{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,8]],"date-time":"2025-02-08T05:15:51Z","timestamp":1738991751017,"version":"3.37.0"},"reference-count":19,"publisher":"Springer Science and Business Media LLC","issue":"2-3","license":[{"start":{"date-parts":[[2009,1,30]],"date-time":"2009-01-30T00:00:00Z","timestamp":1233273600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1007\/s10836-008-5092-0","type":"journal-article","created":{"date-parts":[[2009,1,29]],"date-time":"2009-01-29T15:37:13Z","timestamp":1233243433000},"page":"169-185","source":"Crossref","is-referenced-by-count":6,"title":["A Novel Fault Localization Technique Based on Deconvolution and Calibration of Power Pad Transients Signals"],"prefix":"10.1007","volume":"25","author":[{"given":"Reza M.","family":"Rad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jim","family":"Plusquellic","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2009,1,30]]},"reference":[{"key":"5092_CR1","doi-asserted-by":"crossref","unstructured":"Acharyya D, Plusquellic J (2004) Calibrating power supply signal measurements for process and probe card variations. Workshop on Current and Defect Based Testing, pp 23\u201330","DOI":"10.1109\/DBT.2004.1408948"},{"key":"5092_CR2","doi-asserted-by":"crossref","unstructured":"Aitken RC (1992) A comparison of defect models for fault location with IDDQ measurements. ITC, pp 778\u2013787","DOI":"10.1109\/TEST.1992.527900"},{"key":"5092_CR3","unstructured":"Bhunia S, Roy K, Segura J (2002) A novel wavelet transform based transient current analysis for fault detection and localization. DAC, 2002, pp 361\u2013366"},{"key":"5092_CR4","first-page":"377","volume":"3","author":"S Chakravarty","year":"1992","unstructured":"Chakravarty S, Liu M (1992) IDDQ measurement based diagnosis of bridging faults. JETTA 3:377\u2013385","journal-title":"JETTA"},{"key":"5092_CR5","doi-asserted-by":"crossref","unstructured":"de Paul I, Rosales M, Alorda B, Segura J, Hawkins C, Soden J (2001) Defect oriented fault diagnosis for semiconductor memories using charge analysis, theory and experiments. VLSI Test Symposium pp 286\u2013291","DOI":"10.1109\/VTS.2001.923451"},{"key":"5092_CR6","unstructured":"Gattiker AE, Maly W (1997) Current signatures: application. ITC, pp 156\u2013165"},{"key":"5092_CR7","doi-asserted-by":"crossref","unstructured":"Gong Y, Chakravarty S (1995) On adaptive diagnostic test generation, ICCAD, pp 181\u2013184","DOI":"10.1109\/ICCAD.1995.480010"},{"key":"5092_CR8","unstructured":"http:\/\/www.mosis.com\/Technical\/Testdata\/tsmc-025-prm.html"},{"issue":"4","key":"5092_CR9","doi-asserted-by":"crossref","first-page":"60","DOI":"10.1109\/54.491239","volume":"12","author":"E Isern","year":"1995","unstructured":"Isern E, Figueras J (1995) IDDQ test and diagnosis of CMOS circuits. Des Test Comput 12(4):60\u201367","journal-title":"Des Test Comput"},{"key":"5092_CR10","unstructured":"Lavo DB, Larrabee T., Colburn JE (1999) Eliminating the Ouija(R) Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis. ITC, pp 1065\u20131072"},{"issue":"1","key":"5092_CR11","doi-asserted-by":"crossref","first-page":"42","DOI":"10.1109\/54.902821","volume":"18","author":"K Muhammad","year":"2001","unstructured":"Muhammad K, Roy K (2001) Fault detection and location using IDD waveform analysis. Des and Test Comput 18(1):42\u201349","journal-title":"Des and Test Comput"},{"key":"5092_CR12","unstructured":"Naik S, Maly W (1993) Computer-aided failure analysis of VLSI circuits using IDDQ testing. VLSI Test Symposium, pp 106\u2013108"},{"key":"5092_CR13","doi-asserted-by":"crossref","unstructured":"Plusquellic J, Acharyya D, Tehranipoor M, Patel C (2006) Triangulating to a defect\u2019s physical coordinates using multiple supply pad IDDQs: test chip results. International Symposium on Testing and Failure Analysis, Nov., pp 36\u201345","DOI":"10.31399\/asm.cp.istfa2006p0036"},{"issue":"4","key":"5092_CR14","doi-asserted-by":"crossref","first-page":"278","DOI":"10.1109\/MDT.2006.102","volume":"23","author":"J Plusquellic","year":"2006","unstructured":"Plusquellic J, Acharyya D, Singh A, Tehranipoor M, Patel C (2006) Quiescent-signal analysis: a multiple supply pad IDDQ method. Des Test Comput 23(4):278\u2013293 April","journal-title":"Des Test Comput"},{"key":"5092_CR15","doi-asserted-by":"crossref","unstructured":"Pomeranz I, Reddy SM (1992) On the generation of small dictionaries for fault location. ICCAD, pp 272\u2013279","DOI":"10.1109\/ICCAD.1992.279361"},{"key":"5092_CR16","unstructured":"Singh A, Patel C, Plusquellic J (2004) Fault simulation model for iDDT testing: an investigation. VLSI Test Symposium, pp 304\u2013310"},{"key":"5092_CR17","doi-asserted-by":"crossref","unstructured":"Thibeault C, Boisvert L (1998) Diagnosis method based on delta IDDQ probabilistic signatures: Experimental Results, ITC, pp 1019\u20131026","DOI":"10.1109\/TEST.1998.743299"},{"key":"5092_CR18","unstructured":"van Genderen A, van der Meijs N, Beeftink F, Elias P, Geigenmuller U, Smedes T (1996) SPACE, Layout to Circuit Extraction software module of the Nelsis IC Design System\u201d, Delft University of Technology, ( space@cas.et.tudelft.nl )"},{"key":"5092_CR19","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/2946.001.0001","volume-title":"Extrapolation, interpolation, and smoothing of stationary time series","author":"N Wiener","year":"1949","unstructured":"Wiener N (1949) Extrapolation, interpolation, and smoothing of stationary time series. Wiley, New York"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5092-0.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-008-5092-0\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5092-0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,7]],"date-time":"2025-02-07T08:51:58Z","timestamp":1738918318000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-008-5092-0"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1,30]]},"references-count":19,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[2009,6]]}},"alternative-id":["5092"],"URL":"https:\/\/doi.org\/10.1007\/s10836-008-5092-0","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"type":"print","value":"0923-8174"},{"type":"electronic","value":"1573-0727"}],"subject":[],"published":{"date-parts":[[2009,1,30]]}}}