Des Integr Circuits Syst"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5018-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-007-5018-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5018-2","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:57:42Z","timestamp":1559253462000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-007-5018-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1,5]]},"references-count":25,"journal-issue":{"issue":"1-3","published-print":{"date-parts":[[2008,6]]}},"alternative-id":["5018"],"URL":"https:\/\/doi.org\/10.1007\/s10836-007-5018-2","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,1,5]]}}}