{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:55:20Z","timestamp":1747810520051},"reference-count":20,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2007,10,12]],"date-time":"2007-10-12T00:00:00Z","timestamp":1192147200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2007,12]]},"DOI":"10.1007\/s10836-007-5025-3","type":"journal-article","created":{"date-parts":[[2007,10,11]],"date-time":"2007-10-11T16:59:43Z","timestamp":1192121983000},"page":"593-603","source":"Crossref","is-referenced-by-count":7,"title":["A Robust 130\u00a0nm-CMOS Built-In Current Sensor Dedicated to RF Applications"],"prefix":"10.1007","volume":"23","author":[{"given":"M.","family":"Cimino","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Lapuyade","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"De Matos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Taris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Deval","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. B.","family":"B\u00e9gueret","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2007,10,12]]},"reference":[{"key":"5025_CR1","unstructured":"Al-Qutayri MA (1995) analogue circuit testing by a supply current monitor. IMST Workshop. Grenoble, France, June 20\u201322, 1995"},{"key":"5025_CR2","volume-title":"CMOS analog circuit design","author":"PE Allen","year":"2002","unstructured":"Allen PE, Holberg DR (2002) CMOS analog circuit design. 2nd edn. Oxford University Press, New York, USA","edition":"2"},{"issue":"3","key":"5025_CR3","doi-asserted-by":"crossref","first-page":"1026","DOI":"10.1109\/TMTT.2005.843505","volume":"53","author":"M Brandolini","year":"2005","unstructured":"Brandolini M, Rossi P, Manstretta D, Svelto F (2005) Toward multistandard mobile terminals fully integrated receivers requirements and architectures. IEEE Trans Microwave Theor Tech 53(3):1026\u20131038 (March 2005)","journal-title":"IEEE Trans Microwave Theor Tech"},{"key":"5025_CR4","doi-asserted-by":"crossref","first-page":"1091","DOI":"10.1016\/j.mejo.2005.04.064","volume":"36","author":"A Gopalan","year":"2005","unstructured":"Gopalan A, Margala M, Mukund PR (2005) A current based self-test methodology for RF front-end circuits. Microelectro J 36:1091\u20131102","journal-title":"Microelectro J"},{"key":"5025_CR5","volume-title":"Low-rate wireless personal area networks","author":"JA Gutierrez","year":"2003","unstructured":"Gutierrez JA, Callaway EH (2003) Low-rate wireless personal area networks. IEEE, New York"},{"key":"5025_CR6","unstructured":"HCMOS9GP Design Kit, ST Microelectronics, 2003"},{"key":"5025_CR7","first-page":"400","volume-title":"Optimising test sets for RF components with a defect-oriented approach","author":"R Kheriji","year":"2005","unstructured":"Kheriji R, Danelon V, Carbonero JL, Mir S (2005) Optimising test sets for RF components with a defect-oriented approach. Design Automation and Test Conference in Europe, Munich, Germany, pp 400\u2013403 (7\u201311 March 2005)"},{"key":"5025_CR8","unstructured":"Levi MW (1981) CMOS is most testable. IEEE Proceedings ITC\u201981, Washington DC, USA, pp 217\u2013220"},{"key":"5025_CR9","unstructured":"Maidon Y, Deval Y, Fremont H, Dom JP (1996) Using IDD to analyse Analogue Faults and Development of a sensor, Proceeding of MM\u201996 Symposium. Austin, USA, pp 100\u2013103"},{"key":"5025_CR10","doi-asserted-by":"crossref","unstructured":"Maidon Y, Deval Y, Fouillat P, Tomas J, Dom JP (1996) On-chip IDDX sensor. IDDQ 1996 Digest of Papers. Washington DC, USA, pp 64\u201367","DOI":"10.1109\/IDDQ.1996.557820"},{"issue":"7","key":"5025_CR11","doi-asserted-by":"crossref","first-page":"345","DOI":"10.1049\/el:19970275","volume":"33","author":"Y Maidon","year":"1997","unstructured":"Maidon Y, Deval Y, Begueret JB, Tomas J, Dom JP (1997) 3.3\u00a0V CMOS built-in current sensor. Electron Lett 33(7):345\u2013346","journal-title":"Electron Lett"},{"key":"5025_CR12","unstructured":"Maidon Y, Deval Y, B\u00e9gueret J-B, Dom J-P (1998) High sensitivity CMOS BICS. IEEE European Test Workshop (ETW\u201998). Stiges, Spain, pp 75\u201378 (May 1998)"},{"key":"5025_CR13","doi-asserted-by":"crossref","unstructured":"Pineda de Gyvez J, Gronthoud G, Amine R (2003) VDD ramp testing for rf circuits. International Test Conference 2003. Charlotte, NC, USA, pp 651\u2013658","DOI":"10.1109\/TEST.2003.1270893"},{"key":"5025_CR14","unstructured":"Razavi B (2000) Design of analog CMOS integrated circuits. McGraw-Hill, USA (Preliminary Edition)"},{"key":"5025_CR15","doi-asserted-by":"crossref","unstructured":"Soldo A, Gopalan A, Mukund PR, Margala M (2004) A current sensor for on-chip, non-intrusive testing of RF systems. International Conference on VLSI Design VLSID, pp 1023\u20131026","DOI":"10.1109\/ICVD.2004.1261064"},{"key":"5025_CR16","unstructured":"Tiebout M, Paparisto E (2002) LNA Design for a Fully Integrated CMOS single chip UMTS transceiver. 28th European Solid-State Circuits Conference. Florence, Italy, pp 835\u2013838, 24\u201326 September 2002"},{"key":"5025_CR17","unstructured":"Van Lammeren JPM (1998) ICCQ: a test method for analogue VLSI Based on current monitoring. IEEE CTAMS\u201998 Compendium of Papers. Paris, France, pp 49\u201353"},{"issue":"3","key":"5025_CR18","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1109\/JSSC.2003.822900","volume":"39","author":"JR Vasquez","year":"2004","unstructured":"Vasquez JR, Pineda de Gyvez J (2004) Built in current sensor for \u0394IDDQ testing. IEEE J Solid-State Circuit 39(3):511\u2013518 (March 2004)","journal-title":"IEEE J Solid-State Circuit"},{"key":"5025_CR19","first-page":"565","volume":"1","author":"V Vidojkovic","year":"2004","unstructured":"Vidojkovic V, van der Tang J, Hannsen E, Leeuwenburgh A, van Roermund A (2004) Fully-integrated DECT\/Bluetooth multi-band LNA in 0.18\u00a0um CMOS. IEEE Int Symp Circuits Syst Proc (ISCAS) 1:565\u2013568","journal-title":"IEEE Int Symp Circuits Syst Proc (ISCAS)"},{"key":"5025_CR20","doi-asserted-by":"crossref","first-page":"3974","DOI":"10.1109\/ISCAS.2005.1465501","volume":"4","author":"CS Wang","year":"2005","unstructured":"Wang CS, Li WC, Wang CK (2005) A multi-band multi-standard RF front-end IEEE 802.16a for IEEE 802.16a and IEEE 802.11 a\/b\/g applications. IEEE Int Symp Circuits Syst Proc 4:3974\u20133977 (May 2005)","journal-title":"IEEE Int Symp Circuits Syst Proc"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5025-3.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-007-5025-3\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-007-5025-3","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T01:57:42Z","timestamp":1559267862000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-007-5025-3"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,10,12]]},"references-count":20,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2007,12]]}},"alternative-id":["5025"],"URL":"https:\/\/doi.org\/10.1007\/s10836-007-5025-3","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2007,10,12]]}}}