{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T10:16:26Z","timestamp":1648635386039},"reference-count":6,"publisher":"Springer Science and Business Media LLC","issue":"6","license":[{"start":{"date-parts":[[2008,10,1]],"date-time":"2008-10-01T00:00:00Z","timestamp":1222819200000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2008,12]]},"DOI":"10.1007\/s10836-008-5077-z","type":"journal-article","created":{"date-parts":[[2008,9,30]],"date-time":"2008-09-30T15:45:38Z","timestamp":1222789538000},"page":"591-595","source":"Crossref","is-referenced-by-count":1,"title":["An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR"],"prefix":"10.1007","volume":"24","author":[{"given":"Myung-Hoon","family":"Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongjoon","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sunghoon","family":"Chun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2008,10,1]]},"reference":[{"issue":"5","key":"5077_CR1","doi-asserted-by":"crossref","first-page":"597","DOI":"10.1109\/43.998630","volume":"21","author":"A Chandra","year":"2002","unstructured":"Chandra A, Chakrabarty K (2002) Low-power scan testing and test data compression for system-on-a-chip. IEEE Trans Comput Aided Des Integr Circuits Syst 21(5):597\u2013604 DOI 10.1109\/43.998630","journal-title":"IEEE Trans Comput Aided Des Integr Circuits Syst"},{"key":"5077_CR2","unstructured":"Chandra A., Chakrabarty K (2002) Reduction of SOC test data volume, scan power and testing time using alternating run-length codes. In: Proceedings of Design Automation Conference, pp 673\u2013678"},{"key":"5077_CR3","unstructured":"Koenemann B (1991) LFSR-coded test pattern for scan designs. In: Proceedings of the European Test Conference, pp 237\u2013242"},{"issue":"2","key":"5077_CR4","doi-asserted-by":"crossref","first-page":"396","DOI":"10.1109\/TCAD.2006.882509","volume":"26","author":"J Lee","year":"2007","unstructured":"Lee J, Touba NA (2007) LFSR-reseeding scheme achieving low-power dissipation during test. Proc IEEE Trans Comput Aided Des Integr Circuits Syst 26(2):396\u2013401","journal-title":"Proc IEEE Trans Comput Aided Des Integr Circuits Syst"},{"key":"5077_CR5","doi-asserted-by":"crossref","first-page":"5670","DOI":"10.1109\/ISCAS.2005.1465924","volume":"6","author":"J Li","year":"2005","unstructured":"Li J, Han Y, Li X (2005) Deterministic and low power BIST based on scan slicing overlapping. IEEE Int Symp Circuits Syst 6:5670\u20135673","journal-title":"IEEE Int Symp Circuits Syst"},{"issue":"4","key":"5077_CR6","doi-asserted-by":"crossref","first-page":"209","DOI":"10.1049\/ip-cdt:20030666","volume":"150","author":"PM Rosinger","year":"2003","unstructured":"Rosinger PM, Al-Hashimi BM, Nicolici N (2003) Dual multiple-polynomial LFSR for low-power mixed-mode BIST. IEE Proc Comput Digit Tech 150(4):209\u2013217 DOI 10.1049\/ip-cdt:20030666","journal-title":"IEE Proc Comput Digit Tech"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5077-z.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-008-5077-z\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5077-z","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T21:57:43Z","timestamp":1559253463000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-008-5077-z"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10,1]]},"references-count":6,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2008,12]]}},"alternative-id":["5077"],"URL":"https:\/\/doi.org\/10.1007\/s10836-008-5077-z","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2008,10,1]]}}}