{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T04:49:41Z","timestamp":1648615781605},"reference-count":25,"publisher":"Springer Science and Business Media LLC","issue":"2-3","license":[{"start":{"date-parts":[[2009,1,31]],"date-time":"2009-01-31T00:00:00Z","timestamp":1233360000000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/www.springer.com\/tdm"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Electron Test"],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1007\/s10836-008-5095-x","type":"journal-article","created":{"date-parts":[[2009,1,30]],"date-time":"2009-01-30T15:27:01Z","timestamp":1233329221000},"page":"145-156","source":"Crossref","is-referenced-by-count":6,"title":["A Built-in-Self-Test \u03a3-\u0394 ADC Prototype"],"prefix":"10.1007","volume":"25","author":[{"given":"Hao-Chiao","family":"Hong","sequence":"first","affiliation":[]},{"given":"Sheng-Chuan","family":"Liang","sequence":"additional","affiliation":[]},{"given":"Hong-Chin","family":"Song","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2009,1,31]]},"reference":[{"key":"5095_CR1","doi-asserted-by":"crossref","unstructured":"Arabi K, Kaminska B (1997) Efficient and accurate testing of analog-to-digital converters using oscillation-test method. In: Proc European design and test conference, Paris, 17\u201320 March 1997, pp 348\u2013352","DOI":"10.1109\/EDTC.1997.582381"},{"issue":"3","key":"5095_CR2","doi-asserted-by":"crossref","first-page":"409","DOI":"10.1109\/92.711312","volume":"6","author":"K Arabi","year":"1998","unstructured":"Arabi K, Kaminska B (1998) On chip testing data converters using static parameters. IEEE Trans Very Large Scale Integr (VLSI) Syst 6(3):409\u2013419","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"5095_CR3","doi-asserted-by":"crossref","unstructured":"Azais F, Bernard S, Bertrand Y, Renovell M (2001) Implementation of a linear histogram BIST for ADCs. In: Proc design, automation and test in Europe (DATE), Munich, 13\u201316 March 2001, pp\u00a0590\u2013595","DOI":"10.1109\/DATE.2001.915083"},{"issue":"3","key":"5095_CR4","doi-asserted-by":"crossref","first-page":"257","DOI":"10.1023\/B:JETT.0000029459.74815.56","volume":"20","author":"S Bernard","year":"2004","unstructured":"Bernard S, Comte M, Azais F, Bertrand Y, Renovell M (2004) Efficiency of spectral-based ADC test flows to detect static errors. J Electron Test Theory Appl (JETTA) 20(3):257\u2013267","journal-title":"J Electron Test Theory Appl (JETTA)"},{"key":"5095_CR5","volume-title":"An introduction to mixed-signal IC test and measurement","author":"M Burns","year":"2001","unstructured":"Burns M, Roberts GW (2001) An introduction to mixed-signal IC test and measurement. Oxford University Press, Oxford"},{"issue":"1","key":"5095_CR6","doi-asserted-by":"crossref","first-page":"72","DOI":"10.1109\/TCOM.1986.1096432","volume":"34","author":"JC Candy","year":"1986","unstructured":"Candy JC (1986) Decimation for sigma delta modulation. IEEE Trans Commun 34(1):72","journal-title":"IEEE Trans Commun"},{"key":"5095_CR7","doi-asserted-by":"crossref","unstructured":"Chen H-K, Wang C-H, Su C-C (2002) A self calibrated ADC BIST methodology. In: Proc IEEE VLSI test symp (VTS), Monterey, April 2002, pp\u00a0117\u2013122","DOI":"10.1109\/VTS.2002.1011121"},{"issue":"3","key":"5095_CR8","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1007\/s10836-005-6351-y","volume":"21","author":"MDG Flores","year":"2005","unstructured":"Flores