{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T19:46:26Z","timestamp":1710359186548},"reference-count":14,"publisher":"Springer Science and Business Media LLC","issue":"2-3","license":[{"start":{"date-parts":[[2009,1,30]],"date-time":"2009-01-30T00:00:00Z","timestamp":1233273600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1007\/s10836-008-5091-1","type":"journal-article","created":{"date-parts":[[2009,1,31]],"date-time":"2009-01-31T15:29:03Z","timestamp":1233415743000},"page":"187-195","source":"Crossref","is-referenced-by-count":3,"title":["A New Algorithm for the Selection of Control Cells in Boundary-Scan Interconnect Test"],"prefix":"10.1007","volume":"25","author":[{"given":"A.","family":"Quiros-Olozabal","sequence":"first","affiliation":[]},{"given":"M. A.","family":"Cifredo-Chacon","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2009,1,30]]},"reference":[{"key":"5091_CR1","doi-asserted-by":"crossref","unstructured":"Angelotti, F. W., et al. (1993). System level interconnection test in a tristate environment. Proceedings IEEE International Test Conference, pp. 45\u201353.","DOI":"10.1109\/TEST.1993.470719"},{"key":"5091_CR2","doi-asserted-by":"crossref","unstructured":"Chiang, C., & Gupta, S. K. (1997). BIST TPGs for faults in board level interconnect via boundary scan. Proceedings IEEE VLSI Test Symposium, pp. 376\u2013382.","DOI":"10.1109\/VTEST.1997.600311"},{"key":"5091_CR3","doi-asserted-by":"crossref","unstructured":"Feng, W., Huang, W. K., Meyer, F. J., & Lombardi, F. (1999). A BIST TPG approach for interconnect testing with the IEEE 1149.1 STD. Proceedings Asian Test Symposium, pp. 95\u2013100.","DOI":"10.1109\/ATS.1999.810735"},{"issue":"5","key":"5091_CR4","doi-asserted-by":"crossref","first-page":"77","DOI":"10.1109\/40.958701","volume":"21","author":"W. Feng","year":"2001","unstructured":"Feng W., Karimi F., Lombardi F. (2001) Fault detection in a tristate system environment. IEEE Micro 21(5):77\u201385.","journal-title":"IEEE Micro"},{"key":"5091_CR5","doi-asserted-by":"crossref","unstructured":"Feng, W., Meyer, F. J., & Lombardi, F. (1999). Novel control pattern generators for interconnect testing with boundary scan. Proceedings International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 112\u2013120.","DOI":"10.1109\/DFTVS.1999.802876"},{"key":"5091_CR6","unstructured":"Goel, P., & McMahon, M. T. (1982). Electronic chip-in-place test. Proceedings International Test Conference, pp. 83\u201390."},{"key":"5091_CR7","unstructured":"Her, W., Jin, L., & El-Ziq, Y. (1992). An ATPG driver selection algorithm for interconnect test with boundary scan. Proceedings International Test Conference, pp. 382\u2013388."},{"key":"5091_CR8","unstructured":"IEEE.Std. 1149.1-2001 (Revision of IEEE Std. 1149.1-1990) IEEE Standard Test Access Port and Boundary-Scan Architecture., The Institute of Electrical and Electronic Engineers, Inc., 2001."},{"key":"5091_CR9","doi-asserted-by":"crossref","unstructured":"Jarwala, N., & Yau, C. W. (1989). A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects. Proceedings International Test Conference, pp. 63\u201370.","DOI":"10.1109\/TEST.1989.82278"},{"issue":"4","key":"5091_CR10","doi-asserted-by":"crossref","first-page":"358","DOI":"10.1109\/T-C.1974.223950","volume":"c-23","author":"W. H. Kautz","year":"1974","unstructured":"Kautz W. H. (1974) Testing for faults in wiring interconnects. IEEE Trans Comput c-23(4):358\u2013363 Apr.","journal-title":"IEEE Trans Comput"},{"issue":"5","key":"5091_CR11","first-page":"532","volume":"12","author":"Y. Kim","year":"2004","unstructured":"Kim Y., Kim H., Kang S. (2004) A new maximal diagnosis algorithm for interconnect test. IEEE Transactions on Very Large Scale Integration (VLSI). Systems 12(5):532\u2013537","journal-title":"Systems"},{"key":"5091_CR12","unstructured":"Su, C., & Chen, Y. (1998). Comprehensive interconnect BIST methodology for virtual socket interface. Proceedings Asian Test Symposium, pp. 259\u2013263."},{"issue":"3","key":"5091_CR13","first-page":"225","volume":"15","author":"C. Su","year":"1999","unstructured":"Su C., Jou S. (1999) Decentralized BIST methodology for system level interconnects. J Electron Test 15(3):225\u2013265 Dec.","journal-title":"J Electron Test"},{"key":"5091_CR14","doi-asserted-by":"crossref","unstructured":"Yau, C. W., & Jarwala, N. (1989). A unified theory for designing optimal test generation and diagnosis algorithms for board interconnects. Proceedings International Test Conference, pp. 71\u201377.","DOI":"10.1109\/TEST.1989.82279"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5091-1.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-008-5091-1\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5091-1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T01:57:44Z","timestamp":1559267864000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-008-5091-1"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1,30]]},"references-count":14,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[2009,6]]}},"alternative-id":["5091"],"URL":"https:\/\/doi.org\/10.1007\/s10836-008-5091-1","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,1,30]]}}}