MDG, Negreiros M, Carro L, Susin AA, Clayton FR, Benevento C (2005) Low cost BIST for static and dynamic testing of ADCs. J Electron Test Theory Appl (JETTA) 21(3):205\u2013219","journal-title":"J Electron Test Theory Appl (JETTA)"},{"issue":"1","key":"5095_CR9","doi-asserted-by":"crossref","first-page":"95","DOI":"10.1007\/s10836-006-9523-5","volume":"23","author":"S Goyal","year":"2007","unstructured":"Goyal S, Chatterjee A, Purtell M (2007) A low-cost test methodology for dynamic specification testing of high-speed data converters. J Electron Test Theory Appl (JETTA) 23(1):95\u2013106","journal-title":"J Electron Test Theory Appl (JETTA)"},{"issue":"12","key":"5095_CR10","doi-asserted-by":"crossref","first-page":"1341","DOI":"10.1109\/TVLSI.2007.909799","volume":"15","author":"H-C Hong","year":"2007","unstructured":"Hong H-C (2007) A design-for-digital-testability circuit structure for \u03a3-\u0394 modulators. IEEE Trans Very Large Scale Integr (VLSI) Systems 15(12):1341\u20131350","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Systems"},{"key":"5095_CR11","unstructured":"Hong H-C, Liang S-C (2008) A decorrelating design-for-digital-testability scheme for \u03a3-\u0394 modulators. IEEE Trans Circuit Syst I Regular papers (in press)"},{"issue":"9","key":"5095_CR12","doi-asserted-by":"crossref","first-page":"553","DOI":"10.1109\/TCSII.2003.814812","volume":"50","author":"H-C Hong","year":"2003","unstructured":"Hong H-C, Huang J-L, Cheng K-T, Wu C-W, Kwai D-M (2003) Practical considerations in applying sigma-delta modulation based analog BIST to sampled-data systems. IEEE Trans Circuits Syst 2 Analog Digit Signal Process 50(9):553\u2013566","journal-title":"IEEE Trans Circuits Syst 2 Analog Digit Signal Process"},{"key":"5095_CR13","volume-title":"IEEE standard for teminology and test methods for analog-to-digital converters.","author":"IEEE Std 1241-2000","year":"2001","unstructured":"IEEE Std 1241-2000 (2001) IEEE standard for teminology and test methods for analog-to-digital converters. IEEE-SA Standards Board, New York"},{"issue":"7","key":"5095_CR14","doi-asserted-by":"crossref","first-page":"437","DOI":"10.1109\/82.298375","volume":"41","author":"AK Lu","year":"1994","unstructured":"Lu AK, Roberts GW (1994) A High-quality analog oscillator using oversampling D\/A conversion techniques. IEEE Trans Circuits Syst 2 Analog Digit Signal Process 41(7):437\u2013444","journal-title":"IEEE Trans Circuits Syst 2 Analog Digit Signal Process"},{"key":"5095_CR15","doi-asserted-by":"crossref","unstructured":"Mattes H, Sattler S, Dworski C (2004) Controlled sine wave fitting for ADC test. In: Proc IEEE int test conf (ITC), Charlotte, 26\u201328 October 2004, pp 963\u2013971","DOI":"10.1109\/TEST.2004.1387361"},{"issue":"3","key":"5095_CR16","doi-asserted-by":"crossref","first-page":"205","DOI":"10.1007\/s10836-005-6351-y","volume":"21","author":"MG Mendez-Rivera","year":"2005","unstructured":"Mendez-Rivera MG, Valdes-Garcia A, Silva-Martinez J, Sanchez-Sinencio E (2005) An on-chip spectrum analyzer for analog built-in testing. J Electron Test Theory Appl (JETTA) 21(3):205\u2013219","journal-title":"J Electron Test Theory Appl (JETTA)"},{"key":"5095_CR17","volume-title":"The audio measurement handbook","author":"B Metzler","year":"1993","unstructured":"Metzler B (1993) The audio measurement handbook. Audio Precision, Beaverton"},{"key":"5095_CR18","doi-asserted-by":"crossref","unstructured":"Negreiros M, Carro L, Susin A (2003) Ultra low cost analog BIST using spectral analysis. In: Proc IEEE VLSI test symp (VTS), pp\u00a077\u201382","DOI":"10.1109\/VTEST.2003.1197636"},{"key":"5095_CR19","volume-title":"Delta-sigma data converters: theory, design, and simulation","author":"SR Norsworthy","year":"1997","unstructured":"Norsworthy SR, Schreier R, Temes GC (1997) Delta-sigma data converters: theory, design, and simulation. IEEE, Piscataway"},{"key":"5095_CR20","doi-asserted-by":"crossref","unstructured":"Parthasarathy KL, Jin L, Kuyel T, Price D, Chen D, Geiger R (2003) Experimental evaluation and validation of a BIST algorithm for characterization of A\/D converter performance. In: Proc IEEE int symp circuits and systems (ISCAS), pp\u00a0537\u2013540","DOI":"10.1109\/ISCAS.2003.1206343"},{"issue":"4\u20136","key":"5095_CR21","doi-asserted-by":"crossref","first-page":"325","DOI":"10.1007\/s10836-006-9500-z","volume":"22","author":"L Rolindez","year":"2006","unstructured":"Rolindez L, Mir S, Bounceur A, Carbonero J-L (2006) A BIST scheme for sndr testing of \u03a3-\u0394 ADCs using sine-wave fitting. J Electron Test Theory Appl (JETTA) 22(4\u20136):325\u2013335","journal-title":"J Electron Test Theory Appl (JETTA)"},{"issue":"2","key":"5095_CR22","doi-asserted-by":"crossref","first-page":"420","DOI":"10.1109\/TIM.2007.910106","volume":"57","author":"H-W Ting","year":"2008","unstructured":"Ting H-W, Liu B-D, Chang S-J (2008) Histogram based testing method for estimating A\/D converter performance. IEEE Trans Instrum Meas 57(2):420\u2013427","journal-title":"IEEE Trans Instrum Meas"},{"issue":"8","key":"5095_CR23","doi-asserted-by":"crossref","first-page":"608","DOI":"10.1109\/82.532008","volume":"43","author":"MF Toner","year":"1996","unstructured":"Toner MF, Roberts GW (1996) A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta modulator. IEEE Trans Circuits Syst 2 Analog Digit Signal Process 43(8):608\u2013613","journal-title":"IEEE Trans Circuits Syst 2 Analog Digit Signal Process"},{"key":"5095_CR24","unstructured":"Wen Y-C, Lee K-J (2000) An on chip ADC test structure. In: Proc design, automation and test in Europe (DATE), pp\u00a0221\u2013225"},{"issue":"6","key":"5095_CR25","doi-asserted-by":"crossref","first-page":"2748","DOI":"10.1109\/TIM.2007.908343","volume":"56","author":"J Wibbenmeyer","year":"2007","unstructured":"Wibbenmeyer J, Chen C-IH (2007) Built-in self-test for low-voltage high-speed analog-to-digital converters. IEEE Trans Instrum Meas 56(6):2748\u20132756","journal-title":"IEEE Trans Instrum Meas"}],"container-title":["Journal of Electronic Testing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5095-x.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1007\/s10836-008-5095-x\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1007\/s10836-008-5095-x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,31]],"date-time":"2019-05-31T01:57:44Z","timestamp":1559267864000},"score":1,"resource":{"primary":{"URL":"http:\/\/link.springer.com\/10.1007\/s10836-008-5095-x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1,31]]},"references-count":25,"journal-issue":{"issue":"2-3","published-print":{"date-parts":[[2009,6]]}},"alternative-id":["5095"],"URL":"https:\/\/doi.org\/10.1007\/s10836-008-5095-x","relation":{},"ISSN":["0923-8174","1573-0727"],"issn-type":[{"value":"0923-8174","type":"print"},{"value":"1573-0727","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,1,31]]}}}